| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/02/2005 | US20050116338 Semiconductor device |
| 06/02/2005 | US20050116307 Method and arrangement for protecting a chip and checking its authenticity |
| 06/02/2005 | US20050116223 Burn-in substrate and burn-in device |
| 06/02/2005 | US20050115924 Integration function of RF signal to analyze steady state and non-steady state ( initializaion) of plasmas |
| 06/02/2005 | DE202005001750U1 Lead accumulator charge status sensor for traction, starter and buffer batteries, has four point electrode group on ceramic or glass substrate with acid resistant glass masking |
| 06/02/2005 | DE19816097B4 Verfahren, Vorrichtung und Programmspeichermedium zum Berechnen der Stärke eines elektromagnetischen Feldes Method, apparatus and program storage medium for calculating the strength of an electromagnetic field |
| 06/02/2005 | DE10355116A1 Ein- und Ausgangsschaltung eines integrierten Schaltkreises, Verfahren zum Testen eines integrierten Schaltkreises sowie integrierter Schaltkreis mit einer solchen Ein- und Ausgangsschaltung Input and output circuitry of an integrated circuit, method for testing an integrated circuit and an integrated circuit with such an input and output circuit |
| 06/02/2005 | DE102004019676A1 Verfahren zum Auswählen von Testerentwürfen und Verwendungsmodell, das Betriebscharakteristika verwendet A method of selecting tester designs and use model, the operating characteristics used |
| 06/02/2005 | CA2776512A1 Flow control device |
| 06/02/2005 | CA2546047A1 Independently adjustable circuit board carrier |
| 06/01/2005 | EP1536539A1 Rapid charging battery charging system |
| 06/01/2005 | EP1536282A2 Methods and systems for estimating reticle bias states |
| 06/01/2005 | EP1536244A1 Dynamically configurable scan chain testing |
| 06/01/2005 | EP1536243A1 Monitoring system for communication and remote signaling lines |
| 06/01/2005 | EP1535819A1 Device for secure measurements and detection of an electric current for a safety device |
| 06/01/2005 | EP1535414A2 Wireless local on metropolitan area network with intrusion detection features and related methods |
| 06/01/2005 | EP1535155A2 Methods and apparatus for test process enhancement |
| 06/01/2005 | EP1535131A2 System and method for self-testing and repair of memory modules |
| 06/01/2005 | EP1535081A1 Fault location using measurements of current and voltage from one end of a line |
| 06/01/2005 | EP1535080A1 Press assembly for electronic board testing |
| 06/01/2005 | EP1344073B1 Calibrating single ended channels for obtaining differential performance level |
| 06/01/2005 | EP1340327B1 Component measures |
| 06/01/2005 | EP1173775B1 Telemetry system and method for emi susceptibility testing of motor vehicles |
| 06/01/2005 | EP1129521B1 Fir filter structure with low latency for gigabit ethernet applications |
| 06/01/2005 | CN1623180A Luminance compensation method and apparatus for emissive displays |
| 06/01/2005 | CN1623099A Cooling assembly with direct cooling of active electronic components |
| 06/01/2005 | CN1623098A Multiple-capture dft system for detecting or locating crossing clock-domain faults during self-test or scan test |
| 06/01/2005 | CN1623097A Scatterometry structure with embedded ring oscillator, and methods of using same |
| 06/01/2005 | CN1623096A Electronic unit testing set |
| 06/01/2005 | CN1622387A Method and system for cell protection |
| 06/01/2005 | CN1621976A Electronic watch |
| 06/01/2005 | CN1621897A Electrooptical device regulating method, electrooptical device regulating apparatus and electronic apparatus, |
| 06/01/2005 | CN1621856A Electricity method for measuring thermal resistance front opacification for node type semiconductor luminous tube or laser device |
| 06/01/2005 | CN1621855A Transformer overload automatic test method |
| 06/01/2005 | CN1621854A Antenna testing method |
| 06/01/2005 | CN1621850A Method for designing optical fiber type current transformer |
| 06/01/2005 | CN1621849A Contact type thin film probe |
| 06/01/2005 | CN1621848A Contact type thin film probe |
| 06/01/2005 | CN1204615C Electronic device measuring device and method |
| 06/01/2005 | CN1204613C Adaptive probe device |
| 06/01/2005 | CN1204612C Contact switch for semiconductor device detection and its producing method |
| 06/01/2005 | CN1204574C Transformer for gas insulated electrical appts. |
| 06/01/2005 | CN1204562C Semiconductor storage device for shortening test time |
| 06/01/2005 | CN1204410C Ultrasonic reflection detecting device and method for diagnosis of insulation state of stator for large electric generator |
| 06/01/2005 | CN1204409C Induction motor overload detector and overload detecting method |
| 06/01/2005 | CN1204408C An integrated circuit employing controllable and testable oscillator apparatus |
| 06/01/2005 | CN1204407C Method and device for monitoring an electrode line of a bipolar high voltage direct current (HVDC) transmission system |
| 05/31/2005 | US6901564 System and method for product yield prediction |
| 05/31/2005 | US6901562 Adaptable circuit blocks for use in multi-block chip design |
| 05/31/2005 | US6901546 Enhanced debug scheme for LBIST |
| 05/31/2005 | US6901544 Scan chain testing of integrated circuits with hard-cores |
| 05/31/2005 | US6901543 Utilizing slow ASIC logic BIST to preserve timing integrity across timing domains |
| 05/31/2005 | US6901350 Method and device for monitoring the functioning of a system |
| 05/31/2005 | US6901344 Apparatus and method for verification of system interconnect upon hot-plugging of electronic field replaceable units |
| 05/31/2005 | US6901342 Test wafer usage forecast modeling method |
| 05/31/2005 | US6901339 Eye diagram analyzer correctly samples low dv/dt voltages |
| 05/31/2005 | US6901303 Method and apparatus for controlling fans and power supplies to provide accelerated run-in testing |
| 05/31/2005 | US6901293 System and method for monitoring power source longevity of an implantable medical device |
| 05/31/2005 | US6901014 Circuits and methods for screening for defective memory cells in semiconductor memory devices |
| 05/31/2005 | US6900743 Mode selector apparatus |
| 05/31/2005 | US6900710 Ultrafast sampler with non-parallel shockline |
| 05/31/2005 | US6900691 Semiconductor integrated circuit |
| 05/31/2005 | US6900657 Stall detection circuit and method |
| 05/31/2005 | US6900656 Method of testing an integrated circuit and an integrated circuit test apparatus |
| 05/31/2005 | US6900655 Determination of whether integrated circuit is acceptable or not in wafer-level burn-in test |
| 05/31/2005 | US6900654 Method and apparatus for evaluating a known good die using both wire bond and flip-chip interconnects |
| 05/31/2005 | US6900650 System and method for controlling temperature during burn-in |
| 05/31/2005 | US6900649 High frequency RF interconnect for semiconductor automatic test equipment |
| 05/31/2005 | US6900648 Tester for printed circuit boards |
| 05/31/2005 | US6900646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof |
| 05/31/2005 | US6900645 Semiconductor device test method and semiconductor device tester |
| 05/31/2005 | US6900643 Ride through in electronic power converters |
| 05/31/2005 | US6900642 Aircraft electrostatic discharge test system |
| 05/31/2005 | US6900641 Switch testing apparatus |
| 05/31/2005 | US6900629 Group wiring device for facilitating wire pair identification |
| 05/31/2005 | US6900628 Semiconductor integrated circuit allowing proper detection of pin contact failure |
| 05/31/2005 | US6900627 Apparatus and method for testing semiconductor integrated circuit |
| 05/31/2005 | US6900459 Apparatus for automatically positioning electronic dice within component packages |
| 05/31/2005 | US6900065 Apparatus and method for enhanced voltage contrast analysis |
| 05/26/2005 | WO2005048548A2 Digital data receiver for edge cellular standard |
| 05/26/2005 | WO2005048314A2 Tapered dielectric and conductor structures and applications thereof |
| 05/26/2005 | WO2005048311A2 Bump-on-lead flip chip interconnection |
| 05/26/2005 | WO2005048270A1 Integrated circuit, test system and method for reading out error data from said integrated circuit |
| 05/26/2005 | WO2005048062A2 Method and apparatus for co-verification of digital designs |
| 05/26/2005 | WO2005047913A1 System for testing one or more groups of ic-chips while concurrently loading/unloading another group |
| 05/26/2005 | WO2005047912A1 System for testing a group of ic-chips having a chip holding subassembly that is built-in and loaded/unloaded automatically |
| 05/26/2005 | WO2005047911A1 Hot switchable voltage bus for iddq current measurements |
| 05/26/2005 | WO2005047910A1 Method and device for measuring radio interference levels with frequency tracking |
| 05/26/2005 | WO2005035090A3 An etching method in fabrications of microstructures |
| 05/26/2005 | WO2005029104A8 Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit |
| 05/26/2005 | WO2005008850A3 Spatial and temporal selective laser assisted fault localization |
| 05/26/2005 | WO2004112167A3 Fuel cell device condition detection |
| 05/26/2005 | WO2003093845A3 Semiconductor test system having multitasking algorithmic pattern generator |
| 05/26/2005 | US20050114807 Cross talk analysis methodology and solution |
| 05/26/2005 | US20050114747 Method for optimizing a set of scan diagnostic patterns |
| 05/26/2005 | US20050114746 Method and apparatus for circuit board inspection capable of monitoring inspection signals by using a signal monitor incorporated in the apparatus |
| 05/26/2005 | US20050114745 Substrate inspection apparatus, substrate inspection method, method of manufacturing semiconductor device and recording medium |
| 05/26/2005 | US20050114742 System debugging device and system debugging method |
| 05/26/2005 | US20050114733 Concurrent I/O |
| 05/26/2005 | US20050114550 Synchronization of modules for analog and mixed signal testing in an open architecture test system |