| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/08/2005 | EP1537428A2 Method and device for detecting sparking and spark erosion in electric machines |
| 06/08/2005 | EP1537427A1 Device and method for monitoring and/or analyzing electric machines in operation |
| 06/08/2005 | EP1537426A2 Integrated circuit with embedded identification code |
| 06/08/2005 | EP1537425A1 Method and apparatus for detecting wear in components of high voltage electrical equipment |
| 06/08/2005 | EP1537390A2 Method and device for detecting oscillations of the shafting of an electric machine |
| 06/08/2005 | EP1459081B1 Compact ate with timestamp system |
| 06/08/2005 | EP1442308B1 Impedance stabilization network for determining the electromagnetic interfering radiation of a modem |
| 06/08/2005 | EP1379978A4 Extraction method of defect density and size distributions |
| 06/08/2005 | EP1377841B1 Low-jitter clock for test system |
| 06/08/2005 | EP1260822B1 Automatic test equipment for semiconductor device |
| 06/08/2005 | EP1125330A4 Method of creating an electrical interconnect device bearing an array of electrical contact pads |
| 06/08/2005 | EP0852730B1 Parallel processing integrated circuit tester |
| 06/08/2005 | CN2704049Y Power armour clamp contact superheat alarming device |
| 06/08/2005 | CN2704048Y Measuring interface with earthing method |
| 06/08/2005 | CN1625707A Multi-beam polygon scanning system |
| 06/08/2005 | CN1625695A 电子部件试验装置 Electronic component testing device |
| 06/08/2005 | CN1625694A 电子部件试验装置 Electronic component testing device |
| 06/08/2005 | CN1625693A Integrated circuit transfer device |
| 06/08/2005 | CN1625176A Realization method of edge to edge pseudo-line simulation protocol |
| 06/08/2005 | CN1625155A Inter connected network protocol packet error processing equipment and its method and computer readable medium |
| 06/08/2005 | CN1625093A Method and device for discarding error logical transfer unit |
| 06/08/2005 | CN1624971A Method for providing detecting and displaying of real charging value of charging battery |
| 06/08/2005 | CN1624490A Water logging diagnosis method of hydrogenl oxygen proton exchange film fuel battery pile |
| 06/08/2005 | CN1624489A Semiconductor device and the method of testing the same |
| 06/08/2005 | CN1624488A Discharging automatic testing method of electric equipment |
| 06/08/2005 | CN1624487A Method and device capable of testing remote controller function of electric appliances |
| 06/08/2005 | CN1624486A 电压检测电路 Voltage detection circuit |
| 06/08/2005 | CN1624459A Defect detection device for FPD substrate |
| 06/08/2005 | CN1205850C Load control type exciter |
| 06/08/2005 | CN1205719C Charge/discharge control circuit and rechargeable power supply equipment |
| 06/08/2005 | CN1205482C Partial discharge monitoring system for transformers |
| 06/08/2005 | CN1205481C Voltage measuring device |
| 06/07/2005 | US6904578 System and method for verifying a plurality of states associated with a target circuit |
| 06/07/2005 | US6904577 Hardware debugging in a hardware description language |
| 06/07/2005 | US6904576 Method and system for debugging using replicated logic |
| 06/07/2005 | US6904554 Logic built-in self test (BIST) |
| 06/07/2005 | US6904553 Deterministic testing of edge-triggered logic |
| 06/07/2005 | US6904552 Circuit and method for test and repair |
| 06/07/2005 | US6904462 Method and system for allocating protection path resources |
| 06/07/2005 | US6904397 System and method for assisting in the development and integration of reusable circuit designs |
| 06/07/2005 | US6904381 Testing of a frequency converter device |
| 06/07/2005 | US6904380 Simulator cart |
| 06/07/2005 | US6904375 Method and circuits for testing high speed devices using low speed ATE testers |
| 06/07/2005 | US6904269 Signal type identification |
| 06/07/2005 | US6904015 Congestion avoidance profiles in a packet switching system |
| 06/07/2005 | US6903986 Method and apparatus for improving the reliability of the reading of integrated circuit fuses |
| 06/07/2005 | US6903976 Semiconductor memory device reduced in power consumption during burn-in test |
| 06/07/2005 | US6903908 Magnetoresistive effect sensor with barrier layer smoothed by composition of lower shield layer |
| 06/07/2005 | US6903582 Integrated circuit timing debug apparatus and method |
| 06/07/2005 | US6903568 Circuit for reducing leakage current in a processor |
| 06/07/2005 | US6903567 Test apparatus having multiple test sites at one handler and its test method |
| 06/07/2005 | US6903566 Semiconductor device tester |
| 06/07/2005 | US6903565 Apparatus and method for the parallel and independent testing of voltage-supplied semiconductor devices |
| 06/07/2005 | US6903564 Device aging determination circuit |
| 06/07/2005 | US6903556 Method and apparatus for testing laminated cores of electrical machines |
| 06/07/2005 | US6903554 Control of relay opening events |
| 06/07/2005 | US6903543 Disc drive slider test socket |
| 06/07/2005 | US6903366 Chemically synthesized and assembled electronic devices |
| 06/07/2005 | US6902941 Probing of device elements |
| 06/07/2005 | US6902445 Socket for electrical parts |
| 06/07/2005 | US6902317 Method and device for measuring thermoelectric characteristics of combinatorial specimen |
| 06/03/2005 | CA2451951A1 Apparatus for mounting columns for grid array electronic packages |
| 06/02/2005 | WO2005051055A2 Independently adjustable circuit board carrier |
| 06/02/2005 | WO2005050904A1 Clock recovery circuit and communication device |
| 06/02/2005 | WO2005050898A2 Method and apparatuses for using packet data to manage a data stream in a broadband communications system |
| 06/02/2005 | WO2005050844A1 Variable delay circuit |
| 06/02/2005 | WO2005050810A1 Method for calculating power capability of battery packs using advanced cell model predictive techniques |
| 06/02/2005 | WO2005050706A2 Die design with integrated assembly aid |
| 06/02/2005 | WO2005050234A1 Saturation polarization estimation method and device, and discharge-enabled capacitance estimation method |
| 06/02/2005 | WO2005050233A1 Process and device for testing a serializer circuit arrangement and process and device for testing a deserializer circuit arrangement |
| 06/02/2005 | WO2005050232A1 Scan chain registers that utilize feedback paths within latch units to support toggling of latch unit outputs during enhanced delay fault testing |
| 06/02/2005 | WO2005050231A1 Timing comparator, data sampling device, and test device |
| 06/02/2005 | WO2005050229A1 Method for determining ohmic insulation resistance |
| 06/02/2005 | WO2005049366A1 Abnormality monitoring apparatus in load drive circuit |
| 06/02/2005 | WO2005026959A3 Circuit arrangement for monitoring a processor |
| 06/02/2005 | WO2004102594A3 Method and testing equipment for checking the operation of a lightning arrester |
| 06/02/2005 | WO2004099793A3 Device probing using a matching device |
| 06/02/2005 | WO2004095240A3 A method and apparatus for detecting on-die voltage variations |
| 06/02/2005 | US20050119872 Module-testing device |
| 06/02/2005 | US20050119856 State detecting system and device employing the same |
| 06/02/2005 | US20050119852 Semiconductor test data analysis system |
| 06/02/2005 | US20050119843 Semiconductor production system |
| 06/02/2005 | US20050119823 Limp home control method under disconnected state of battery power line |
| 06/02/2005 | US20050119778 Coding method with dynamic positioning |
| 06/02/2005 | US20050118970 Method of measuring and calibrating frequency down converter |
| 06/02/2005 | US20050118736 Method for measuring withstand voltage of semiconductor epitaxial wafer and semiconductor epitaxial wafer |
| 06/02/2005 | US20050118497 Method and assembly for evaluating the state of charge of batteries |
| 06/02/2005 | US20050117597 Clusters of devices, softwares and methods for improved handling of a gatekeeper load in VoIP communication |
| 06/02/2005 | US20050117422 Semiconductor integrated circuit including semiconductor memory |
| 06/02/2005 | US20050117420 Memory test circuit and test system |
| 06/02/2005 | US20050117050 Battery, camera and camera system |
| 06/02/2005 | US20050116773 Amplifier system with current-mode servo feedback |
| 06/02/2005 | US20050116759 Programmable jitter signal generator |
| 06/02/2005 | US20050116734 Dynamic overdrive compensation test system and method |
| 06/02/2005 | US20050116733 Apparatus and method for detecting and rejecting high impedance failures in chip interconnects |
| 06/02/2005 | US20050116732 Device for measurement and analysis of electrical signals of an integrated circuit component |
| 06/02/2005 | US20050116731 Testing circuits on substrate |
| 06/02/2005 | US20050116730 Double-faced detecting devices for an electronic substrate |
| 06/02/2005 | US20050116729 Method and device for testing or calibrating a pressure sensor on a wafer |
| 06/02/2005 | US20050116728 Tester device, inspection device, and interconnection board receiving unit for the tester device and inspection device |