| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/14/2005 | US6907379 System and method for processing tester information and visualization for parameter with multiple distributions in integrated circuit technology development |
| 06/14/2005 | US6907378 Empirical data based test optimization method |
| 06/14/2005 | US6907376 Systems and methods for facilitating testing of pad receivers of integrated circuits |
| 06/14/2005 | US6907011 Quiescent reconfiguration of a routing network |
| 06/14/2005 | US6906997 Protection method and system for equipment in a network element |
| 06/14/2005 | US6906903 Protection relay |
| 06/14/2005 | US6906801 Measuring a property of a layer in multilayered structure |
| 06/14/2005 | US6906596 Oscillation circuit and a communication semiconductor integrated circuit |
| 06/14/2005 | US6906548 Capacitance measurement method of micro structures of integrated circuits |
| 06/14/2005 | US6906547 Conductive material for integrated circuit fabrication |
| 06/14/2005 | US6906546 Semiconductor device inspection apparatus and inspection method |
| 06/14/2005 | US6906545 Voltage measurement device tolerant of undershooting or overshooting input voltage of pad |
| 06/14/2005 | US6906544 Methods and apparatus for testing a circuit board using a surface mountable adaptor |
| 06/14/2005 | US6906542 Probing method and prober |
| 06/14/2005 | US6906540 Method for chemically etching photo-defined micro electrical contacts |
| 06/14/2005 | US6906539 High density, area array probe card apparatus |
| 06/14/2005 | US6906538 Alternating pulse dual-beam apparatus, methods and systems for voltage contrast behavior assessment of microcircuits |
| 06/14/2005 | US6906536 Time division multiplexed, piloted current monitoring in a switched mode DC—DC voltage converter and phase current measurement calibration for a multiphase converter |
| 06/14/2005 | US6906526 Non-intrusive cable connection monitoring for use in HFC networks |
| 06/14/2005 | US6906525 Ground detection apparatus for electric vehicle |
| 06/14/2005 | US6906523 Method and apparatus for testing cells and batteries embedded in series/parallel systems |
| 06/14/2005 | US6906522 Battery tester with battery replacement output |
| 06/14/2005 | US6906514 Concept for compensating the influences of external disturbing quantities on physical functional parameters of integrated circuits |
| 06/14/2005 | US6906508 Component testing system vacuum ring and test plate construction |
| 06/14/2005 | US6906506 Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe |
| 06/14/2005 | US6906498 Device and method for the detection of a charging voltage |
| 06/14/2005 | US6906492 Motor abnormality detection apparatus and electric power steering control system |
| 06/14/2005 | US6906341 Probe needle test apparatus and method |
| 06/14/2005 | US6905897 Wafer acceptance testing method and structure of a test key used in the method |
| 06/14/2005 | US6905891 Method for processing multiple semiconductor devices for test |
| 06/14/2005 | US6905890 Poly gate silicide inspection by back end etching and by enhanced gas etching |
| 06/09/2005 | WO2005053160A1 Oscillator, frequency multiplier, and testing apparatus |
| 06/09/2005 | WO2005053158A1 High frequency delay circuit, and testing device |
| 06/09/2005 | WO2005053114A1 Socket for electric component |
| 06/09/2005 | WO2005052958A1 Jig for installation inspection |
| 06/09/2005 | WO2005052617A1 Diagnosis unit for a current supply and current supply provided with said diagnosis unit |
| 06/09/2005 | WO2005052616A1 Method for monitoring contact consumption in multiple contact switches |
| 06/09/2005 | WO2005052615A1 Pseudo random verification of a device under test in the presence of byzantine faults |
| 06/09/2005 | WO2005052614A1 Testing apparatus |
| 06/09/2005 | WO2005052613A1 Synchronization of modules for analog and mixed signal testing |
| 06/09/2005 | WO2005052612A2 Input and output circuit for an integrated switching circuit, method for testing an integrated switching circuit and an integrated switching circuit provided with said input and output circuit |
| 06/09/2005 | WO2005052611A1 Identifying process and temperature of silicon chips |
| 06/09/2005 | WO2005052610A1 Switch device |
| 06/09/2005 | WO2005052609A1 Inspection signal supply device and inspection signal application method |
| 06/09/2005 | WO2005052607A1 Monitoring method and system |
| 06/09/2005 | WO2005052603A1 Apparatus for testing a device with a high frequency signal |
| 06/09/2005 | WO2005024589A3 Cable modem termination system having a gateway for transporting out-of-band messaging signals |
| 06/09/2005 | WO2005019848A3 Self-heating burn-in |
| 06/09/2005 | WO2005004208A3 Wafer inspection device |
| 06/09/2005 | WO2004081587A3 Apparatus and method for testing electronic systems |
| 06/09/2005 | WO2004073027A3 Microprocessor based self-diagnostic port |
| 06/09/2005 | US20050125755 Method of generating an efficient stuck-at fault and transition delay fault truncated scan test pattern for an integrated circuit design |
| 06/09/2005 | US20050125754 Hardware debugging in a hardware description language |
| 06/09/2005 | US20050125753 Methods and apparatus for transforming sequential logic designs into equivalent combinational logic |
| 06/09/2005 | US20050125712 Manifold-Distributed Air Flow Over Removable Test Boards in a Memory-Module Burn-In System With Heat Chamber Isolated by Backplane |
| 06/09/2005 | US20050125711 Method and system for defect evaluation using quiescent power plane current (IDDQ) voltage linearity |
| 06/09/2005 | US20050125512 Network-based system for configuring a system using configuration information generated based on a user specification |
| 06/09/2005 | US20050125186 Biometric quality control process |
| 06/09/2005 | US20050125185 Multiple level transistor abstraction for dynamic circuits |
| 06/09/2005 | US20050125175 Method, system and apparatus for quantifying the contribution of inter-symbol interference jitter on timing skew budget |
| 06/09/2005 | US20050125172 Method and apparatus for use with a portable power source |
| 06/09/2005 | US20050124083 Method for manufacturing semiconductor device |
| 06/09/2005 | US20050124082 Method for manufacturing semiconductor device |
| 06/09/2005 | US20050124081 Manufacturing method for a semiconductor device |
| 06/09/2005 | US20050124079 Modeling process for integrated circuit film resistors |
| 06/09/2005 | US20050122976 Method and apparatuses for using packet data to manage a data stream in a broadband communications system |
| 06/09/2005 | US20050122897 Supporting SDH/SONET APS bridge selector functionality for ethernet |
| 06/09/2005 | US20050122758 Field programmable gate array incorporating dedicated memory stacks |
| 06/09/2005 | US20050122748 Semiconductor device and method of manufacturing thereof |
| 06/09/2005 | US20050122568 Three-dimensional photonic crystal and process for production thereof as well as probe used therefor |
| 06/09/2005 | US20050122525 Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity |
| 06/09/2005 | US20050122515 Differential evalution of adjacent regions for change in reflectivity |
| 06/09/2005 | US20050122300 Semiconductor device and testing method thereof |
| 06/09/2005 | US20050122297 Semiconductor device and the method of testing the same |
| 06/09/2005 | US20050122227 Brush abrasion detector of vehicle generator |
| 06/09/2005 | US20050122144 Timing vernier using a delay locked loop |
| 06/09/2005 | US20050122142 Circuit for controlling internal supply voltage driver |
| 06/09/2005 | US20050122136 Methods and arrangements for an enhanced scanable latch circuit |
| 06/09/2005 | US20050122127 Method and apparatus for testing of integrated circuit package |
| 06/09/2005 | US20050122126 Apparatus for mounting columns for grid array electronic packages |
| 06/09/2005 | US20050122125 Guarded tub enclosure |
| 06/09/2005 | US20050122124 Semiconductor manufacturing device and semiconductor manufacturing method |
| 06/09/2005 | US20050122120 Method and apparatus for characterizing shared contacts in high-density SRAM cell design |
| 06/09/2005 | US20050122118 Electric field sensor |
| 06/09/2005 | US20050122077 Cost-effective measurement of large machine currents |
| 06/09/2005 | DE60103635T2 Vorrichtung und verfahren zur verbesserung der prüfung, des ertrags und der leistung von vlsi schaltungen Apparatus and methods for improvement of the audit, the yield and performance of VLSI circuits, the |
| 06/09/2005 | DE4446988B4 Schneller Testmustergenerator One quick test pattern generator |
| 06/09/2005 | DE19616809B4 Prüfmanipulator mit Drehtisch Test manipulator with rotary table |
| 06/09/2005 | DE10359532B3 Wideband noise source detection method for DC distribution network e.g. for arcing detection in automobile onboard network, using frequency filtering and analysis of network signal |
| 06/09/2005 | DE10355296B3 Testing device for wafer testing of digital semiconductor circuits with signal amplifiers inserted in test signal channels for eliminating signal attentuation and noise |
| 06/09/2005 | DE10355086A1 Verfahren zum Bestimmen des ohmschen Isolationswiderstandes eines geerdeten Wechselstromnetzes A method for determining the ohmic insulation resistance of an earthed alternating current network |
| 06/09/2005 | DE10352282A1 Prüfgerät zum Prüfen der Funktionsfähigkeit einer elektrischen Komponente Tester for testing the functionality of an electrical component |
| 06/09/2005 | DE10349933A1 Auswerteschaltung und Verfahren zum Feststellen und/oder zum Lokalisieren fehlerhafter Datenworte in einem Datenstrom Evaluation circuit and method for detecting and / or locating faulty data words in a data stream |
| 06/09/2005 | DE10349462A1 Installationsgerät mit überprüftem Potentiometer und entsprechendes Überprüfungsverfahren Installation device with checked potentiometer and appropriate review procedures |
| 06/09/2005 | DE102004041901A1 Spannungsdetektor einer Batterieanordnung Voltage detecting a battery assembly |
| 06/09/2005 | CA2545827A1 Method for monitoring contact consumption in multiple contact switches |
| 06/08/2005 | EP1538724A2 Charging control device with memory for cycle count |
| 06/08/2005 | EP1538588A2 Self-light-emitting display module and method for verifying defect state of the same |
| 06/08/2005 | EP1538453A1 Apparatus and method for fault diagnosis on digital outputs of a control element |
| 06/08/2005 | EP1538452A1 Placing table drive device and probe method |