| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/21/2005 | US6909261 Method for predicting the loading capability of an electrochemical element |
| 06/21/2005 | US6909172 Semiconductor device with conduction test terminals |
| 06/21/2005 | US6909056 Compliant electrical contact assembly |
| 06/16/2005 | WO2005055548A1 A method for realizing the pseudo wire emulation edge-to-edge protocol |
| 06/16/2005 | WO2005055487A2 Network message processing using inverse pattern matching |
| 06/16/2005 | WO2005055361A1 Antenna coupler |
| 06/16/2005 | WO2005055094A2 System and method for architecture verification |
| 06/16/2005 | WO2005054884A1 Integrated circuit with leakage control and method for leakage control |
| 06/16/2005 | WO2005054883A1 Control device inspection device, pattern signal generation device, and inspection program creation device |
| 06/16/2005 | WO2005054882A1 Failsafe for differential circuit based on current sense scheme |
| 06/16/2005 | WO2005054879A1 Battery cell voltage and impedance measuring circuit |
| 06/16/2005 | WO2005054878A1 A ground-signal-ground (gsg) test structure |
| 06/16/2005 | WO2005006394A3 Circuit for testing and fine tuning integrated circuit (switch control circuit) |
| 06/16/2005 | WO2004046652A3 Device and method for detecting anomolies in a wire and related sensing methods |
| 06/16/2005 | US20050132254 Test circuit inserting method and apparatus for a semiconductor integrated circuit |
| 06/16/2005 | US20050131665 Method for automatically searching for functional defects in a description of a circuit |
| 06/16/2005 | US20050131624 Method for monitoring at least two electromagnetic valves of an internal combustion engine, especially an internal combustion engine of a motor vehicle in particular |
| 06/16/2005 | US20050130617 Variable-gain low noise amplifier for digital terrestrial applications |
| 06/16/2005 | US20050130380 Semiconductor device structures including metal silicide interconnects and dielectric layers at substantially the same fabrication level |
| 06/16/2005 | US20050130332 Method for manufacturing semiconductor device |
| 06/16/2005 | US20050129301 Electronic part inspection device |
| 06/16/2005 | US20050129227 Method for testing subscriber connection lines for broadband services |
| 06/16/2005 | US20050129104 Testing apparatus and testing method |
| 06/16/2005 | US20050129059 Method of implementing PSEUDO wire emulation edge-to-edge protocol |
| 06/16/2005 | US20050128832 Method of determining localized electron tunneling in a capacitive structure |
| 06/16/2005 | US20050128655 Pulsed current generator circuit with charge booster |
| 06/16/2005 | US20050128471 Optical coupling for testing integrated circuits |
| 06/16/2005 | US20050128020 Ultrafast sampler with non-parallel shockline |
| 06/16/2005 | US20050127936 Test pad array for contact resistance measuring of ACF bonds on a liquid crystal display panel |
| 06/16/2005 | US20050127935 Semiconductor device tester |
| 06/16/2005 | US20050127934 Electrical inspection method and method of fabricating semiconductor display devices |
| 06/16/2005 | US20050127933 Method and apparatus for non-invasively testing intergrated circuits |
| 06/16/2005 | US20050127932 Integrated circuit burn-in test system and associated methods |
| 06/16/2005 | US20050127931 Variable temperature test cell and associated method |
| 06/16/2005 | US20050127930 Die level testing using machine grooved storage tray with vacuum channels |
| 06/16/2005 | US20050127928 Semiconductor interconnect having semiconductor spring contacts |
| 06/16/2005 | US20050127927 Indexing rotatable chuck for a probe station |
| 06/16/2005 | US20050127926 Method using conductive atomic force microscopy to measure contact leakage current |
| 06/16/2005 | US20050127922 High level arc fault detector |
| 06/16/2005 | US20050127921 Voltage detecting circuit |
| 06/16/2005 | US20050127918 Activity-based battery monitor with a universal current measuring apparatus |
| 06/16/2005 | US20050127898 Stage driving apparatus and probe method |
| 06/16/2005 | US20050127897 Rear-mounted gimbal for supporting test head |
| 06/16/2005 | US20050127896 Component testing system vacuum ring and test plate construction |
| 06/16/2005 | US20050127894 Method and apparatus for measuring jitter |
| 06/16/2005 | US20050127892 Apparatus and method for inspecting interface between ground layer and substrate of microstrip by using scattering parameters |
| 06/16/2005 | US20050127891 Apparatus with storage for measuring stray currents from subway rails and power lines |
| 06/16/2005 | US20050127877 Battery pack and remaining battery power calculation method |
| 06/16/2005 | US20050127876 Method of measuring and display the actual quantity of electricity of rechargeable battery |
| 06/16/2005 | US20050127871 Battery pack |
| 06/16/2005 | US20050127509 Semiconductor device and method for fabricating the same |
| 06/16/2005 | US20050127423 Wafer acceptance testing method and structure of a test key used in the method |
| 06/16/2005 | US20050126590 Cleaning sheet for a probe |
| 06/16/2005 | US20050125994 Socket and/or adapter device, and an apparatus and process for loading a socket and/or adapter device with a corresponding semi-conductor component |
| 06/16/2005 | DE202005005238U1 Electric cable system for charging motor vehicle batteries and/or for use as battery jumper leads has two cables each with contact terminals on their free ends |
| 06/16/2005 | DE202005000926U1 Direct current (DC) voltage device for DC current recognition (CR) and protection has an automatic DC CR device with a protective circuit for avoiding excess currents and voltages |
| 06/16/2005 | DE19713986B4 Halbleiterbauelement-Testgerät The semiconductor device testing apparatus |
| 06/16/2005 | DE10392393T5 Halbleiterprüfvorrichtung und Zeitmessverfahren hierfür Semiconductor testing and chronometric method therefor |
| 06/16/2005 | DE10330903B4 Verfahren zur Lautsprechererkennung und ein Audiosystem hierzu A method for speaker recognition and an audio system for this purpose |
| 06/16/2005 | DE10246383B4 Verfahren und Einrichtung zum Berechnen des Ladewirkungsgrads und der elektrischen Ladungsmenge einer Batterie Method and apparatus for calculating the charging efficiency and the amount of electric charge of a battery |
| 06/16/2005 | DE102004051832A1 Notbetrieb-Steuerverfahren in einem Getrennt-Zustand einer Batterie-Starkstromleitung Emergency mode control method in a Separated state of a battery-power line |
| 06/16/2005 | DE102004032466A1 Mehrfachabtastleseschaltung mit Testbetriebsmodus Mehrfachabtastleseschaltung with test mode |
| 06/16/2005 | DE102004023084B3 Supply voltage monitoring method e.g. for motor vehicle control appliances, involves comparing actual voltage with given lower voltage threshold |
| 06/16/2005 | DE10136443B4 Zeitlagekalibrierverfahren und Halbleiterbauelementtestgerät mit Zeitlagekalibrierfunktion Zeitlagekalibrierverfahren and semiconductor device tester with Zeitlagekalibrierfunktion |
| 06/16/2005 | DE10110642B4 Lithium-ion cell capacity estimation for electronic devices, involves estimating capacity of cell based on elapsed time from time when charge voltage reaches specified value to time when charge condition is changed |
| 06/15/2005 | EP1542306A1 Method for testing precursor of secondary cell, its testing instrument, and method for manufacturing secondary cell using the method |
| 06/15/2005 | EP1542029A2 Surface mounting electronic module and method of testing the same |
| 06/15/2005 | EP1542028A1 Performance board and test system |
| 06/15/2005 | EP1542027A1 Device for measuring of ambiant radiation |
| 06/15/2005 | EP1542023A2 Finger tester |
| 06/15/2005 | EP1542006A1 Impurity measuring method for GE substrates |
| 06/15/2005 | EP1540844A2 Methods for transmitting a waveform having a controllable attenuation and propagation velocity |
| 06/15/2005 | EP1540828A1 Coding of information in integrated circuits |
| 06/15/2005 | EP1540722A2 Photonic devices and pics including sacrificial testing structures and method of making the same |
| 06/15/2005 | EP1540659A1 A method and a unit for programming a memory |
| 06/15/2005 | EP1540360A1 A system for burn-in testing of electronic devices |
| 06/15/2005 | EP1540359A1 Method and test adapter for testing an appliance having a smart card reader |
| 06/15/2005 | EP1540356A1 Interface comprising a thin pcb with protrusions for testing an integrated circuit |
| 06/15/2005 | EP1538981A2 Cardiac diagnostics using wall motion and perfusion cardiac mri imaging and systems for cardiac diagnostics |
| 06/15/2005 | EP1167987B1 Battery capacity calculating method and device therefor |
| 06/15/2005 | CN1628404A Method and apparatus for controlling energy transfer between an energy bus and a battery system based upon battery operating condition |
| 06/15/2005 | CN1628253A Method and apparatus for testing assisted position location capable devices |
| 06/15/2005 | CN1627516A Test module and test method in use for electrical erasable memory built in chip |
| 06/15/2005 | CN1627092A Monitor for small type wind driven generator |
| 06/15/2005 | CN1627091A Semiconductor integrated circuit verification method and test pattern preparation method |
| 06/15/2005 | CN1627090A A circuit structure capable of automatic adjusting and measuring hysteresis window of hysteresis comparator |
| 06/15/2005 | CN1627089A Method for testing resistance value of high-pressure distributor under vacuum state |
| 06/15/2005 | CN1627088A Mechanism for testing circuit boards |
| 06/15/2005 | CN1627084A Probe in use for detection |
| 06/15/2005 | CN1206777C Electronic connection testing device for wiring terminal joint and method for same |
| 06/15/2005 | CN1206764C Method and device for judging service life of secondary cell |
| 06/15/2005 | CN1206733C Semiconductor integrated circuit |
| 06/15/2005 | CN1206719C Contactor, method of producing the same, and method of testing using the same |
| 06/15/2005 | CN1206659C Method of testing memory |
| 06/15/2005 | CN1206540C Current and voltage equalizing test method for SCR set and its device |
| 06/14/2005 | US6907585 Semiconductor integrated circuit and its design methodology |
| 06/14/2005 | US6907557 System and method for testing a group of related products |
| 06/14/2005 | US6907556 Scanable R-S glitch latch for dynamic circuits |
| 06/14/2005 | US6907555 Self-test circuit and memory device incorporating it |
| 06/14/2005 | US6907394 Device for simulating circuits, method for simulating the same, and recording medium |