Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2005
06/23/2005US20050137824 Electronic device environmental effect prediction
06/23/2005US20050136563 Backside failure analysis of integrated circuits
06/23/2005US20050135525 DDS circuit with arbitrary frequency control clock
06/23/2005US20050135524 High resolution synthesizer with improved signal purity
06/23/2005US20050135466 Method for accurate estimation of noise for data modems
06/23/2005US20050135238 Method and system for providing a failover circuit for rerouting logical circuit data in a data network
06/23/2005US20050135237 Method and system for automatically rerouting logical circuit data in a data network
06/23/2005US20050135232 Transmission apparatus having a function of changing path setting
06/23/2005US20050135028 Gas insulating apparatus and method for locating fault point thereof
06/23/2005US20050134865 Method for determining a map, device manufacturing method, and lithographic apparatus
06/23/2005US20050134857 Method to monitor silicide formation on product wafers
06/23/2005US20050134837 Detection of partial discharge or arcing in wiring via fiber optics
06/23/2005US20050134394 On-chip transistor degradation monitoring
06/23/2005US20050134370 Method of self-calibration of pulse rise and fall times
06/23/2005US20050134302 Dynamic gamma for a liquid crystal display
06/23/2005US20050134301 Simultaneous pin short and continuity test on IC packages
06/23/2005US20050134300 Semiconductor integrated circuit and method for testing a semiconductor integrated circuit
06/23/2005US20050134299 System and apparatus for testing packaged devices and related methods
06/23/2005US20050134291 Apparatus and method for measuring EMI level of electronic device
06/23/2005US20050134290 Current transformers for partial discharge detection on aircraft cables and wires
06/23/2005US20050134288 Device and method for monitoring the connection of an electrical supply unit
06/23/2005US20050134287 Test apparatus
06/23/2005US20050134285 Arc fault detector
06/23/2005US20050134284 Control system health test system and method
06/23/2005US20050134283 Method for determining the internal impedance of a battery cell in a string of serially connected battery cells
06/23/2005US20050134282 [method and apparatus for battery testing and measuring]
06/23/2005US20050134256 System for processing electronic devices
06/23/2005US20050134255 Coaxial cable unit, test apparatus, and CPU system
06/23/2005US20050134248 Methods and systems for load bank control and operation
06/23/2005US20050134230 Battery pack, battery protection processsing apparatus, and control method of the battery protection processing apparatus
06/23/2005US20050134224 Charger capable of displaying quantity of charge of rechargeable battery
06/23/2005US20050134221 Charge control device
06/23/2005US20050133922 Tapered dielectric and conductor structures and applications thereof
06/23/2005US20050133786 Semiconductor testing device and semiconductor testing method
06/23/2005US20050133205 Emulation of operational characteristics of electronic device
06/23/2005DE19851861B4 Fehleranalysespeicher für Halbleiterspeicher-Testvorrichtungen und Speicherverfahren unter Verwendung des Fehleranalysespeichers Failure analysis memory for semiconductor memory devices and memory test method using the failure analysis memory
06/23/2005DE19525790B4 Anzeige einer digitalen Audio-Wellenform auf einem Anzeigegerät für Video-Wellenformen Display a digital audio waveform on a display device for video waveforms
06/23/2005DE10362049A1 In-Betrieb-Test eines Signalpfades In operation test of a signal path
06/23/2005DE10356087A1 Antennenkoppler Antenna
06/23/2005DE10351387A1 Schaltervorrichtung Switch device
06/23/2005DE102004057775A1 Handling facility for feeding electronic components like integrated circuits in a component carrier to a test device has a component holder (CH) with a device for positioning the component in the CH
06/23/2005DE102004056097A1 Probe for detecting abnormalities in stator core of large generator, has sense core defining air gaps between opposed surfaces of adjacent teeth between which probe is disposed, and respective sensing ends of core
06/23/2005DE10156849B4 Verfahren und Vorrichtung zur Erfassung der winkelmäßigen Position eines Rotors Method and apparatus for detecting the angular position of a rotor
06/23/2005CA2590482A1 System and method to forecast the electrical conductivity of anodes for aluminum production before baking
06/23/2005CA2546277A1 Internet endpoint system
06/22/2005EP1544909A1 Probe method,prober,and electrode recucing/plasma-etching process mechanism
06/22/2005EP1544633A1 Tap multiplexer
06/22/2005EP1544632A1 TAP sampling at double rate
06/22/2005EP1544631A1 TAP time division multiplexing with scan test
06/22/2005EP1544630A1 TAP time division multiplexing
06/22/2005EP1544624A1 Method for testing dies utilising a machine grooved storage tray
06/22/2005EP1544042A1 Control circuit for controlling the supply of power to hazard warning lamps
06/22/2005EP1543339A1 Method and apparatus for determining iddq
06/22/2005EP1543338A1 Integrated test circuit arrangement and test method
06/22/2005EP1543336A1 Electrical panel safety monitor
06/22/2005EP1405154B1 Transmitter circuit comprising timing deskewing means
06/22/2005EP1133701B1 Method for diagnosing insulation degradation in underground cable
06/22/2005CN2705795Y Attached detector for power joint in computer
06/22/2005CN2705794Y Transformer fault oscillograph
06/22/2005CN1630057A Socket and/or adapter device, and an apparatus and process for loading a socket and/or adapter device with a corresponding semi-conductor component
06/22/2005CN1629650A Apparatus for ageing fluorescent lamps
06/22/2005CN1629649A Loading device
06/22/2005CN1629648A Method, apparatus, system, program and medium for inspecting a circuit board and an apparatus incorporating the circuit board
06/22/2005CN1629647A Intellectualized real-time on-line monitoring system for transmission line of high voltage fence
06/22/2005CN1629646A Power frequency parameter tester and testing method for high tension transmission line
06/22/2005CN1629645A Method and system for measuring coercive field strength of ferroelectrics
06/22/2005CN1629644A Insulated electric resistant testing method
06/22/2005CN1207720C Semiconductor memory device
06/22/2005CN1207572C Broken wire detecting method for voltage transformer
06/21/2005US6910169 ECC code mechanism to detect wire stuck-at faults
06/21/2005US6910166 Method of and apparatus for timing verification of LSI test data and computer product
06/21/2005US6910165 Digital random noise generator
06/21/2005US6910164 High-resistance contact detection test mode
06/21/2005US6910162 Memory-module burn-in system with removable pattern-generator boards separated from heat chamber by backplane
06/21/2005US6910155 System and method for chip testing
06/21/2005US6909978 Signal pre-processing for estimating attributes of a transmission line
06/21/2005US6909977 Method for diagnosing degradation in aircraft wiring
06/21/2005US6909935 Methods with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer
06/21/2005US6909929 Stereolithographic method and apparatus for packaging electronic components
06/21/2005US6909698 Redundant packet selection based on packet content in wireless communications systems
06/21/2005US6909693 Performance evaluation and traffic engineering in IP networks
06/21/2005US6909649 Semiconductor device and semiconductor integrated circuit
06/21/2005US6909624 Semiconductor memory device and test method thereof
06/21/2005US6909372 Power monitoring unit, control method therefor, and exposure apparatus
06/21/2005US6909358 Hamming distance comparison
06/21/2005US6909304 Display device and scanning circuit testing method
06/21/2005US6909303 Multichip module and testing method thereof
06/21/2005US6909302 Real-time in-line testing of semiconductor wafers
06/21/2005US6909301 Oscillation based access time measurement
06/21/2005US6909299 System for testing multiple groups of IC-chips which concurrently sends time-shifted test signals to the groups
06/21/2005US6909296 Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting
06/21/2005US6909295 Analysis methods of leakage current luminescence in CMOS circuits
06/21/2005US6909293 Space-saving test structures having improved capabilities
06/21/2005US6909290 Rotor angle detecting apparatus for DC brushless motor
06/21/2005US6909288 Battery remaining amount warning circuit
06/21/2005US6909287 Energy management system for automotive vehicle
06/21/2005US6909286 Method of inspecting insulators to detect defects including measuring leakage current flowing through the insulator
06/21/2005US6909285 Method for detecting failure of a relay
06/21/2005US6909274 Signal pin tester for AC defects in integrated circuits
06/21/2005US6909273 Zero-temperature-gradient zero-bias thermally stimulated current technique to characterize defects in semiconductors or insulators