| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/30/2005 | DE10333397B4 Drehmoment-Meßvorrichtung für Elektromotoren Torque-measuring device for electric motors |
| 06/30/2005 | DE10011179B4 Verfahren zur Ermittlung der Temperatur eines Halbleiter-Chips und Halbleiter-Chip mit Temperaturmessanordnung Method for determining the temperature of a semiconductor chip and semiconductor chip with temperature measurement arrangement |
| 06/30/2005 | CA2549177A1 System and method for treating process fluids delivered to an electrochemical cell stack |
| 06/30/2005 | CA2490981A1 Differential active load |
| 06/29/2005 | EP1548945A1 DDS circuit with arbitrary frequency control clock |
| 06/29/2005 | EP1548910A1 Battery charger with state of charge display |
| 06/29/2005 | EP1548543A1 Low jitter direct digital synthesizer |
| 06/29/2005 | EP1548453A1 Battery state-of-charge estimator |
| 06/29/2005 | EP1548452A1 Method and device for determining the internal resistance of a battery block |
| 06/29/2005 | EP1548450A2 Probe card and method of testing wafer having a plurality of semiconductor devices |
| 06/29/2005 | EP1547270A1 Aircraft multi-function wire and insulation tester |
| 06/29/2005 | EP1547010A2 Method and apparatus for analyzing serial data streams |
| 06/29/2005 | EP1546947A2 Method and system for debugging using replicated logic |
| 06/29/2005 | EP1546832A2 Method and apparatus for latent temperature control for a device under test |
| 06/29/2005 | EP1546747A1 System and method of battery capacity estimation |
| 06/29/2005 | EP1546745A1 Method and system for establishing a relation between joule heating and a current density in a conductor |
| 06/29/2005 | EP1546744A2 Cognitive flow control based on channel quality conditions |
| 06/29/2005 | EP1546739A1 Rf chip testing method and system |
| 06/29/2005 | EP1495339A4 Semiconductor test system with easily changed interface unit |
| 06/29/2005 | EP1336112B1 Method and system for automated measuring of electromagnetic emissions |
| 06/29/2005 | CN2706771Y Automatic tester for circuitboard |
| 06/29/2005 | CN1633766A Protable radio terminal testing apparatus using single self-complementary antenna |
| 06/29/2005 | CN1633602A Semiconductor device and its test method |
| 06/29/2005 | CN1633600A Contact structure having silicon finger contactor |
| 06/29/2005 | CN1633018A Method and apparatus for detecting validity of monitoring current flow of frequency converter |
| 06/29/2005 | CN1632996A An intelligent transformer operating and controlling device and its use |
| 06/29/2005 | CN1632900A Unit defects diagnosis method and equipment for plasma display screen module |
| 06/29/2005 | CN1632850A Display device and used display panel, pixel circuit and compensating mechanism |
| 06/29/2005 | CN1632755A Method for testing overfrequency usage of video card and video card system |
| 06/29/2005 | CN1632707A Battery feeding type memory electricity quantity measuring system and method |
| 06/29/2005 | CN1632608A Reliability test installation for overload relay |
| 06/29/2005 | CN1632607A Experimental installation for failure diagnosis of air conditioner control circuit |
| 06/29/2005 | CN1632606A Current transformer failure metering and electric larceny proof real-time on-line detection method and apparatus |
| 06/29/2005 | CN1632605A Chip pin open circuit and short circuit tester and method therefor |
| 06/29/2005 | CN1632604A Transformer overload automatic test method |
| 06/29/2005 | CN1632603A Capacitor for measuring vane electrical characteristics |
| 06/29/2005 | CN1632602A Electric network geomagnetic induction current monitoring method and apparatus |
| 06/29/2005 | CN1632595A Method and device for implementing universal adapter of tester special for circuit board |
| 06/29/2005 | CN1208824C Processing system for cutting semiconductor packing device |
| 06/29/2005 | CN1208628C Apparatus and method for programmable parametric toggle testing of digital CMOS pads |
| 06/29/2005 | CN1208627C Data carrier module having indication means for indicating result of test operation |
| 06/29/2005 | CN1208626C Electrical test of interconnection of conductors on substrate |
| 06/28/2005 | US6912701 Method and apparatus for power supply noise modeling and test pattern development |
| 06/28/2005 | US6912698 Skew lots for IC oscillators and other analog circuits |
| 06/28/2005 | US6912681 Circuit cell for test pattern generation and test pattern compression |
| 06/28/2005 | US6912679 System and method for electrical data link testing |
| 06/28/2005 | US6912678 System for identifying valid connections between electrical system components and responding to invalid connections |
| 06/28/2005 | US6912665 Automatic timing analyzer |
| 06/28/2005 | US6912473 Method for verifying cross-sections |
| 06/28/2005 | US6912203 Method and apparatus for estimating delay and jitter between many network routers using measurements between a preferred set of routers |
| 06/28/2005 | US6912172 Semiconductor device and method of the semiconductor device |
| 06/28/2005 | US6912167 Sensing circuit |
| 06/28/2005 | US6912166 Semiconductor memory device and test method thereof |
| 06/28/2005 | US6911838 Online detection of shorted turns in a generator field winding |
| 06/28/2005 | US6911836 Apparatus for functional and stress testing of exposed chip land grid array devices |
| 06/28/2005 | US6911835 High performance probe system |
| 06/28/2005 | US6911831 Method for automatically changing current ranges |
| 06/28/2005 | US6911827 System and method of measuring low impedances |
| 06/28/2005 | US6911825 Battery tester with CCA lookup table |
| 06/28/2005 | US6911816 Safety lock system for test head mount |
| 06/28/2005 | US6911815 Semiconductor test system and method of operating the same |
| 06/28/2005 | US6911814 Apparatus and method for electromechanical testing and validation of probe cards |
| 06/28/2005 | US6911812 Method and apparatus for measuring frequency pulling in oscillators |
| 06/28/2005 | US6911349 Evaluating sidewall coverage in a semiconductor wafer |
| 06/28/2005 | US6910924 Wireless CASS interface device |
| 06/28/2005 | US6910915 Terminal connector |
| 06/28/2005 | CA2222665C Graphical editor for defining memory test sequences |
| 06/23/2005 | WO2005057752A2 Method and apparatus for use with a portable power source |
| 06/23/2005 | WO2005057334A2 Internet endpoint system |
| 06/23/2005 | WO2005057332A2 Reliable multicast communication |
| 06/23/2005 | WO2005057231A1 Method for functional testing of a lamp circuit |
| 06/23/2005 | WO2005057230A2 Methods and apparatus for transforming sequential logic designs into equivalent combinational logic |
| 06/23/2005 | WO2005057229A1 Buffer circuit and driver circuit |
| 06/23/2005 | WO2005057228A1 Ionization test for electrical verification |
| 06/23/2005 | WO2005057195A1 Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity |
| 06/23/2005 | WO2005057194A1 Differential evaluation of adjacent regions for change in reflectivity |
| 06/23/2005 | US20050138577 Method, apparatus, and article of manufacture for manufacturing high frequency balanced circuits |
| 06/23/2005 | US20050138515 Method and apparatus for co-verification of digital designs |
| 06/23/2005 | US20050138514 ABIST-assisted detection of scan chain defects |
| 06/23/2005 | US20050138513 Multiple on-chip test runs and repairs for memories |
| 06/23/2005 | US20050138512 Semiconductor integrated circuit |
| 06/23/2005 | US20050138511 Self-timed scan circuit for ASIC fault testing |
| 06/23/2005 | US20050138510 Scan test circuit |
| 06/23/2005 | US20050138509 Systems and methods for circuit testing |
| 06/23/2005 | US20050138508 Scan chain diagnostics using logic paths |
| 06/23/2005 | US20050138507 Semiconductor device and display device |
| 06/23/2005 | US20050138505 Test apparatus |
| 06/23/2005 | US20050138504 Test apparatus and testing method |
| 06/23/2005 | US20050138503 Integrated circuit with JTAG port, tap linking module, and Off-Chip TAP interface port |
| 06/23/2005 | US20050138502 Test mode circuit of semiconductor device |
| 06/23/2005 | US20050138501 System and method for testing electronic devices on a microchip |
| 06/23/2005 | US20050138500 Functional test design for testability (DFT) and test architecture for decreased tester channel resources |
| 06/23/2005 | US20050138499 System and method to test integrated circuits on a wafer |
| 06/23/2005 | US20050138498 Channel processing data without leading sync mark |
| 06/23/2005 | US20050138496 Method and apparatus for test and repair of marginally functional SRAM cells |
| 06/23/2005 | US20050138494 Method and system for error manipulation |
| 06/23/2005 | US20050138491 Circuit arrangement and method for driving electronic chips |
| 06/23/2005 | US20050138481 Microcomputer, A Method For Protecting Memory And A Method For Performing Debugging |
| 06/23/2005 | US20050138075 Method for collecting data from semiconductor equipment |
| 06/23/2005 | US20050137840 Network-based system for configuring a programmable hardware element in a modeling system using hardware configuration programs determined based on a user specification |