| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/06/2005 | CN1209804C Spiral contactor and manufacturing method thereof, semiconductor detection apparatus using same and electronic element |
| 07/06/2005 | CN1209767C Circuit for evaluating information content of memory cell |
| 07/06/2005 | CN1209634C Method for positioning grounding failure region of feed line in low-current grounding system |
| 07/06/2005 | CN1209633C Large-size magnetic core sensor and anti-interference method for discriminating directional coupling pulse |
| 07/06/2005 | CN1209632C Printed circuit board test apparatus and method |
| 07/05/2005 | US6915503 Methods of utilizing noise cores in PLD designs to facilitate future design modifications |
| 07/05/2005 | US6915497 Automatic design system for wiring on LSI |
| 07/05/2005 | US6915495 Process and system for management of test access port (TAP) functions |
| 07/05/2005 | US6915494 Fault analyzing system, method for pursuing fault origin and information storage medium for storing computer program representative of the method |
| 07/05/2005 | US6915470 Data log acquisition circuit and data log acquisition method |
| 07/05/2005 | US6915468 Apparatus for testing computer memory |
| 07/05/2005 | US6915466 Method and system for multi-user channel allocation for a multi-channel analyzer |
| 07/05/2005 | US6915247 Computer system |
| 07/05/2005 | US6915221 Self learning system and method for predicting remaining usage time for different modes of a mobile device |
| 07/05/2005 | US6915220 Integrated, self-powered battery monitoring device and system |
| 07/05/2005 | US6915219 Method for canceling transient errors in unsynchronized digital current differential transmission line protection systems |
| 07/05/2005 | US6915186 System and method for synchronizing electrical generators |
| 07/05/2005 | US6914892 Arrangement for testing network switch expansion port data by converting to media independent interface format |
| 07/05/2005 | US6914881 Prioritized continuous-deficit round robin scheduling |
| 07/05/2005 | US6914799 Semiconductor memory device |
| 07/05/2005 | US6914447 High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments |
| 07/05/2005 | US6914446 Chip tester having a heat-exchanger with an extendable period of operation |
| 07/05/2005 | US6914444 Semiconductor device test method and semiconductor device tester |
| 07/05/2005 | US6914443 Apparatus and method for enhanced voltage contrast analysis |
| 07/05/2005 | US6914442 Method for measuring resistivity of semiconductor wafer |
| 07/05/2005 | US6914441 Detection of defects in patterned substrates |
| 07/05/2005 | US6914440 Welding system and method utilizing a ground integrity monitor |
| 07/05/2005 | US6914434 Driver circuit |
| 07/05/2005 | US6914425 Measurement circuit with improved accuracy |
| 07/05/2005 | US6914424 Automatic integrated circuit testing system and device using an integrative computer and method for the same |
| 07/05/2005 | US6914423 Probe station |
| 07/05/2005 | US6914413 Alternator tester with encoded output |
| 07/05/2005 | US6914259 Multi-chip module, semiconductor chip, and interchip connection test method for multi-chip module |
| 07/05/2005 | US6913939 Method for inspecting a wafer and apparatus for inspecting a wafer |
| 07/05/2005 | US6913653 Prior to cleaning with XeF2, contacting XeF2 gas with an article to be cleaned, such as a semiconductor, in a reduced-pressure or vacuum atmosphere containing a required amount of water to form HFto be |
| 07/05/2005 | US6913483 Cable for electronic battery tester |
| 07/05/2005 | US6913468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods |
| 07/05/2005 | US6912778 Methods of fabricating full-wafer silicon probe cards for burn-in and testing of semiconductor devices |
| 07/05/2005 | CA2331462C Method and apparatus for automated time domain monitoring in optical networks |
| 07/05/2005 | CA2194341C Apparatus and method for detecting and assessing a spatially discrete dot pattern |
| 06/30/2005 | WO2005060098A1 Delay circuit and testing apparatus |
| 06/30/2005 | WO2005060063A1 Method and device for detecting a broad-band noise source in a direct voltage distribution network |
| 06/30/2005 | WO2005060062A2 High level arc fault detector |
| 06/30/2005 | WO2005060061A2 Device for controlling a final power-output stage |
| 06/30/2005 | WO2005060035A1 System and method for treating process fluids delivered to an electrochemical cell stack |
| 06/30/2005 | WO2005059956A2 Polymorphic automatic test systems and methods |
| 06/30/2005 | WO2005059926A1 Coaxial cable, twist pair cable, coaxial cable unit, test device, and cpu system |
| 06/30/2005 | WO2005059580A1 Method and assembly for testing a power output stage |
| 06/30/2005 | WO2005059579A1 Apparatus and method for estimating state of charge of battery using neural network |
| 06/30/2005 | WO2005059578A2 Integrated circuit with debug support interface |
| 06/30/2005 | WO2005059577A1 Test apparatus and measuring method for performing electrical and optical measurements of an optical sensor of an integrated circuit |
| 06/30/2005 | WO2005059576A2 Loop resistance tester |
| 06/30/2005 | WO2005059575A1 Device for measuring ambient electromagnetic radiation |
| 06/30/2005 | WO2005059574A1 Method and device for detecting at least two operating modes of an electric unit for a motor vehicle, method for controlling said unit |
| 06/30/2005 | WO2005059571A1 Anisotropic conductive connector and circuit device inspection method |
| 06/30/2005 | WO2005017542A3 Calibration of tester and testboard by golden sample |
| 06/30/2005 | WO2004027905A3 System and method for controlling a fuel cell testing device |
| 06/30/2005 | US20050144585 Method and system for hardware accelerated verification of digital circuit design and its testbench |
| 06/30/2005 | US20050144580 Method and system for testing a logic design |
| 06/30/2005 | US20050144577 Method and system for logic verification using mirror interface |
| 06/30/2005 | US20050144547 Test pattern generation |
| 06/30/2005 | US20050144546 Semiconductor integrated circuit and evaluation method of wiring in the same |
| 06/30/2005 | US20050144545 Simultaneous switch test mode |
| 06/30/2005 | US20050144335 Testing a host's support for peripheral devices |
| 06/30/2005 | US20050143955 Battery management system and apparatus |
| 06/30/2005 | US20050142957 Method and device system for testing electrical components |
| 06/30/2005 | US20050142918 ZIF connector and semiconductor-testing apparatus using the same |
| 06/30/2005 | US20050142697 Fabrication method of semiconductor integrated circuit device |
| 06/30/2005 | US20050142673 Method for manufacturing semiconductor device |
| 06/30/2005 | US20050142672 Method for monitoring an ion implanter |
| 06/30/2005 | US20050142671 Low energy dose monitoring of implanter using implanted wafers |
| 06/30/2005 | US20050141642 Transformer, transforming apparatus, transforming method and machine readable medium storing thereon program |
| 06/30/2005 | US20050141429 Monitoring packet flows |
| 06/30/2005 | US20050141314 Semiconductor integrated circuit device and digital measuring instrument |
| 06/30/2005 | US20050140464 Transceiver module with voltage regulation and filtering |
| 06/30/2005 | US20050140417 Variable-delay signal generators and methods of operation therefor |
| 06/30/2005 | US20050140401 Driver IC and inspection method for driver IC and output device |
| 06/30/2005 | US20050140388 Hybrid AC/DC-coupled channel for testing |
| 06/30/2005 | US20050140386 Active wafer probe |
| 06/30/2005 | US20050140385 System and method for testing and recording temperatures of a CPU |
| 06/30/2005 | US20050140384 Chuck with integrated wafer support |
| 06/30/2005 | US20050140383 Electric-connection testing device |
| 06/30/2005 | US20050140382 High density, area array probe card apparatus |
| 06/30/2005 | US20050140380 Probe device, probe card channel information creation program, and probe card information creation device |
| 06/30/2005 | US20050140379 Probe navigation method and device and defect inspection device |
| 06/30/2005 | US20050140376 Apparatus and method for monitoring transmission systems using off-frequency signals |
| 06/30/2005 | US20050140367 Nondestructive and noncontact analysis system |
| 06/30/2005 | US20050140318 Method for measuring the electromotive force constant of motors |
| 06/30/2005 | US20050140006 Method of manufacturing a semiconductor device |
| 06/30/2005 | US20050139771 Thin film transistor array inspection apparatus |
| 06/30/2005 | US20050139767 Multiple directional scans of test structures on semiconductor integrated circuits |
| 06/30/2005 | US20050139682 Portable diagnostic device |
| 06/30/2005 | US20050139369 Digital electronic apparatus with suppressed radiant noise |
| 06/30/2005 | DE69828877T2 Testsystem für integrierte schaltkreise mit wenigstens einem quasi-autonomen testinstrument Test system for integrated circuits with at least one quasi-autonomous test instrument |
| 06/30/2005 | DE19801247B4 Verfahren und Vorrichtung zum präzisen Ausrichten von Halbleiter-Chips auf einem Substrat Method and apparatus for precisely aligning of semiconductor chips on a substrate |
| 06/30/2005 | DE10392667T5 Ereignisbasiertes IC-Testsystem Event-based IC test system |
| 06/30/2005 | DE10355577A1 Apparatus for testing electric or electronic devices for ability to withstand electromagnetic radiation formed with a series of U shaped antenna elements defining a measurement chamber |
| 06/30/2005 | DE10354080A1 Motor vehicle battery`s current/voltage measuring device, has pole pliers with shanks including two oppositely arranged arc-shaped gripping areas that contact outer contour of pole pin at contacting region of pin |
| 06/30/2005 | DE10353586A1 Ein/Ausgangschaltanordnung für Halbleiterschaltungen und Verfahren zur Prüfung von Treiberschaltkreisen von Halbleiterschaltungen Input / output circuitry for semiconductor circuits and methods for testing driver circuits of semiconductor circuits |
| 06/30/2005 | DE10353585A1 Unidirektionale Eingangsschaltanordnung, Halbleiterschaltung und Verfahren zur Prüfung einer Laufzeitverzögerung eines Eingangstreibers einer Halbleiterschaltung Unidirectional input circuitry, semiconductor circuit and method for testing a propagation delay of an input driver of a semiconductor circuit |