| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/07/2005 | US20050149800 Circuit testing with ring-connected test instrument modules |
| 07/07/2005 | US20050149799 Integrated circuit with leakage control and method for leakage control |
| 07/07/2005 | US20050149798 Semiconductor integrated circuit |
| 07/07/2005 | US20050149797 Soc-based core scan chain linkage switch |
| 07/07/2005 | US20050149796 Removable and replaceable TAP domain selection circuitry |
| 07/07/2005 | US20050149795 Inherently fail safe processing or control apparatus |
| 07/07/2005 | US20050149793 Integrated circuit having multiple modes of operation |
| 07/07/2005 | US20050149792 Semiconductor device and method for testing the same |
| 07/07/2005 | US20050149790 Semiconductor integrated circuit verification method and test pattern preparation method |
| 07/07/2005 | US20050149789 Pseudo random verification of waveform fault coverage |
| 07/07/2005 | US20050149788 Methods of testing semiconductor memory devices in a variable CAS latency environment and related semiconductor test devices |
| 07/07/2005 | US20050149787 Apparatus and method for testing MEGACO protocol |
| 07/07/2005 | US20050149786 Apparatus and method for determining threshold voltages in a flash memory unit |
| 07/07/2005 | US20050149785 Apparatus and method for testing a flash memory unit using stress voltages |
| 07/07/2005 | US20050149784 Testing apparatus and testing method |
| 07/07/2005 | US20050149783 Methods and apparatus for testing an IC |
| 07/07/2005 | US20050149780 System-in-package and method of testing thereof |
| 07/07/2005 | US20050149779 Circuit for producing a variable frequency clock signal having a high frequency low jitter pulse component |
| 07/07/2005 | US20050149778 On-chip timing characterizer |
| 07/07/2005 | US20050149777 Characterizing circuit performance by separating device and interconnect impact on signal delay |
| 07/07/2005 | US20050149313 Method and system for selective compilation of instrumentation entities into a simulation model of a digital design |
| 07/07/2005 | US20050149280 Remote battery discharge testing method and apparatus |
| 07/07/2005 | US20050149279 Battery management system and apparatus |
| 07/07/2005 | US20050149205 Internal bias measure with onboard ADC for electronic devices |
| 07/07/2005 | US20050148234 Apparatus for connecting a test unit to a data line |
| 07/07/2005 | US20050148233 Method of confirming connection of a terminal connecting portion |
| 07/07/2005 | US20050148157 Backside unlayering of MOSFET devices for electrical and physical characterization |
| 07/07/2005 | US20050147048 Low cost test option using redundant logic |
| 07/07/2005 | US20050146969 Semiconductor memory apparatus |
| 07/07/2005 | US20050146959 Non-volatile semiconductor memory device and electric device with the same |
| 07/07/2005 | US20050146708 Systems and methods for deformation measurement |
| 07/07/2005 | US20050146438 Remote control with low battery indication |
| 07/07/2005 | US20050146374 Semiconductor integrated circuit device |
| 07/07/2005 | US20050146360 Multi-stage numeric counter oscillator |
| 07/07/2005 | US20050146349 [testing apparatus for flat-panel display] |
| 07/07/2005 | US20050146348 Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer |
| 07/07/2005 | US20050146347 Techniques for controlling movement of a circuit board module along card cage slot |
| 07/07/2005 | US20050146346 Method and an apparatus for testing transmitter and receiver |
| 07/07/2005 | US20050146344 Circuit tester interface |
| 07/07/2005 | US20050146343 Heat transfer apparatus for burn-in board |
| 07/07/2005 | US20050146342 Apparatus for generating test stimulus signal having current regardless of internal impedance changes of device under test |
| 07/07/2005 | US20050146341 Apparatus for interfacing electronic packages and test equipment |
| 07/07/2005 | US20050146339 Method of manufacturing a probe card |
| 07/07/2005 | US20050146337 Method of manufacturing and testing semiconductor device using assembly substrate |
| 07/07/2005 | US20050146336 Connector for measuring electric resistance, apparatus and method for measuring electric resistance of circuit board |
| 07/07/2005 | US20050146335 Electrical leakage detection circuit |
| 07/07/2005 | US20050146321 Apparatus and method for detecting photon emissions from transistors |
| 07/07/2005 | US20050146320 Differential active load |
| 07/07/2005 | US20050146244 Frequency characterization of quartz crystals |
| 07/07/2005 | US20050146013 Wafer-level testing apparatus |
| 07/07/2005 | US20050145842 Socket for testing a semiconductor device and a connecting sheet used for the same |
| 07/07/2005 | US20050145841 Method to selectively identify reliability risk die based on characteristics of local regions on the wafer |
| 07/07/2005 | US20050145751 Methods and apparatus for passive illumination of refueling hoses |
| 07/07/2005 | US20050145602 Test patterns and methods of controlling CMP process using the same |
| 07/07/2005 | DE202005002728U1 Positioning device for chuck of substrate tester has transfer element with inner and outer parts opposite each other on closed tester housing wall with magnetic force connection between the parts |
| 07/07/2005 | DE19944246B4 Charakterisierung des EOS/ESD-Verhaltens von ICs Characterization of the EOS / ESD behavior of ICs |
| 07/07/2005 | DE19718870B4 Prüfgerät für ungekapselte Halbleiterchips Tester for unencapsulated semiconductor chips |
| 07/07/2005 | DE10392823T5 Steckverbindung, Befestigungsvorrichtung für elektronische Komponenten und Tester Plug-in connection, fastening device for electronic components and Tester |
| 07/07/2005 | DE10392587T5 Messvorrichtung und Messverfahren Measuring apparatus and measurement procedures |
| 07/07/2005 | DE10392318T5 Messvorrichtung und Messverfahren Measuring apparatus and measurement procedures |
| 07/07/2005 | DE10358691A1 Sockel- bzw. Adapter-Einrichtung, sowie Vorrichtung und Verfahren zum Beladen einer Sockel- bzw. Adapter-Einrichtung mit einem entsprechenden Halbleiter-Bauelement Socket or adapter device, and apparatus and method for loading a socket or adapter device with a corresponding semiconductor device |
| 07/07/2005 | DE10356448A1 Testing method for an ignition coil uses a high-voltage connection for picking up a high voltage produced by the ignition coil |
| 07/07/2005 | DE10355861A1 Einheit zum sicheren Messen oder Erkennen eines elektrischen Stroms einer sicherungstechnischen Einrichtung Unit for safe measuring or recognizing an electric current of a device underwriting |
| 07/07/2005 | DE10355206A1 Circuit structure for motor vehicles monitors branches wired in parallel for batteries connected in series with voltage sensors to measure voltage for batteries |
| 07/07/2005 | DE102004057776A1 Positioning device for adjusting the position of a component holder in a handling device for electronic components like integrated circuits has a centering frame and a testing device |
| 07/07/2005 | DE102004042783A1 Halbleitervorrichtung und Herstellungsverfahren von dieser A semiconductor device and manufacturing method of this |
| 07/07/2005 | CA2549151A1 Controlled process gas pressure decay at shut down |
| 07/07/2005 | CA2546561A1 Supporting sdh/sonet aps bridge selector functionality for ethernet |
| 07/06/2005 | EP1550934A1 Multi-stage NCO |
| 07/06/2005 | EP1550880A1 Battery managing metod and device |
| 07/06/2005 | EP1550879A1 Silicon-on-insulator channel architecture for automatic test equipment |
| 07/06/2005 | EP1550878A1 Parallel source/capture architecture for automatic test equipment |
| 07/06/2005 | EP1550877A1 Differential active load |
| 07/06/2005 | EP1550876A1 Apparatus and methods for measuring permittivity in semiconductor wafers |
| 07/06/2005 | EP1550875A1 Apparatus and method for controlling insertion of a module |
| 07/06/2005 | EP1549965A1 Secure scan |
| 07/06/2005 | EP1549964A1 Semiconductor testing instrument to determine safe operating area |
| 07/06/2005 | EP1549963A1 Diagnosis method for an antenna connection |
| 07/06/2005 | EP1549962A2 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 07/06/2005 | EP1549961A1 Test head positioning apparatus |
| 07/06/2005 | EP1264191B1 Device and method for monitoring a capacitor bushing |
| 07/06/2005 | EP1026696B1 Test method and test circuit for electronic device |
| 07/06/2005 | CN2708552Y Phase loss and anti-phase detection circuit for three-phase power source |
| 07/06/2005 | CN2708514Y An upper and lower clamp on cell chemical composition partial volume detection system |
| 07/06/2005 | CN2708330Y Device for detecting rotor position of motor |
| 07/06/2005 | CN2708329Y A material transporting shuttle for testing die |
| 07/06/2005 | CN2708328Y Sample circuit for fault tester of high-voltage transmission line |
| 07/06/2005 | CN2708327Y Capacitor sensing mechanism |
| 07/06/2005 | CN2708326Y CCD testing device |
| 07/06/2005 | CN1636143A Method and circuit arrangement for determining the average current consumption of a battery-operated apparatus |
| 07/06/2005 | CN1636142A Contact actuator with contact force controlling mechanism |
| 07/06/2005 | CN1635627A Low energy dosage monitoring using wafer impregnating machine |
| 07/06/2005 | CN1635390A Test circuit of double Rutherford horizontal dual diffusion field-effect transistor conducting resistor |
| 07/06/2005 | CN1635389A Measuring method of drive circuit |
| 07/06/2005 | CN1635388A Ball grid array substrate detecting device and constructive method thereof |
| 07/06/2005 | CN1635387A Driver of resonant transducer and signal collector |
| 07/06/2005 | CN1635386A Relay protection fault detection module |
| 07/06/2005 | CN1209933C Method and device for testing the electromagnetic compatibility of screen devices |
| 07/06/2005 | CN1209856C Continuity testing unit and system |
| 07/06/2005 | CN1209805C Three-end electrical measuring process for quantum spots device |