| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/13/2005 | EP1552905A2 Contactor cleaning sheet, contactor cleaning sheet manufacturing method, and contactor cleaning method |
| 07/13/2005 | EP1552734A1 Shock absorber means for components and cards |
| 07/13/2005 | EP1552318A1 Aparat und verfahren zur iddq-messung |
| 07/13/2005 | EP1552317A1 Reduced chip testing scheme at wafer level |
| 07/13/2005 | EP1357985A4 Inductive sensory apparatus |
| 07/13/2005 | EP1352370A4 Method and device for in-use detecting low cranking strength of a combustion engine battery during engine starting |
| 07/13/2005 | EP1085333B1 Method for determining iddq |
| 07/13/2005 | EP1025476A4 Multiple output programmable reference voltage source |
| 07/13/2005 | CN2709997Y Automobile main power supply test meter |
| 07/13/2005 | CN2709996Y Monitoring and activating device for accumulator of emergency power supply |
| 07/13/2005 | CN2709995Y Multi-core cable integral testing device |
| 07/13/2005 | CN2709994Y Alarm for under-voltage of distribution line |
| 07/13/2005 | CN2709993Y Cable holding device |
| 07/13/2005 | CN2709992Y Cable testing platform |
| 07/13/2005 | CN2709991Y Test device for precision mould |
| 07/13/2005 | CN2709982Y Cable test table with separate channel |
| 07/13/2005 | CN1639663A Integrated circuit security and method therefor |
| 07/13/2005 | CN1639581A Integrated circuit with test circuit |
| 07/13/2005 | CN1639580A Method and apparatus for creating and testing a channel decoder with built-in self-test |
| 07/13/2005 | CN1639579A Device with board abnormality detecting circuit |
| 07/13/2005 | CN1639578A Under-voltage detection circuit |
| 07/13/2005 | CN1639577A Test probe alignment apparatus |
| 07/13/2005 | CN1638263A High resolution synthesizer with improved signal purity |
| 07/13/2005 | CN1638230A Battery pack |
| 07/13/2005 | CN1638225A Low cost surge protection apparatus and method |
| 07/13/2005 | CN1638127A 半导体集成电路器件 The semiconductor integrated circuit device |
| 07/13/2005 | CN1638108A Method of manufacturing a semiconductor device |
| 07/13/2005 | CN1638082A Fabrication method of semiconductor integrated circuit device |
| 07/13/2005 | CN1638080A Die level testing using machine grooved storage tray with vacuum channels |
| 07/13/2005 | CN1638079A Fabrication method of semiconductor integrated circuit device |
| 07/13/2005 | CN1637953A Semiconductor memory device having advanced test mode |
| 07/13/2005 | CN1637939A Semiconductor memory apparatus |
| 07/13/2005 | CN1637822A Device and method for driving a plurality of loads |
| 07/13/2005 | CN1637817A Image display apparatus and inspection method thereof |
| 07/13/2005 | CN1637816A Method for inspecting organic el substrate and organic el display device |
| 07/13/2005 | CN1637716A Embedded micro computer unit (MCU) using a memory emulation module and a method of testing the same |
| 07/13/2005 | CN1637684A Universal FIFO interface testing equipment and system |
| 07/13/2005 | CN1637470A Apparatus for automatically displaying the grade of liquid crystal display device and operating method thereof |
| 07/13/2005 | CN1637427A Battery, camera and camera system and portable equipment |
| 07/13/2005 | CN1637426A Driver ic and inspection method for driver ic and output device |
| 07/13/2005 | CN1637424A Techniques for controlling movement of a circuit board module along card cage slot |
| 07/13/2005 | CN1637421A Measuring current on a die |
| 07/13/2005 | CN1210824C Cell assembly |
| 07/13/2005 | CN1210745C Control system for an electromagnetic switching device and electromagnetic switching device corresponding thereto |
| 07/13/2005 | CN1210722C Semiconductor data storage circuit device and its checking method and method for alternating badly element in said device |
| 07/13/2005 | CN1210721C Semi-conductor assembly and method for testing and operating a semi-conductor assembly |
| 07/13/2005 | CN1210572C Test circuit for HVDC thyristor valve |
| 07/13/2005 | CN1210571C Storage lead wire calibration data based on affairs testing system for nonvolatile memory |
| 07/12/2005 | US6918098 Random code generation using genetic algorithms |
| 07/12/2005 | US6918076 Method for providing bitwise constraints for test generation |
| 07/12/2005 | US6918075 Pattern generator for semiconductor test system |
| 07/12/2005 | US6918074 At speed testing asynchronous signals |
| 07/12/2005 | US6918073 Differential self-test of input/output circuits |
| 07/12/2005 | US6918072 Circuit and method for time-efficient memory repair |
| 07/12/2005 | US6918061 Element for carrying out a program or test sequence |
| 07/12/2005 | US6918058 Semiconductor integrated circuit, system board and debugging system |
| 07/12/2005 | US6918025 IC with wait state registers |
| 07/12/2005 | US6917888 Method and system for power line network fault detection and quality monitoring |
| 07/12/2005 | US6917698 Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objects |
| 07/12/2005 | US6917592 LNS high availability and load balancing with LNS-to-LNS state offloading |
| 07/12/2005 | US6917587 Method and apparatus for recovering a call resource from a call session |
| 07/12/2005 | US6917525 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 07/12/2005 | US6917324 Signal processor and apparatus and method for testing same |
| 07/12/2005 | US6917320 Method and device for use in DC parametric tests |
| 07/12/2005 | US6917220 Semiconductor device and a method for checking state transition thereof |
| 07/12/2005 | US6917213 Semiconductor integrated circuit device |
| 07/12/2005 | US6917212 Test fixture for printed circuit board assembly |
| 07/12/2005 | US6917209 Non- contacting capacitive diagnostic device |
| 07/12/2005 | US6917208 Method and test structure for determining resistances at a plurality of interconnected resistors in an integrated circuit |
| 07/12/2005 | US6917203 Current signature sensor |
| 07/12/2005 | US6917195 Wafer probe station |
| 07/12/2005 | US6917194 External verification of package processed linewidths and spacings in semiconductor packages |
| 07/12/2005 | US6917174 Cost-effective measurement of large machine currents |
| 07/12/2005 | US6917090 Chip scale image sensor package |
| 07/12/2005 | US6916719 Method and apparatus for non-conductively interconnecting integrated circuits |
| 07/12/2005 | US6916682 Semiconductor package device for use with multiple integrated circuits in a stacked configuration and method of formation and testing |
| 07/12/2005 | US6916671 Gate oxide measurement apparatus |
| 07/12/2005 | CA2334173C Battery having a built-in controller |
| 07/09/2005 | CA2491507A1 Functional test and demonstration apparatus for fuel cell power system |
| 07/07/2005 | WO2005062456A1 Detecting a failure in a converter-load system |
| 07/07/2005 | WO2005062450A1 A device in a semiconductor valve |
| 07/07/2005 | WO2005062063A1 Diagnostic method for monitoring a plug-in connection |
| 07/07/2005 | WO2005062028A1 Substrate inspection device |
| 07/07/2005 | WO2005062012A1 Measuring device, in particular a temperature measuring transducer |
| 07/07/2005 | WO2005060718A2 Cap at resistors of electrical test probe |
| 07/07/2005 | WO2005060568A2 Pulsed current generator circuit with charge booster |
| 07/07/2005 | WO2005060470A2 Supporting sdh/sonet aps bridge selector functionality for ethernet |
| 07/07/2005 | WO2005011344A3 Method for configuration throughput of electronic circuits |
| 07/07/2005 | US20050149897 Hardware/software co-verification method |
| 07/07/2005 | US20050149892 System and method for debugging system-on-chips using single or n-cycle stepping |
| 07/07/2005 | US20050149830 Satellite controlling system having function of distributing satellite state data based on reception environment and method thereof |
| 07/07/2005 | US20050149829 IP packet error handling apparatus and method using the same, and computer readable medium having computer program for executing the method recorded thereon |
| 07/07/2005 | US20050149822 Method of controlling FEC in EPON |
| 07/07/2005 | US20050149807 Parallel source/capture architecture |
| 07/07/2005 | US20050149806 Failure detection simulation system |
| 07/07/2005 | US20050149805 Pending bug monitors for efficient processor development and debug |
| 07/07/2005 | US20050149804 Device and method for testing integrated circuit |
| 07/07/2005 | US20050149803 Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory |
| 07/07/2005 | US20050149802 Multi nodal computer system and method for handling check stops in the multi nodal computer system |
| 07/07/2005 | US20050149801 Semiconductor test device |