| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/20/2005 | CN1642045A Automatic testing method for modulating and demodulation unit and its testing system |
| 07/20/2005 | CN1641997A DDS circuit with arbitrary frequency control clock |
| 07/20/2005 | CN1641996A Motor driver |
| 07/20/2005 | CN1641984A Precision margining circuitry |
| 07/20/2005 | CN1641853A Inspection device and method for manufacturing the same, method for manufacturing electro-optic device and method for manufacturing semiconductor device |
| 07/20/2005 | CN1641852A Method for marking test result for electronic package |
| 07/20/2005 | CN1641794A Semiconductor device |
| 07/20/2005 | CN1641372A Mobile electronic device cell volume compensating device and method |
| 07/20/2005 | CN1641371A Test method for a semiconductor integrated circuit and a semiconductor integrated circuit |
| 07/20/2005 | CN1641369A Video-audio plug detecting device and method |
| 07/20/2005 | CN1641368A Method and device for controlling high-voltage discharge measuring instrument |
| 07/20/2005 | CN1641367A Printed circuit board maintenance and measurement memory device |
| 07/20/2005 | CN1641366A Method for measuring multimedia recording and playing device |
| 07/20/2005 | CN1212053C Element processing apparatus |
| 07/20/2005 | CN1211851C Semiconductor device inspection system |
| 07/20/2005 | CN1211664C Probe unit for inspection of base board for assemblying semiconductor chip |
| 07/19/2005 | US6920621 Methods of testing for shorts in programmable logic devices using relative quiescent current measurements |
| 07/19/2005 | US6920597 Uniform testing of tristate nets in logic BIST |
| 07/19/2005 | US6920596 Method and apparatus for determining fault sources for device failures |
| 07/19/2005 | US6920594 Scan flip-flop circuit, logic macro, scan test circuit, and method for laying out the same |
| 07/19/2005 | US6920593 Logical verification apparatus and method for memory control circuit |
| 07/19/2005 | US6920590 Semiconductor apparatus for providing reliable data analysis of signals |
| 07/19/2005 | US6920582 Method and apparatus for testing circuit modules |
| 07/19/2005 | US6920404 Method of detecting residual capacity of secondary battery |
| 07/19/2005 | US6920403 Power supply voltage fluctuation analyzing method |
| 07/19/2005 | US6920402 Technique for determining performance characteristics of electronic devices and systems |
| 07/19/2005 | US6920112 Sampling packets for network monitoring |
| 07/19/2005 | US6920107 Method and apparatus for congestion control for packet-based networks using pipeline reconfiguration |
| 07/19/2005 | US6920106 Speculative loading of buffers within a port of a network device |
| 07/19/2005 | US6919813 Built-in circuitry and method to test connector loading |
| 07/19/2005 | US6919734 Cooling fin connected to a cooling unit and a pusher of the testing apparatus |
| 07/19/2005 | US6919733 Electronic component production method and burn-in apparatus |
| 07/19/2005 | US6919727 Accurate time measurement system circuit and method |
| 07/19/2005 | US6919726 Leakage detection apparatus and motor car |
| 07/19/2005 | US6919725 Electronic battery tester/charger with integrated battery cell temperature measurement device |
| 07/19/2005 | US6919718 System for testing a group of IC-chips having a chip holding subassembly that is built-in and loaded/unloaded automatically |
| 07/19/2005 | US6919716 Precision avalanche photodiode current monitor |
| 07/19/2005 | US6919707 Battery power source device, method for controlling the same, and method for providing address |
| 07/19/2005 | US6919706 Voltage measuring circuit of battery pack |
| 07/14/2005 | WO2005064583A1 Display device driving apparatus, display device, and method for testing driving apparatus or display device |
| 07/14/2005 | WO2005064356A2 High sensitivity magnetic built-in current sensor |
| 07/14/2005 | WO2005064355A1 Characterizing circuit performance |
| 07/14/2005 | WO2005064354A1 Circuit pattern testing apparatus and circuit pattern testing method |
| 07/14/2005 | WO2005064353A1 A group wiring patching system and method for wire pair identification |
| 07/14/2005 | WO2005064352A1 Electric test tip and method and device for carrying out discharge tests using such a test probe |
| 07/14/2005 | WO2005064351A1 Conductive contact holder, conductive contact unit and process for producing conductive contact holder |
| 07/14/2005 | WO2005064320A1 Device and method for observing a bonding interface |
| 07/14/2005 | WO2005062917A2 Arc fault detector |
| 07/14/2005 | WO2005010942A3 Method and apparatus for calibrating a metrology tool |
| 07/14/2005 | WO2004102617A3 Test circuit for input-to output speed measurement |
| 07/14/2005 | US20050155005 Circuit analyzing device, circuit analyzing method, program, and computer readable information recording medium |
| 07/14/2005 | US20050155003 Scalable logic self-test configuration for multiple chips |
| 07/14/2005 | US20050154953 Multiple function pattern generator and comparator having self-seeding test function |
| 07/14/2005 | US20050154952 Apparatus for fault detection for parallelly transmitted audio signals and apparatus for delay difference detection and adjustment for parallelly transmitted audio signals |
| 07/14/2005 | US20050154951 Saving self-test output to both flash and media |
| 07/14/2005 | US20050154950 Method for saving self-test output to both flash and media |
| 07/14/2005 | US20050154949 System for flexible embedded Boundary Scan testing |
| 07/14/2005 | US20050154948 Accelerated scan circuitry and method for reducing scan test data volume and execution time |
| 07/14/2005 | US20050154947 Microcomputer And Method For Debugging Microcomputer |
| 07/14/2005 | US20050154552 Methods for delay-fault testing in field-programmable gate arrays |
| 07/14/2005 | US20050154551 Method and structure to develop a test program for semiconductor integrated circuits |
| 07/14/2005 | US20050154550 Method and structure to develop a test program for semiconductor integrated circuits |
| 07/14/2005 | US20050154544 System for calculating remaining capacity of energy storage device |
| 07/14/2005 | US20050153465 Fabrication method of semiconductor integrated circuit device |
| 07/14/2005 | US20050153180 Functional test and demonstration apparatus for fuel cell power system |
| 07/14/2005 | US20050152190 Semiconductor memory device capable of testing memory cells at high speed |
| 07/14/2005 | US20050152113 Motherboard testing mount |
| 07/14/2005 | US20050152085 Low cost surge protection |
| 07/14/2005 | US20050151658 Motor Driver |
| 07/14/2005 | US20050151657 Battery monitor with wireless remote communication |
| 07/14/2005 | US20050151560 Scan flip flop, semiconductor device, and production method of semiconductor device |
| 07/14/2005 | US20050151559 Battery ground fault detecting circuit |
| 07/14/2005 | US20050151558 Method for inspecting defects on a display panel |
| 07/14/2005 | US20050151556 Testing probe and testing jig |
| 07/14/2005 | US20050151555 Cooling devices and methods of using them |
| 07/14/2005 | US20050151554 Cooling devices and methods of using them |
| 07/14/2005 | US20050151553 Active thermal control system with miniature liquid-cooled temperature control device for electronic device testing |
| 07/14/2005 | US20050151552 High frequency measurement for current-in-plane-tunneling |
| 07/14/2005 | US20050151551 Electronic part test apparatus |
| 07/14/2005 | US20050151549 Probe method, prober, and electrode reducing/plasma-etching processing mechanism |
| 07/14/2005 | US20050151542 Device and method for error diagnosis at digital outputs of a control module |
| 07/14/2005 | US20050151532 Synchronous vector measuring device |
| 07/14/2005 | US20050151531 Circuit for simultaneous testing of electricity meters with interconnected current and voltage circuits |
| 07/14/2005 | US20050151505 Rechargeable battery device |
| 07/14/2005 | US20050151456 Electron-beam inspection apparatus and methods of inspecting through-holes using clustered nanotube arrays |
| 07/14/2005 | US20050151424 Device and method for driving a plurality of loads |
| 07/14/2005 | US20050151248 Inter-dice signal transfer methods for integrated circuits |
| 07/14/2005 | US20050150102 System and method for validating radio frequency identification tags |
| 07/14/2005 | DE4330615B4 Verfahren zum Betreiben einer Hochdruck-Entladungslampe A method for operating a high pressure discharge lamp |
| 07/14/2005 | DE10359988A1 Messeinrichtung, insbesondere Temperaturmessumformer Measuring device, in particular temperature transmitter |
| 07/14/2005 | DE10358794A1 Near field measurement for printed circuit boards involves radiating measured, stored test spectrum to test board in near field region while operating continuously, checking functional behavior of test board under effect of test spectrum |
| 07/14/2005 | DE10357524A1 Current measurement device for current-carrying cable, especially for motor vehicle, has voltage supply device that generates floating operating voltage at internal d.c. voltage output connected to measurement and evaluation device |
| 07/14/2005 | DE102004009006A1 Verfahren zur Funktionsprüfung einer Lampenschaltung Method for testing the function of a lamp circuit |
| 07/14/2005 | DE10027042B4 Vorrichtung zum Messen, insbesondere Hochfrequenzmessen von elektrischen Bauelementen Apparatus for measuring, particularly high-frequency measurement of electrical components |
| 07/14/2005 | CA2551693A1 Display device driving apparatus, display device, and method for testing driving apparatus or display device |
| 07/14/2005 | CA2550997A1 Arc fault detector |
| 07/13/2005 | EP1553623A1 Anisotropic conductivity connector, probe member, wafer inspecting device, and wafer inspecting method |
| 07/13/2005 | EP1553622A1 Anisotropic conductivity connector, conductive paste composition, probe member, wafer inspecting device, and wafer inspecting method |
| 07/13/2005 | EP1553422A1 Electric supply system including short-circuit and interrupt detection for vehicle power systems |
| 07/13/2005 | EP1553421A2 Method and device for testing a piezoelectric actuator |