| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/26/2005 | US6922087 Control arrangement for power electronic system |
| 07/26/2005 | US6922084 Ultra-low power programmable timer and low voltage detection circuits |
| 07/26/2005 | US6922070 Evaluating pattern for measuring an erosion of a semiconductor wafer polished by a chemical mechanical polishing |
| 07/26/2005 | US6922069 Needle assembly of probe card |
| 07/26/2005 | US6922067 Determination of minority carrier diffusion length in solid state materials |
| 07/26/2005 | US6922062 Timing markers for the measurement and testing of the controlled impedance of a circuit board |
| 07/26/2005 | US6922060 Method for detecting partial conductor short circuits, and device for performing and using the method |
| 07/26/2005 | US6922059 Electric field sensor |
| 07/26/2005 | US6922058 Method for determining the internal impedance of a battery cell in a string of serially connected battery cells |
| 07/26/2005 | US6922050 Method for testing a remnant batch of semiconductor devices |
| 07/26/2005 | US6922049 Testing method for a printed circuit board formed with conductive traces for high-frequency differential signal transmission |
| 07/26/2005 | US6922047 Startup/yank circuit for self-biased phase-locked loops |
| 07/26/2005 | US6921719 Method of preparing whole semiconductor wafer for analysis |
| 07/26/2005 | US6921672 Test structures and methods for inspection of semiconductor integrated circuits |
| 07/26/2005 | US6921271 Socket having terminals with reslient contact arms |
| 07/26/2005 | CA2291681C Boundary scan element and communication device made by using the same |
| 07/21/2005 | WO2005067320A1 Apparatus and method for monitoring transmission systems using off-frequency signals |
| 07/21/2005 | WO2005066829A1 A method and systems for resource bunlding in a communications network |
| 07/21/2005 | WO2005066648A1 A method for measuring the operating state of a synchronous motor using composite power angle meter |
| 07/21/2005 | WO2005066647A1 Cdma integrated circuit demodulator with build-in test pattern generation |
| 07/21/2005 | WO2005066646A1 Timing clock calibration method |
| 07/21/2005 | WO2005066645A1 Delay fault test circuitry and related method |
| 07/21/2005 | WO2005065438A2 Cantilever microprobes for contacting components and methods for making such probes |
| 07/21/2005 | WO2005065437A2 Probe arrays and method for making |
| 07/21/2005 | WO2005065432A2 Pin-type probes for contacting electronic circuits and methods for making such probes |
| 07/21/2005 | WO2005065431A2 Microprobe tips and methods for making |
| 07/21/2005 | WO2005065258A2 Active wafer probe |
| 07/21/2005 | WO2005017648A3 System and method for processing and identifying errors in data |
| 07/21/2005 | US20050160473 Context aware transmission management method |
| 07/21/2005 | US20050160339 Automated bist test pattern sequence generator software system and method |
| 07/21/2005 | US20050160338 Integrated circuit with test circuit |
| 07/21/2005 | US20050160337 JTAG bus communication method and apparatus |
| 07/21/2005 | US20050160336 Semiconductor LSI circuit with scan circuit, scan circuit system, scanning test system and method |
| 07/21/2005 | US20050160333 Embedded micro computer unit (MCU) for high-speed testing using a memory emulation module and a method of testing the same |
| 07/21/2005 | US20050160332 Semiconductor integrated circuit |
| 07/21/2005 | US20050160331 PICA system timing measurement and calibration |
| 07/21/2005 | US20050160327 Input stage threshold adjustment for high speed data communications |
| 07/21/2005 | US20050159913 Read-write processing device for RFID tag |
| 07/21/2005 | US20050159909 Method of defect review |
| 07/21/2005 | US20050159906 RFID tag inspection system |
| 07/21/2005 | US20050159049 Wireless cass interface device |
| 07/21/2005 | US20050159034 Connector, electronic component fixing device, and tester |
| 07/21/2005 | US20050158890 Silicon-on-insulator channel architecture for automatic test equipment |
| 07/21/2005 | US20050158888 System and method for product yield prediction |
| 07/21/2005 | US20050157918 Method for pattern recognition in energized charge particle beam wafer/slider inspection/measurement systems in presence of electrical charge |
| 07/21/2005 | US20050157643 Method and apparatus for sharing common capacity and using different schemes for restoring telecommunications networks |
| 07/21/2005 | US20050157593 Apparatus for identification of locations of a circuit within an integrated circuit having low speed performance |
| 07/21/2005 | US20050157440 Burn-in board having an indirect fuse |
| 07/21/2005 | US20050156830 Image display apparatus and inspection method thereof |
| 07/21/2005 | US20050156622 Semiconductor test device |
| 07/21/2005 | US20050156619 Device for monitoring quiescent current of an electronic device |
| 07/21/2005 | US20050156618 Methods, apparatus and systems for wafer-level burn-in stressing of semiconductor devices |
| 07/21/2005 | US20050156617 Test pattern of semiconductor device and test method using the same |
| 07/21/2005 | US20050156616 Integrated circuit device |
| 07/21/2005 | US20050156615 Semiconductor integrated circuit device |
| 07/21/2005 | US20050156614 Semiconductor inspection device and method for manufacturing contact probe |
| 07/21/2005 | US20050156612 Test system and test structure for testing an integrated circuit and an integrated circuit having a test structure |
| 07/21/2005 | US20050156611 Probe card configuration for low mechanical flexural strength electrical routing substrates |
| 07/21/2005 | US20050156610 Probe station |
| 07/21/2005 | US20050156609 Voltage testing and measurement |
| 07/21/2005 | US20050156603 Method of testing a battery pack by purposeful charge/discharge operations |
| 07/21/2005 | US20050156589 Semiconductor device and test method for the same |
| 07/21/2005 | US20050156586 Combination test method and test device |
| 07/21/2005 | US20050156559 Integrated battery service system |
| 07/21/2005 | US20050156313 Inspection device and method for manufacturing the same, method for manufacturing electro-optic device and method for manufacturing semiconductor device |
| 07/21/2005 | US20050156166 Jig device for transporting and testing integrated circuit chip |
| 07/21/2005 | US20050156165 Test assembly including a test die for testing a semiconductor product die |
| 07/21/2005 | US20050155219 Index head in semiconductor device test handler |
| 07/21/2005 | DE69825078T2 Speicherprüfsystem mit einer Einrichtung für eine Prüffolgenoptimierung und Verfahren für diesen Vorgang The memory test system comprising a device for a method for this operation and Prüffolgenoptimierung |
| 07/21/2005 | DE60108993T2 Anpassung von "Scan-BIST"-Architekturen für einen Betrieb mit niedrigem Verbrauch Adaptation of "Scan BIST" architectures for operation with low consumption |
| 07/21/2005 | DE19956981B4 Handhabungsvorrichtung für eine Prüfung von IC-Bausteinen Handling apparatus for testing integrated circuit devices |
| 07/21/2005 | DE10358849A1 Testaufbau zum Testen einer integrierten Schaltung, integrierte Schaltung und Testsystem Test assembly for testing an integrated circuit, and integrated circuit test system |
| 07/21/2005 | DE10297214T5 Überkreuzungsfehlerklassifikation für Netzleitungen mit Parallelschaltungen Crossover error classification for power cables in parallel circuits |
| 07/21/2005 | DE102004059937A1 Prüfvorrichtung und Prüfverfahren Tester and test methods |
| 07/21/2005 | DE102004051384A1 Verfahren, Vorrichtung und Herstellungsartikel zum Herstellen von symmetrischen Hochfrequenzschaltungen A method, apparatus and article of manufacture for the production of balanced high-frequency circuits |
| 07/21/2005 | DE102004025123A1 Hearing aid with acoustic battery status display whereby the current charge level of the battery is determined and communicated to the user by an acoustic signal |
| 07/21/2005 | DE102004017101A1 Diagnosable fixture device for electronic components e.g. for antenna arrangement of motor vehicle, has fixture element electronically joined to electronic component |
| 07/20/2005 | EP1555675A1 An apparatus for determining the access time and/or the minimally allowable cycle time of a memory |
| 07/20/2005 | EP1555537A1 Battery remaining capacity measuring apparatus |
| 07/20/2005 | EP1555536A2 Motor driver |
| 07/20/2005 | EP1555533A1 Semiconductor inspection device and method of manufacturing contact probe |
| 07/20/2005 | EP1554756A2 Electrical device, a method for manufacturing an electrical device, test structure, a method for manufacturing such a test structure and a method for testing a display panel |
| 07/20/2005 | EP1553907A1 An electrical drive system |
| 07/20/2005 | EP1446675A4 Determining electrical faults on undergrounded power systems using directional element |
| 07/20/2005 | EP1410053B1 Integrated testing of serializer/deserializer in fpga |
| 07/20/2005 | EP1405091A4 A method and system for infrared detection of electrical short defects |
| 07/20/2005 | EP1348971B1 Additional output circuit for differential signal transmission during boundary scan |
| 07/20/2005 | EP1135916A4 Fault conditions affecting high speed data services |
| 07/20/2005 | EP1097617B1 Interconnect assembly for printed circuit boards and method of fabrication |
| 07/20/2005 | EP1090302B1 System measuring partial discharge using digital peak detection |
| 07/20/2005 | EP1070260B1 An arrangement for transient-current testing of a digital electronic cmos circuit |
| 07/20/2005 | EP1032845A4 Integrated circuit tester having pattern generator controlled data bus |
| 07/20/2005 | CN2711747Y Rechargeable cell monitor control and balance circuit |
| 07/20/2005 | CN2711746Y Test device for applied assembly of field emission display |
| 07/20/2005 | CN2711745Y Test device for repairing domestic appliances |
| 07/20/2005 | CN2711744Y Circuit detection pen |
| 07/20/2005 | CN2711743Y Self-check indicated start press button device |
| 07/20/2005 | CN1643390A System and method for measuring fuel cell voltage and high frequency resistance |
| 07/20/2005 | CN1643389A Predictive, adaptive power supply for an integrated circuit under test |
| 07/20/2005 | CN1642118A Multiple function pattern generator and comparator having self-seeding test function |