| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/28/2005 | US20050166109 Enhanced JTAG interface |
| 07/28/2005 | US20050166108 Segmented scan chains with dynamic reconfigurations |
| 07/28/2005 | US20050166107 Selector circuit and semiconductor device |
| 07/28/2005 | US20050166106 Tap sampling at double rate |
| 07/28/2005 | US20050166105 Tap multiplexer |
| 07/28/2005 | US20050166104 Simultaneous AC logic self-test of multiple clock domains |
| 07/28/2005 | US20050166100 Method and apparatus for synchronizing signals in a testing system |
| 07/28/2005 | US20050166097 Semiconductor memory device having advanced test mode |
| 07/28/2005 | US20050165590 System and method for virtual laser marking |
| 07/28/2005 | US20050165573 Semiconductor integrated circuit apparatus, measurement result management system, and management server |
| 07/28/2005 | US20050165572 Systems and methods for non-intrusive testing of signals between circuits |
| 07/28/2005 | US20050165569 Pulse width measuring device with automatic range setting function |
| 07/28/2005 | US20050165529 Short-circuit detecting circuit device |
| 07/28/2005 | US20050164485 Method for fabricating semiconductor device and apparatus for fabricating the same |
| 07/28/2005 | US20050164428 Flip chip packaging process employing improved probe tip design |
| 07/28/2005 | US20050164416 Method for processing an integrated circuit |
| 07/28/2005 | US20050163915 mixing isotopes with liquid or powder matrices, then curing and annealing, to form test systems that mimic alpha-ray emissions from moldings used to encapsulate electronic or flip chip packages |
| 07/28/2005 | US20050163128 Digital subscriber line user capacity estimation |
| 07/28/2005 | US20050163057 Digital subscriber line user capacity estimation |
| 07/28/2005 | US20050163055 Optical transmission apparatus having path trace function |
| 07/28/2005 | US20050163051 Data transfer device |
| 07/28/2005 | US20050162365 Method for adjusting electro-optical apparatus, adjusting apparatus of electro-optical apparatus, and electronic system |
| 07/28/2005 | US20050162183 Apparatus for automatically displaying the grade of liquid crystal display device and operating method thereof |
| 07/28/2005 | US20050162182 Internally generating patterns for testing in an integrated circuit device |
| 07/28/2005 | US20050162181 Adaptive integrated circuit based on transistor current measurements |
| 07/28/2005 | US20050162180 Semiconductor testing device |
| 07/28/2005 | US20050162179 Probe with trapezoidal contactor and device based on application thereof, and method of producing them |
| 07/28/2005 | US20050162177 Multi-signal single beam probe |
| 07/28/2005 | US20050162176 Test device for wafer testing digital semiconductor circuits |
| 07/28/2005 | US20050162174 System and method for adjusting a pid controller in a limited rotation motor system |
| 07/28/2005 | US20050162172 Wireless battery monitor |
| 07/28/2005 | US20050162153 Zero-temperature-gradient zero-bias thermally stimulated current technique to characterize defects in semiconductors or insulators |
| 07/28/2005 | US20050162151 Device transfer mechanism for a test handler |
| 07/28/2005 | US20050162150 Electronic device testing apparatus |
| 07/28/2005 | US20050162129 Method and apparatus for monitoring energy storage devices |
| 07/28/2005 | US20050162072 Organic electroluminescent device |
| 07/28/2005 | US20050161800 Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet |
| 07/28/2005 | DE19741780B4 Verfahren zur Erkennung von Leitungsbrüchen bei einem induktiven Sensor Method for detecting cable breaks in an inductive sensor |
| 07/28/2005 | DE10360209A1 Diagnoseverfahren zur Überwachung einer Steckverbindung Diagnostic method for monitoring a plug-in connection |
| 07/28/2005 | DE10333817B4 Emulationsschnittstellensystem Emulation interface system |
| 07/28/2005 | DE102004063431A1 Verfahren und Vorrichtung zur Ermittlung des Innenwiderstandes eines Batterieblockes Method and apparatus for determining the internal resistance of a battery block |
| 07/28/2005 | DE102004059309A1 Verfahren und Vorrichtung zum Bestimmen eines Frequenzprofils eines Schwingquarzes Method and apparatus for determining a frequency profile of a quartz oscillator |
| 07/28/2005 | DE102004051734A1 Detektion einer Teilentladung oder einer Lichtbogenbildung in einer Verdrahtung mittels Glasfaseroptik Detection of a partial discharge or arcing in a wiring using fiber optics |
| 07/28/2005 | DE102004034357A1 Prüfkarten Trägerelement Test cards support element |
| 07/28/2005 | DE102004018918B3 Process for locating information errors in insulated ungrounded alternating voltage networks comprises determining the temporary progression of network disturbances for each network loss when the testing voltage generator is switched off |
| 07/28/2005 | DE102004018028A1 Electronic circuit testing method in which electronic circuits to be tested are compared with a reference circuit by application of test signals and comparison of the resultant output signals |
| 07/28/2005 | DE10132452B4 Vorrichtung und Verfahren zum Messen von Betriebstemperaturen eines elektrischen Bauteils Apparatus and method for measuring operating temperatures of an electrical component |
| 07/28/2005 | DE10027822B4 Unterdrückung von Datenabtastwerten Suppression of data samples |
| 07/28/2005 | CA2552037A1 Fuel cell voltage monitoring system and associated electrical connectors |
| 07/27/2005 | EP1557877A1 Probe device that controls temperature of object to be inspected and probe inspection method |
| 07/27/2005 | EP1557876A1 Probe mark reader and probe mark reading method |
| 07/27/2005 | EP1557683A2 Methods and apparatus for analyzing high voltage circuit breakers |
| 07/27/2005 | EP1557682A1 Test mode activation by phase comparison |
| 07/27/2005 | EP1556709A2 Method and apparatus for predicting the remaining capacity of a battery in a mobile telephone |
| 07/27/2005 | EP1556708A1 Method and apparatus for diagnosis injectors |
| 07/27/2005 | EP1476816B1 Data bus for electrically controlling the installation of modules |
| 07/27/2005 | EP1456679B1 Controller based hardware device and method for setting the same |
| 07/27/2005 | EP1370880A4 A multiple-capture dft system for scan-based integrated circuits |
| 07/27/2005 | EP1266404B1 Test circuit arrangement and a method for testing a plurality of electric components |
| 07/27/2005 | EP1075663B1 Method for testing an integrated circuit and corresponding integrated circuit |
| 07/27/2005 | EP0941480B1 Measurement instrument amplitude calibration |
| 07/27/2005 | CN2713522Y Intelligent controller for DC power supply panel |
| 07/27/2005 | CN2713482Y An improved battery using state displaying structure |
| 07/27/2005 | CN2713481Y Electric loop contact fault detector |
| 07/27/2005 | CN2713480Y Signal sampling apparatus for insulated charged detection of electric power capacitive device |
| 07/27/2005 | CN2713474Y Replaceable tool assembly structure for autotest packaging machine |
| 07/27/2005 | CN1647452A Method for testing subscriber connection lines for broadband services |
| 07/27/2005 | CN1647248A Manufacturing method and apparatus to avoid prototype-hold in ASIC/SOC manufacturing |
| 07/27/2005 | CN1647246A Method and device for conditioning semiconductor wafers and/or hybrids |
| 07/27/2005 | CN1647163A Optical disk drive, optical storage medium, optical storage medium inspection device, and optical storage inspection method |
| 07/27/2005 | CN1647126A Remote control with low battery indication |
| 07/27/2005 | CN1647057A Sensor, controller and method for monitoring at least one sensor |
| 07/27/2005 | CN1646932A Method and arrangement for protecting a chip and checking its authenticity |
| 07/27/2005 | CN1646931A Semiconductor test system with easily changed interface unit |
| 07/27/2005 | CN1646929A Single axis manipulator with controlled compliance |
| 07/27/2005 | CN1646925A Test head positioner system |
| 07/27/2005 | CN1645985A Electronic module, device therwith and verifying method for press connection thereon |
| 07/27/2005 | CN1645737A Comprehensive measuring method and circuit for electric motor rotating speed and rotor location |
| 07/27/2005 | CN1645698A Method and mechanism for producing elliptic motion trace by air wire |
| 07/27/2005 | CN1645609A Test pattern of semiconductor device and test method using the same |
| 07/27/2005 | CN1645581A Designing method for improving breakdown potential of electronic element with epoxy powder pack |
| 07/27/2005 | CN1645549A Electron-beam inspection apparatus and methods of inspecting through-holes using clustered nanotube arrays |
| 07/27/2005 | CN1645337A Method and apparatus for testing host computer board including interconnecting peripheries quickly |
| 07/27/2005 | CN1645159A Reliability tester for electric leakage protector |
| 07/27/2005 | CN1645158A Fault inspecting device |
| 07/27/2005 | CN1645157A Method and apparatus for detecting liquid crystal displaying device array |
| 07/27/2005 | CN1645156A Automatic rotary button detecting method and apparatus |
| 07/27/2005 | CN1645155A Furnace cabinet style aging lighters |
| 07/27/2005 | CN1645138A Tester and testing method for cement-base material cracking and contracting characleristics |
| 07/27/2005 | CN1212523C Inspection system for inspeting discrete wiring patterns formed on continuous substrate sheet of flexible material |
| 07/26/2005 | US6922803 Test method of semiconductor intergrated circuit and test pattern generator |
| 07/26/2005 | US6922799 Semiconductor memory device and testing system and testing method |
| 07/26/2005 | US6922796 Method and apparatus for performing failure recovery in a Java platform |
| 07/26/2005 | US6922750 Semiconductor memory device capable of simultaneously reading data and refreshing data |
| 07/26/2005 | US6922650 Semiconductor device tester and its method |
| 07/26/2005 | US6922649 Multiple on-chip test runs and repairs for memories |
| 07/26/2005 | US6922648 Tuning chart for devices under test |
| 07/26/2005 | US6922643 Leakage current or resistance measurement method, and monitoring apparatus and monitoring system of the same |
| 07/26/2005 | US6922396 System and method for managing time sensitive data streams across a communication network |
| 07/26/2005 | US6922151 Battery remaining amount warning circuit |