| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/04/2005 | US20050167396 A measurement to determine plasma leakage |
| 08/04/2005 | DE69533275T2 Ein Steuergerät zur Durchführung der Abtastprüfung A control unit for performing the scan- |
| 08/04/2005 | DE19912260B4 Stabilisatorvorrichtung und Stabilisierungsverfahren für ein Stromnetz Stabilizer apparatus and method for stabilizing a power grid |
| 08/04/2005 | DE102004061533A1 Verfahren und Vorrichtung zur Sondennavigation sowie Defektprüfvorrichtung Method and apparatus for navigation and defect inspection probe |
| 08/04/2005 | DE102004032689A1 Semiconductor memory device operation testing method, involves generating internal bank addresses in response to bank interleaving test signal, and receiving addresses for testing read and write operation of memory device |
| 08/04/2005 | CA2553203A1 Radio frequency identification tag inlay sortation and assembly |
| 08/03/2005 | EP1560360A2 Variable phase bit sampling with minimized synchronization loss |
| 08/03/2005 | EP1560358A1 A method and apparatus for creating performance limits from parametric measurements |
| 08/03/2005 | EP1560232A2 Ignition coil tester |
| 08/03/2005 | EP1560034A1 A method and apparatus to measure and display data dependent eye diagrams |
| 08/03/2005 | EP1560033A1 Integrated circuit comprising a secure test mode by resetting of said test mode |
| 08/03/2005 | EP1560032A1 Integrated circuit test mode securisation method by intrusion detection |
| 08/03/2005 | EP1560031A1 Integrated circuit test mode securisation |
| 08/03/2005 | EP1560030A1 Method and apparatus for testing integrated circuits for susceptibility to latch-up |
| 08/03/2005 | EP1559304A1 Vision inspection apparatus using a full reflection mirror |
| 08/03/2005 | EP1559116A2 Probe station with low noise characteristics |
| 08/03/2005 | EP1558987A2 A multi-rate, multi-port, gigabit serdes transceiver |
| 08/03/2005 | EP1558940A2 Device and method of monitoring the starting capability of a vehicles starter battery |
| 08/03/2005 | EP1558939A2 Apparatus and method for simultaneously detecting the power state of a plurality of circuit breaker switches |
| 08/03/2005 | EP1558936A2 Amperage control for valves |
| 08/03/2005 | EP1397806B1 Identification of an integrated circuit from its physical manufacture parameters |
| 08/03/2005 | EP1356308A4 Apparatus and method for detecting and calculating ground fault resistance |
| 08/03/2005 | EP1157278B1 A method and integrated circuit arranged for feeding a test forcing pattern on a single shared pin of the circuit |
| 08/03/2005 | EP1095286B1 Driver with transmission path loss compensation |
| 08/03/2005 | CN2715357Y 3-in-1 intelligent repairing instrument for accumulator |
| 08/03/2005 | CN2715169Y Fault alarm pipeline |
| 08/03/2005 | CN2715166Y AC induced voltage monitor for desk-top computer |
| 08/03/2005 | CN2715164Y High tension transmission line insulator leakage current collecting ring |
| 08/03/2005 | CN1650318A Metrology diffraction signal adaptation for tool-to-tool matching |
| 08/03/2005 | CN1650185A Method for diagnosing deterioration of coil and system for diagnosing deterioration of coil |
| 08/03/2005 | CN1650184A Technique for programming clocks in automatic test system |
| 08/03/2005 | CN1650183A Method and apparatus for secure scan testing |
| 08/03/2005 | CN1650182A Automatic teaching method for printed circuit board inspection system |
| 08/03/2005 | CN1650181A Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method |
| 08/03/2005 | CN1650180A Secure scan |
| 08/03/2005 | CN1650179A Electronic device test system |
| 08/03/2005 | CN1650176A Connector for measuring electric resistance, apparatus and method for measuring electric resistance of circuit board |
| 08/03/2005 | CN1649267A Circuit device of monitoring power voltage |
| 08/03/2005 | CN1649120A Silicon-on-insulator channel architecture for automatic test equipment |
| 08/03/2005 | CN1649117A Device package and methods for the fabrication and testing thereof |
| 08/03/2005 | CN1648679A Test device for small breaker reliability |
| 08/03/2005 | CN1648678A Test platform for radio transmission circuit board |
| 08/03/2005 | CN1648677A Short-circuit detecting circuit device |
| 08/03/2005 | CN1648674A Integrated printed circuit board and test contactor for high speed semiconductor testing |
| 08/03/2005 | CN1648643A Self-light-emitting display module and method for verifying defect state of the same |
| 08/03/2005 | CN1213505C Judging method of acccumulator charging and discharging state |
| 08/03/2005 | CN1213471C Transfer device for semiconductor device in processor |
| 08/03/2005 | CN1213470C Semiconductor device and checkup apparatus thereof |
| 08/03/2005 | CN1213469C Apparatus and method for contact failure inspection in semiconductor devices |
| 08/03/2005 | CN1213280C Intelligent analysts system and method for electric equipment filled with fluid |
| 08/02/2005 | US6925617 Method and apparatus for generating test pattern for integrated circuit design |
| 08/02/2005 | US6925616 Method to test power distribution system |
| 08/02/2005 | US6925615 Semiconductor device having embedded array |
| 08/02/2005 | US6925590 Scan interface |
| 08/02/2005 | US6925588 Methods and apparatus for testing data lines |
| 08/02/2005 | US6925583 Structure and method for writing from a JTAG device with microcontroller to a non-JTAG device |
| 08/02/2005 | US6925430 Method of and apparatus for signal-waveform simulation, and computer product |
| 08/02/2005 | US6925429 Electric wiring simulation device and recording medium recording simulation program for electric wiring simulation device |
| 08/02/2005 | US6925408 Mixed-signal core design for concurrent testing of mixed-signal, analog, and digital components |
| 08/02/2005 | US6925406 Scan test viewing and analysis tool |
| 08/02/2005 | US6925404 Apparatus and method for determining effect of on-chip noise on signal propagation |
| 08/02/2005 | US6925018 System-in-package type semiconductor device |
| 08/02/2005 | US6924658 Device and method for checking signal transmission quality of circuit board |
| 08/02/2005 | US6924657 Real-time in-line testing of semiconductor wafers |
| 08/02/2005 | US6924656 Method and apparatus for testing BGA-type semiconductor devices |
| 08/02/2005 | US6924655 Probe card for use with microelectronic components, and methods for making same |
| 08/02/2005 | US6924654 Structures for testing circuits and methods for fabricating the structures |
| 08/02/2005 | US6924653 Selectively configurable microelectronic probes |
| 08/02/2005 | US6924651 Printed board inspecting apparatus |
| 08/02/2005 | US6924650 Device for generator diagnosis with built-in rotor |
| 08/02/2005 | US6924648 Method for identifying risks as a result of stray currents |
| 08/02/2005 | US6924647 Fault location method and device |
| 08/02/2005 | US6924637 Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device |
| 08/02/2005 | US6924636 System for testing one or more groups of IC-chips while concurrently loading/unloading another group |
| 08/02/2005 | US6924635 IC tester for preventing damage from electrostatic discharge and operation method thereof |
| 08/02/2005 | US6924623 Method and device for judging the condition of secondary batteries and method for regenerating secondary batteries |
| 08/02/2005 | US6924622 Battery capacity measurement |
| 08/02/2005 | US6924482 Method of inspecting pattern and inspecting instrument |
| 08/02/2005 | CA2816862A1 Bathing system controller having abnormal operational condition identification capabilities |
| 08/02/2005 | CA2495844A1 A method and apparatus to measure and display data dependent eye diagrams |
| 08/02/2005 | CA2495775A1 A method and apparatus for creating performance limits from parametric measurements |
| 08/02/2005 | CA2495135A1 Variable phase bit sampling with minimized synchronization loss |
| 08/02/2005 | CA2286590C Multifunctional polymeric tissue coatings |
| 07/28/2005 | WO2005069487A1 Pulse width adjusting circuit, pulse width adjusting method, and semiconductor testing apparatus |
| 07/28/2005 | WO2005069474A1 Plausibility check of an electric three-phase system |
| 07/28/2005 | WO2005069025A1 Jtag test architecture for multi-chip pack |
| 07/28/2005 | WO2005069024A1 Rewiring substrate strip comprising several semiconductor component positions |
| 07/28/2005 | WO2005069018A1 Electric connecting device and contactor |
| 07/28/2005 | WO2005067453A2 Dynamic gamma for a liquid crystal display |
| 07/28/2005 | WO2005067445A2 Chuck with integrated wafer support |
| 07/28/2005 | WO2005040836A3 Isolation buffers with controlled equal time delays |
| 07/28/2005 | WO2005003896A3 Test standard interfaces and architectures |
| 07/28/2005 | WO2004084033A3 Method and system for testing a signal path having an operational signal |
| 07/28/2005 | US20050166166 Method and apparatus for thermal testing of semiconductor chip designs |
| 07/28/2005 | US20050166116 Method and apparatus for encoding and generating transaction-based stimulus for simulation of VLSI circuits |
| 07/28/2005 | US20050166115 Method for performing software stress test |
| 07/28/2005 | US20050166114 Single-Pass Methods for Generating Test Patterns for Sequential Circuits |
| 07/28/2005 | US20050166112 Method and system for efficiently verifying optical proximity correction |
| 07/28/2005 | US20050166111 Memory built-in self test circuit with full error mapping capability |
| 07/28/2005 | US20050166110 Generation of memory test patterns for DLL calibration |