Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2005
08/09/2005US6928371 Monitoring system of VRLA battery capacitance
08/09/2005US6928106 Phy control module for a multi-pair gigabit transceiver
08/09/2005US6928053 Dynamic resource control in telecommunications networks
08/09/2005US6928018 Dynamic register with low clock rate testing capability
08/09/2005US6928010 Semiconductor integrated circuit device capable of tuning of internal power supply voltages generated by a plurality of internal power generating circuits
08/09/2005US6927988 Method and apparatus for measuring fault diagnostics on insulated gate bipolar transistor converter circuits
08/09/2005US6927955 Apparatus and method of detecting ground fault in power conversion system
08/09/2005US6927603 Semiconductor integrated circuit having system bus divided in stages
08/09/2005US6927600 Resistance calibration circuit in semiconductor device
08/09/2005US6927599 Failsafe for differential circuit based on current sense scheme
08/09/2005US6927598 Test probe for electrical devices having low or no wedge depression
08/09/2005US6927597 Direct current machine monitoring system and method
08/09/2005US6927596 In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays
08/09/2005US6927595 Dynamically switched voltage screen
08/09/2005US6927593 System for testing semiconductor die on multiple semiconductor wafers
08/09/2005US6927592 Device for monitoring quiescent current of an electronic device
08/09/2005US6927591 Method and system for wafer and device level testing of an integrated circuit
08/09/2005US6927590 Method and circuit for testing a regulated power supply in an integrated circuit
08/09/2005US6927589 Apparatus for testing bumped die
08/09/2005US6927588 Ball alignment plate testing apparatus and method for testing semiconductor chips
08/09/2005US6927587 Probe apparatus
08/09/2005US6927586 Temperature compensated vertical pin probing device
08/09/2005US6927585 Membrane probing system with local contact scrub
08/09/2005US6927584 Circuit arrangement with several sensor elements in matrix circuit design
08/09/2005US6927579 Parallel arc fault diagnostic for aircraft wiring
08/09/2005US6927569 Techniques for electrically characterizing tunnel junction film stacks with little or no processing
08/09/2005US6927565 Dynamic register with IDDQ testing capability
08/09/2005US6927562 Power factor/tan δtesting of high voltage bushings on power transformers, current transformers, and circuit breakers
08/09/2005US6927561 Current measuring circuit for a PWM driver and method of using the same
08/09/2005US6927554 Simple optimal estimator for PbA state of charge
08/09/2005US6927383 Radiation hardened visible P-I-N detector
08/09/2005US6927083 Method for constructing a wafer-interposer assembly
08/09/2005US6927081 Method of inkless wafer blind assembly
08/09/2005US6927079 Method for probing a semiconductor wafer
08/09/2005US6927078 Method of measuring contact resistance of probe and method of testing semiconductor device
08/09/2005US6927077 Method and apparatus for measuring contamination of a semiconductor substrate
08/09/2005US6925706 Index head in semiconductor device test handler
08/09/2005US6925699 Method of producing a quantity of integrated circuits
08/04/2005WO2005071813A1 Low cost surge protection
08/04/2005WO2005071582A2 Detection of abnormal behaviour in dynamic systems
08/04/2005WO2005071427A1 Battery pure resistance measuring method and apparatus
08/04/2005WO2005071426A1 Testing of circuits with multiple clock domains
08/04/2005WO2005071425A1 Test architecture and method
08/04/2005WO2005070178A2 Test result marking of electronic packages
08/04/2005WO2005070171A2 Active thermal control system for testing
08/04/2005WO2005070163A2 Cooling devices and methods of using them
08/04/2005WO2005069914A2 Probe card configuration for low mechanical flexural strength electrical routing substrates
08/04/2005WO2005069828A2 Thermal protection for electronic components during processing
08/04/2005WO2004107086A3 Method for reducing the cost of handling incoming/outgoing phone calls
08/04/2005US20050172254 Method and apparatus for supporting designing of LSI, and computer product
08/04/2005US20050172198 System and method for retransmission of data
08/04/2005US20050172194 Remote bist high speed test and redundancy calculation
08/04/2005US20050172193 Tap time division multiplexing
08/04/2005US20050172192 Scan based automatic test pattern generation (ATPG) test circuit, test method using the test circuit, and scan chain reordering method
08/04/2005US20050172191 Method and apparatus for transferring hidden signals in a boundary scan test interface
08/04/2005US20050172190 Method and apparatus for accessing hidden data in a boundary scan test interface
08/04/2005US20050172189 Test method for a semiconductor integrated circuit having a multi-cycle path and a semiconductor integrated circuit
08/04/2005US20050172188 Diagnostic method for detection of multiple defects in a Level Sensitive Scan Design (LSSD)
08/04/2005US20050172187 Signal pin tester for AC defects in integrated circuits
08/04/2005US20050172185 Integrated circuit comprising a test mode secured by initialization of the test mode
08/04/2005US20050172184 Method of securing the test mode of an integrated circuit via intrusion detection
08/04/2005US20050172183 Method and system for broadcasting data to multiple tap controllers
08/04/2005US20050172182 Optimal operational voltage identification for a processor design
08/04/2005US20050172181 System and method for production testing of high speed communications receivers
08/04/2005US20050171722 Automatic test equipment operating architecture
08/04/2005US20050171719 System and method for measuring essential power amplification functions
08/04/2005US20050171718 Apparatus for testing a device with a high frequency signal
08/04/2005US20050171647 High impedance fault detection
08/04/2005US20050171421 Magneto-optical apparatus and method for the spatially-resolved detection of weak magnetic fields
08/04/2005US20050170535 Calibration standards for dopants/impurities in silicon and preparation method
08/04/2005US20050170524 Impurity measuring method for Ge substrates
08/04/2005US20050169436 Digital kick meter and graphical user interface (GUI)
08/04/2005US20050169318 Microcomputer that does not cause destruction of peripherals
08/04/2005US20050169167 Line format setting method and communication apparatus using the line format setting method
08/04/2005US20050169076 Protecting an integrated circuit test mode
08/04/2005US20050169072 Pattern generator, memory controller, and test device
08/04/2005US20050169060 Semiconductor integrated circuit device and control method for the semiconductor integrated circuit device
08/04/2005US20050169018 Inverter
08/04/2005US20050168456 Array substrate and display apparatus and method for manufacturing display apparatus
08/04/2005US20050168298 Electromagnetic interface module for balanced data communication
08/04/2005US20050168255 Compensation technique to mitigate aging effects in integrated circuit components
08/04/2005US20050168237 In-tray burn-in broad, device and test assembly for testing integrated circuit devices in situ on processing trays
08/04/2005US20050168236 Test apparatus having multiple test sites at one handler and its test method
08/04/2005US20050168235 Inspection system, inspection method, and method for manufacturing semiconductor device
08/04/2005US20050168234 Contactless circuit testing for adaptive wafer processing
08/04/2005US20050168233 Test system and method for reduced index time
08/04/2005US20050168232 Probing method and prober
08/04/2005US20050168231 Methods and structures for electronic probing arrays
08/04/2005US20050168230 Cap at resistors of electrical test probe
08/04/2005US20050168229 Method and apparatus for measuring electric characteristics of cable assembly, and computer product
08/04/2005US20050168228 Method and apparatus for diagnosing broken scan chain based on leakage light emission
08/04/2005US20050168226 Battery management system and apparatus
08/04/2005US20050168214 Sorting handler for burn-in tester
08/04/2005US20050168212 Optical testing of integrated circuits with temperature control
08/04/2005US20050168201 Circuit arrangement for monitoring a voltage supply, and for reliable locking of signal levels when the voltage supply is below normal
08/04/2005US20050168192 Battery pack
08/04/2005US20050167899 Wafer scale thermal stress fixture and method
08/04/2005US20050167783 Wafer collective reliability evaluation device and wafer collective reliability evaluation method
08/04/2005US20050167400 System and method for decapsulating an encapsulated object
08/04/2005US20050167397 Critical dimension control in a semiconductor fabrication process
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