| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/11/2005 | WO2005073737A1 Measurement device, method, program, and recording medium |
| 08/11/2005 | WO2005072438A2 Multi-signal single beam probe |
| 08/11/2005 | WO2005072406A2 Test system and method for reduced index time |
| 08/11/2005 | WO2005072287A2 Remote bist for high speed test and redundancy calculation |
| 08/11/2005 | WO2005072264A2 System and method for adjusting a pid controller in a limited rotation motor system |
| 08/11/2005 | WO2005072071A2 Signal detector |
| 08/11/2005 | WO2005048548A3 Digital data receiver for edge cellular standard |
| 08/11/2005 | WO2005029725A3 System for the analysis of the operation of a control network of an installation |
| 08/11/2005 | US20050177334 Resistance value calculation method |
| 08/11/2005 | US20050177331 Timing calibration apparatus, timing calibration method, and device evaluation system |
| 08/11/2005 | US20050177330 System and method for optimizing character marking performance |
| 08/11/2005 | US20050177328 Process for the electromagnetic modelling of electronic components and systems |
| 08/11/2005 | US20050177325 System and method for efficient analysis of transmission lines |
| 08/11/2005 | US20050176286 Three-phase electrical receptacle tester |
| 08/11/2005 | US20050176285 Pin-type probes for contacting electronic circuits and methods for making such probes |
| 08/11/2005 | US20050176282 Connector for a measurement element in a battery sensor |
| 08/11/2005 | US20050176225 Method of manufacturing electronic device capable of controlling threshold voltage and ion implanter controller and system that perform the method |
| 08/11/2005 | US20050176159 Method for inspecting a wafer and apparatus for inspecting a wafer |
| 08/11/2005 | US20050175195 Detecting connectivity of a speaker |
| 08/11/2005 | US20050175079 Simultaneous physical and protocol layer analysis |
| 08/11/2005 | US20050174941 Methods and apparatus for controlling the flow of multiple signal sources over a single full duplex ethernet link |
| 08/11/2005 | US20050174808 Quick attachment fixture and power card for diode-based light devices |
| 08/11/2005 | US20050174420 Method and apparatus for measuring forward voltage drop of light emitting element, light source apparatus, and thermal printer |
| 08/11/2005 | US20050174273 Ic with built-in self-test and design method thereof |
| 08/11/2005 | US20050174234 Radio frequency power generation and power measurement |
| 08/11/2005 | US20050174140 Thin film transistor array inspection device |
| 08/11/2005 | US20050174139 Apparatus for high speed probing of flat panel displays |
| 08/11/2005 | US20050174138 Method, circuit and system for determining burn-in reliability from wafer level burn-in |
| 08/11/2005 | US20050174137 Distributed, load sharing power supply system for IC tester |
| 08/11/2005 | US20050174134 Method and apparatus for testing bumped die |
| 08/11/2005 | US20050174133 Probe card |
| 08/11/2005 | US20050174132 Integrated type probe card and its fabrication method |
| 08/11/2005 | US20050174131 Contactless interfacing of test signals with a device under test |
| 08/11/2005 | US20050174126 Apparatus and method for determining the status of an electric power cable |
| 08/11/2005 | US20050174125 Multiple voltage level detection circuit |
| 08/11/2005 | US20050174124 System and method for diagnosing a controller in a limited rotation motor system |
| 08/11/2005 | US20050174122 Quick-connect ballast testing and monitoring method and apparatus |
| 08/11/2005 | US20050174105 Testing apparatus |
| 08/11/2005 | US20050174103 Apparatus and method for determining a current through a power semiconductor component |
| 08/11/2005 | US20050174102 On-chip analysis & computation of transition behaviour of embedded nets in integrated circuits |
| 08/11/2005 | US20050173702 Chip mis-position detection method |
| 08/11/2005 | DE19923362B4 Verfahren zur Bewertung des Kontaktzustandes eines Leistungsschalters A method for evaluating the state of contact of a circuit breaker |
| 08/11/2005 | DE10393445T5 Testgerät und Testverfahren Test apparatus and test procedure |
| 08/11/2005 | DE102005001925A1 Verfahren und Vorrichtung zum Zugriff auf versteckte Daten in einer Boundary Scan Testschnittstelle Method and apparatus for accessing hidden data in a boundary scan test interface |
| 08/11/2005 | DE102005001924A1 Verfahren und Vorrichtung zur Übertragung versteckter Signale in einer BoundaryScan Testschnittstelle Method and apparatus for transmitting signals in a hidden boundary scan test interface |
| 08/11/2005 | DE102004045719A1 Gedruckte-Schaltungsplatine-Testzugangspunktstrukturen und Verfahren zum Herstellen derselben Printed circuit board test access point structures and method of making same |
| 08/11/2005 | DE102004026031B3 Handling device for positioning a test head on a testing device for testing integrated circuits comprises an adjusting unit which can be moved in the vertical direction by a drive spindle, and a counter plate |
| 08/11/2005 | DE102004021163A1 Integrated circuit delay element delay time measurement procedure connects input and output to make ring oscillator for frequency measurement |
| 08/11/2005 | DE102004003293A1 Automobile battery condition is monitored by measuring quiescent current by transient disconnection of controller from power circuit |
| 08/11/2005 | DE102004003198A1 Car battery charge status sensor has passive sensors connected by leads to car body computer unit |
| 08/11/2005 | DE102004001956A1 Umverdrahtungssubstratstreifen mit mehreren Halbleiterbauteilpositionen Rewiring substrate having a plurality of semiconductor component positions |
| 08/11/2005 | DE102004001668A1 Integral electronic amplifier temperature sensor for mobile phone base stations uses threshold comparators connected to digital and analogue inputs and sensor |
| 08/10/2005 | EP1562131A2 Simultaneous analysis of digital data sequences and underlying analog waveforms |
| 08/10/2005 | EP1562049A1 Method for the determination of characteristics for electrical states of a storage battery and corresponding monitoring device |
| 08/10/2005 | EP1562048A1 Battery capacity calculating method, battery capacity calculating apparatus, and battery capacity calculating program |
| 08/10/2005 | EP1561123A1 Semiconductor monitoring instrument |
| 08/10/2005 | EP1561122A2 Retrofit kit for interconnect cabling system |
| 08/10/2005 | EP1516196B1 Device and method for determining a charged state of a battery |
| 08/10/2005 | EP1368672B1 A scan test system and method for manipulating logic values that remain constant during normal operations |
| 08/10/2005 | EP1272860B1 Sensor array and method for detecting the condition of a transistor in a sensor array |
| 08/10/2005 | EP1212606B1 Inspecting component placement relative to component pads |
| 08/10/2005 | EP0839322B1 Microelectronic contact structure and method of making same |
| 08/10/2005 | CN2716849Y Apparatus for testing explosion protection piece of battery |
| 08/10/2005 | CN2716848Y AC measurement apparatus for internal resistance of accumulator |
| 08/10/2005 | CN2716847Y An intelligent monitor for submersible motor |
| 08/10/2005 | CN1653678A Inverter |
| 08/10/2005 | CN1653346A Tester system having a multi-purpose memory |
| 08/10/2005 | CN1653345A Tester system having multiple instruction memories |
| 08/10/2005 | CN1653344A System for testing digital module |
| 08/10/2005 | CN1653343A Module-testing device |
| 08/10/2005 | CN1653341A Test system and method |
| 08/10/2005 | CN1653340A High performance probe system for testing semiconductor wafers |
| 08/10/2005 | CN1652611A Decoding method and decoding apparatus |
| 08/10/2005 | CN1652426A Portable composite battery managing system |
| 08/10/2005 | CN1652390A Battery pack |
| 08/10/2005 | CN1652389A Battery and maintenance service system for power supply device |
| 08/10/2005 | CN1652318A Wafer collective reliability evaluation device and wafer collective reliability evaluation method |
| 08/10/2005 | CN1652087A Method and device for analyzing damage |
| 08/10/2005 | CN1652052A Method for compensating deviation of test temperature |
| 08/10/2005 | CN1651927A On-line observing method for asynchronous motor magetic chain |
| 08/10/2005 | CN1651926A Power cable damage synchronous magnetic field directioning positioning method |
| 08/10/2005 | CN1651925A Method for metering transformer loss |
| 08/10/2005 | CN1214529C Integrated circuit comprising at least two clock systems |
| 08/10/2005 | CN1214483C Charging method for battery |
| 08/10/2005 | CN1214304C Protection circuit for integrated circuit |
| 08/10/2005 | CN1214251C Circuit for detecting leadage in power supply |
| 08/10/2005 | CN1214250C Apparatus and method for testing non-componented printed circuit boards |
| 08/10/2005 | CN1214248C Mechanism for clamping device interface board to peripheral |
| 08/09/2005 | US6928638 Tool for generating a re-generative functional test |
| 08/09/2005 | US6928635 Selectively applying resolution enhancement techniques to improve performance and manufacturing cost of integrated circuits |
| 08/09/2005 | US6928629 System and method for parsing HDL events for observability |
| 08/09/2005 | US6928606 Fault tolerant scan chain for a parallel processing system |
| 08/09/2005 | US6928598 Scan method for built-in-self-repair (BISR) |
| 08/09/2005 | US6928597 Method and apparatus for testing digital circuitry |
| 08/09/2005 | US6928596 Test circuit of semiconductor integrated circuit |
| 08/09/2005 | US6928586 Method and apparatus for saving peripheral device states of a microcontroller |
| 08/09/2005 | US6928581 Innovative bypass circuit for circuit testing and modification |
| 08/09/2005 | US6928377 Self-test architecture to implement data column redundancy in a RAM |
| 08/09/2005 | US6928375 Inspection condition setting program, inspection device and inspection system |
| 08/09/2005 | US6928372 Method for estimating time to full-charge in a rechargeable battery |