Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2005
08/18/2005DE102004004173A1 Detecting a disconnected battery on an in board vehicle circuit uses frequency or voltage analysis unit to identify a defect or disconnection
08/18/2005DE102004004172A1 Determination of a defective automobile electrical battery based upon measurement of battery current
08/17/2005EP1564709A2 A method for measuring forward voltage drop
08/17/2005EP1564561A1 Detecting connectivity of a speaker
08/17/2005EP1564366A1 Method for trenchless laying of plastic pipes
08/17/2005EP1563672A1 A self learning system and method for predicting remaining usage time for different modes of a mobile device
08/17/2005EP1563392A2 Interface circuit
08/17/2005EP1563390A1 Integrated circuit having multiple modes of operation
08/17/2005EP1563386A1 A method and apparatus for decomposing and verifying configurable hardware
08/17/2005EP1563380A2 Virtual to physical memory address mapping within a system having a secure domain and a non-secure domain
08/17/2005EP1488245A4 Apparatus for interfacing electronic packages and test equipment
08/17/2005EP1485700A4 Battery monitoring method and apparatus
08/17/2005EP1468302B1 Electric motor monitoring system
08/17/2005EP1388015B1 Contact control and contact monitoring
08/17/2005EP1382104B1 Method and device for measuring the temperature of windings of a drive motor
08/17/2005EP1377842A4 Method of detecting carrier dose of a semiconductor wafer
08/17/2005EP1311825A4 Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages
08/17/2005EP1256009B1 Lssd interface
08/17/2005EP1221056B1 Sensor for detecting high-frequency oscillations of an electrical voltage and an arrangement of such a sensor
08/17/2005EP1064716B1 Electric motor monitoring circuit and method
08/17/2005EP0859686B1 Fabricating interconnects and tips using sacrificial substrates
08/17/2005CN2718640Y Portable electrohydraulic actuator on-line check meter
08/17/2005CN2718595Y Electric current balance error detecting circuit for CCFL back light system
08/17/2005CN2718594Y Switching device for inverter battery voltage measurement
08/17/2005CN2718593Y Electric cable local discharge on-line monitoring apparatus
08/17/2005CN2718592Y Neultral point low-resistance grounding mode power supply line fault whole function indicatior
08/17/2005CN2718591Y Dielectric loss on-line monitoring device for capacitive electric equipment
08/17/2005CN2718584Y Testing device for testing determined panel
08/17/2005CN1656598A Large substrate test system
08/17/2005CN1656386A Method and control circuitry for accessing multiple taps (test access ports) via a single tap
08/17/2005CN1656385A Cell with fixed output voltage for integrated circuit
08/17/2005CN1655649A Detecting connectivity of a speaker
08/17/2005CN1655352A Method and device for storing and presetting microelectronic circuit status
08/17/2005CN1655342A Device package and methods for the fabrication and testing thereof
08/17/2005CN1655335A Method of inspecting a semiconductor dynamic quantity sensor
08/17/2005CN1655219A Shared buffer display panel drive methods and systems
08/17/2005CN1654974A Energy storage system state of charge diagnostic
08/17/2005CN1654973A Scan based self-testing structure and method adopting weighted scanning strobe signal
08/17/2005CN1654972A Twelve bits counting compression circuit
08/17/2005CN1654971A Device and method for accessing hidden data in boundary scan test interface
08/17/2005CN1654970A Device and method for transmitting hidden signal in boundary scan test interface
08/17/2005CN1654969A Electron beam test system with integrated substrate transfer module
08/17/2005CN1654968A A method and a device for measuring forward voltage drop of a light emitting element, light source device and thermal printer
08/17/2005CN1654967A Resistance value calculation method
08/17/2005CN1654966A Transient current measuring method and system for IC chip
08/17/2005CN1654964A Contact film probe and manufacturing method thereof
08/17/2005CN1654947A Component mounting board inspecting apparatus
08/17/2005CN1215753C Machine for pick-up of device in processor
08/17/2005CN1215545C Semiconductor test device
08/17/2005CN1215544C Equipment for identifying working height of device conveying system and its method
08/17/2005CN1215338C Constant pulsed light xenon lamp solar cell testing method
08/17/2005CN1214839C Inductive sensory appts.
08/16/2005US6931620 Inspection method and inspection system using charged particle beam
08/16/2005US6931609 Capacitance parameters calculation method for MOSFET and program therefor
08/16/2005US6931606 Automatic method and system for instantiating built-in-test (BIST) modules in ASIC memory designs
08/16/2005US6931579 Integrated excitation/extraction system for test and measurement
08/16/2005US6931572 Design instrumentation circuitry
08/16/2005US6931565 Semiconductor memory
08/16/2005US6931349 Jitter measuring system in high speed data output device and total jitter measuring method
08/16/2005US6931346 Method and apparatus for reduced pin count package connection verification
08/16/2005US6931345 Method for quantifying safe operating area for bipolar junction transistor
08/16/2005US6931344 Test circuit and semiconductor integrated circuit effectively carrying out verification of connection of nodes
08/16/2005US6931338 System for providing a calibrated path for multi-signal cables in testing of integrated circuits
08/16/2005US6931336 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
08/16/2005US6931332 Method and system for testing battery connectivity
08/16/2005US6931301 System processing time computation method computation device, and recording medium with computation program recorded thereon
08/16/2005US6931003 Packet prioritization protocol for a large-scale, high speed computer network
08/16/2005US6930979 Method and system for multi-PHY addressing
08/16/2005US6930947 Power source detector
08/16/2005US6930938 Semiconductor memory device having test mode
08/16/2005US6930868 Apparatus and method of detecting ground fault of solar power generation system
08/16/2005US6930744 LCD device having test contact pads
08/16/2005US6930610 Monitoring system and method for wiring systems
08/16/2005US6930564 Providing controllable impedance at a reference plane in a circuit
08/16/2005US6930504 Semiconductor integrated circuit device
08/16/2005US6930503 System for testing integrated circuit devices
08/16/2005US6930502 Method using conductive atomic force microscopy to measure contact leakage current
08/16/2005US6930500 IDDQ testing of CMOS mixed-signal integrated circuits
08/16/2005US6930499 Method of manufacturing an integrated circuit, integrated circuit obtained in accordance with said method, wafer provided with an integrated circuit obtained in accordance with the method, and system comprising an integrated circuit obtained by means of the method
08/16/2005US6930498 Membrane probing system
08/16/2005US6930494 Capacitive probe assembly with flex circuit
08/16/2005US6930491 Partial discharge detection test link, partial discharge detection system and methods for detecting partial discharge on a power cable
08/16/2005US6930490 Traction motor fault detection system
08/16/2005US6930488 Method and apparatus for accelerated SER testing of circuitry
08/16/2005US6930485 Electronic battery tester with battery failure temperature determination
08/16/2005US6930465 Residual capacity correction method for battery
08/16/2005US6930088 Conformationally constrained backbone cyclized somatostatin analogs
08/16/2005US6929962 System and method for wafer acceptance test configuration
08/16/2005US6929486 Socket for electrical parts and method for using the same
08/12/2005CA2496431A1 Method and system for continuity testing of medical electrodes
08/11/2005WO2005074328A1 Organic el panel
08/11/2005WO2005074127A1 A driver circuit
08/11/2005WO2005074091A2 Method and apparatus for monitoring energy storage devices
08/11/2005WO2005073819A1 System and method for diagnosing a controller in a limited rotation motor system
08/11/2005WO2005073783A1 System and method for optimizing character marking performance
08/11/2005WO2005073782A1 System and method for virtual laser marking
08/11/2005WO2005073742A1 System and method for monitoring a vehicle battery
08/11/2005WO2005073741A1 Method and apparatus for testing integrated circuits for susceptibility to latch-up
08/11/2005WO2005073740A1 Testing apparatus and testing method
08/11/2005WO2005073739A1 Digital subscriber line user capacity estimation