| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/24/2005 | CN1657958A Substrate detection device and detection method |
| 08/24/2005 | CN1657957A Testing regulating device and method of quartz crystal osciuator |
| 08/24/2005 | CN1216413C Quick evaluation method for reliability of microelectronic device |
| 08/24/2005 | CN1216298C Device for measuring battery charging capacity of battery truck and alarm device for capacity inadequate |
| 08/24/2005 | CN1216297C Contact MEMS switch service life testing method and instrument |
| 08/24/2005 | CN1216296C Method and apparatus of nondestructive insulation test for small electric machine |
| 08/24/2005 | CN1216295C Apparatus and method for inspection |
| 08/24/2005 | CN1216294C Method for testing single phase grounding current of electric distribution network |
| 08/24/2005 | CN1216293C Probe device |
| 08/23/2005 | US6934921 Resolving LBIST timing violations |
| 08/23/2005 | US6934919 Semiconductor device having embedded array |
| 08/23/2005 | US6934900 Test pattern generator for SRAM and DRAM |
| 08/23/2005 | US6934898 Test circuit topology reconfiguration and utilization techniques |
| 08/23/2005 | US6934897 Scheduling the concurrent testing of multiple cores embedded in an integrated circuit |
| 08/23/2005 | US6934896 Time shift circuit for functional and AC parametric test |
| 08/23/2005 | US6934895 I/O compression circuit for a semiconductor memory device |
| 08/23/2005 | US6934885 Fail thresholding in a batch simulation farm network |
| 08/23/2005 | US6934884 One-chip microcomputer and control method thereof as well as an IC card having such a one-chip microcomputer |
| 08/23/2005 | US6934670 Virtual test environment |
| 08/23/2005 | US6934669 Capacitance measurements for an integrated circuit |
| 08/23/2005 | US6934656 Auto-linking of function logic state with testcase regression list |
| 08/23/2005 | US6934655 Method and apparatus for transmission line analysis |
| 08/23/2005 | US6934648 Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal |
| 08/23/2005 | US6934647 Efficient sampling of digital waveforms for eye diagram analysis |
| 08/23/2005 | US6934250 Method and apparatus for an output packet organizer |
| 08/23/2005 | US6934204 Semiconductor device with reduced terminal input capacitance |
| 08/23/2005 | US6934132 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system |
| 08/23/2005 | US6933873 PWM-based measurement interface for a micro-machined electrostatic actuator |
| 08/23/2005 | US6933868 Testing of mixed signal integrated circuits generating analog signals from digital data elements |
| 08/23/2005 | US6933853 Apparatus and method for detecting and communicating interconnect failures |
| 08/23/2005 | US6933747 Structures and methods of testing interconnect structures in programmable logic devices |
| 08/23/2005 | US6933743 Dual mode analog differential and CMOS logic circuit |
| 08/23/2005 | US6933742 Chip card circuit with monitored access to a test mode |
| 08/23/2005 | US6933741 Electrostatic discharge testers for undistorted human-body-model and machine-model characteristics |
| 08/23/2005 | US6933740 Electronic circuit inspection sensor and inspection system using same |
| 08/23/2005 | US6933739 Ring oscillator system |
| 08/23/2005 | US6933736 Prober |
| 08/23/2005 | US6933731 Method and system for determining transistor degradation mechanisms |
| 08/23/2005 | US6933730 Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies |
| 08/23/2005 | US6933729 Method and apparatus for measuring on-chip power supply integrity |
| 08/23/2005 | US6933728 Method and apparatus for measuring voltage of battery module of electric vehicle |
| 08/23/2005 | US6933727 Electronic battery tester cable |
| 08/23/2005 | US6933692 Diagnostic method for an electric drive assembly |
| 08/23/2005 | US6933628 High speed channel selector switch |
| 08/23/2005 | US6932635 Electronic component testing socket and electronic component testing apparatus using the same |
| 08/23/2005 | US6932174 Capacity indicating device and method thereof |
| 08/23/2005 | CA2356538C Model-based fault detection system for electric motors |
| 08/18/2005 | WO2005076428A1 High impedance fault detection |
| 08/18/2005 | WO2005076141A1 Signal generator provided with license control function and license control method thereof |
| 08/18/2005 | WO2005076132A2 A test system |
| 08/18/2005 | WO2005076025A1 Monitoring capacity of a rechargeable battery |
| 08/18/2005 | WO2005076023A1 Test equipment |
| 08/18/2005 | WO2005076022A1 Semiconductor integrated circuit, and semiconductor system including that semiconductor integrated circuit |
| 08/18/2005 | WO2005076021A1 Measurement instrument, measurement method, and test instrument |
| 08/18/2005 | WO2005076020A1 Method and device for detecting a temperature-dependent operating parameter of a component |
| 08/18/2005 | WO2005076019A2 Digital kick meter and graphical user interface (gui) |
| 08/18/2005 | WO2005076018A1 Needle-like member, conductive contact, and conductive contact unit |
| 08/18/2005 | WO2005059576A3 Loop resistance tester |
| 08/18/2005 | WO2005008737A3 Inspection and metrology module cluster tool with multi-tool manager |
| 08/18/2005 | US20050183047 Circuit for generating an identification code for an IC |
| 08/18/2005 | US20050182588 Test system for integrated circuits with serdes ports |
| 08/18/2005 | US20050182587 Circuit quality evaluation method and apparatus, circuit quality evaluation program, and medium having the program recorded thereon |
| 08/18/2005 | US20050182586 Digital circuit for frequency and timing characterization |
| 08/18/2005 | US20050182585 Structure and method for package burn-in testing |
| 08/18/2005 | US20050182583 Testing apparatus |
| 08/18/2005 | US20050182536 Methods and apparatus for determining battery characteristics in a vehicle |
| 08/18/2005 | US20050182398 Method and system for continuity testing of medical electrodes |
| 08/18/2005 | US20050181656 Socket for electrical parts |
| 08/18/2005 | US20050180844 Device handling system and method |
| 08/18/2005 | US20050180333 xDSL line tester |
| 08/18/2005 | US20050180322 TCP time stamp processing in hardware based TCP offload |
| 08/18/2005 | US20050180318 Subordinate apparatus and superordinate apparatus |
| 08/18/2005 | US20050180196 Cell with fixed output voltage for integrated circuit |
| 08/18/2005 | US20050179576 Test circuit for evaluating characteristic of analog signal of device |
| 08/18/2005 | US20050179460 Method and apparatus for testing semiconductor device chip wafer |
| 08/18/2005 | US20050179459 Method and system for testing an electronic device |
| 08/18/2005 | US20050179458 Cantilever microprobes for contacting electronic components and methods for making such probes |
| 08/18/2005 | US20050179457 Burn-in test apparatus for BGA packages using forced heat exhaust |
| 08/18/2005 | US20050179456 High density cantilevered probe for electronic devices |
| 08/18/2005 | US20050179455 Probing a device |
| 08/18/2005 | US20050179454 Probes with perpendicularly disposed spring pins, and methods of making and using same |
| 08/18/2005 | US20050179453 Integrated substrate transfer module |
| 08/18/2005 | US20050179452 Configurable prober for TFT LCD array test |
| 08/18/2005 | US20050179451 Configurable prober for TFT LCD array testing |
| 08/18/2005 | US20050179442 Device for testing cables provided with luminous signals |
| 08/18/2005 | US20050179441 Circuit arrangement and method for determining the load current through an inductive load connected to a supply voltage in a clocked manner |
| 08/18/2005 | US20050179440 Method of inspecting a semiconductor dynamic quantity sensor |
| 08/18/2005 | US20050179427 Probe station |
| 08/18/2005 | US20050179426 Liquid crystal substrate inspection apparatus |
| 08/18/2005 | US20050179035 Apparatus and method to access a plurality of pn-junctions with a limited number of pins |
| 08/18/2005 | US20050178815 Method for preparing integrated circuit modules for attachment to printed circuit substrates |
| 08/18/2005 | US20050178754 Earth connections for workpieces |
| 08/18/2005 | US20050178702 Membrane zeta potential measuring system |
| 08/18/2005 | DE19612713B4 Einrichtung in einer Halbleiterfertigungsanlage, insbeosndere für integrierte Schaltungen Means in a semiconductor fabrication facility, insbeosndere for integrated circuits |
| 08/18/2005 | DE10297763T5 Prüfgerät für elektronische Bauelemente An electronic component tester |
| 08/18/2005 | DE102005003464A1 Batterieeinheit Battery pack |
| 08/18/2005 | DE102005001686A1 Schaltungsanordung zum Detektieren eines Kurzschlusses Circuit arrangement for detecting a short-circuit |
| 08/18/2005 | DE102004041008A1 Electrical supply network with short-, open-circuit detection for motor vehicle on-board electrical system has supply line system with detection line system connected to detector circuit at one end, terminating element at further end(s) |
| 08/18/2005 | DE102004006052A1 Prüfverfahren zum Erfassen eines temperaturabhängigen Betriebsparameters eines elektronischen Bauelementes und Prüfvorrichtung Test method for detecting a temperature-dependent operating parameter of an electronic device and testing unit |
| 08/18/2005 | DE102004004280A1 Car battery diagnosis procedure uses neural network with Lemal algorithm and learning from reference battery to construct model for comparison with actual battery status |