| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 08/30/2005 | US6936483 On-wafer burn-in of semiconductor devices using thermal rollover |
| 08/30/2005 | US6935020 Method of producing a battery-connecting plate |
| 08/30/2005 | CA2318318C High-speed test cycle counter |
| 08/25/2005 | WO2005078769A2 Manufacturing integrated circuits |
| 08/25/2005 | WO2005078736A1 Semiconductor device testing apparatus and testing method |
| 08/25/2005 | WO2005078673A1 Remote battery monitoring system having embedded telesensors |
| 08/25/2005 | WO2005078584A1 Performance improvement apparatus for hardware-assisted verification using massive memory and compilation avoidance and its verification method using the same |
| 08/25/2005 | WO2005078465A1 Integrated circuit chip with communication means enabling remote control of testing means of ip cores of the integrated circuit |
| 08/25/2005 | WO2005078464A1 Method and device for testing a phase locked loop |
| 08/25/2005 | WO2005078463A1 Test equipment |
| 08/25/2005 | WO2005078459A1 Quick attachment fixture and power card for diode-based light devices |
| 08/25/2005 | WO2005078397A1 Radiometric level gauge |
| 08/25/2005 | WO2005077024A2 Methods and apparatus for data analysis |
| 08/25/2005 | WO2005076909A2 Methods and apparatus for controlling the flow of multiple signal sources over a single full duplex ethernet link |
| 08/25/2005 | WO2005076885A2 Contactless interfacing of test signals with a device under test |
| 08/25/2005 | WO2005055487A3 Network message processing using inverse pattern matching |
| 08/25/2005 | WO2005050898A3 Method and apparatuses for using packet data to manage a data stream in a broadband communications system |
| 08/25/2005 | WO2005029747A3 System and method for locating and determining discontinuities in a communications medium using frequency domain correlation |
| 08/25/2005 | WO2004102594B1 Method and testing equipment for checking the operation of a lightning arrester |
| 08/25/2005 | US20050188340 Method of designing semiconductor integrated circuit |
| 08/25/2005 | US20050188290 Method and structure for picosecond-imaging-circuit-analysis based built-in-self-test diagnostic |
| 08/25/2005 | US20050188289 Method for system performance testing and self correcting action |
| 08/25/2005 | US20050188287 Testing and repair methodology for memories having redundancy |
| 08/25/2005 | US20050187729 Dynamic waveform resource management |
| 08/25/2005 | US20050186776 Evaluating a multi-layered structure for voids |
| 08/25/2005 | US20050186726 Scan testing system, method and apparatus |
| 08/25/2005 | US20050186483 Method for determining a map, device manufacturing method, and lithographic apparatus |
| 08/25/2005 | US20050186326 High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments |
| 08/25/2005 | US20050185769 Calibration method and apparatus |
| 08/25/2005 | US20050185708 Apparatus for measuring jitter, method of measuring jitter and computer-readable medium storing a program thereof |
| 08/25/2005 | US20050185578 Methods and systems for streaming data |
| 08/25/2005 | US20050185485 Semiconductor wafer, semiconductor chip, and manufacturing method of semiconductor device |
| 08/25/2005 | US20050185484 Semiconductor memory device having test mode for data access time |
| 08/25/2005 | US20050185479 Method and device for saving and setting a circuit state of a microelectronic circuit |
| 08/25/2005 | US20050185213 Erroneous cable connection detecting system of printer and method thereof |
| 08/25/2005 | US20050184771 Semiconductor apparatus |
| 08/25/2005 | US20050184764 Method and apparatus for detecting on-die voltage variations |
| 08/25/2005 | US20050184751 Method and apparatus for detection of brush sparking and spark erosion on electrical machines |
| 08/25/2005 | US20050184750 Testing device for printed circuit boards |
| 08/25/2005 | US20050184749 Control system and method of semiconductor inspection system |
| 08/25/2005 | US20050184748 Pin-type probes for contacting electronic circuits and methods for making such probes |
| 08/25/2005 | US20050184747 Spring plunger probe |
| 08/25/2005 | US20050184745 Probe card |
| 08/25/2005 | US20050184744 Wafer probe station having a skirting component |
| 08/25/2005 | US20050184743 Probe card |
| 08/25/2005 | US20050184742 Device monitor for RF and DC measurement |
| 08/25/2005 | US20050184741 Multi-function probe card |
| 08/25/2005 | US20050184739 Delay lock circuit having self-calibrating loop |
| 08/25/2005 | US20050184738 Apparatus and method for monitoring electrical cable chafing via optical waveguides |
| 08/25/2005 | US20050184737 Method and system for measuring partial discharge |
| 08/25/2005 | US20050184736 In-circuit measurement of saturation flux density Bsat, coercivity Hc, and permiability of magnetic components using a digital storage oscilloscope |
| 08/25/2005 | US20050184732 Replaceable clamp for electronic battery tester |
| 08/25/2005 | US20050184724 Inspecting apparatus for liquid crystal displays |
| 08/25/2005 | US20050184723 Circuit board component ambient moisture exposure monitoring |
| 08/25/2005 | US20050184720 Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability |
| 08/25/2005 | US20050184593 Battery communication system |
| 08/25/2005 | US20050184236 Probe current imaging |
| 08/25/2005 | US20050184235 Image processing method, image processing apparatus and semiconductor manufacturing method |
| 08/25/2005 | US20050184028 Probe tip processing |
| 08/25/2005 | US20050183504 Apparatus and method for detecting vibrations of the shaft assembly in an electrical machine |
| 08/25/2005 | DE60012132T2 Mikroprozessor mit Prüfinstruktionsspeicher Microprocessor with Prüfinstruktionsspeicher |
| 08/25/2005 | DE19549779B4 Vehicular diagnostic system using data from electronic control unit partic. for data communications protocol - has integrated circuit interfaced to ECU, with memory cartridge ROM contg. diagnostic program for partic. vehicle to be tested, and design data for reprogramming interface |
| 08/25/2005 | DE10393447T5 Mehrabtastsignal-Gerät, Testgerät und Einstellverfahren Mehrabtastsignal equipment, test equipment and setting |
| 08/25/2005 | DE10393444T5 Mustergenerator, Speichersteuervorrichtung und Prüfvorrichtung Pattern generator, storage control device and testing unit |
| 08/25/2005 | DE10352527B3 Determining state of switchgear contact assembly from electromagnetic arcing radiation, compares initiation instant of electromagnetic emission with timing mark measurement |
| 08/25/2005 | DE10297807T5 Datenverarbeitungsverfahren eines logischen Prüfgeräts Data processing method of a logic tester |
| 08/25/2005 | DE10256588B4 Verfahren und Vorrichtung zur Batteriezustandserkennung Method and apparatus for battery state identification |
| 08/25/2005 | DE102004048687A1 Bildanzeigevorrichtung und Inspektionsverfahren für diese An image display apparatus and inspection procedures for this |
| 08/25/2005 | DE102004007910A1 Test device for checking motor vehicle control units prior to installation has a receiving device for the control units and a test device which causes the control units to generate a message indicating their type and version |
| 08/25/2005 | DE102004005551A1 Test report generating device, e.g. for testing electrical units and appliances to ensure they conform to health and safety requirements, has test and appliance data input means and test data signing means |
| 08/25/2005 | DE102004004808A1 Maintenance of the state of a microelectronic circuit, in which certain circuit sections can be turned off, whereby a scan chain used for circuit testing is also used to collect register contents and then shift them into memory |
| 08/25/2005 | DE102004001692A1 Prüfverfahren und Prüfeinrichtung für einen Piezoaktor Test methods and testing device for a piezoelectric actuator |
| 08/24/2005 | EP1566648A1 Method for the determination of at least one characteristic for the state of a electrochemical storage battery and monitoring device |
| 08/24/2005 | EP1566647A1 Particle beam device probe operation |
| 08/24/2005 | EP1566646A1 Method and system for measuring partial discharge |
| 08/24/2005 | EP1566645A2 Method and system for continuity testing of medical electrodes |
| 08/24/2005 | EP1566643A1 Method for checking-on-overload of the current output of an electrical equipment, and for checking such an equipment |
| 08/24/2005 | EP1566642A1 Probe card |
| 08/24/2005 | EP1565989A1 Self-adjusting programmable on-chip clock aligner |
| 08/24/2005 | EP1086382B1 Measuring and compensating for warp in the inspection of printed circuit board assemblies |
| 08/24/2005 | CN2720651Y Cell clamp |
| 08/24/2005 | CN2720642Y Non-crystal-silicon solar cell diagnosis and therapy instrument |
| 08/24/2005 | CN2720457Y Semiconductor laser characteristic parameter testing device |
| 08/24/2005 | CN2720456Y Semiconductor laser detection device |
| 08/24/2005 | CN2720455Y Device for measuring permanent couple polar moment of single atomic gas |
| 08/24/2005 | CN2720454Y Infrared telecontroller tester |
| 08/24/2005 | CN1659745A Connector, electronic component fixing device, and tester |
| 08/24/2005 | CN1659442A Device and method of testing an electronic component |
| 08/24/2005 | CN1659064A Circuit for detecting ground offset of parts of a network |
| 08/24/2005 | CN1658463A Discriminiting element for developmental fault of high-voltage transmission line of power system |
| 08/24/2005 | CN1658379A Structure and method of strengthening testing of packaged |
| 08/24/2005 | CN1658164A Host panel functional test board |
| 08/24/2005 | CN1657966A On-line testing system for capacity of vehicle lead-acid battery |
| 08/24/2005 | CN1657965A Circuit board testing apparatus |
| 08/24/2005 | CN1657964A Automatic testing method of filter |
| 08/24/2005 | CN1657963A Method and system for measuring partial discharge |
| 08/24/2005 | CN1657962A AC-DC high-voltage insulator passive tester |
| 08/24/2005 | CN1657961A Improved method of oscillating testing and deblocking |
| 08/24/2005 | CN1657960A Low-voltage electric network sequential discriminating leakage selecting method and protector for mine |
| 08/24/2005 | CN1657959A Rang-measuring method for transmission line one-phase earth fault of small current neutral grounding system |