Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2005
09/01/2005US20050189920 Monitoring device and method for determining at least one characteristic variable for the state of a battery
09/01/2005US20050189919 Battery pack and remaining battery power calculation method
09/01/2005US20050189918 Energy storage system state of charge diagnostic
09/01/2005US20050189817 Power supply loading indicators and methods
09/01/2005US20050189649 LSI package, LSI element testing method, and semiconductor device manufacturing method
09/01/2005US20050189540 Module inspection fixture
09/01/2005US20050189267 Method for sorting integrated circuit devices
09/01/2005DE19680786B4 Halbleiterbauelement-Testgerät The semiconductor device testing apparatus
09/01/2005DE19642639B4 Vorrichtung zur Prüfung des Anschlusses von Meßleiterpaaren Apparatus for testing the connection of Meßleiterpaaren
09/01/2005DE10393272T5 Hochgeschwindigkeits-Halbleitertestsystem High-speed semiconductor test system
09/01/2005DE10393200T5 System und Verfahren zum Detektieren eines Wechselstromgenerator - bzw. Lichtmaschinenzustands System and method for detecting an alternating current generator - or alternators state
09/01/2005DE102005005554A1 Verfahren zur Überprüfung eines Halbleitersensors für eine dynamische Grösse A method for checking a semiconductor dynamic quantity sensor
09/01/2005DE102004059185A1 Elektronenstrahl-Testsystem mit intergrierter Substratüberführungseinheit Electron beam test system with integrated substrate transfer unit
09/01/2005DE102004010275B3 Monitoring device for laser light cable has third electrical circuit for monitoring capacitance between inner and outer metal casings in addition to first and second monitoring circuits
09/01/2005DE102004007680A1 Radiometrisches Meßgerät Radiometric meter
09/01/2005DE102004007353A1 Locking and correct coupling arrangement for plug connector with two interconnectable parts for forming accomplished electric connection, mainly in car cable harness
09/01/2005DE102004006298A1 Verbindungsanordnung für ein Messelement eines Batteriesensors Connection arrangement for a sensing element of a battery sensor
09/01/2005DE102004005478A1 Verfahren zur Bestimmung von Kenngrößen für elektrische Zustände einer Speicherbatterie und Überwachungseinrichtung hierzu A method for the determination of parameters for electrical states of a storage battery monitoring device and for this purpose
09/01/2005DE102004004729A1 Schaltungsanordnung zum Überwachen einer Spannungsversorgung und sicheren Verriegeln von Signalpegeln bei Spannungsunterversorgung Circuit arrangement for monitoring a supply voltage and safe locking of signal levels at voltage supply
09/01/2005CA2498545A1 Power supply noise measuring device
08/2005
08/31/2005EP1569005A2 Calibration method and apparatus
08/31/2005EP1569004A1 Mounting-error inspecting method and substrate inspecting apparatus using the method
08/31/2005EP1569000A2 Probe card
08/31/2005EP1568985A2 Apparatus for surface inspection and method and apparatus for inspecting substrate
08/31/2005EP1568983A1 Instrument for testing solid-state imaging device
08/31/2005EP1567877A1 Method and device for determining battery status
08/31/2005EP1567876A1 Secondary battery replacement method
08/31/2005EP1567875A1 Diagnosis system for household electric appliances
08/31/2005EP1567873A2 Method and apparatus for locating a discharge in a stator of an electrical machine
08/31/2005EP1567872A2 A method of and apparatus for testing for integrated circuit contact defects
08/31/2005EP1567871A2 Probe station with low inductance path
08/31/2005EP1567759A1 Monitoring method for an actuator and corresponding driver circuit
08/31/2005EP1436822A4 Smart awa
08/31/2005EP1282913B1 Wireless radio frequency testing method of integrated circuits and wafers
08/31/2005EP1153311B1 Method and apparatus for determining characteristic parameters of a charge storage device
08/31/2005CN2722267Y Automatic pointer-type tester of battery
08/31/2005CN2722266Y Digital leakage protective switch tester
08/31/2005CN2722265Y DC grounding on-line tester
08/31/2005CN2722264Y Safety alarming device of electric power transmission line
08/31/2005CN2722263Y Up-line device of fault measuring device for high-voltage transmission line
08/31/2005CN2722262Y Safety monitor of high-voltage transmission line
08/31/2005CN2722261Y Igniting system electrical device and circuit repairing tester of motorcycle
08/31/2005CN2722254Y Testing needle structural improvement of base board detection
08/31/2005CN2721327Y Flexible screw driver with illuminating electric tester
08/31/2005CN2721326Y Flexible screw driver of illuminating electric tester
08/31/2005CN1663165A Fault-tolerant broadcast router
08/31/2005CN1662823A Electromigration test apparatus and an electromigration test method
08/31/2005CN1662822A System for burn-in testing of electronic devices
08/31/2005CN1662821A Placing table drive device and probe method
08/31/2005CN1662820A Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs
08/31/2005CN1662819A Test method for yielding a known good die
08/31/2005CN1661919A Operation mode setting circuit
08/31/2005CN1661847A Battery of possessing function for displaying surplus energy and method
08/31/2005CN1661388A System-on-chip (SOC) having built-in-self-test circuits and a self-test method of the SOC
08/31/2005CN1661387A Inspection system, inspection method, and method for manufacturing semiconductor device
08/31/2005CN1661386A Controller and checker using same
08/31/2005CN1661385A JTAG module and debug method applying the module
08/31/2005CN1661384A Device for testing electric pulse strength for insulation
08/31/2005CN1661383A Three-layered automatic test system for safety regulations in master slaver mode
08/31/2005CN1661382A Testing apparatus
08/31/2005CN1661381A Simulator of AC electronic load suitable to any waveform of AC signal
08/31/2005CN1661378A Thin film transistor array, method and device for testing a thin film transistor array
08/31/2005CN1661377A Method for testing a thin film transistor array
08/31/2005CN1661376A 探针卡 Probe Card
08/31/2005CN1661375A 探针卡 Probe Card
08/31/2005CN1661323A Apparatus for surface inspection and method and apparatus for inspecting substrate
08/31/2005CN1217466C Household electric user having electronic contonic contorl, and contorl and programming system thereof
08/31/2005CN1217198C Low profile pneumatically actuated docking module with power fault release
08/31/2005CN1217197C Probe card for LCD detection
08/30/2005US6938228 Simultaneously simulate multiple stimuli and verification using symbolic encoding
08/30/2005US6938225 Scan design for double-edge-triggered flip-flops
08/30/2005US6938194 Integrated circuit testing method and system
08/30/2005US6938192 Method and system for increasing reliability of data packet transmission against impulsive noise in powerline communication systems
08/30/2005US6938191 Access control device and testing method
08/30/2005US6937965 Statistical guardband methodology
08/30/2005US6937956 Testing unit and self-evaluating device
08/30/2005US6937949 System and method of processing a data signal
08/30/2005US6937944 Frequency domain reflectometry system for baselining and mapping of wires and cables
08/30/2005US6937572 Call trace on a packet switched network
08/30/2005US6937569 Method and system for determining a relative position of a device on a network
08/30/2005US6937051 Integrated circuit that can be externally tested through a normal signal output pin
08/30/2005US6937050 Non-contact mobile charge measurement with leakage band-bending and dipole correction
08/30/2005US6937049 Parallel testing of integrated circuits
08/30/2005US6937048 Method for testing an integrated circuit with an external potential applied to a signal output pin
08/30/2005US6937047 Integrated circuit with test pad structure and method of testing
08/30/2005US6937046 Non-invasive, low pin count test circuits and methods
08/30/2005US6937044 Bare die carrier
08/30/2005US6937043 Apparatus and method for testing electronic component
08/30/2005US6937038 Contactor having conductive particles in a hole as a contact electrode
08/30/2005US6937037 Probe card assembly for contacting a device with raised contact elements
08/30/2005US6937035 Method and apparatus for inspecting printed circuit boards
08/30/2005US6937030 Testing electrical integrity of electrically heated subsea pipelines
08/30/2005US6937029 Method for detection of a shielding fault in a multiwire cable
08/30/2005US6937028 Resistor value detection circuit
08/30/2005US6937027 Hybrid type sensor for detecting high frequency partial discharge
08/30/2005US6937025 Method and circuit employing current sensing to read a sensor
08/30/2005US6937006 Pin electronics interface circuit
08/30/2005US6937004 Test mark and electronic device incorporating the same
08/30/2005US6936920 Voltage contrast monitor for integrated circuit defects
08/30/2005US6936889 Semiconductor device and method for testing semiconductor device