| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/07/2005 | CN1664598A Method for automatically orientating line fault of electrical power system by using time mark grouping |
| 09/07/2005 | CN1664597A Insulation monitoring method for low current neutral grounding systems and apparatus for realizing the method |
| 09/07/2005 | CN1664596A Detection equipment for LCD module |
| 09/07/2005 | CN1664593A Device for measuring electrical double layer streaming potential in thin-film lubrication |
| 09/07/2005 | CN1664536A Method and equipment for detecting liquid crystal panel clearance size |
| 09/07/2005 | CN1664535A Automatic measuring system for visual angle of liquid crystal display |
| 09/07/2005 | CN1663864A Track circuit compensation capacitance testing device and method |
| 09/07/2005 | CN1663698A Optical coupling screening device |
| 09/07/2005 | CN1218321C Memory device |
| 09/07/2005 | CN1218187C Method and apparatus for detecting failed thyristor |
| 09/07/2005 | CN1218186C Sensitive-element current-voltage characteristic measuring apparatus |
| 09/07/2005 | CN1217813C Modulator mis-wire test device and method |
| 09/06/2005 | US6941530 Method of cross-mapping integrated circuit design formats |
| 09/06/2005 | US6941529 Method and system for using emission microscopy in physical verification of memory device architecture |
| 09/06/2005 | US6941498 Technique for debugging an integrated circuit having a parallel scan-chain architecture |
| 09/06/2005 | US6941497 N-squared algorithm for optimizing correlated events |
| 09/06/2005 | US6941496 Error detecting circuit for detecting the location of error |
| 09/06/2005 | US6941258 Method, apparatus and computer program product for determination of noise in mixed signal systems |
| 09/06/2005 | US6941235 Method and system for analyzing quiescent power plane current (IDDQ) test data in very-large scale integrated (VLSI) circuits |
| 09/06/2005 | US6941234 Query based electronic battery tester |
| 09/06/2005 | US6941232 Method and apparatus for performing multi-site integrated circuit device testing |
| 09/06/2005 | US6940812 Apparatus and method for transmitting constant bit rate data cells, controlling transmission of data cells to prevent head data cells from being sent out through the continuous slots of the transmission cycle |
| 09/06/2005 | US6940330 Timing generator, semiconductor test apparatus, and timing generating method |
| 09/06/2005 | US6940301 Test pad array for contact resistance measuring of ACF bonds on a liquid crystal display panel |
| 09/06/2005 | US6940300 Integrated circuits for testing an active matrix display array |
| 09/06/2005 | US6940299 Method of testing for short circuits between adjacent input/output pins of an integrated circuit |
| 09/06/2005 | US6940297 Top plate release mechanism |
| 09/06/2005 | US6940290 Sensor output processing device having self-diagnosis function |
| 09/06/2005 | US6940288 Apparatus and method for monitoring and predicting failures in system interconnect |
| 09/06/2005 | US6940285 Method and apparatus for testing a micro electromechanical device |
| 09/06/2005 | US6940284 Efficient diagnosis of faulty distributorless and hybrid ignition systems |
| 09/06/2005 | US6940273 Handling device, especially for positioning a test head on a testing device |
| 09/06/2005 | US6940271 Pin electronics interface circuit |
| 09/06/2005 | US6940270 Hand mounted testing meter |
| 09/06/2005 | US6940255 Battery charge indicator such as for an implantable medical device |
| 09/06/2005 | US6940168 Enhanced pad design for substrate |
| 09/06/2005 | US6939740 Method of fabricating an encapsulated semiconductor device with partly exposed leads |
| 09/06/2005 | US6939472 Etching method in fabrications of microstructures |
| 09/06/2005 | US6939409 Cleaning method and etching method |
| 09/06/2005 | US6939175 Coaxial cable for overvoltage protection |
| 09/06/2005 | US6939142 Semiconductor device testing contactor having a circuit-side contact piece and test-board-side contact piece |
| 09/06/2005 | US6938872 Machine shoe for the support of machines and a method |
| 09/06/2005 | US6938338 Method of making an electronic contact |
| 09/06/2005 | CA2170696C Step down transformer power supply with short circuit protection |
| 09/03/2005 | CA2460828A1 Portable battery operated electronic interactive electric arc detector |
| 09/01/2005 | WO2005081305A1 Semiconductor inspection method and system therefor |
| 09/01/2005 | WO2005081006A1 Loading system for fuel cell testing stations |
| 09/01/2005 | WO2005081005A1 Detection method for an electrical polyphase machine |
| 09/01/2005 | WO2005081004A1 Skew adjusting method, skew adjusting device, and test instrument |
| 09/01/2005 | WO2005081003A1 Dual feedback control system for maintaining the temperature of an ic-chip near a set-point |
| 09/01/2005 | WO2005081001A1 Probing a device |
| 09/01/2005 | WO2005081000A1 Method and apparatus for inspecting a printed circuit board assembly |
| 09/01/2005 | WO2005080996A1 Adapter for circuit board examination and device for circuit board examination |
| 09/01/2005 | WO2005079561A1 A portable apparatus for use with an electrical conductor |
| 09/01/2005 | WO2005029504A3 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
| 09/01/2005 | US20050193355 Source synchronous timing extraction, cyclization and sampling |
| 09/01/2005 | US20050193306 Polymorphic automatic test systems and methods |
| 09/01/2005 | US20050193303 Implementation of test patterns in automated test equipment |
| 09/01/2005 | US20050193302 Test switching circuit for a high speed data interface |
| 09/01/2005 | US20050193301 CDR-based clock synthesis |
| 09/01/2005 | US20050193300 Semiconductor integrated circuit detecting glitch noise and test method of the same |
| 09/01/2005 | US20050193299 Method and/or apparatus for performing static timing analysis on a chip in scan mode with multiple scan clocks |
| 09/01/2005 | US20050193298 Testing apparatus |
| 09/01/2005 | US20050193297 Methods and apparatus for defect isolation |
| 09/01/2005 | US20050193296 On-chip test apparatus |
| 09/01/2005 | US20050193295 Tester channel count reduction using observe logic and pattern generator |
| 09/01/2005 | US20050193294 Wireless no-touch testing of integrated circuits |
| 09/01/2005 | US20050193293 Semiconductor device capable of performing test at actual operating frequency |
| 09/01/2005 | US20050193291 Application functionality for a test tool for application programming interfaces |
| 09/01/2005 | US20050193290 Built-in self test method and apparatus for jitter transfer, jitter tolerance, and FIFO data buffer |
| 09/01/2005 | US20050193284 Electronic device, failure prediction method, and computer product |
| 09/01/2005 | US20050193280 Design instrumentation circuitry |
| 09/01/2005 | US20050193276 Semiconductor IC incorporating a co-debugging function and test system |
| 09/01/2005 | US20050193274 Method and apparatus for testing a memory device in quasi-operating conditions |
| 09/01/2005 | US20050192776 Method and apparatus for evaluating automotive window regulators |
| 09/01/2005 | US20050192775 Biometric quality control process |
| 09/01/2005 | US20050192773 System and method for reducing temperature variation during burn in |
| 09/01/2005 | US20050192772 Independent deskew lane |
| 09/01/2005 | US20050192770 Biometric quality control process |
| 09/01/2005 | US20050191952 Cleaning sheet for probe needles |
| 09/01/2005 | US20050191770 Flip chip semiconductor die internal signal access system and method |
| 09/01/2005 | US20050191768 Apparatus and method for measuring substrates |
| 09/01/2005 | US20050190959 Drill hole inspection method for printed circuit board fabrication |
| 09/01/2005 | US20050190874 Variable phase bit sampling with minimized synchronization loss |
| 09/01/2005 | US20050190828 System and method for detecting cable faults for high-speed transmission link |
| 09/01/2005 | US20050190690 Multi-port, gigabit serdes transceiver capable of automatic fail switchover |
| 09/01/2005 | US20050190629 Method and apparatus for testing circuit units to be tested with different test mode data sets |
| 09/01/2005 | US20050190361 Apparatus for surface inspection and method and apparatus for inspecting substrate |
| 09/01/2005 | US20050190358 Magnetic field measuring apparatus capable of measuring at high spatial resolution |
| 09/01/2005 | US20050190310 Inspection method and apparatus using charged particle beam |
| 09/01/2005 | US20050190169 Method and device for testing a thin film transistor array |
| 09/01/2005 | US20050189960 Method for testing a thin film transistor array |
| 09/01/2005 | US20050189959 Electrochemical fabrication process for forming multilayer multimaterial microprobe structures |
| 09/01/2005 | US20050189958 Cantilever microprobes for contacting electronic components and methods for making such probes |
| 09/01/2005 | US20050189957 Integrated circuit temperature sensing device and method |
| 09/01/2005 | US20050189954 Method for optimizing the accuracy of an electronic circuit |
| 09/01/2005 | US20050189950 ATE measurement technique for comparator threshold voltage |
| 09/01/2005 | US20050189949 Flying capacitor type battery voltage detector |
| 09/01/2005 | US20050189948 Device and method for determining characteristic variables for batteries |
| 09/01/2005 | US20050189936 Removable breaking calibration connector for toroidal conductivity sensor and method of calibration |