| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/13/2005 | US6943500 Matrix element precharge voltage adjusting apparatus and method |
| 09/13/2005 | US6943427 Semiconductor device for charge-up damage evaluation and charge-up damage evaluation method |
| 09/13/2005 | US6943043 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 09/13/2005 | US6942497 Socket assembly for test of integrated circuit, and its integrated circuit and tester |
| 09/13/2005 | US6942493 Connector structure for connecting electronic parts |
| 09/13/2005 | US6941869 Sensor for monitoring electronic detonation circuits |
| 09/09/2005 | WO2005083773A1 Probe card, and method of producing the same |
| 09/09/2005 | WO2005083749A1 Test system with integrated substrate transfer module |
| 09/09/2005 | WO2005083622A1 Test system for integrated circuits with serdes ports |
| 09/09/2005 | WO2005083455A1 An electronic stream processing circuit with test access |
| 09/09/2005 | WO2005083454A1 Method for creating hdl description files of digital systems, and systems obtained |
| 09/09/2005 | WO2005083453A1 Circuit substrate inspection device and circuit substrate inspection method |
| 09/09/2005 | WO2005083452A1 Method for inspecting array board and method for manufacturing array board |
| 09/09/2005 | WO2005082752A2 Device handling system and method |
| 09/09/2005 | WO2005082106A2 Built-in self test method and apparatus for jitter transfer, jitter tolerance, and fifo data buffer |
| 09/09/2005 | WO2005081728A2 Simultaneous physical and protocol layer analysis |
| 09/09/2005 | WO2005017959A3 Integrated circuit with test pad structure and method of testing |
| 09/09/2005 | WO2004099792A3 Planarizing and testing of bga packages |
| 09/09/2005 | WO2004092090A3 Temperature compensated vertical pin probing device |
| 09/09/2005 | CA2546641A1 Methodology and apparatus for the detection of biological substances |
| 09/08/2005 | US20050198611 Method and apparatus for decomposing and verifying configurable hardware |
| 09/08/2005 | US20050198606 Compilation of remote procedure calls between a timed HDL model on a reconfigurable hardware platform and an untimed model on a sequential computing platform |
| 09/08/2005 | US20050197817 Interference analysis method, interference analysis device, interference analysis program and recording medium with interference analysis program recorded thereon |
| 09/08/2005 | US20050197797 Method and apparatus for testing circuit boards |
| 09/08/2005 | US20050196996 Component mounting board inspecting apparatus |
| 09/08/2005 | US20050196901 Device mounting method and device transport apparatus |
| 09/08/2005 | US20050196884 Method of evaluating semiconductor device |
| 09/08/2005 | US20050196882 Real-time in-line testing of semiconductor wafers |
| 09/08/2005 | US20050195737 Protection method and system for equipment in a network element |
| 09/08/2005 | US20050195736 Information processing apparatus and method of controlling the information processing apparatus |
| 09/08/2005 | US20050195628 Semiconductor memory device |
| 09/08/2005 | US20050195396 Inspection condition setting program, inspection device and inspection system |
| 09/08/2005 | US20050194990 Wafer-level opto-electronic testing apparatus and method |
| 09/08/2005 | US20050194989 Power supply arrangement for integrated circuit tester |
| 09/08/2005 | US20050194988 Semiconductor device |
| 09/08/2005 | US20050194987 System and method for check-in control in wafer testing |
| 09/08/2005 | US20050194984 Testing apparatus and testing method |
| 09/08/2005 | US20050194983 Wafer probe station having a skirting component |
| 09/08/2005 | US20050194980 Method for detecting an offset drift in a wheatstone measuring bridge |
| 09/08/2005 | US20050194979 Online fiber optic sensor for detecting partial discharge and similar events in large utility station transformers and the like |
| 09/08/2005 | US20050194978 System and Method to Locate an Anomaly of a Conductor |
| 09/08/2005 | US20050194976 Critical state estimation system and method for secondary cells |
| 09/08/2005 | US20050194963 Dual channel source measurement unit for semiconductor device testing |
| 09/08/2005 | US20050194936 Apparatus and method for estimating state of charge of battery using neural network |
| 09/08/2005 | US20050194929 Battery-powered tool capable of detecting discharged battery pack |
| 09/08/2005 | US20050194649 Semiconductor chip and method for testing semiconductor chip |
| 09/08/2005 | US20050194590 System and method for controlling manufacturing apparatuses |
| 09/08/2005 | US20050193829 Device for testing material properties with regard to combined tensile and shear loads, in particular for testing adhesives |
| 09/08/2005 | DE19748823B4 Servicefreundliche Kontaktiervorrichtung Service friendly contactor |
| 09/08/2005 | DE10393446T5 Jittermessgerät und Testgerät Jitter measuring and testing equipment |
| 09/08/2005 | DE10392921T5 Ereignispipeline- und -summierungsverfahren und -gerät für ein ereignisbasiertes Testsystem Ereignispipeline- and -summierungsverfahren and apparatus for an event-based test system |
| 09/08/2005 | DE102005006370A1 Diagnose des Ladungszustands eines Energiespeicher-Systems Diagnosis of the state of charge of an energy storage system |
| 09/08/2005 | DE102005000644A1 Elektronenstrahlprüfvorrichtung und Verfahren zum Überprüfen von Durchgangsöffnungen unter Verwendung von geclusterten Nanoröhren-Arrays Elektronenstrahlprüfvorrichtung and method for checking of through holes using clustered nanotube arrays |
| 09/08/2005 | DE102004033646A1 Struktur und Verfahren zum Einbrenntesten für eine Packung Structure and method for burn-in testing for a pack |
| 09/08/2005 | DE102004008404A1 Handling device for positioning a test head on a testing device comprises a column, a horizontal carriage and double-hinged arms having a first end hinged on a holder and a second arm hinged on the horizontal carriage |
| 09/08/2005 | DE102004008403A1 Handling device for positioning a test head on a testing device comprises a column, a horizontal carriage, a pivoting arm arranged on the horizontal carriage, and a holder arranged on the pivoting arm |
| 09/08/2005 | DE102004008402A1 Handling device for positioning a testing head on a testing device comprises a column extending in the vertical direction, a first horizontal carriage, a second horizontal carriage, and a holder arranged on the second horizontal carriage |
| 09/08/2005 | DE102004007851A1 Intelligent connector for battery, especially in vehicle, has measurement resistance integrated into connection device, 2 predefined contact points, between which measurement resistance lies and by which measurement circuit can be contacted |
| 09/08/2005 | DE102004007369A1 Circuit arrangement for detecting earthing has coil in power feed line so load is in series with coil, measurement coil inductively coupled to coil and connected to voltage detector |
| 09/08/2005 | DE102004007209A1 Schaltungsanordnung und Verfahren zur Ermittlung des Laststromes durch eine getaktet an eine Versorgungsspannung angelegte induktive Last Circuit arrangement and method for determining the load current through a clocked applied to a supply voltage inductive load |
| 09/08/2005 | DE102004005243A1 Shift register with linear feedback has Exclusive-OR logic formed by individual logic gates and at least two gates are connected to two different flip-flops arranged upstream of flip-flops whose outputs are fed to logic |
| 09/08/2005 | DE10124878B4 Testvorrichtung für Halbleiterbauelemente Test apparatus for semiconductor devices |
| 09/07/2005 | EP1571458A1 Battery-powered tool capable of detecting discharged battery pack |
| 09/07/2005 | EP1571457A1 Battery charged condition computing device and battery charged condition computing method |
| 09/07/2005 | EP1571456A1 Test circuit and method for hierarchical core |
| 09/07/2005 | EP1571455A2 Power supply noise measuring device |
| 09/07/2005 | EP1570664A2 Context aware transmission management method |
| 09/07/2005 | EP1570538A2 Method and apparatus for monitoring fuel cell voltages |
| 09/07/2005 | EP1570536A2 System and method for controlling a fuel cell testing device |
| 09/07/2005 | EP1570514A2 Integrated circuit and methods of measurement and preparation of measurement structure |
| 09/07/2005 | EP1570510A2 Fast localization of electrical failures on an integrated circuit system and method |
| 09/07/2005 | EP1570281A1 Method for predicting the voltage of a battery |
| 09/07/2005 | EP1570280A1 Self-marking device for an integrated circuit, and associated housed integrated circuit |
| 09/07/2005 | EP1570279A1 Guarded tub enclosure |
| 09/07/2005 | EP1356307A4 Nickel alloy probe card frame laminate |
| 09/07/2005 | EP0925509B1 Probe structure having a plurality of discrete insulated probe tips |
| 09/07/2005 | CN2724218Y Device for estimating recharge rate of cell |
| 09/07/2005 | CN2724014Y Signal lamp driving test circuit |
| 09/07/2005 | CN2724013Y Electric automobile battery test device |
| 09/07/2005 | CN2724012Y Detector for detecting and repairing charging system of motor vehicle genrator |
| 09/07/2005 | CN2724011Y Small current earthing electric grid single phase earthing fault line selecting device |
| 09/07/2005 | CN2724010Y Single phase load identification electric energy meter |
| 09/07/2005 | CN2722611Y Three-way dynamic collector for grain image |
| 09/07/2005 | CN1666110A Electronic circuit with test unit for testing interconnects |
| 09/07/2005 | CN1666109A Time-frequency domain reflectometry apparatus and method |
| 09/07/2005 | CN1665153A Application-specific integrated circuits checking apparatus and method based on peripherial element expansion interface card |
| 09/07/2005 | CN1665098A Battery-powered tool capable of detecting discharged battery pack |
| 09/07/2005 | CN1665020A Multipurpose load plate |
| 09/07/2005 | CN1665012A System for processing electronic devices |
| 09/07/2005 | CN1665011A Multifunctional probe card |
| 09/07/2005 | CN1665004A Device mounting method and device transport apparatus |
| 09/07/2005 | CN1664991A Semiconductor device and manufacturing method of the same |
| 09/07/2005 | CN1664954A Semiconductor device |
| 09/07/2005 | CN1664605A Method for detecting broken line fault between rectifier zero line of uninterrupted power source and electrified wire netting zero line |
| 09/07/2005 | CN1664604A Method for sorting batteries according to battery volt-ampere curve |
| 09/07/2005 | CN1664603A Current density distribution measuring shim inside fuel cells |
| 09/07/2005 | CN1664602A Balance detection and correction apparatus for magneto rotors |
| 09/07/2005 | CN1664601A Magneto rotor magnetizing and detecting apparatus |
| 09/07/2005 | CN1664600A Circuit connecting line conducting test method based on dichotomy |
| 09/07/2005 | CN1664599A Method for testing arc parameters of high-intensity discharge lamps |