| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/15/2005 | US20050200363 Electrical inspection method and apparatus for printed wiring board for the electronic component mounting, and computer-readable recording medium |
| 09/15/2005 | US20050200362 Signal acquisition probing and voltage measurement systems using an electro-optical cavity |
| 09/15/2005 | US20050200361 Ignition coil tester |
| 09/15/2005 | US20050200346 Electrical power probe |
| 09/15/2005 | US20050200005 Semiconductor device, semiconductor package, and method for testing semiconductor device |
| 09/15/2005 | US20050199875 Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structure |
| 09/15/2005 | US20050199807 Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus |
| 09/15/2005 | DE19957614B4 Verfahren zum Handhaben eines IC-Bausteins A method for managing an IC package |
| 09/15/2005 | DE10393251T5 Auf der Basis der Batterietemperatur und des Entladungszustands der Batterie angepasste Batterietestausgaben Adjusted on the basis of the battery temperature and the discharge status of the battery test battery issues |
| 09/15/2005 | DE10353585B4 Unidirektionale Eingangsschaltanordnung, Halbleiterschaltung und Verfahren zur Prüfung einer Laufzeitverzögerung eines Eingangstreibers einer Halbleiterschaltung Unidirectional input circuitry, semiconductor circuit and method for testing a propagation delay of an input driver of a semiconductor circuit |
| 09/15/2005 | DE10345057B4 Verfahren und Vorrichtung zur Bestimmung des Ladezustandes einer Batterie Method and device for determining the charge condition of a battery |
| 09/15/2005 | DE102005004729A1 Test method e.g. for starter battery for car, involves having starting inputs of parameters of examinee and marked in that majority of parameters are discarded as battery specific bar code as starter battery is tested |
| 09/15/2005 | DE102004053605A1 Dynamische Signalverlaufsressourcenverwaltung Dynamic waveform Resource Management |
| 09/15/2005 | DE102004039392B3 Detecting current in electrical device driven by field effect transistor using pulse width modulation involves deriving current from pulse width modulation, source-daring voltage, ambient temperature and supply voltage |
| 09/15/2005 | DE102004012143B3 Verfahren zum Testen der Funktion von in einem Kraftfahrzeug eines bestimmten Typs verbauten, über einen Kommunikationsbus adressierbaren elektronischen und elektrischen Komponenten A method for testing the function of a built-up in a motor vehicle of a certain type, addressable via a communication bus electronic and electrical components |
| 09/15/2005 | DE102004007904A1 Verfahren zur Bestimmung mindestens einer Kenngröße für den Zustand einer elektrochemischen Speicherbatterie und Überwachungseinrichtung A method for determining at least one characteristic variable for the state of an electrochemical storage battery monitoring device and |
| 09/15/2005 | CA2557600A1 Burn-in testing apparatus and method |
| 09/14/2005 | EP1575126A1 Bow tie coupler |
| 09/14/2005 | EP1575086A2 Semiconductor device and manufacturing method of the same, including a dicing step |
| 09/14/2005 | EP1575022A2 Self light emitting display module, electronic equipment into which the same module is loaded, and inspection method of a defect state in the same module |
| 09/14/2005 | EP1574869A1 Circuit for detecting a leakage current |
| 09/14/2005 | EP1574868A1 Assembly for LSI test and method for the test |
| 09/14/2005 | EP1574867A1 Semiconductor device and method for testing the same |
| 09/14/2005 | EP1574866A1 Inspection method and inspection equipment |
| 09/14/2005 | EP1574865A1 Pressing member and electronic component handling device |
| 09/14/2005 | EP1574864A1 Method for testing of the function of electronic and electric components mounted in a vehicle of a specific type and addressable via a communication bus |
| 09/14/2005 | EP1573941A1 Integrated circuit comprising a transmission channel with an integrated independent tester. |
| 09/14/2005 | EP1573851A1 Wireless battery management system |
| 09/14/2005 | EP1573788A2 Method and system for fabricating multi layer devices on a substrate |
| 09/14/2005 | EP1573543A2 Inherently fail safe processing or control apparatus |
| 09/14/2005 | EP1573403A1 Resistor structures to electrically measure unidirectional misalignment of stitched masks |
| 09/14/2005 | EP1573346A1 Method and circuit arrangement for the measurement of electrochemical cells in a serial circuit |
| 09/14/2005 | EP1573345A1 Jtag testing arrangement |
| 09/14/2005 | EP1236017B1 X-ray tomography bga ( ball grid array ) inspections |
| 09/14/2005 | EP1159625B1 Device for detecting impedance disturbance points in symmetrical data transmission lines |
| 09/14/2005 | EP1145515B1 Trellis decoder with correction of pair swaps, for use in gigabit ethernet transceivers |
| 09/14/2005 | EP1042681B1 Compound switching matrix for probing and interconnecting devices under test to measurement equipment |
| 09/14/2005 | CN2725908Y Fully-automatic regulating clamp cell detecting apparatus |
| 09/14/2005 | CN2725907Y Automobile tyre pressure monitoring display system with exciter and its structural member |
| 09/14/2005 | CN2725906Y Safety protector for data of automatic money taking machine |
| 09/14/2005 | CN2725905Y Tester for transformer sleeve |
| 09/14/2005 | CN2725898Y Adapting probe for measurer of printed circuitboard |
| 09/14/2005 | CN1668933A Battery state-of-charge estimator |
| 09/14/2005 | CN1668932A Method and test adapter for testing an appliance having a smart card reader |
| 09/14/2005 | CN1668931A Probe card for testing integrated circuits |
| 09/14/2005 | CN1668929A Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 09/14/2005 | CN1667907A Earth leakage protecting method and apparatus for one line one ground type DC supply circuit |
| 09/14/2005 | CN1667814A Interference analysis method and interference analysis device |
| 09/14/2005 | CN1667810A Method for simulating reliability of semiconductor device |
| 09/14/2005 | CN1667682A Self light emitting display module, electronic equipment into which the same module is loaded, and inspection method of a defect state in the same module |
| 09/14/2005 | CN1667579A Method and apparatus for customizing and monitoring multiple interfaces and implementing enhanced fault tolerance and isolation features |
| 09/14/2005 | CN1667429A Primary cut-out state monitoring method |
| 09/14/2005 | CN1667428A Device and method for application specific integrated circuit verification utilizing simulated source data |
| 09/14/2005 | CN1667427A Chip testing method and relevant apparatus |
| 09/14/2005 | CN1667426A Electrical inspection method and apparatus for printed wiring board and computer-readable recording medium |
| 09/14/2005 | CN1667425A Device for checking faulty component in the overhead transmission line or lightning stroke |
| 09/14/2005 | CN1667424A Earth fault line-selecting method for arc suppression coil earthing system |
| 09/14/2005 | CN1667423A Display test system and method |
| 09/14/2005 | CN1219218C Charge or discharge state indicator of battery for portable electronic products |
| 09/14/2005 | CN1219217C Device for testing printed boards |
| 09/13/2005 | US6944837 System and method for evaluating an integrated circuit design |
| 09/13/2005 | US6944835 Delay circuit, testing apparatus, and capacitor |
| 09/13/2005 | US6944810 Method and apparatus for the testing of input/output drivers of a circuit |
| 09/13/2005 | US6944808 Method of evaluating core based system-on-a-chip |
| 09/13/2005 | US6944784 Flip-flop having multiple clock sources and method therefore |
| 09/13/2005 | US6944778 Method for testing an integrated circuit including hardware and/or software parts having a confidential nature |
| 09/13/2005 | US6944723 Data processing device for processing data accessed by a buffer manager, and interface device |
| 09/13/2005 | US6944567 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting ICs mis-processed during their manufacture |
| 09/13/2005 | US6944558 Methods and apparatus for optimizing the masking of waveforms to reduce the number of waveforms in a list of waveforms |
| 09/13/2005 | US6944554 Method for detecting fault on transmission lines by using harmonics and state transition diagram |
| 09/13/2005 | US6944247 Plural circuit selection using role reversing control inputs |
| 09/13/2005 | US6944237 Multi-pair transceiver decoder system with low computation slicer |
| 09/13/2005 | US6944132 Transmission apparatus, order wire transmission system and order wire monitoring method |
| 09/13/2005 | US6944127 System for detecting spurious network traffic |
| 09/13/2005 | US6944123 Redundant packet selection and manipulation in wireless communications systems |
| 09/13/2005 | US6944046 Ferroelectric memory and method of testing the same |
| 09/13/2005 | US6944003 Semiconductor integrated circuit with voltage-detecting circuit and signal transmitting and receiving system |
| 09/13/2005 | US6944000 Electrical system like a testing system for testing the channels of a communication system |
| 09/13/2005 | US6943826 Apparatus for debugging imaging devices and method of testing imaging devices |
| 09/13/2005 | US6943693 Method for informing user of available battery time based on operating mode of hybrid terminal |
| 09/13/2005 | US6943616 Semiconductor integrated circuit device, and adjustment method of semiconductor integrated circuit device |
| 09/13/2005 | US6943605 Scan cell designs for a double-edge-triggered flip-flop |
| 09/13/2005 | US6943586 Method and system to temporarily modify an output waveform |
| 09/13/2005 | US6943578 Method and application of PICA (picosecond imaging circuit analysis) for high current pulsed phenomena |
| 09/13/2005 | US6943577 Multichip package test |
| 09/13/2005 | US6943576 Systems for testing a plurality of circuit devices |
| 09/13/2005 | US6943575 Method, circuit and system for determining burn-in reliability from wafer level burn-in |
| 09/13/2005 | US6943573 System and method for site-to-site yield comparison while testing integrated circuit dies |
| 09/13/2005 | US6943572 Apparatus and method for detecting photon emissions from transistors |
| 09/13/2005 | US6943571 Reduction of positional errors in a four point probe resistance measurement |
| 09/13/2005 | US6943569 Method, system and apparatus to detect defects in semiconductor devices |
| 09/13/2005 | US6943567 Method for detecting the operability of a number of identical zener diodes that are connected in parallel to one another and to a solenoid |
| 09/13/2005 | US6943562 Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits |
| 09/13/2005 | US6943561 Method of and an apparatus for collecting RF input and output and biasing signal data of a device under test |
| 09/13/2005 | US6943559 Circuit pattern inspection device, circuit pattern inspection method, and recording medium |
| 09/13/2005 | US6943558 System and method for remotely detecting electric arc events in a power system |
| 09/13/2005 | US6943556 High-speed duty cycle test through DC measurement using a combination of relays |
| 09/13/2005 | US6943546 Magnetoresistive element lifecycle tester |
| 09/13/2005 | US6943541 Apparatus and method for testing circuit modules |
| 09/13/2005 | US6943528 Method and arrangement for determination of the state of charge of a battery |