| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/20/2005 | US6948097 Semiconductor device including function verification capability |
| 09/20/2005 | US6948096 Functional random instruction testing (FRIT) method for complex devices such as microprocessors |
| 09/20/2005 | US6947883 Method for designing mixed signal integrated circuits and configurable synchronous digital noise emulator circuit |
| 09/20/2005 | US6947864 Latent fault detection in redundant power supply systems |
| 09/20/2005 | US6947856 Method and device for detecting a signal |
| 09/20/2005 | US6947855 Adaptive algorithm to control and characterize super-capacitor performance |
| 09/20/2005 | US6947853 Apparatus and method for inspecting electrical continuity of circuit board, jig for use therein, and recording medium thereon |
| 09/20/2005 | US6947588 Edge normal process |
| 09/20/2005 | US6947482 System and method for high-speed decoding and ISI compensation in a multi-pair transceiver system |
| 09/20/2005 | US6947380 Guaranteed bandwidth mechanism for a terabit multiservice switch |
| 09/20/2005 | US6947315 Magnetic random access memory device having write test mode |
| 09/20/2005 | US6947292 Primary functional circuit board suitable for use in verifying chip function by alternative manner |
| 09/20/2005 | US6946866 Measurement of package interconnect impedance using tester and supporting tester |
| 09/20/2005 | US6946863 Circuit and method for measuring and forcing an internal voltage of an integrated circuit |
| 09/20/2005 | US6946860 Modularized probe head |
| 09/20/2005 | US6946858 Method and apparatus for measuring photoelectric conversion device, and process and apparatus for producing photoelectric conversion device |
| 09/20/2005 | US6946857 Semiconductor device tester |
| 09/20/2005 | US6946856 Thermal testing method for integrated circuit chips and packages |
| 09/20/2005 | US6946850 Method and apparatus for filtering unwanted noise while amplifying a desired signal |
| 09/20/2005 | US6946846 Circuit for measuring on-chip power supply integrity |
| 09/20/2005 | US6946843 Test paddle having a universal binding post |
| 09/20/2005 | US6946827 Optical electric field or voltage sensing system |
| 09/20/2005 | US6946375 Manufacture of probe unit having lead probes extending beyond edge of substrate |
| 09/20/2005 | US6946307 Method and system for testing driver circuits of AMOLED |
| 09/20/2005 | US6946306 Method of manufacturing a semiconductor device and a fabrication apparatus for a semiconductor device |
| 09/20/2005 | US6945803 Positionable-connect apparatus for electrically coupling selected electrical devices |
| 09/20/2005 | CA2118196C An electronic control apparatus for an air-bag system |
| 09/15/2005 | WO2005086279A1 Method of and device for determining at least one characteristic parameter of a resonant structure |
| 09/15/2005 | WO2005086175A1 Safety protective instrumentation system and its handling method |
| 09/15/2005 | WO2005085939A1 Array board inspecting method |
| 09/15/2005 | WO2005085938A1 Board inspecting method, array board inspecting method and array board inspecting equipment |
| 09/15/2005 | WO2005085889A1 Method of estimating the state-of-charge and of the use time left of a rechargeable battery, and apparatus for executing such a method |
| 09/15/2005 | WO2005085888A1 Testing of embedded systems |
| 09/15/2005 | WO2005085887A1 System and method pertaining to burn-in testing |
| 09/15/2005 | WO2005085886A1 System and method for regulating temperature during burn-in |
| 09/15/2005 | WO2005085885A1 Method and apparatus for characterising a three phase transformer using a single phase power supply |
| 09/15/2005 | WO2005085884A2 System and method for reducing temperature variation during burn in |
| 09/15/2005 | WO2005085877A1 Probe and probe manufacturing method |
| 09/15/2005 | WO2005085792A1 Method and apparatus for assessing condition of motor-driven mechanical system |
| 09/15/2005 | WO2005084328A2 Burn-in testing apparatus and method |
| 09/15/2005 | WO2004112089A3 Method and system for fabricating multi layer devices on a substrate |
| 09/15/2005 | US20050204246 Remote control signal receiver and remote control signal receiving method |
| 09/15/2005 | US20050204245 Method of timing calibration using slower data rate pattern |
| 09/15/2005 | US20050204244 Lssd-compatible edge-triggered shift register latch |
| 09/15/2005 | US20050204243 Method and testing system for storage devices under test |
| 09/15/2005 | US20050204241 Method and device for analyzing software error |
| 09/15/2005 | US20050204240 Test data generating system and method to test high-speed actual operation |
| 09/15/2005 | US20050204239 Method for testing semiconductor integrated circuit |
| 09/15/2005 | US20050204238 Apparatus and method for judging the legitimacy of transfer data |
| 09/15/2005 | US20050204237 Method and system for providing interactive testing of integrated circuits |
| 09/15/2005 | US20050204236 Interconnections for plural and hierarchical P1500 test wrappers |
| 09/15/2005 | US20050204235 Automatic method and system for instantiating built-in-test (BIST) modules in ASIC memory designs |
| 09/15/2005 | US20050204233 System-on-chip (SOC) having built-in-self-test circuits and a self-test method of the SOC |
| 09/15/2005 | US20050204232 Technique for combining scan test and memory built-in self test |
| 09/15/2005 | US20050204231 Testing memories using algorithm selection |
| 09/15/2005 | US20050204230 Method and a unit for programming a memory |
| 09/15/2005 | US20050204229 Boundary scan tester for logic devices |
| 09/15/2005 | US20050204228 Low power scan & delay test method and apparatus |
| 09/15/2005 | US20050204227 Semiconductor circuit apparatus and scan test method for semiconductor circuit |
| 09/15/2005 | US20050204226 Core circuit test architecture |
| 09/15/2005 | US20050204225 Serial I/O using JTAG TCK and TMS signals |
| 09/15/2005 | US20050204224 Programmable driver for an I/O pin of an integrated circuit |
| 09/15/2005 | US20050204223 Bonding pads for testing of a semiconductor device |
| 09/15/2005 | US20050204222 Apparatus and method for eliminating the TMS connection in a JTAG procedure |
| 09/15/2005 | US20050204221 Apparatus and method for exchanging non-JTAG signals with a core processor during selected JTAG modes |
| 09/15/2005 | US20050204220 Random number test circuit, random number generation circuit, semiconductor integrated circuit, IC card and information terminal device |
| 09/15/2005 | US20050204219 Method and device for testing array substrate |
| 09/15/2005 | US20050204218 Operation mode setting circuit |
| 09/15/2005 | US20050204217 Identical core testing using dedicated compare and mask circuitry |
| 09/15/2005 | US20050204216 Method and apparatus for customizing and monitoring multiple interfaces and implementing enhanced fault tolerance and isolation features |
| 09/15/2005 | US20050204215 Problem solving in a communications system |
| 09/15/2005 | US20050204214 Distributed montoring in a telecommunications system |
| 09/15/2005 | US20050204211 Apparatus for determining the access time and/or the minimally allowable cycle time of a memory |
| 09/15/2005 | US20050204210 Decoding method, medium, and apparatus |
| 09/15/2005 | US20050204208 Digital data receiver for edge cellular standard |
| 09/15/2005 | US20050203720 Method for providing bitwise constraints for test generation |
| 09/15/2005 | US20050203719 Method for simulating reliability of semiconductor device |
| 09/15/2005 | US20050203672 Systems, devices, and methods for detecting arcs |
| 09/15/2005 | US20050202716 Insert and electronic component handling apparatus provided with the same |
| 09/15/2005 | US20050202597 Manufacturing method of a tray, a socket for inspection, and a semiconductor device |
| 09/15/2005 | US20050202576 Compliant contact structures, contactor cards and test system including same, and methods of fabrication and use |
| 09/15/2005 | US20050201500 Semiconductor integrated circuit and method for testing the same |
| 09/15/2005 | US20050201284 TCP optimized single rate policer |
| 09/15/2005 | US20050201278 Reconfiguring a multicast tree |
| 09/15/2005 | US20050201276 Method and system for allocating protection path resources |
| 09/15/2005 | US20050201271 Method, system, and computer program product for avoiding data loss during network port recovery processes |
| 09/15/2005 | US20050200850 Apparatus and method for measuring a property of a layer in a multilayered structure |
| 09/15/2005 | US20050200841 Detection of defects in patterned substrates |
| 09/15/2005 | US20050200574 Self light emitting display module, electronic equipment into which the same module is loaded, and inspection method of a defect state in the same module |
| 09/15/2005 | US20050200507 Testing of mixed signal integrated circuits generating analog signals from digital data elements |
| 09/15/2005 | US20050200406 Gain control methods and systems in an amplifier assembly |
| 09/15/2005 | US20050200378 Apparatus and method for monitoring and/or analysis of electrical machines during operation |
| 09/15/2005 | US20050200377 Testing method, semiconductor device, and display apparatus |
| 09/15/2005 | US20050200376 Integrated circuit (IC) test assembly including phase change material for stabilizing temperature during stress testing of integrated circuits and method thereof |
| 09/15/2005 | US20050200375 Probe device and probe card using the same |
| 09/15/2005 | US20050200374 Semiconductor test system having a tester and a prober and test method thereof |
| 09/15/2005 | US20050200373 Signal acquisition probing system using a micro-cavity laser capable of sensing DC voltages |
| 09/15/2005 | US20050200372 Contact plate for use in standardizing tester channels of a tester system and a standardization system having such a contact plate |
| 09/15/2005 | US20050200371 Signal acquisition probing system using a micro-cavity laser |
| 09/15/2005 | US20050200364 Leakage current or resistance measurement method, and monitoring apparatus and monitoring system of the same |