| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/22/2005 | US20050209800 System and method for alarm recovery for an electrolyzer cell module |
| 09/22/2005 | US20050209723 Method for yield improvement of manufactured products |
| 09/22/2005 | US20050209715 Monitoring device for monitoring internal signals during initialization of an electronic circuit unit |
| 09/22/2005 | US20050208910 Variable-gain low noise amplifier for digital terrestrial applications |
| 09/22/2005 | US20050208775 Method for growing a gate oxide layer on a silicon surface with preliminary n2o anneal |
| 09/22/2005 | US20050208755 Nitrogen-free ARC layer and a method of manufacturing the same |
| 09/22/2005 | US20050208735 Semiconductor device and manufacturing method of the same |
| 09/22/2005 | US20050208684 Manufacturing method of semiconductor device |
| 09/22/2005 | US20050208368 Method and device for judging the condition of secondary batteries and method for regenerating secondary batteries |
| 09/22/2005 | US20050207252 Semiconductor storage device, test method therefor, and test circuit therefor |
| 09/22/2005 | US20050207245 Bank selectable parallel test circuit and parallel test method thereof |
| 09/22/2005 | US20050207243 Semiconductor memory device with redundancy circuit |
| 09/22/2005 | US20050207076 Sub-circuit voltage manipulation |
| 09/22/2005 | US20050206887 Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process |
| 09/22/2005 | US20050206791 Apparatus for injecting electrical signals into lines or cables for location purposes |
| 09/22/2005 | US20050206606 Display device and scanning circuit testing method |
| 09/22/2005 | US20050206545 Holding method, analog to digital converting method, signal observing method, holding apparatus, analog to digital converting apparatus, and signal observing apparatus |
| 09/22/2005 | US20050206459 Startup/yank circuit for self-biased phase-locked loops |
| 09/22/2005 | US20050206430 Skew detection device |
| 09/22/2005 | US20050206404 Method for testing a TFT array |
| 09/22/2005 | US20050206403 System and method for testing devices utilizing capacitively coupled signaling |
| 09/22/2005 | US20050206402 Methods and systems for determining one or more properties of a specimen |
| 09/22/2005 | US20050206401 Test sockets, test systems, and methods for testing microfeature devices |
| 09/22/2005 | US20050206400 Integrated circuit characterization printed circuit board |
| 09/22/2005 | US20050206399 Selectively configurable probe structures, e.g., for testing microelectronic components |
| 09/22/2005 | US20050206398 Test probe for finger tester and corresponding finger tester |
| 09/22/2005 | US20050206397 Probe card cooling assembly with direct cooling of active electronic components |
| 09/22/2005 | US20050206396 Vacuum prober and vacuum probe method |
| 09/22/2005 | US20050206395 Probe tile for probing semiconductor wafer |
| 09/22/2005 | US20050206394 Measurement of integrated circuit interconnect process parameters |
| 09/22/2005 | US20050206393 System and method for high voltage testing of twisted insulated conductors |
| 09/22/2005 | US20050206392 Determination of worst case voltage in a power supply loop |
| 09/22/2005 | US20050206390 Method and device for judging the condition of secondary batteries and method for regenerating secondary batteries |
| 09/22/2005 | US20050206389 Method and device for judging the condition of secondary batteries and method for regenerating secondary batteries |
| 09/22/2005 | US20050206388 Battery management system and apparatus with anomaly reporting |
| 09/22/2005 | US20050206387 Device for measuring an electrical quantity of a storage battery |
| 09/22/2005 | US20050206386 Switching circuit and individual voltmeter apparatus |
| 09/22/2005 | US20050206368 Burn-in testing apparatus and method |
| 09/22/2005 | US20050206367 Automatic range finder for electric current testing |
| 09/22/2005 | US20050206364 Apparatus and method for switch control, and voltage measuring device |
| 09/22/2005 | US20050206348 Battery apparatus and discharge controlling method of battery apparatus |
| 09/22/2005 | US20050206347 Power supply apparatus |
| 09/22/2005 | US20050206345 Power management method for an electronic apparatus |
| 09/22/2005 | US20050205865 IC testing apparatus and methods |
| 09/22/2005 | US20050205246 Annular cold plate with reflexive channels |
| 09/22/2005 | US20050204803 Method for testing an electric motor |
| 09/22/2005 | US20050204761 Temperature detection device, temperature detection method, and computer-readable computer program product containing temperature detection program |
| 09/22/2005 | DE19837138B4 Prüfkarte zum Prüfen von Chips mit integrierten Schaltungen Probe card for testing integrated circuit chips |
| 09/22/2005 | DE19706534B4 Halbleitereinrichtung, bei der eine interne Funktion entsprechend einem Potential einer speziellen Anschlußfläche bestimmt wird, und Verfahren des Bestimmens einer internen Funktion einer Halbleitereinrichtung A semiconductor device in which an internal function in accordance with a potential of a specific terminal area is determined, and procedures of determining an internal function of a semiconductor device |
| 09/22/2005 | DE19680785B4 Halbleiterbauelement-Testgerät und Halbleiterbauelement-Testsystem, das eine Mehrzahl von Halbleiterbauelement-Testgeräten enthält The semiconductor device testing apparatus and semiconductor device testing system, which includes a plurality of semiconductor device test devices |
| 09/22/2005 | DE19605255B4 Verfahren und Vorrichtung zum Betrachten von Beschaltungs- bzw. Verdrahtungsmustern in einer gedruckten Schaltungsplatte Method and apparatus for viewing Wiring and wiring patterns in a printed circuit board |
| 09/22/2005 | DE19512131B4 Halbleiter-Testgerät A semiconductor test device |
| 09/22/2005 | DE102005008370A1 Prüfschaltungsschaltkreis für ein Hochgeschwindigkeitsdaten-Interface Prüfschaltungsschaltkreis for a high-speed data interface |
| 09/22/2005 | DE102004053559A1 Drahtloses, berührungsloses Testen von integrierten Schaltungen Wireless, contactless testing of integrated circuits |
| 09/22/2005 | DE102004009337A1 Kontaktplatte zur Verwendung bei einer Kalibrierung von Testerkanälen eines Testersystems sowie ein Kalibriersystem mit einer solchen Kontaktplatte Contact plate for use in calibration of tester channels of a tester system and a calibration system with such a contact plate |
| 09/22/2005 | CA2558483A1 Wafer-level opto-electronic testing apparatus and method |
| 09/22/2005 | CA2557254A1 Test station for a fuel cell power module |
| 09/21/2005 | EP1577803A2 Interference analysis method, interference analysis device, interference analysis program and recording medium with interference analysis program recorded thereon |
| 09/21/2005 | EP1577677A1 Battery apparatus and discharge controlling method of battery apparatus |
| 09/21/2005 | EP1577676A1 Method and circuit for the protection of test contactors in high current measurements of semiconductor components |
| 09/21/2005 | EP1577150A1 Arrangement for detecting short-circuits in switched-off branches of electrical AC power networks, especially in branches for feeding railways |
| 09/21/2005 | EP1576380A1 Inspecting method and apparatus for a led matrix display |
| 09/21/2005 | EP1576379A1 Method and device for recognizing battery-less operation of a vehicle |
| 09/21/2005 | EP1576378A2 Composite motion probing |
| 09/21/2005 | EP1576377A2 Apparatus and method for limiting over travel in a probe card assembly |
| 09/21/2005 | EP1490672A4 An electrical condition monitoring method for polymers |
| 09/21/2005 | EP1456675B1 Input buffer and method for voltage level detection |
| 09/21/2005 | EP1102999B1 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit |
| 09/21/2005 | CN2727991Y Special purpose clamp for polymer battery charging/discharging detector |
| 09/21/2005 | CN2727784Y Circuit fault detecting and laser repairing device for two-dimensional display |
| 09/21/2005 | CN2727754Y 启动电机测试装置 Start the motor test device |
| 09/21/2005 | CN2727753Y Automatic detecting device for dielectric strength between commutator segments |
| 09/21/2005 | CN2727752Y Accurate positioning device for fault location of underground laying power cable |
| 09/21/2005 | CN2727751Y Medium-high voltage frequency-converter output grounded detecting circuit |
| 09/21/2005 | CN2727750Y Portable household electrical appliance maintaining instrument |
| 09/21/2005 | CN1672057A Method of making microelectronic spring contact array |
| 09/21/2005 | CN1672056A Probe for testing electric conduction |
| 09/21/2005 | CN1671265A Discharging lamp initiating device and illuminating device |
| 09/21/2005 | CN1670937A Non-volatile memory evaluating method and non-volatile memory |
| 09/21/2005 | CN1670782A Measuring apparatus |
| 09/21/2005 | CN1670743A Method for yield improvement of manufactured products |
| 09/21/2005 | CN1670664A Power management method for an electronic apparatus |
| 09/21/2005 | CN1670540A Electric signal connecting device, probe assembly and detector using the same |
| 09/21/2005 | CN1670539A Transducer assembly for semiconductor device testing processors |
| 09/21/2005 | CN1670535A Method for testing a TFT array |
| 09/21/2005 | CN1670497A Temperature detection device, temperature detection method, and computer-readable computer program product containing temperature detection program |
| 09/21/2005 | CN1669858A Track circuit compensation capacitance on-line detector |
| 09/21/2005 | CN1220298C Voltage measuring circuit of battery pack |
| 09/21/2005 | CN1220295C Rechargeable battery anti-forge system |
| 09/21/2005 | CN1220264C Semiconductor IC and manufacturing method thereof |
| 09/21/2005 | CN1220068C Dry load test apparatus |
| 09/21/2005 | CN1220067C Apparatus for scanning-testing printed circuit board |
| 09/21/2005 | CN1220066C Intelligent AC-DC withstand voltage test apparatus |
| 09/21/2005 | CN1220063C Integrated block on-line measuring apparatus |
| 09/20/2005 | US6948141 Apparatus and methods for determining critical area of semiconductor design data |
| 09/20/2005 | US6948140 Methods and apparatus for characterizing board test coverage |
| 09/20/2005 | US6948107 Method and installation for fast fault localization in an integrated circuit |
| 09/20/2005 | US6948106 Method and system for partial-scan testing of integrated circuits |
| 09/20/2005 | US6948105 Method of evaluating core based system-on-a-chip (SoC) and structure of SoC incorporating same |
| 09/20/2005 | US6948098 Circuits and methods for debugging an embedded processor and systems using the same |