Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
---|
09/28/2005 | CN1675559A Fault location using measurements of current and voltage from one end of a line |
09/28/2005 | CN1674548A Pre-configured topology with connection management |
09/28/2005 | CN1674431A Apparatus and method for determining whether motor lock error occurs in sensorless motor |
09/28/2005 | CN1674350A Battery apparatus and discharge controlling method of battery apparatus |
09/28/2005 | CN1674246A Semiconductor integrated circuit having current detection functionality and power supply unit equipped with the same |
09/28/2005 | CN1674245A Method for evaluating semiconductor device error and system for supporting the same |
09/28/2005 | CN1674164A Device for detecting interferences or interruptions of the inner fields smoothing layer of medium or high voltage cables |
09/28/2005 | CN1674144A Semiconductor memory device and reading out method for redundancy remedial address |
09/28/2005 | CN1674075A Self light emitting display module, and inspection method of defect state in the same module and equipment with the same module |
09/28/2005 | CN1674053A A measuring method, module and system |
09/28/2005 | CN1673768A Calibration method and apparatus |
09/28/2005 | CN1673767A Vacuum circuit breaker electrical endurance monitoring apparatus |
09/28/2005 | CN1673765A Line defect detection maintenance equipment and method |
09/28/2005 | CN1673764A Switch selecting and moment measuring method for single phase earthing fault of small current earthed system |
09/28/2005 | CN1673763A Multifunction tester for electric cable |
09/28/2005 | CN1673762A Gasinsulation combined electric device local discharge analog experimental apparatus and experimental method |
09/28/2005 | CN1673761A Gas insulation combined electric device local discharge superhigh frequency detection apparatus and method |
09/28/2005 | CN1673760A Apparatus for testing USB memory and method thereof |
09/28/2005 | CN1673665A Measurements using tunnelling current between elongate conductors |
09/28/2005 | CN1221056C Method of monitoring operation reliability of rechargeable lithium cell |
09/28/2005 | CN1221046C Battery pack and its tester |
09/28/2005 | CN1220882C Voltage monitoring method and monitor thereof |
09/28/2005 | CN1220881C Method and device for detecting circuit board signal transmission quality |
09/27/2005 | US6951001 Method for analysis of interconnect coupling in VLSI circuits |
09/27/2005 | US6951000 Simulated voltage contrasted image generator and comparator |
09/27/2005 | US6950974 Efficient compression and application of deterministic patterns in a logic BIST architecture |
09/27/2005 | US6950973 Dynamic scan circuitry for A-phase |
09/27/2005 | US6950972 Multi-purpose BER tester (MPBERT) for very high RZ and NRZ signals |
09/27/2005 | US6950963 Control method and apparatus for testing of multiple processor integrated circuits and other digital systems |
09/27/2005 | US6950830 Stress-test information database structure and method of use |
09/27/2005 | US6950779 Apparatus and method for detecting incorrect connector insertion, and program for carrying out the method |
09/27/2005 | US6950771 Correlation of electrical test data with physical defect data |
09/27/2005 | US6950683 Battery life indication |
09/27/2005 | US6950613 Office information system having a device which provides an operational message of the system when a specific event occurs |
09/27/2005 | US6950394 Methods and systems to transfer information using an alternative routing associated with a communication network |
09/27/2005 | US6950355 System and method to screen defect related reliability failures in CMOS SRAMS |
09/27/2005 | US6950334 Magnetic random access memory having test circuit and test method therefor |
09/27/2005 | US6950046 IC with built-in self-test and design method thereof |
09/27/2005 | US6950030 Battery charge indicating circuit |
09/27/2005 | US6949969 Semiconductor device having relief circuit for relieving defective portion |
09/27/2005 | US6949960 Semiconductor integrated circuit comprising functional modes |
09/27/2005 | US6949953 Method and apparatus for providing a preselected voltage to test or repair a semiconductor device |
09/27/2005 | US6949947 Test mode circuit of semiconductor device |
09/27/2005 | US6949946 Integrated semiconductor circuit and method for functional testing of pad cells |
09/27/2005 | US6949945 Method and apparatus for measurement of the winding temperature of a drive motor |
09/27/2005 | US6949944 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
09/27/2005 | US6949942 Predictive, adaptive power supply for an integrated circuit under test |
09/27/2005 | US6949941 Manual tester for testing device and method thereof |
09/27/2005 | US6949940 Device for measurement and analysis of electrical signals of an integrated circuit component |
09/27/2005 | US6949935 Method and system for built in testing of switch functionality of tunable capacitor arrays |
09/27/2005 | US6949934 Fault-annuciating system for a transformer |
09/27/2005 | US6949933 Apparatus and method for monitoring electrical cable chafing via optical waveguides |
09/27/2005 | US6949932 Method for monitoring a power supply of a control unit in a motor vehicle |
09/27/2005 | US6949921 Auto-calibration of multiple trip settings in a fault indicator |
09/27/2005 | US6949920 Apparatus for measuring current density of fuel cell |
09/27/2005 | US6949919 Unbreakable micro-browser |
09/27/2005 | US6949911 Method for determining the amount of charge which can be drawn from a storage battery and a monitoring device for a storage battery |
09/27/2005 | US6949817 Stackable test apparatus for protecting integrated circuit packages during testing |
09/27/2005 | US6949765 Padless structure design for easy identification of bridging defects in lines by passive voltage contrast |
09/27/2005 | US6948941 Interconnect assemblies and methods |
09/27/2005 | US6948940 Helical microelectronic contact and method for fabricating same |
09/25/2005 | CA2461862A1 System and method for detecting connector pin insertion in printed circuit board assemblies |
09/22/2005 | WO2005089032A1 Apparatus for testing of flexible printed circuit board |
09/22/2005 | WO2005088814A1 Power converter, inverter x-ray high voltage unit, fluoroscopic system, x-ray ct system, mri system |
09/22/2005 | WO2005088804A1 Intelligent battery switching circuit block for portable devices |
09/22/2005 | WO2005088800A2 Power supply loading indicators and methods |
09/22/2005 | WO2005088798A1 Systems, devices, and methods for detecting arcs |
09/22/2005 | WO2005088753A1 Fuel cell system failure diagnosis method, failure diagnosis device using same, and fuel cell system |
09/22/2005 | WO2005088715A1 System and method pertaining to semiconductor dies |
09/22/2005 | WO2005088712A2 Temperature control system which sprays liquid coolant droplets against an ic-module and directs radiation against the ic-module |
09/22/2005 | WO2005088702A1 Semiconductor device |
09/22/2005 | WO2005088645A1 Test device and test method |
09/22/2005 | WO2005088326A1 Test station for a fuel cell power module |
09/22/2005 | WO2005088325A1 Test circuit and method for hierarchical core |
09/22/2005 | WO2005088324A1 Semiconductor device test equipment and device interface board |
09/22/2005 | WO2005088320A1 Adapter device for testing electrical consumers, in particular for or in a motor vehicle |
09/22/2005 | WO2005086812A2 System and method to locate an anomaly of a conductor |
09/22/2005 | WO2005086786A2 Wafer-level opto-electronic testing apparatus and method |
09/22/2005 | WO2005029097A3 A method of analyzing the time-varying electrical response of a stimulated target substance |
09/22/2005 | WO2004106946A3 A method and apparatus for measuring and analyzing electrical or electrochemical systems |
09/22/2005 | US20050210420 Design review output apparatus, design review support apparatus, design review system, design review output method, and design review support method |
09/22/2005 | US20050210352 Method and apparatus for embedded Built-In Self-Test (BIST) of electronic circuits and systems |
09/22/2005 | US20050210351 Test circuit and circuit test method |
09/22/2005 | US20050210349 Scan test tools, models and/or methods |
09/22/2005 | US20050210348 Microcomputer and method of testing same |
09/22/2005 | US20050210347 Integrated circuit |
09/22/2005 | US20050210346 Closed loop dynamic power management |
09/22/2005 | US20050210345 System and method for increasing the speed of serially inputting data into a JTAG-compliant device |
09/22/2005 | US20050210344 Non-volatile memory evaluating method and non-volatile memory |
09/22/2005 | US20050210343 Method and system for multi-user channel allocation for a multi-channel analyzer |
09/22/2005 | US20050210341 Test device |
09/22/2005 | US20050210334 Discrete tests for weak bits |
09/22/2005 | US20050210333 Performing diagnostic operations upon a data processing apparatus with power down support |
09/22/2005 | US20050210332 Module with trigger bus for SOC tester and a method of timing calibration in the module |
09/22/2005 | US20050210170 Measuring apparatus with plural modules |
09/22/2005 | US20050209827 Method and system for determining distortion in a circuit image |
09/22/2005 | US20050209809 Method for controlling a measuring apparatus |
09/22/2005 | US20050209808 Circuit board diagnostic operating center |
09/22/2005 | US20050209805 Method and system for generating test pulses to test electronic elements |
09/22/2005 | US20050209801 Testing device and testing method |