Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2005
09/28/2005CN1675559A Fault location using measurements of current and voltage from one end of a line
09/28/2005CN1674548A Pre-configured topology with connection management
09/28/2005CN1674431A Apparatus and method for determining whether motor lock error occurs in sensorless motor
09/28/2005CN1674350A Battery apparatus and discharge controlling method of battery apparatus
09/28/2005CN1674246A Semiconductor integrated circuit having current detection functionality and power supply unit equipped with the same
09/28/2005CN1674245A Method for evaluating semiconductor device error and system for supporting the same
09/28/2005CN1674164A Device for detecting interferences or interruptions of the inner fields smoothing layer of medium or high voltage cables
09/28/2005CN1674144A Semiconductor memory device and reading out method for redundancy remedial address
09/28/2005CN1674075A Self light emitting display module, and inspection method of defect state in the same module and equipment with the same module
09/28/2005CN1674053A A measuring method, module and system
09/28/2005CN1673768A Calibration method and apparatus
09/28/2005CN1673767A Vacuum circuit breaker electrical endurance monitoring apparatus
09/28/2005CN1673765A Line defect detection maintenance equipment and method
09/28/2005CN1673764A Switch selecting and moment measuring method for single phase earthing fault of small current earthed system
09/28/2005CN1673763A Multifunction tester for electric cable
09/28/2005CN1673762A Gasinsulation combined electric device local discharge analog experimental apparatus and experimental method
09/28/2005CN1673761A Gas insulation combined electric device local discharge superhigh frequency detection apparatus and method
09/28/2005CN1673760A Apparatus for testing USB memory and method thereof
09/28/2005CN1673665A Measurements using tunnelling current between elongate conductors
09/28/2005CN1221056C Method of monitoring operation reliability of rechargeable lithium cell
09/28/2005CN1221046C Battery pack and its tester
09/28/2005CN1220882C Voltage monitoring method and monitor thereof
09/28/2005CN1220881C Method and device for detecting circuit board signal transmission quality
09/27/2005US6951001 Method for analysis of interconnect coupling in VLSI circuits
09/27/2005US6951000 Simulated voltage contrasted image generator and comparator
09/27/2005US6950974 Efficient compression and application of deterministic patterns in a logic BIST architecture
09/27/2005US6950973 Dynamic scan circuitry for A-phase
09/27/2005US6950972 Multi-purpose BER tester (MPBERT) for very high RZ and NRZ signals
09/27/2005US6950963 Control method and apparatus for testing of multiple processor integrated circuits and other digital systems
09/27/2005US6950830 Stress-test information database structure and method of use
09/27/2005US6950779 Apparatus and method for detecting incorrect connector insertion, and program for carrying out the method
09/27/2005US6950771 Correlation of electrical test data with physical defect data
09/27/2005US6950683 Battery life indication
09/27/2005US6950613 Office information system having a device which provides an operational message of the system when a specific event occurs
09/27/2005US6950394 Methods and systems to transfer information using an alternative routing associated with a communication network
09/27/2005US6950355 System and method to screen defect related reliability failures in CMOS SRAMS
09/27/2005US6950334 Magnetic random access memory having test circuit and test method therefor
09/27/2005US6950046 IC with built-in self-test and design method thereof
09/27/2005US6950030 Battery charge indicating circuit
09/27/2005US6949969 Semiconductor device having relief circuit for relieving defective portion
09/27/2005US6949960 Semiconductor integrated circuit comprising functional modes
09/27/2005US6949953 Method and apparatus for providing a preselected voltage to test or repair a semiconductor device
09/27/2005US6949947 Test mode circuit of semiconductor device
09/27/2005US6949946 Integrated semiconductor circuit and method for functional testing of pad cells
09/27/2005US6949945 Method and apparatus for measurement of the winding temperature of a drive motor
09/27/2005US6949944 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process
09/27/2005US6949942 Predictive, adaptive power supply for an integrated circuit under test
09/27/2005US6949941 Manual tester for testing device and method thereof
09/27/2005US6949940 Device for measurement and analysis of electrical signals of an integrated circuit component
09/27/2005US6949935 Method and system for built in testing of switch functionality of tunable capacitor arrays
09/27/2005US6949934 Fault-annuciating system for a transformer
09/27/2005US6949933 Apparatus and method for monitoring electrical cable chafing via optical waveguides
09/27/2005US6949932 Method for monitoring a power supply of a control unit in a motor vehicle
09/27/2005US6949921 Auto-calibration of multiple trip settings in a fault indicator
09/27/2005US6949920 Apparatus for measuring current density of fuel cell
09/27/2005US6949919 Unbreakable micro-browser
09/27/2005US6949911 Method for determining the amount of charge which can be drawn from a storage battery and a monitoring device for a storage battery
09/27/2005US6949817 Stackable test apparatus for protecting integrated circuit packages during testing
09/27/2005US6949765 Padless structure design for easy identification of bridging defects in lines by passive voltage contrast
09/27/2005US6948941 Interconnect assemblies and methods
09/27/2005US6948940 Helical microelectronic contact and method for fabricating same
09/25/2005CA2461862A1 System and method for detecting connector pin insertion in printed circuit board assemblies
09/22/2005WO2005089032A1 Apparatus for testing of flexible printed circuit board
09/22/2005WO2005088814A1 Power converter, inverter x-ray high voltage unit, fluoroscopic system, x-ray ct system, mri system
09/22/2005WO2005088804A1 Intelligent battery switching circuit block for portable devices
09/22/2005WO2005088800A2 Power supply loading indicators and methods
09/22/2005WO2005088798A1 Systems, devices, and methods for detecting arcs
09/22/2005WO2005088753A1 Fuel cell system failure diagnosis method, failure diagnosis device using same, and fuel cell system
09/22/2005WO2005088715A1 System and method pertaining to semiconductor dies
09/22/2005WO2005088712A2 Temperature control system which sprays liquid coolant droplets against an ic-module and directs radiation against the ic-module
09/22/2005WO2005088702A1 Semiconductor device
09/22/2005WO2005088645A1 Test device and test method
09/22/2005WO2005088326A1 Test station for a fuel cell power module
09/22/2005WO2005088325A1 Test circuit and method for hierarchical core
09/22/2005WO2005088324A1 Semiconductor device test equipment and device interface board
09/22/2005WO2005088320A1 Adapter device for testing electrical consumers, in particular for or in a motor vehicle
09/22/2005WO2005086812A2 System and method to locate an anomaly of a conductor
09/22/2005WO2005086786A2 Wafer-level opto-electronic testing apparatus and method
09/22/2005WO2005029097A3 A method of analyzing the time-varying electrical response of a stimulated target substance
09/22/2005WO2004106946A3 A method and apparatus for measuring and analyzing electrical or electrochemical systems
09/22/2005US20050210420 Design review output apparatus, design review support apparatus, design review system, design review output method, and design review support method
09/22/2005US20050210352 Method and apparatus for embedded Built-In Self-Test (BIST) of electronic circuits and systems
09/22/2005US20050210351 Test circuit and circuit test method
09/22/2005US20050210349 Scan test tools, models and/or methods
09/22/2005US20050210348 Microcomputer and method of testing same
09/22/2005US20050210347 Integrated circuit
09/22/2005US20050210346 Closed loop dynamic power management
09/22/2005US20050210345 System and method for increasing the speed of serially inputting data into a JTAG-compliant device
09/22/2005US20050210344 Non-volatile memory evaluating method and non-volatile memory
09/22/2005US20050210343 Method and system for multi-user channel allocation for a multi-channel analyzer
09/22/2005US20050210341 Test device
09/22/2005US20050210334 Discrete tests for weak bits
09/22/2005US20050210333 Performing diagnostic operations upon a data processing apparatus with power down support
09/22/2005US20050210332 Module with trigger bus for SOC tester and a method of timing calibration in the module
09/22/2005US20050210170 Measuring apparatus with plural modules
09/22/2005US20050209827 Method and system for determining distortion in a circuit image
09/22/2005US20050209809 Method for controlling a measuring apparatus
09/22/2005US20050209808 Circuit board diagnostic operating center
09/22/2005US20050209805 Method and system for generating test pulses to test electronic elements
09/22/2005US20050209801 Testing device and testing method