| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/04/2005 | US6951263 Sound absorber, especially for motor vehicles, and a method for producing a sound absorber |
| 09/30/2005 | CA2462495A1 Method and system for protecting content in a programmable system |
| 09/29/2005 | WO2005091424A1 Power system and its management method |
| 09/29/2005 | WO2005091362A1 Method, device and system for controlling heating of circuits |
| 09/29/2005 | WO2005091305A1 Test device and test method |
| 09/29/2005 | WO2005091006A1 Probe device capable of being used for plural kinds of testers |
| 09/29/2005 | WO2005091005A2 Electronic circuit |
| 09/29/2005 | WO2005091004A1 Electric winding displacement detection method and apparatus |
| 09/29/2005 | WO2005091003A1 System and method for high voltage testing of twisted insulated conductors |
| 09/29/2005 | WO2005091002A1 Electrical monitoring device |
| 09/29/2005 | WO2005065438A3 Cantilever microprobes for contacting components and methods for making such probes |
| 09/29/2005 | US20050216811 Apparatus for testing USB memory and method thereof |
| 09/29/2005 | US20050216809 Memory module with parallel testing |
| 09/29/2005 | US20050216808 Method and circuit arrangement for testing electrical modules |
| 09/29/2005 | US20050216807 System and method for testing a circuit |
| 09/29/2005 | US20050216806 Edge-triggered master + lssd slave binary latch |
| 09/29/2005 | US20050216805 Methods for debugging scan testing failures of integrated circuits |
| 09/29/2005 | US20050216804 Semiconductor device and test method therefor |
| 09/29/2005 | US20050216803 Integrated circuit device |
| 09/29/2005 | US20050216802 TAP time division multiplexing with scan test |
| 09/29/2005 | US20050216213 Real-time noise-suppression method and apparatus therefor |
| 09/29/2005 | US20050216212 Method for estimating long term end-of-life characteristics using short-term data for lithium/silver vanadium oxide cells |
| 09/29/2005 | US20050215086 Sheet-form connector and production method and application therefor |
| 09/29/2005 | US20050215081 Method and apparatus for testing PCBA subcomponents |
| 09/29/2005 | US20050215023 Electrochemical fabrication process for forming multilayer multimaterial microprobe structures |
| 09/29/2005 | US20050214957 Method for manufacturing a transmitting optical sub-assembly with a thermo-electric cooler therein |
| 09/29/2005 | US20050214633 Method and device for judging the condition of secondary batteries and method for regenerating secondary batteries |
| 09/29/2005 | US20050213882 Optical sub-assembly having a thermo-electric cooler and an optical transceiver using the optical sub-assembly |
| 09/29/2005 | US20050213867 Optical battery temperature monitoring system and method |
| 09/29/2005 | US20050213608 Pre-configured topology with connection management |
| 09/29/2005 | US20050213403 Test terminal negation circuit |
| 09/29/2005 | US20050213402 Semiconductor memory device and test method thereof |
| 09/29/2005 | US20050213394 Multiple-select multiplexer circuit, semiconductor memory device including a multiplexer circuit and method of testing the semiconductor memory device |
| 09/29/2005 | US20050213275 Semiconductor integrated circuit having current detection functionality and power supply unit equipped with the same |
| 09/29/2005 | US20050212782 Control device having improved testing properties |
| 09/29/2005 | US20050212730 Self light emitting display module, electronic equipment into which the same module is loaded, and inspection method of defect state in the same module |
| 09/29/2005 | US20050212568 Drive circuit and method of applying high voltage test thereon |
| 09/29/2005 | US20050212555 Semiconductor circuit |
| 09/29/2005 | US20050212550 Semiconductor device incorporating characteristic evaluating circuit operated by high frequency clock signal |
| 09/29/2005 | US20050212549 Motor driving system having power semiconductor module life detection function |
| 09/29/2005 | US20050212548 Apparatus and method for determining whether motor lock error occurs in sensorless motor |
| 09/29/2005 | US20050212547 System and method for measuring time dependent dielectric breakdown with a ring oscillator |
| 09/29/2005 | US20050212546 Method and apparatus for package testing |
| 09/29/2005 | US20050212545 Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method |
| 09/29/2005 | US20050212544 Performance board and testing system |
| 09/29/2005 | US20050212543 System and method for measuring negative bias thermal instability with a ring oscillator |
| 09/29/2005 | US20050212542 Self-testing input/output pad |
| 09/29/2005 | US20050212541 Test probe |
| 09/29/2005 | US20050212540 Probe card and method for constructing same |
| 09/29/2005 | US20050212539 Cantilever microprobes for contacting electronic components and methods for making such probes |
| 09/29/2005 | US20050212538 System and method for site-to-site yield comparison while testing integrated circuit dies |
| 09/29/2005 | US20050212530 Method and Apparatus for Testing Electromagnetic Connectivity in a Drill String |
| 09/29/2005 | US20050212528 Power supply noise measuring device |
| 09/29/2005 | US20050212527 Detecting the status of an electrical fuse |
| 09/29/2005 | US20050212526 Electrical wiring inspection system |
| 09/29/2005 | US20050212525 Advanced 24/7 differential oscilloscope with remote access and security features for detection of neutral to earth voltage |
| 09/29/2005 | US20050212524 Electric power line on-line diagnostic method |
| 09/29/2005 | US20050212523 Variable-structure diagnostics approach achieving optimized low-frequency data sampling for EMA motoring subsystem |
| 09/29/2005 | US20050212522 Circuit protection device with timed negative half-cycle self test |
| 09/29/2005 | US20050212521 Electronic battery tester or charger with databus connection |
| 09/29/2005 | US20050212506 Testing of current transformers |
| 09/29/2005 | US20050212490 Device combination system |
| 09/29/2005 | US20050212147 Semiconductor wafer, semiconductor chip, and semiconductor chip inspection method |
| 09/29/2005 | US20050212044 Inspection method and inspection apparatus |
| 09/29/2005 | US20050211890 Method for evaluating semiconductor device error and system for supporting the same |
| 09/29/2005 | DE20320996U1 Probing apparatus for measuring electrical characteristics of integrated circuit, has signal contact tip for selective engagement with signal contact pad of device under test and coupled to impedance matching resistor |
| 09/29/2005 | DE202005010764U1 Charging device for batteries e.g. for forklift truck, has control device and bidirectional interface for data exchange with mobile phone |
| 09/29/2005 | DE19731944B4 Testmusterbereich bzw. eine Testelementgruppe zur Lebensdauerauswertung von Ladungsträgern in einem Halbleitersubstrat Test pattern area or a test element group for lifetime evaluation of charge carriers in a semiconductor substrate |
| 09/29/2005 | DE19707325B4 Verfahren zum Prüfen integrierter Schaltkreise A method of testing integrated circuits |
| 09/29/2005 | DE10393176T5 Verfahren zum Evaluieren eines kernbasierten Systems auf einem Chip A method for evaluating a core based system on a chip |
| 09/29/2005 | DE10307344B4 Vorrichtung und Verfahren zur dezentralen On-Board-Diagnose für Kraftfahrzeuge Apparatus and method for decentralized On-board diagnostics for motor vehicles |
| 09/29/2005 | DE102004050909A1 Quellensynchrone Zeitextraktion, Zyklisierung und Abtastung Source Synchronous time extraction, cyclization and scanning |
| 09/29/2005 | DE102004035343A1 Contacting card for use in testing integrated circuits, has a substrate carrier with contacts matching those of a wafer substrate to be tested and connects from these contacts to a testing device |
| 09/29/2005 | DE102004033836B3 Starter battery operating parameters determining device for motor vehicle, has comparator to effect transition of measuring device, controller, bus and converter from inactive to active mode when battery voltage falls below preset voltage |
| 09/29/2005 | DE102004012371A1 Adaptervorrichtung zum Prüfen von elektrischen Verbrauchern, insbesondere für oder in einem Kraftfahrzeug Adapter device for testing electrical loads, particularly for or in a motor vehicle |
| 09/29/2005 | DE102004012238A1 Arrangement of semiconductor elements on a wafer has capacitors near sawing edge and fuse elements near chips for testing |
| 09/29/2005 | DE102004010783A1 Verfahren und Schaltungsanordnung zum Testen elektrischer Bausteine Method and circuit arrangement for testing electrical components |
| 09/29/2005 | CA2561000A1 Electric winding displacement detection method and apparatus |
| 09/28/2005 | EP1580810A2 A semiconductor device with a plurality of ground planes |
| 09/28/2005 | EP1580720A2 Self light emitting display module, electronic equipment into which the same module is loaded, and inspection method of defect state in the same module |
| 09/28/2005 | EP1580567A2 Device and method for nondestructive inspection on semiconductor device |
| 09/28/2005 | EP1580564A1 Method of determination of current density distribution in fuel cells |
| 09/28/2005 | EP1579230A1 Device and method for creating a signature |
| 09/28/2005 | EP1579229A1 Connecting multiple test access port controllers through a single test access port |
| 09/28/2005 | EP1579228A1 A method and apparatus for inspection of high frequency and microwave hybrid circuits and printed circuit boards |
| 09/28/2005 | EP1579226A2 System with multiple path fail over, fail back and load balancing |
| 09/28/2005 | EP1579205A2 Battery monitoring system and method |
| 09/28/2005 | EP1451594B1 Test probe for a finger tester and corresponding finger tester |
| 09/28/2005 | EP1402665B1 Measuring system with a reference signal between a signal generator and a signal analyser |
| 09/28/2005 | EP0917765B1 Swept frequency device test |
| 09/28/2005 | EP0886894B1 Contact carriers for populating substrates with spring contacts |
| 09/28/2005 | CN2729741Y Controller for apparatus of automatic detecting dielectric strength between commutator |
| 09/28/2005 | CN2729740Y Apparatus for detecting grounding fault of electric distribution network |
| 09/28/2005 | CN2729739Y TV cable assisted tester |
| 09/28/2005 | CN2729738Y Apparatus for detecting rotor winding of motor |
| 09/28/2005 | CN2729735Y 0.1 H2 electronic ultra-low frequency AC voltage test apparatus |
| 09/28/2005 | CN2728534Y Electrostatic discharging path on-line monitor |
| 09/28/2005 | CN1675756A Anisotropic conductivity connector, conductive paste composition, probe member, wafer inspecting device, and wafer inspecting method |
| 09/28/2005 | CN1675755A Anisotropically conductive connector, probe material member, wafer inspection apparatus, and wafer inspection method |
| 09/28/2005 | CN1675560A Module, electronic device and evaluation tool |