Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2005
10/06/2005US20050218924 Method and testing apparatus for testing integrated circuits
10/06/2005US20050218923 Semiconductor wafer and semiconductor device manufacturing method using the same
10/06/2005US20050218922 Method and apparatus for testing defective portion of semiconductor device
10/06/2005US20050218921 Method and application of pica (picosecond imaging circuit analysis) for high current pulsed phenomena
10/06/2005US20050218920 Apparatus and method for providing system and test clock signals to an integrated circuit on a single pin
10/06/2005US20050218919 Apparatus and method for testing semiconductor device
10/06/2005US20050218918 Apparatus for determining burn-in reliability from wafer level burn-in
10/06/2005US20050218917 Semiconductor component with internal heating
10/06/2005US20050218916 Semiconductor device and inspection method
10/06/2005US20050218915 Method and apparatus for battery testing
10/06/2005US20050218908 Method to include delta-i noise on chip using lossy transmission line representation for the power mesh
10/06/2005US20050218907 System and method for on line monitoring of insulation condition for dc machines
10/06/2005US20050218906 System and method for monitoring of insulation condition
10/06/2005US20050218905 Device for detecting interferences or interruptions of the inner fields smoothing layer of medium or high voltage cables
10/06/2005US20050218904 Fault detection circuit for a driver circuit
10/06/2005US20050218903 Voltage waveform generation circuit
10/06/2005US20050218902 Battery test module
10/06/2005US20050218901 Query based electronic battery tester
10/06/2005US20050218900 Voltage measuring apparatus
10/06/2005US20050218899 Load board with embedded relay tracker
10/06/2005US20050218883 Method and system for detecting electronic component failures
10/06/2005US20050218881 Jitter measuring apparatus and a testing apparatus
10/06/2005US20050218512 Semiconductor device, electrical inspection method thereof, and electronic apparatus including the semiconductor device
10/06/2005US20050217583 Wafer chuck having thermal plate with interleaved heating and cooling elements
10/06/2005DE202005010711U1 Energy/power supply for showing single loads in a supply voltage shows energy consumption conditions of individual loads
10/06/2005DE10243972B4 Mehrteilige Befestigungsplatte Multi-piece mounting plate
10/06/2005DE10205115B4 Kopplungsvorrichtung für Platinen Coupling device for boards
10/06/2005DE102004061510A1 Jitter testing device for electronic device e.g. deserializer, has determination unit that determines whether electronic device is defective, by detecting bit error in output signal from electronic device
10/06/2005DE102004013817A1 Critical vehicle battery charge status monitoring unit measures voltage and quality parameter and compares them with threshold matrix to provide fault alert
10/06/2005DE102004012798A1 Stickstofffreie antireflektierende Beschichtung und Verfahren zur Herstellung derselben Nitrogen-free anti-reflective coating and methods for making the same
10/05/2005EP1583406A2 Interconnect assembly for printed circuit boards
10/05/2005EP1583007A2 Method for evaluating semiconductor device error and system for supporting the same
10/05/2005EP1582985A2 Test case inheritance controlled via attributes
10/05/2005EP1582958A2 Method and system for protecting content in a programmable system
10/05/2005EP1582885A1 Test system with differential signal measurement
10/05/2005EP1582884A1 Semiconductor motor drive circuit with end of life detection
10/05/2005EP1582883A1 Method of inducing a state in a hardware emulation circuit
10/05/2005EP1582882A2 Method of measuring duty cycle
10/05/2005EP1581870A2 Semiconductor test system storing pin calibration data, commands and other data in non-volatile memory
10/05/2005EP1581816A1 Measuring method for deciding direction to a flickering source
10/05/2005EP1581815A2 Method and system for computer-assisted testing of a machine system
10/05/2005EP1577150B1 Arrangement for detecting short-circuits in switched-off branches of electrical AC power networks, especially in branches for feeding railways
10/05/2005CN2731806Y Fully automatic emergency electronic stabilier
10/05/2005CN2731466Y Battery capacity detection appts.
10/05/2005CN2731465Y Bar-to-bar dielectric strength detector for dynamo commutator
10/05/2005CN2731464Y Non-load tester for parameter and performance of d.c permanent-magnet dynamo
10/05/2005CN2731463Y Intelligent electricity leakage alarm for train
10/05/2005CN2731462Y Antitheft alarm for power line
10/05/2005CN2731461Y Digital cable checker
10/05/2005CN2731460Y Theoretical line loss monitor
10/05/2005CN1679264A Wireless local on metropolitan area network with intrusion detection features and related methods
10/05/2005CN1679199A Method for inspecting secondary battery precursor, and method for manufacturing secondary battery using the method
10/05/2005CN1679165A Method of evaluating core based system-on-a-chip
10/05/2005CN1679118A Built-in-self-test of flash memory cells
10/05/2005CN1678917A Integrated circuit with embedded identification code
10/05/2005CN1678916A Apparatus and method for evaluating underground electric power cables
10/05/2005CN1678172A Circuit board component ambient moisture exposure monitoring
10/05/2005CN1677844A High performance signal generation
10/05/2005CN1677788A Battery, battery protection processing device and control method
10/05/2005CN1677640A Test system with differential signal measurement
10/05/2005CN1677639A Method of measuring duty cycle
10/05/2005CN1677638A Method and apparatus for testing defective portion of semiconductor device
10/05/2005CN1677633A Motor drive device with power semiconductor module life testing function
10/05/2005CN1677614A Semiconductor device, electrical inspection method thereof, and electronic apparatus including the semiconductor device
10/05/2005CN1677450A Sensor cable and amplifier-separated type sensor with the cable
10/05/2005CN1677365A Test case inheritance controlled via attributes
10/05/2005CN1677123A Method for calibrating semiconductor test instrument
10/05/2005CN1677122A Method for calibrating semiconductor test instrument
10/05/2005CN1677121A Method for calibrating semiconductor test instrument
10/05/2005CN1677120A Method, system and device for operating PICA (picosecond imaging circuit analysis)/high current source system
10/05/2005CN1677119A Test terminal negation circuit
10/05/2005CN1677118A 印刷电路板检查装置 A printed circuit board inspection apparatus
10/05/2005CN1677117A Wireless detection system
10/05/2005CN1677116A Probe examination device
10/05/2005CN1677114A Voltage measuring apparatus
10/05/2005CN1222198C Printed circuit board with testing point formed at side
10/05/2005CN1222036C Semiconductor device fabrication method and device thereof
10/05/2005CN1222028C Correcting apparatus for use in semiconductor device testing processor
10/05/2005CN1221926C Method and device for examining circuit board in pre-determined area of said circuit
10/05/2005CN1221808C Method and equipment for testing semiconductor device
10/04/2005US6952812 Design analysis tool for path extraction and false path identification and method thereof
10/04/2005US6952796 Test data generating system and method to test high-speed actual operation
10/04/2005US6952790 System for varying timing between source and data signals in a source synchronous interface
10/04/2005US6952654 Methods for calculating the voltage induced in a device
10/04/2005US6952623 Permanent chip ID using FeRAM
10/04/2005US6952492 Method and apparatus for inspecting a semiconductor device
10/04/2005US6952403 Method and apparatus providing dial on demand scaling
10/04/2005US6952398 System and method for optimal allocation of link bandwidth in a communications network for truck routing
10/04/2005US6952373 Semiconductor device having PLL-circuit
10/04/2005US6952372 Semiconductor memory device capable of testing data line redundancy replacement circuit
10/04/2005US6952111 Apparatus and method for universally testing semiconductor devices with different pin arrangement
10/04/2005US6952110 Testing apparatus for carrying out inspection of a semiconductor device
10/04/2005US6952109 Selectively configurable probe structures, e.g., for testing microelectronic components
10/04/2005US6952108 Methods for fabricating plasma probes
10/04/2005US6952107 Optical electric field or voltage sensing system
10/04/2005US6952106 E-beam voltage potential circuit performance library
10/04/2005US6952105 Inspection method and apparatus for circuit pattern of resist material
10/04/2005US6952104 Inspection method and apparatus for testing fine pitch traces
10/04/2005US6952103 Circuit and method for detecting insulation faults
10/04/2005US6951767 Development hastened stability of titanium nitride for APM etching rate monitor
1 ... 1012 1013 1014 1015 1016 1017 1018 1019 1020 1021 1022 1023 1024 1025 1026 1027 1028 1029 1030 1031 1032 ... 1523