Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2005
10/13/2005DE102004008994A1 Error diagnosis process in high voltage networks determines error affected phase then earths a non affected phase and finds distance to the fault by impedance measurement
10/13/2005CA2561880A1 Method and system for protecting content in a programmable system
10/13/2005CA2559922A1 Electrical wire joint fault detection
10/13/2005CA2503077A1 Procedure for detecting and locating the source of partial discharges in an electrical device
10/12/2005EP1585374A1 Circuit board checker and circuit board checking method
10/12/2005EP1585207A2 Power supply apparatus
10/12/2005EP1585139A1 An on-chip and at-speed tester for testing and characterization of different types of memories
10/12/2005EP1584941A1 Device for measuring a battery energy in particular during charge/discharge of a battery
10/12/2005EP1584940A1 Apparatus and method for compensating clock period elongation during scan testing in an integrated circuit
10/12/2005EP1584939A1 An integrated circuit with test circuitry
10/12/2005EP1584938A1 At-speed testing of an integrated circuit
10/12/2005EP1584937A1 Systems and methods for processing automatically generated test patterns
10/12/2005EP1584936A1 Test terminal negation circuit
10/12/2005EP1584935A1 Configuration of unused external pins during the test mode in a semiconductor integrated circuit
10/12/2005EP1584934A1 Device for releasable connecting an interface to a test equipment
10/12/2005EP1584933A1 Method and device for testing of integrated circuits
10/12/2005EP1584932A1 Method of testing semiconductor wafers with non-penetrating probes
10/12/2005EP1584931A1 High voltage converter and method of detecting an insulation fault in a high voltage converter
10/12/2005EP1584929A2 High performance signal generation
10/12/2005EP1583975A1 Universal-messadapter-system
10/12/2005EP1504273B1 System for testing digital components
10/12/2005EP1377844B1 Method and system for determining the buffer action of a battery
10/12/2005EP1151308B1 Coupling and centering system, particularly for aligning printed circuits in testing procedures
10/12/2005EP0987631B1 Communication equipment
10/12/2005CN2733374Y Remote power down monitoring module
10/12/2005CN2733373Y Apparatus having storage battery and generator condition display
10/12/2005CN2733372Y 继电器输出电路控制器 Relay Output circuit controller
10/12/2005CN2733371Y An apparatus for testing transformer
10/12/2005CN2733370Y Energy-saving burn-in device for DC/AC switch power supply
10/12/2005CN2733363Y Electronic component and circuit and circuit board detecting device
10/12/2005CN2733362Y Pushing device of electric crystal test module
10/12/2005CN1682447A Coding of information in integrated circuits
10/12/2005CN1682125A Method and device for voltage measurement of an AC power supply
10/12/2005CN1682124A Compensation for test signal degradation due to dut fault
10/12/2005CN1682123A Method and system for joule heating characterization
10/12/2005CN1682122A Apparatus and method for measuring IDDQ
10/12/2005CN1682121A Reduced chip testing scheme at wafer level
10/12/2005CN1682120A System and method for detecting alternator condition
10/12/2005CN1682117A Interface comprising a thin PCB with protrusions for testing an integrated circuit
10/12/2005CN1681209A Flip flop
10/12/2005CN1681152A Power supply apparatus
10/12/2005CN1681106A Manufacturing method of semiconductor integrated circuit device and probe card
10/12/2005CN1680822A Voltage detecting monitor of large-scale integrated fuel battery
10/12/2005CN1680821A Leakage monitoring system
10/12/2005CN1680820A Calibration method of semiconductor tester
10/12/2005CN1222779C Detecting method for motor phase current
10/12/2005CN1222776C Probe card and method of producing the same
10/12/2005CN1222775C Test systems for wireless-communications devices
10/11/2005US6954913 System and method for in-situ signal delay measurement for a microprocessor
10/11/2005US6954912 Error detection in dynamic logic circuits
10/11/2005US6954888 Arithmetic built-in self-test of multiple scan-based integrated circuits
10/11/2005US6954887 Multiple-capture DFT system for scan-based integrated circuits
10/11/2005US6954886 Deterministic hardware reset for FRC machine
10/11/2005US6954706 Method for measuring integrated circuit processor power demand and associated system
10/11/2005US6954705 Method of screening defects using low voltage IDDQ measurement
10/11/2005US6954678 Artificial intelligence system for track defect problem solving
10/11/2005US6954104 Method and system for monitoring a deliverable radio frequency power of an amplifier operable on a monolithic microwave integrated circuit
10/11/2005US6954083 Circuit for detection of hardware faults due to temporary power supply fluctuations
10/11/2005US6954082 Method and apparatus for testing of integrated circuit package
10/11/2005US6954080 Method and apparatus for die testing on wafer
10/11/2005US6954079 Interface circuit coupling semiconductor test apparatus with tested semiconductor device
10/11/2005US6954076 Aircraft multi-function wire and insulation tester
10/11/2005US6954061 Method and apparatus for electronic meter testing
10/11/2005US6954060 a-c current transformer functional with a d-c current component present
10/11/2005US6953348 IC socket
10/08/2005CA2503934A1 Ac power phase indicator
10/06/2005WO2005093820A1 Turning device for heavy object
10/06/2005WO2005093447A2 Method of testing an electrochemical device
10/06/2005WO2005093446A1 Method and equipment for estimating residual capacity of storage battery
10/06/2005WO2005093445A1 Testing integrated circuits
10/06/2005WO2005093444A1 System and method for detecting connector pin insertion in printed circuit board assemblies
10/06/2005WO2005093443A1 Test device and test method
10/06/2005WO2005093442A1 Method for manufacturing semiconductor integrated circuit device
10/06/2005WO2005093441A1 Line defect testing-repairing device and method
10/06/2005WO2005091962A2 Dual channel source measurement unit for semiconductor device testing
10/06/2005WO2005091791A2 Fiber optic sensor for detecting partial discharge
10/06/2005WO2005072071A3 Signal detector
10/06/2005WO2005067445A3 Chuck with integrated wafer support
10/06/2005WO2004079865A8 High speed connector
10/06/2005WO2004062170A3 Field transmitter with diagnostic self-test mode
10/06/2005US20050223346 Random code generation using genetic algorithms
10/06/2005US20050223266 Storage system and a method for diagnosing failure of the storage system
10/06/2005US20050223232 Provisioning and use of security tokens to enable automated test equipment
10/06/2005US20050222821 Test system with differential signal measurement
10/06/2005US20050222800 System and method for predicting burn-in conditions
10/06/2005US20050222798 Method and apparatus for creating performance limits from parametric measurements
10/06/2005US20050222795 Apparatus and method for compensating clock period elongation during scan testing in an integrated circuit (IC)
10/06/2005US20050222789 Automatic test system
10/06/2005US20050221644 Microprobe tips and methods for making
10/06/2005US20050220237 Method and arrangement for sampling
10/06/2005US20050220035 Estimator for end-to-end throughput of wireless networks
10/06/2005US20050219926 Real current sense apparatus for a DC-to-DC converter
10/06/2005US20050219521 Apparatus and method for inspecting a semiconductor component
10/06/2005US20050219406 Digital camera
10/06/2005US20050219050 Method and apparatus for the automatic determination of network cable connections using RFID tags and an antenna grid
10/06/2005US20050218997 High performance signal generation
10/06/2005US20050218960 Integrated circuit
10/06/2005US20050218939 Under-voltage detection circuit
10/06/2005US20050218926 Measuring method, inspection method, inspection device, semiconductor device, method of manufacturing a semiconductor device, and method of manufacturing an element substrate
10/06/2005US20050218925 Laser production and product qualification via accelerated life testing based on statistical modeling
1 ... 1011 1012 1013 1014 1015 1016 1017 1018 1019 1020 1021 1022 1023 1024 1025 1026 1027 1028 1029 1030 1031 ... 1523