Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2005
10/18/2005US6956355 Self-diagnosis system for an energy storage device
10/18/2005US6956174 Tip structures
10/18/2005US6955932 Single and double-gate pseudo-FET devices for semiconductor materials evaluation
10/18/2005US6955870 Method of manufacturing a semiconductor device
10/18/2005US6955264 Method of detecting protrusion of inspection object from palette and method of fabricating semiconductor device
10/13/2005WO2005096688A1 System and method for defect detection and process improvement for printed circuit board assemblies
10/13/2005WO2005096606A1 Electrical wire joint fault detection
10/13/2005WO2005096500A1 Circuit testing apparatus, circuit testing method, and signal distributing method therefor
10/13/2005WO2005096386A1 Parameter adjuster
10/13/2005WO2005096368A1 Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
10/13/2005WO2005096156A1 Method and system for protecting content in a programmable system
10/13/2005WO2005096007A1 Magnetic field sensor
10/13/2005WO2005096006A1 Sensor and inspection device using the sensor
10/13/2005WO2005096005A1 Measuring circuit for the output of a power amplifier and a power amplifier comprising the measuring circuit
10/13/2005WO2005096004A1 Real-time in-line testing of semiconductor wafers
10/13/2005WO2005096003A1 A method of testing the defect of a display panel
10/13/2005WO2005096002A1 Radiation information management device and communication device
10/13/2005WO2005095999A1 Inspection block
10/13/2005WO2005094405A2 Closed loop dynamic power management
10/13/2005WO2005094154A2 Method and device for detecting an external antenna
10/13/2005WO2005072264A3 System and method for adjusting a pid controller in a limited rotation motor system
10/13/2005WO2005065432A3 Pin-type probes for contacting electronic circuits and methods for making such probes
10/13/2005WO2005057230A3 Methods and apparatus for transforming sequential logic designs into equivalent combinational logic
10/13/2005WO2004102299A3 Test apparatus for evaluating voltage regulators
10/13/2005US20050229123 Computer-aided design system to automate scan synthesis at register-transfer level
10/13/2005US20050229121 Verification of integrated circuit tests using test simulation and integrated circuit simulation with simulated failure
10/13/2005US20050229074 Forward error correction in packet networks
10/13/2005US20050229067 Semiconductor integrated circuit
10/13/2005US20050229066 Digital frequency synthesis clocked circuits
10/13/2005US20050229065 Semiconductor integrated ciruit which properly executes an operational test of a circuit under test in the semiconductor integrated circuit
10/13/2005US20050229064 Methods and systems for digital testing on automatic test equipment (ATE)
10/13/2005US20050229063 Fault position identification system for a semiconductor device and method of identifying a fault position of a semiconductor device
10/13/2005US20050229062 Systems and methods for processing automatically generated test patterns
10/13/2005US20050229061 Method of efficiently compressing and decompressing test data using input reduction
10/13/2005US20050229060 Method and apparatus for detecting array degradation and logic degradation
10/13/2005US20050229059 Flip flop circuit and apparatus using a flip flop circuit
10/13/2005US20050229058 Semiconductor intergrated circuit
10/13/2005US20050229057 Method, apparatus, and computer program product for implementing deterministic based broken scan chain diagnostics
10/13/2005US20050229056 Circuit and method for comparing circuit performance between functional and AC scan testing in an integrated circuit (IC)
10/13/2005US20050229055 Interface circuit for a single logic input pin of an electronic system
10/13/2005US20050229054 Integrated circuit
10/13/2005US20050229053 Circuit and method for low frequency testing of high frequency signal waveforms
10/13/2005US20050229052 Method, system and program product for autonomous error recovery for memory devices
10/13/2005US20050229050 Semiconductor device
10/13/2005US20050228631 Model specific register operations
10/13/2005US20050228606 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting ICs mis-processed during their manufacture
10/13/2005US20050227512 Kelvin contact module for a microcircuit test system
10/13/2005US20050227503 Method and device for conditioning semiconductor wafers and/or hybrids
10/13/2005US20050227383 Manufacturing method of semiconductor integrated circuit device and probe card
10/13/2005US20050226275 Local transmission system for a vehicle
10/13/2005US20050226195 Monitoring network traffic
10/13/2005US20050226168 Method of discovering and operating a payload node
10/13/2005US20050226160 Method and system for multi-PHY addressing
10/13/2005US20050225948 Apparatus and method for a clip device for coupling a heat sink plate system with a burn-in board system
10/13/2005US20050225909 Leakage monitoring system
10/13/2005US20050225423 Fast-test printed resistor device with test auxiliary lines
10/13/2005US20050225382 Apparatus for providing a high frequency loop back with a DC path for a parametric test
10/13/2005US20050225360 Voltage detection circuit, power supply unit and semiconductor device
10/13/2005US20050225350 Capacitance measurement method of micro structures of integrated circuits
10/13/2005US20050225349 Semiconductor tester
10/13/2005US20050225348 Integrated circuit and associated packaged integrated circuit
10/13/2005US20050225347 Wireless test cassette
10/13/2005US20050225346 Cooling fin connected to a cooling unit and a pusher of the testing apparatus
10/13/2005US20050225345 Method of testing semiconductor wafers with non-penetrating probes
10/13/2005US20050225344 Interconnect having spring contacts
10/13/2005US20050225343 Device and method of testing an electronic component
10/13/2005US20050225342 Method of manufacturing a semiconductor device testing contactor having a circuit-side contact piece and test-board-side contact piece
10/13/2005US20050225340 Conductive material for integrated circuit fabrication
10/13/2005US20050225339 Double side probing of semiconductor devices
10/13/2005US20050225338 Hard drive test fixture
10/13/2005US20050225337 Contact system for wafer level testing
10/13/2005US20050225333 Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits
10/13/2005US20050225330 High frequency delay circuit and test apparatus
10/13/2005US20050225329 Correction of loss and dispersion in cable fault measurements
10/13/2005US20050225316 Connection apparatus and cable assembly for semiconductor-device characteristic measurement apparatus
10/13/2005US20050225315 Socket cover and test interface
10/13/2005US20050225314 Method of measuring duty cycle
10/13/2005US20050225301 Method and system for determining the health of a battery
10/13/2005US20050225300 Device for a battery charger
10/13/2005US20050225295 Information terminal and battery remaining capacity calculating method
10/13/2005US20050225290 Power supply apparatus
10/13/2005US20050224963 Voltage contrast monitor for integrated circuit defects
10/13/2005US20050224942 Semiconductor device with a plurality of ground planes
10/13/2005US20050224792 Novel test structure for speeding a stress-induced voiding test and method of using same
10/13/2005US20050224492 Micro thermal chamber having proximity control temperature management for devices under test
10/13/2005US20050224457 Method and apparatus for repairing shape, and method for manufacturing semiconductor device using those
10/13/2005DE19645158B4 Verfahren zur Erfassung eines Störlichtbogens und Lichtbogenwächter hierfür A method for detecting a fault arc and arc monitor this
10/13/2005DE19525475B4 Sicherungsvorrichtung für eine Stromleitung in Fahrzeugen Safety device for a power line in vehicles
10/13/2005DE10297753T5 Unterspannungs-Detektionsschaltung Under-voltage detection circuit
10/13/2005DE102004014648A1 Test object holder, for semiconductor thermal tests, has semiconductor heater and sensor element using bipolar transistor
10/13/2005DE102004014624A1 Lokales Übertragungssystem für ein Verkehrsmittel Local transmission system for a transport
10/13/2005DE102004014493A1 Verfahren zur Bestimmung der Stromdichteverteilung in Brennstoffzellen A method for determining the current density distribution in the fuel cell
10/13/2005DE102004014389A1 Testing method for Zener/rectifier diodes for a motor vehicle's generator easily recognizes the type of diode by measuring quiescent current and capacity
10/13/2005DE102004013665A1 CT-adapter (in-circuit test) for testing computer mother boards using a UV light radiator instead of needles with contact-free current transfer from the signal transmitter in the adapter to the board under test
10/13/2005DE102004013659A1 Vorrichtung zum Erfassen einer elektrischen Größe eines Akkumulators A device for detecting an electrical quantity of an accumulator
10/13/2005DE102004013606A1 Vorrichtung zur Messung von Störungen oder Unterbrechungen in der inneren Glättungsschicht in Mittel- und Hochspannungskabeln Apparatus for measurement of disturbances or interruptions in the inner layer smoothing in medium and high voltage cables
10/13/2005DE102004013492A1 Vorrichtung zum Einkoppeln von elektrischen Signalen in Leitungen oder Kabel zu Ortungszwecken Apparatus for coupling electrical signals in lines or cables to locating purposes
10/13/2005DE102004013429A1 Überwachungsvorrichtung zur Überwachung interner Signale während einer Initialisierung einer elektronischen Schaltungseinheit Monitoring device to monitor internal signals during initialization of an electronic circuit unit
10/13/2005DE102004012766A1 Carrier module for semiconductor device test handler, has bolting devices fastened such that it is rotated on opposite sides of other set of bolting devices, where two elastic units flexibly hold bolting devices
10/13/2005DE102004009693A1 Technik zum Kombinieren eines Abtasttests und eines eingebauten Speicherselbsttests Technique for combining a scan test and a built-in memory selftest
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