| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/20/2005 | US20050231229 Apparatus and method for inspecting a liquid crystal display panel |
| 10/20/2005 | US20050231228 Electrical circuit and method for testing integrated circuits |
| 10/20/2005 | US20050231227 Semiconductor test apparatus |
| 10/20/2005 | US20050231226 Low-current probe card |
| 10/20/2005 | US20050231224 Burn-in socket assembly |
| 10/20/2005 | US20050231223 Membrane probing system with local contact scrub |
| 10/20/2005 | US20050231222 Wafer probing that conditions devices for flip-chip bonding |
| 10/20/2005 | US20050231220 Terminal of IC test fixture |
| 10/20/2005 | US20050231219 Apparatus and method for detecting photon emissions from transistors |
| 10/20/2005 | US20050231218 Apparatus and method for non-destructive testing of primers, in particular for airbags in motor vehicles |
| 10/20/2005 | US20050231217 DC ground fault detection with resistive centering |
| 10/20/2005 | US20050231211 Continuity tester with magnetic ground and method therefor |
| 10/20/2005 | US20050231210 Apparatus and method for field testing polymer insulators |
| 10/20/2005 | US20050231208 Non-load driven fault monitor for electrical circuits |
| 10/20/2005 | US20050231206 Battery gas gauge |
| 10/20/2005 | US20050231205 Scan tool for electronic battery tester |
| 10/20/2005 | US20050231204 Testing MEM device array |
| 10/20/2005 | US20050231190 [auto-recovery wafer testing apparatus and wafer testing method] |
| 10/20/2005 | US20050231189 Measurement circuit with improved accuracy |
| 10/20/2005 | US20050231188 Method and circuit for conducting AC offset current compensation and testing device using the same |
| 10/20/2005 | US20050231187 Method and structure for variable pitch microwave probe assembly |
| 10/20/2005 | US20050231175 Power supply apparatus |
| 10/20/2005 | US20050231167 Battery monitoring system |
| 10/20/2005 | US20050231040 Radiation information management device and communication device |
| 10/20/2005 | US20050230796 Semiconductor integrated circuit |
| 10/20/2005 | US20050230792 Modifying a semiconductor device to provide electrical parameter monitoring |
| 10/20/2005 | US20050230622 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 10/20/2005 | DE60015493T2 Vorrichtung und verfahren zur vermeidung von buskonflikten Apparatus and method for avoiding bus contention |
| 10/20/2005 | DE10393879T5 Halbleitertestgerät Semiconductor testing apparatus |
| 10/19/2005 | EP1587244A1 Method of configuring a filter device for a data stream comprising frames, and protocol tester |
| 10/19/2005 | EP1587144A1 Test structure for an electronic device and corresponding test method |
| 10/19/2005 | EP1586912A1 Laser beam inspection equipment |
| 10/19/2005 | EP1586911A1 Process for detecting and locating a partial discharge source in an electrical apparatus |
| 10/19/2005 | EP1586910A1 Method of and device for insulation monitoring |
| 10/19/2005 | EP1586909A1 Method of determining the offset drift of a Wheatstone bridge |
| 10/19/2005 | EP1586181A1 Intelligent control for scaleable congestion free switching |
| 10/19/2005 | EP1410051B1 Method and device for checking for errors in electrical lines and/or electrical consumers in a vehicle |
| 10/19/2005 | EP1348134B1 Weighted random pattern test using pre-stored weights |
| 10/19/2005 | EP1307753B1 Method and device for identifying and localising high-ohm, single-pole earth faults |
| 10/19/2005 | EP1118867B1 Method for testing a CMOS integrated circuit |
| 10/19/2005 | EP0921528B1 A memory device using direct access mode test and a method of testing the same |
| 10/19/2005 | EP0884599B1 Programming mode selection with jtag circuits |
| 10/19/2005 | CN2735353Y 电容器测试机构 Capacitor testing agency |
| 10/19/2005 | CN2735348Y Improved structure for printed circuit board test device |
| 10/19/2005 | CN2735347Y Improved structure for printed circuit board test device |
| 10/19/2005 | CN2735346Y Earthing structure of circuit board test device |
| 10/19/2005 | CN2735345Y Circuit board assistant testing component and circuit board having the component |
| 10/19/2005 | CN2735344Y Circuit board assistant testing component and circuit board having the component |
| 10/19/2005 | CN1685510A Electrical device, a method for manufacturing an electrical device, test structure, a method for manufacturing such a test structure and a method for testing a display panel |
| 10/19/2005 | CN1685241A System and method of battery capacity estimation |
| 10/19/2005 | CN1685239A Rf芯片测试方法和系统 Rf chip testing method and system |
| 10/19/2005 | CN1684380A Verifying device special for integrated circuit function |
| 10/19/2005 | CN1684351A Voltage detection circuit, power supply unit and semiconductor device |
| 10/19/2005 | CN1684201A Test method for a semiconductor memory |
| 10/19/2005 | CN1684073A Integrated circuit design setting model for permiting regulation check of related size |
| 10/19/2005 | CN1684016A Output circuit for concentration scale control, testing apparatus thereof, and testing method |
| 10/19/2005 | CN1683936A On-line detecting method and its device for multiple path transient wave form over voltage of power system |
| 10/19/2005 | CN1683935A On-line test system for safety unit |
| 10/19/2005 | CN1683934A Method of and device for insulation monitoring |
| 10/19/2005 | CN1683933A Probe element and its test card |
| 10/19/2005 | CN1224216C Method for verifying wideband communication logic emulating platform design |
| 10/19/2005 | CN1224089C Imperfection detecting method and device for semiconductor ICs |
| 10/19/2005 | CN1224053C Semiconductor memory used for reducing input cycles of input test mode |
| 10/19/2005 | CN1223931C Easy-to-measure design of logic circuit |
| 10/19/2005 | CN1223864C IC tester using optical driving type driver and optical output voltage sensor |
| 10/19/2005 | CN1223863C Planarizing interposer |
| 10/19/2005 | CN1223862C Digital board determining method and digital board capable of being determined in short-circuit |
| 10/19/2005 | CN1223861C Apparatus for measuring leakage current and insulation impedance |
| 10/18/2005 | US6957413 System and method for specifying integrated circuit probe locations |
| 10/18/2005 | US6957405 Methods for manufacturing an electronic device having an electronically determined physical test member |
| 10/18/2005 | US6957403 Computer-aided design system to automate scan synthesis at register-transfer level |
| 10/18/2005 | US6957371 Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systems |
| 10/18/2005 | US6957370 Digital signal processor including an interface therein capable of allowing direct access to registers from an external device |
| 10/18/2005 | US6957369 Hidden failure detection |
| 10/18/2005 | US6957163 Integrated circuits having post-silicon adjustment control |
| 10/18/2005 | US6957158 High density random access memory in an intelligent electric device |
| 10/18/2005 | US6957117 Portable protective air gap tool and method |
| 10/18/2005 | US6957091 Portable multi-band communication device, and a method for determining a charge consumption thereof |
| 10/18/2005 | US6957049 Mobile communication unit with bone conduction speaker |
| 10/18/2005 | US6957005 Pogo contactor assembly for testing of and/or other operations on ceramic surface mount devices and other electronic components |
| 10/18/2005 | US6956937 Apparatus and method for network-initiated real-time multi-party communications |
| 10/18/2005 | US6956488 Method of and apparatus for setting battery alarm voltage in battery management server |
| 10/18/2005 | US6956487 Battery charging status indication circuit |
| 10/18/2005 | US6956459 Sensing apparatus for blown fuse of rectifying wheel and associated methods |
| 10/18/2005 | US6956422 Generation and measurement of timing delays by digital phase error compensation |
| 10/18/2005 | US6956396 Testing apparatus for flat-panel display |
| 10/18/2005 | US6956395 Tester for testing an electronic device using oscillator and frequency divider |
| 10/18/2005 | US6956394 Tester architecture for testing semiconductor integrated circuits |
| 10/18/2005 | US6956393 Source current measurement apparatus and test apparatus |
| 10/18/2005 | US6956392 Heat transfer apparatus for burn-in board |
| 10/18/2005 | US6956391 Testing method for electronic component and testing device |
| 10/18/2005 | US6956390 Method and apparatus for verifying temperature during integrated circuit thermal testing |
| 10/18/2005 | US6956389 Highly resilient cantilever spring probe for testing ICs |
| 10/18/2005 | US6956387 Socket connection test modules and methods of using the same |
| 10/18/2005 | US6956385 Integrated circuit defect analysis using liquid crystal |
| 10/18/2005 | US6956383 Method and apparatus for implementing automated electronic package transmission line characteristic impedance verification |
| 10/18/2005 | US6956379 Testing device and method for testing backplanes and connectors on backplanes |
| 10/18/2005 | US6956378 Signal supply apparatus and method for examining the same, and semiconductor device, electro-optical apparatus and electronic apparatus using the same |
| 10/18/2005 | US6956377 Disconnection detection apparatus |
| 10/18/2005 | US6956365 System and method for calibration of testing equipment using device photoemission |