Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2005
10/27/2005DE102004016359A1 Abtastverfahren und -vorrichtung Scanning method and apparatus
10/27/2005DE102004015831A1 Integrierte Schaltung Integrated circuit
10/27/2005DE102004010227B3 Testing device for the orderly functioning of a one hot encoder has test data producing device with three logic circuits having many inputs receiving encoder outputs
10/27/2005DE10052692B4 Bauteilhandhabungsvorrichtung Component handling device
10/27/2005CA2562621A1 Method and system for monitoring the health of wireless telecommunication networks
10/27/2005CA2561326A1 Battery state of charge estimator
10/27/2005CA2553666A1 Method and safety device for ground fault protection circuit
10/26/2005EP1589578A1 Method and structures for indexing dice
10/26/2005EP1589395A1 Microprocessor comprising signing means for detecting an error injection attack
10/26/2005EP1589394A1 Microprocessor comprising means for detecting errors, immunized against an error injection attack
10/26/2005EP1589346A1 Process for the determination of the quiescent voltage of an storage battery
10/26/2005EP1589345A1 Method of an apparatus for locating an insulation fault in an unearthed alternating voltage network
10/26/2005EP1588928A2 Method and device for supplying a sensor with a regulated sensor supply voltage
10/26/2005EP1588571A2 Method and apparatus for evaluating and optimizing a signaling system
10/26/2005EP1588439A2 Condition detection and indicating means for a storage battery
10/26/2005EP1588176A1 Method and device for determining the charge that can be drawn from an energy accumulator
10/26/2005EP1540722A4 Photonic devices and pics including sacrificial testing structures and method of making the same
10/26/2005EP1485724B1 Scatterometry structure with embedded ring oscillator, and methods of using same
10/26/2005EP1430320B1 Electronic component and method for measuring its qualification
10/26/2005EP1185875B1 Gauge effect battery tester
10/26/2005EP1105716B1 Inspection of printed circuit boards using color
10/26/2005EP1029385B1 Battery having a built-in controller
10/26/2005EP1005708B1 Circuit board arrangement
10/26/2005EP0898284B1 Semiconductor memory having a test circuit
10/26/2005EP0744033B1 An integrated resistor for sensing electrical parameters
10/26/2005EP0571179B1 Method and apparatus for the testing of connections of an electronic apparatus
10/26/2005CN2736782Y Voltage transformer local discharge ultrahigh frequency (UHF) online monitoring device
10/26/2005CN2736781Y High speed sampling apparatus for insulator contamination degree determination device
10/26/2005CN1689387A Vision inspection apparatus using a full reflection mirror
10/26/2005CN1689159A Semiconductor integrated circuit device and method for controlling semiconductor integrated circuit device
10/26/2005CN1688976A System and method for controlling a fuel cell testing device
10/26/2005CN1688889A Pulse width measuring apparatus with auto-range setting function
10/26/2005CN1687801A Automatic detector and method for mechanical performance of push-pull circuit breaker
10/26/2005CN1687800A Electrical parameter characterization method of silicon on insulation body
10/26/2005CN1687799A Combined detector and combined detecting method for switch state of DC ground resistance
10/26/2005CN1687798A Distributing and electrical appliance state controlling diagnosis sensor for mine
10/26/2005CN1225055C Reverberation chamber tuner and shaft with electromagnetic radiation leakage device
10/26/2005CN1225054C Accumulator charge-discharge device and charge-discharge method
10/26/2005CN1225016C Test board separator for semiconductor device measurement
10/26/2005CN1224843C Method and apparatus for industrial frequency voltage holding test of switch on column
10/26/2005CN1224842C Joint connection state detecting circuit of integrated circuit
10/25/2005US6959426 Cost-effective scan architecture and a test application scheme for scan testing with non-scan test power and test application cost
10/25/2005US6959409 Design for test of analog module systems
10/25/2005US6959408 IC with serial scan path, protocol memory, and event circuit
10/25/2005US6959272 Method and system for generating an ATPG model of a memory from behavioral descriptions
10/25/2005US6959257 Apparatus and method to test high speed devices with a low speed tester
10/25/2005US6959252 Method for analyzing in-line QC test parameters
10/25/2005US6959038 High-speed decoder for a multi-pair gigabit transceiver
10/25/2005US6959037 System and method for locating and determining discontinuities and estimating loop loss in a communications medium using frequency domain correlation
10/25/2005US6958978 Differentiated services in packet-switched networks
10/25/2005US6958814 Apparatus and method for measuring a property of a layer in a multilayered structure
10/25/2005US6958659 Test method and apparatus for verifying fabrication of transistors in an integrated circuit
10/25/2005US6958622 Scan-mode indication technique for an integrated circuit
10/25/2005US6958619 Inspecting apparatus and inspecting method for circuit board
10/25/2005US6958618 Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober
10/25/2005US6958617 Electromechanical module, for holding IC-chips in a chip testing system, that synchronizes and translates test signals to the IC-chips
10/25/2005US6958616 Hybrid interface apparatus for testing integrated circuits having both low-speed and high-speed input/output pins
10/25/2005US6958612 Apparatus for calibrating high frequency signal measurement equipment
10/25/2005US6958611 Diagnostic remote control for electrical components on vehicle
10/25/2005US6958598 Efficient switching architecture with reduced stub lengths
10/25/2005US6958248 Method and apparatus for the improvement of material/voltage contrast
10/20/2005WO2005098462A2 Probe card and method for constructing same
10/20/2005WO2005098461A2 Estimator for end-to-end throughput of wireless networks
10/20/2005WO2005098460A2 Double side probing of semiconductor devices
10/20/2005WO2005064356A3 High sensitivity magnetic built-in current sensor
10/20/2005WO2005060470A3 Supporting sdh/sonet aps bridge selector functionality for ethernet
10/20/2005WO2005034185A3 System and method for on-tool semiconductor simulation
10/20/2005US20050235354 Method and system for protecting content in a programmable system
10/20/2005US20050235241 Method and apparatus for designing layout, and computer product
10/20/2005US20050235189 Measurement circuit and method for serially merging single-ended signals to analyze them
10/20/2005US20050235188 Method of generating test patterns to efficiently screen inline resistance delay defects in complex ASICs
10/20/2005US20050235187 Apparatus and method for testing motherboard having PCI express devices
10/20/2005US20050235186 Multiple-capture DFT system for scan-based integrated circuits
10/20/2005US20050235185 Scan interface
10/20/2005US20050235184 Semiconductor integrated circuit device and test method thereof
10/20/2005US20050235183 Restricted scan reordering technique to enhance delay fault coverage
10/20/2005US20050235182 Method on scan chain reordering for lowering VLSI power consumption
10/20/2005US20050235181 Auto-recovery wafer testing apparatus and wafer testing method
10/20/2005US20050235180 Integrated module having a plurality of separate substrates
10/20/2005US20050235179 Device for protection against error injection into a synchronous flip-flop of an elementary logic module
10/20/2005US20050235177 Path delay test method
10/20/2005US20050235176 Intelligent frequency and voltage margining
10/20/2005US20050234674 Apparatus, system and/or method for converting a serial test to a parallel test
10/20/2005US20050234663 Battery management system and apparatus with runtime analysis reporting
10/20/2005US20050233540 Minimizing transistor variations due to shallow trench isolation stress
10/20/2005US20050233481 Novel development hastened stability of titanium nitride for APM etching rate monitor
10/20/2005US20050233480 Clearance inspection apparatus and clearance inspection method
10/20/2005US20050232479 Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objects
10/20/2005US20050232477 Defect inspection apparatus and defect inspection method
10/20/2005US20050232278 System and method for distributing addresses
10/20/2005US20050232247 Collection of enhanced caller ID information
10/20/2005US20050232238 Method and apparatus for dynamically determining when to use quality of service reservation in internet media applications
10/20/2005US20050232160 Apparatus and method for network-initiated real-time multi-party communications
10/20/2005US20050232146 System and method for recovering a damaged routing path in a mobile network
10/20/2005US20050232040 Test method for a semiconductor memory
10/20/2005US20050232011 Memory devices with page buffer having dual registers and metod of using the same
10/20/2005US20050231881 Apparatus and method for field testing MOV arresters
10/20/2005US20050231868 Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device
10/20/2005US20050231595 Test system and method for portable electronic apparatus
10/20/2005US20050231262 Semiconductor integrated circuit and a burn-in method thereof
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