Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2005
11/01/2005US6961669 De-embedding devices under test
11/01/2005US6961635 Method for yield improvement of manufactured products
11/01/2005US6961317 Identifying and synchronizing permuted channels in a parallel channel bit error rate tester
11/01/2005US6960940 Short circuit protection apparatus with self-clocking self-clearing latch
11/01/2005US6960928 Electromagnetic coupling based motor plug detect system and method
11/01/2005US6960927 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process
11/01/2005US6960926 Method and apparatus for characterizing a circuit with multiple inputs
11/01/2005US6960925 Input buffer with automatic switching point adjustment circuitry, and synchronous DRAM device including same
11/01/2005US6960924 Electrical contact
11/01/2005US6960923 Probe card covering system and method
11/01/2005US6960918 Method and apparatus for control and fault detection of a remote electrical motor
11/01/2005US6960917 Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assemblies
11/01/2005US6960916 Circuit breaker overcurrent and ground fault test apparatus
11/01/2005US6960915 Electric circuit system
11/01/2005US6960908 Method for electrical testing of semiconductor package that detects socket defects in real time
11/01/2005US6960802 Performing passive voltage contrast on a silicon on insulator semiconductor device
11/01/2005US6960765 Probe driving method, and probe apparatus
11/01/2005US6960123 Cleaning sheet for probe needles
10/2005
10/27/2005WO2005101878A1 Method and system for monitoring the health of wireless telecommunication networks
10/27/2005WO2005101717A2 Forward error correction in packet networks
10/27/2005WO2005101645A2 Apparatus for providing a high frequency loop back with a dc path for a parametric test
10/27/2005WO2005101605A1 Method and safety device for ground fault protection circuit
10/27/2005WO2005101482A1 Method for preparing electronic chips, and resulting set of chips
10/27/2005WO2005101042A1 Battery state of charge estimator
10/27/2005WO2005101041A1 Socket cover and test interface
10/27/2005WO2005101040A1 Micro thermal chamber having proximity control temperature management for devices under test
10/27/2005WO2005101039A1 Inspection unit
10/27/2005WO2005101038A2 Wireless test cassette
10/27/2005WO2005101037A1 High frequency electric characteristics measuring method and equipment for electronic component
10/27/2005WO2005101035A1 Method and instrument for measuring high-frequency electric characteristic of electronic component, and method for calibrating high-frequency electrical characteristic measuring instrument
10/27/2005WO2005101034A1 Method and instrument for measuring high-frequency electric characteristic of electronic component, and method for calibrating high-frequency electrical characteristic measuring instrument
10/27/2005WO2005100944A1 Test equipment for image sensor
10/27/2005WO2005100215A1 Chip component carrying method and system, and visual inspection method and system
10/27/2005WO2005100160A2 Apparatus for reducing deflection of a mobile member in a chamber
10/27/2005WO2005074091A3 Method and apparatus for monitoring energy storage devices
10/27/2005WO2004077524A3 Method and apparatus for test and characterization of semiconductor components
10/27/2005US20050240887 Generating test patterns having enhanced coverage of untargeted defects
10/27/2005US20050240852 Testing apparatus
10/27/2005US20050240851 ROM-based controller monitor in a memory device
10/27/2005US20050240850 Multicore processor test method
10/27/2005US20050240848 Masking circuit and method of masking corrupted bits
10/27/2005US20050240847 Clock controller for at-speed testing of scan circuits
10/27/2005US20050240846 Accurate Generation of Scan Enable Signal when Testing Integrated Circuits Using Sequential Scanning Techniques
10/27/2005US20050240845 Reducing Number of Pins Required to Test Integrated Circuits
10/27/2005US20050240844 Integrated circuit burn-in methods and apparatus
10/27/2005US20050240843 Method, computer program and device for deleting data sets contained in a data list from a table system
10/27/2005US20050240842 Circuit and method for testing semiconductor device
10/27/2005US20050240841 Cross-platform test environment automatic setup method and system
10/27/2005US20050240840 Method and system for on demand selective rerouting of logical circuit data in a data network
10/27/2005US20050240839 Critical area computation of composite fault mechanisms using voronoi diagrams
10/27/2005US20050240838 Semiconductor memory device having code bit cell array
10/27/2005US20050240831 Universal controller and graphical user interface
10/27/2005US20050240814 Power supply control system and storage device
10/27/2005US20050240790 Clocking methodology for at-speed testing of scan circuits with synchronous clocks
10/27/2005US20050240698 Repeatability over communication links
10/27/2005US20050240389 Virtual test environment
10/27/2005US20050239445 Method and system for providing registration, authentication and access via broadband access gateway
10/27/2005US20050239420 Rf amplifier system with interface to provide a computer readable spectral depiction of the rf output
10/27/2005US20050239222 Run-to-run control of backside pressure for CMP radial uniformity optimization based on center-to-edge model
10/27/2005US20050238093 Circuit and method for evaluating the performance of an adaptive decision feedback equalizer-based serializer deserializer and serdes incorporating the same
10/27/2005US20050238051 Apparatus and method for transmitting data blocks based on priority
10/27/2005US20050238037 Wideband frequency domain reflectometry to determine the nature and location of subscriber line faults
10/27/2005US20050238005 Method and apparatus for controlling traffic in a computer network
10/27/2005US20050237968 Wireless quality-of-service detection method
10/27/2005US20050237942 Method and system for monitoring the health of wireless telecommunication networks
10/27/2005US20050237940 Adaptively applying a target noise margin to a DSL loop for DSL data rate establishment
10/27/2005US20050237938 Method and system for compressing multi-field rule specifications
10/27/2005US20050237932 Method and system for rate-controlled mode wireless communications
10/27/2005US20050237212 Health monitoring method and system for a permanent magnet device
10/27/2005US20050237081 Apparatus and method for electrical contact testing of substrates
10/27/2005US20050237080 Method and device for measuring the diffusion length of minority carriers in a semiconductor sample
10/27/2005US20050237079 Semiconductor device characteristics measurement apparatus and connection apparatus
10/27/2005US20050237078 Compliant micro-browser for a hand held probe
10/27/2005US20050237077 Method for testing using a universal wafer carrier for wafer level die burn-in
10/27/2005US20050237076 Method for testing using a universal wafer carrier for wafer level die burn-in
10/27/2005US20050237075 Method for testing using a universal wafer carrier for wafer level die burn-in
10/27/2005US20050237074 Structures for testing circuits and methods for fabricating the structures
10/27/2005US20050237073 Intelligent probe card architecture
10/27/2005US20050237072 Device for testing printed circuit boards
10/27/2005US20050237071 Electronic component test apparatus
10/27/2005US20050237069 Semiconductor device test method and semiconductor device tester
10/27/2005US20050237068 Sensor cable having easily changeable entire length and allowing accurate and high speed signal transmission even when entire length is made longer, and amplifier-separated type sensor with the cable
10/27/2005US20050237067 Arrangement and method for detection and localization of short circuits in membrane electrode arrangements
10/27/2005US20050237064 Apparatus and method for determining contact dynamics
10/27/2005US20050237027 Remaining capacity calculation method for secondary battery, and battery pack
10/27/2005US20050237024 Method of charging secondary battery, method of calculating remaining capacity rate of secondary battery, and battery pack
10/27/2005US20050236902 Portable device for automotive device control system
10/27/2005US20050236717 System in-package test inspection apparatus and test inspection method
10/27/2005US20050236703 Systems and methods for testing packaged dies
10/27/2005US20050236648 Inspection method and inspection system using charged particle beam
10/27/2005DE4129891B4 System zur Fehlererkennung System for fault detection
10/27/2005DE202005010562U1 Device for optical checking of quality characteristics of solar cell has optical means for modification of diffusion characteristics of light used for identification of quality characteristics of solar cell
10/27/2005DE10393783T5 Positionserfassungsvorrichtung, Positionserfassungsverfahren und Tragvorrichtung für elektronische Komponenten Position detection device, position detecting method and apparatus for supporting electronic components
10/27/2005DE102005014213A1 Testing method for motor vehicle electrical and electronic units in which the units are exposed to at least one abnormal environmental parameter and the resultant effects monitored in real-time optical, mechanical or acoustic way
10/27/2005DE102004058753A1 Verifizierung von Integrierte-Schaltung-Tests unter Verwendung einer Testsimulation und einer Integrierte-Schaltungs-Simulation mit einem simulierten Ausfall Verification of integrated circuit test using a test simulation and an integrated circuit simulation with a simulated failure
10/27/2005DE102004031044A1 Operational amplifier open loop gain electronic test circuit has resistor network connecting input voltage to amplifier terminals with fixed reference voltage on positive input
10/27/2005DE102004030077A1 Testing unit for semiconductor components comprises a test head, contact surfaces for spring contact elements, and a high frequency plug component
10/27/2005DE102004022556B3 Selbstkalibrierende Vorrichtung zur Spannungsmessung und Verfahren hierfür Self-calibrating device for measuring voltage and method therefor
10/27/2005DE102004017660A1 Load analysis method for use in electromechanical system of e.g. motor vehicle, involves determining characteristic value using system specific load parameters and loading time for detecting loading grade of system component
10/27/2005DE102004016387A1 Schnittstellenschaltung für einen einzelnen Logik-Eingangspin eines elektronischen Systems An interface circuit for a single logic input pin of an electronic system
1 ... 1007 1008 1009 1010 1011 1012 1013 1014 1015 1016 1017 1018 1019 1020 1021 1022 1023 1024 1025 1026 1027 ... 1523