Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2005
11/03/2005WO2005103740A2 Intelligent probe card architecture
11/03/2005WO2005103738A2 Bi-directional three-dimensional microwave scanning and volumetric mapping of a whole roll or pallet of paper
11/03/2005WO2005103735A1 Sheet-shaped probe, manufacturing method thereof and application thereof
11/03/2005WO2005103734A1 Sheet-like probe, method of producing the probe, and application of the probe
11/03/2005WO2005103733A1 Sheet-like probe, method of producing the probe, and application of the probe
11/03/2005WO2005103732A1 Sheet-shaped probe, manufacturing method thereof and application thereof
11/03/2005WO2005103731A1 Sheet-shaped probe, manufacturing method thereof and application thereof
11/03/2005WO2005103730A1 Sheet-like probe, method of producing the probe, and application of the probe
11/03/2005WO2005103729A1 Rewiring substrate strip with several semiconductor component positions
11/03/2005WO2005062917A3 Arc fault detector
11/03/2005WO2005043594A3 Method for forming photo-defined micro electrical contacts
11/03/2005WO2005034408A3 Wireless network system and method
11/03/2005WO2004102598A3 Switched suspended conductor and connection
11/03/2005US20050246605 Method for processing noise interference
11/03/2005US20050246604 Office information system having a device which provides an operational message of the system when a specific event occurs
11/03/2005US20050246603 Pin coupler for an integrated circuit tester
11/03/2005US20050246602 On-chip and at-speed tester for testing and characterization of different types of memories
11/03/2005US20050246601 Method and apparatus to measure and display data dependent eye diagrams
11/03/2005US20050246600 Device for protection against error injection into an asynchronous logic block of an elementary logic module
11/03/2005US20050246599 System and method for testing input and output characterization on an integrated circuit device
11/03/2005US20050246598 Voltage/process evaluation in semiconductors
11/03/2005US20050246597 IC with expected data memory coupled to scan data register
11/03/2005US20050246586 Device capable of detecting BIOS status for clock setting and method thereof
11/03/2005US20050246128 Liquid crystal module inspecting apparatus and liquid crystal module
11/03/2005US20050246126 Method, apparatus and computer program product for implementing physical interconnect fault source identification
11/03/2005US20050246125 System And Method Of Digitally Testing An Analog Driver Circuit
11/03/2005US20050246116 Method and system for evaluating timing in an integrated circuit
11/03/2005US20050245088 Method for barc over-etch time adjust with real-time process feedback
11/03/2005US20050244048 Micro-image examining apparatus
11/03/2005US20050243906 Test device and setting method
11/03/2005US20050243905 Bounding box signal detector
11/03/2005US20050243903 PHY control module for a multi-pair gigabit transceiver
11/03/2005US20050243822 Method and apparatus for estimating delay and jitter between many network routers using measurements between a preferred set of routers
11/03/2005US20050243728 Configuration of filter for data stream organized in frames
11/03/2005US20050243726 System and method for real-time buying and selling of internet protocol (IP) transit
11/03/2005US20050243725 System for selecting routes for retransmission in a network
11/03/2005US20050243724 Method and apparatus for selecting a preferred LSP path from a set of equal cost paths
11/03/2005US20050243714 Redundant packet selection and manipulation in wireless communications systems
11/03/2005US20050243710 Fault-tolerant broadcast router
11/03/2005US20050243649 Method of detecting and locating a source of partial discharge in an electrical apparatus
11/03/2005US20050243605 Apparatus and method for transmitting constant bit rate data cells, controlling transmission of data cells to prevent head data cells from being sent out through the continuous slots of the transmission cycle
11/03/2005US20050243523 Shock absorber means for components and cards
11/03/2005US20050242980 Boundary-scan circuit used for analog an ddigital testing of an integrated circuit
11/03/2005US20050242836 System monitor in a programmable logic device
11/03/2005US20050242827 Contact pad arrangement on a die
11/03/2005US20050242826 Methods for testing continuity of electrical paths through connectors of circuit assemblies
11/03/2005US20050242825 Method and apparatus for measuring employing main and remote units
11/03/2005US20050242824 Method and apparatus for non-contact testing and diagnosing electrical paths through connectors on circuit assemblies
11/03/2005US20050242823 Test structure embedded in a shipping and handling cover for integrated circuit sockets and method for testing integrated circuit sockets and circuit assemblies utilizing same
11/03/2005US20050242822 Method and device for testing at least one LED strip
11/03/2005US20050242821 Battery charging/discharging apparatus and battery charging/discharging method
11/03/2005US20050242820 Method for testing precursor of secondary cell, its testing instrument, and method for manufacturing secondary cell using the method
11/03/2005US20050242801 Unbreakable micro-browser
11/03/2005US20050242784 Malfunction detecting apparatus for on-vehicle charging system
11/03/2005US20050241175 Method and apparatus for removing and/or preventing surface contamination of a probe
11/03/2005DE60015991T2 Prüfgerät zum gleichzeitigen testen mehrerer integrierter schaltkreise Tester for simultaneously testing a plurality of integrated circuits
11/03/2005DE4223658B4 Testvorrichtung für Halbleiter-Chips Test apparatus for semiconductor chips
11/03/2005DE19880680B4 Halbleiterbauelement-Testgerät und Verfahren zur Durchführung von Tests in einem solchen A semiconductor device testing apparatus and method for performing tests, in such a
11/03/2005DE19636229B4 Verfahren und Vorrichtung zur Bestimmung von Degradationsprozessen in Halbleiterlasern Method and apparatus for determination of degradation in semiconductor lasers
11/03/2005DE19625876B4 Automatisches Prüfmanipulatorsystem für IC-Prüfer Automatic Prüfmanipulatorsystem for IC tester
11/03/2005DE102005010900A1 Modellspezifische Registeroperationen Model-specific register operations
11/03/2005DE102004017787A1 Verfahren und Testvorrichtung zum Testen integrierter Schaltungen The method and test device for testing integrated circuits
11/03/2005DE102004001653B3 Verfahren und Vorrichtung zum Testen von zu testenden Schaltungseinheiten mit unterschiedlichen Testmodus-Datensätzen A method and apparatus for testing the circuit under test units with different test mode records
11/02/2005EP1592057A2 Method and apparatus for removing and/or preventing surface contamination of a probe
11/02/2005EP1591916A1 Method, computer program and device for deleting data sets contained in a table system
11/02/2005EP1591798A1 Health monitoring method and system for a permanent magnet device
11/02/2005EP1591797A1 Circuit breakers test device
11/02/2005EP1591796A1 Antenna identification system
11/02/2005EP1591795A1 Harmonic diagnosing method for electric facility
11/02/2005EP1591351A1 Electric inspection device of cockpit module assembly for vehicle
11/02/2005EP1590679A1 State variable and parameter estimator comprising several partial models for an electrical energy storage device
11/02/2005EP1590678A1 Boundary scan circuit with integrated sensor for sensing physical operating parameters
11/02/2005EP1573788A3 Method and system for fabricating multi layer devices on a substrate
11/02/2005EP1516193B1 Method for determination of a parameter of an electrical network
11/02/2005CN2738262Y Combined lamp tester
11/02/2005CN2738261Y Experimental research apparatus for fuel battery mixed power system
11/02/2005CN1692367A Test mode control circuit for reconfiguring a device pin of an integrated circuit chip
11/02/2005CN1692285A Semiconductor device and method for testing the same
11/02/2005CN1692283A Sheet-form connector and production method and application therefor
11/02/2005CN1691883A Lighting condition determination method, element recognition device, surface mounting machine and element test apparatus
11/02/2005CN1691714A Enhanced caller id information based on access device information via a broadband access gateway
11/02/2005CN1691653A Method and system for providing registration, authentication and access via broadband access gateway
11/02/2005CN1691460A Remaining capacity calculation method for secondary battery, and battery pack
11/02/2005CN1691303A Direct determination of interface traps in mos devices
11/02/2005CN1691202A Semiconductor memory device having code bit cell array
11/02/2005CN1690724A Circuit and method for testing semiconductor device
11/02/2005CN1690723A Method and apparatus for non-contact testing and diagnosing electrical paths
11/02/2005CN1690722A Test structure embedded in a shipping and handling cover for integrated circuit sockets and testing method
11/02/2005CN1690684A Methods and systems for monitoring and diagnosing machinery
11/02/2005CN1225742C Method for quickly identifying element line defect kenel
11/02/2005CN1225649C Method and apparatus for determining battery properties from complex impedance/admittance
11/01/2005US6961887 Streamlined LASAR-to-L200 post-processing for CASS
11/01/2005US6961886 Diagnostic method for structural scan chain designs
11/01/2005US6961885 System and method for testing video devices using a test fixture
11/01/2005US6961884 JTAG mirroring circuitry and methods
11/01/2005US6961883 Tester built-in semiconductor integrated circuit device
11/01/2005US6961871 Method, system and program product for testing and/or diagnosing circuits using embedded test controller access data
11/01/2005US6961690 Behaviorial digital simulation using hybrid control and data flow representations
11/01/2005US6961672 Universal diagnostic platform for specimen analysis
11/01/2005US6961670 Probe testing method and apparatus for determining acceptable/defective end shape of contact probe through image analysis
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