Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2005
11/10/2005US20050251357 Method, apparatus and database using a map of linked data nodes for storing test numbers
11/10/2005US20050251282 Method and apparatus for forming structures proximate to workpieces
11/10/2005US20050250254 Method of manufacturing a semiconductor device and a fabrication apparatus for a semiconductor device
11/10/2005US20050250224 Method of inspecting pattern and inspecting instrument
11/10/2005US20050249397 Position detecting apparatus, a position detecting method and an electronic component carrying apparatus
11/10/2005US20050249353 System and method for detecting fault conditions on audio output channels
11/10/2005US20050249206 Packet counters and packet adders for traffic profiling in a multiprocessor router
11/10/2005US20050249122 Monitoring network traffic
11/10/2005US20050249116 System and method for prioritizing data transmissions
11/10/2005US20050249001 Testing apparatus and a testing method
11/10/2005US20050248374 Method and apparatus for improving the frequency resolution of a direct digital synthesizer
11/10/2005US20050248361 Damping control in a three-phase motor with a single current sensor
11/10/2005US20050248360 Transistor monitor for a multiphase circuit
11/10/2005US20050248359 Membrane probing system
11/10/2005US20050248354 Frequency rectification tool for shorter waveforms
11/10/2005US20050248353 Electrical testing of prited circuit boards employing a multiplicity of non-contact stimulator electrodes
11/10/2005US20050248352 Method and system for detecting potential reliability failures of integrated circuit
11/10/2005US20050248351 Self-calibrating device for measuring voltage and corresponding method
11/10/2005US20050248314 Intelligent battery charging system
11/10/2005US20050247930 Shallow trench isolation void detecting method and structure for the same
11/10/2005US20050247605 Arrangements having IC voltage and thermal resistance designated on a per IC basis
11/10/2005US20050246891 Multilayer wiring board, manufacturing method therefor and test apparatus thereof
11/10/2005DE202005008675U1 Wire-monitoring device for selective multi-core wires in low-voltage supply networks monitors for breakdowns, short-circuits and reverse battery effect
11/10/2005DE19811384B4 Verfahren zur Prüfung einer Generatorschutzeinrichtung Method for testing a generator protection system
11/10/2005DE10393845T5 Halbleitertestgerät Semiconductor testing apparatus
11/10/2005DE102005008279A1 CDR-basierte Taktsynthese CDR-based clock synthesis
11/10/2005DE102005007841A1 Leiterplattenkomponenten-UmgebungsfeuchtigkeitsaussetzungsÜberwachung PCB component ambient humidity exposure monitoring
11/10/2005DE102004020045A1 Verfahren zum Ermitteln eines eine Abnutzung von Schaltkontakten eines Leistungsschalters angebenden Restschaltspiel-Wertes A method for determining a wear of switching contacts of a circuit breaker indicating residual switching cycle value
11/10/2005DE102004018474A1 Heavy duty manipulator especially for testing ICs has a movable tower mounted on a support platform and with integral damping
11/10/2005DE102004017487A1 Signaling method for sending safety signals, checks occurrence of a safety signal for a direct transmission of a further low-priority safety signal and its interruption per transmission length
11/10/2005DE10118027B4 Batteriemessklemme mit Fremdstartstützpunkt und integrierter Meßsensorik Battery measuring terminal with jump-starting base and integrated measuring sensor
11/10/2005DE10112569B4 Verfahren zur Diagnose von elektrischen Verbindungen an elektrischen Maschinen A method for the diagnosis of electrical connections in electrical machines
11/10/2005CA2561974A1 Method and apparatus for dynamically determining when to use quality of service reservation in internet media applications
11/09/2005EP1594021A1 Circuit device and method for testing relay switching contacts of a digital output circuit
11/09/2005EP1593983A1 Method of and apparatus for locating an insulation fault in an unearthed alternating voltage network
11/09/2005EP1593982A1 Robustmodelingcontrol of a physical system
11/09/2005EP1593981A2 Partial discharge detection device
11/09/2005EP1593083A2 Methods and apparatus for data analysis
11/09/2005EP1592982A2 System and method for identifying and locating an acoustic event
11/09/2005EP1592976A1 Method and structure to develop a test program for semiconductor integrated circuits
11/09/2005EP1592975A1 Method and apparatus for testing integrated circuits
11/09/2005EP1472551B1 Testing of circuit with plural clock domains
11/09/2005EP1419507B1 Method and device for testing semiconductor memory devices
11/09/2005EP1384305A4 Method and apparatus for high-voltage battery array monitoring sensors network
11/09/2005EP1364221A4 Planarizing interposer
11/09/2005EP1183544B1 System-on-a-chip with a reprogrammable tester, debugger, and bus monitor
11/09/2005CN2739646Y Bulb conveying mechanism for festival lamp measuring machine
11/09/2005CN1695238A Probe method, prober, and electrode reducing/plasma-etching processing mechanism
11/09/2005CN1695065A Method and device for detecting sparking and spark erosion in electric machines
11/09/2005CN1695064A Device and method for monitoring and/or analyzing electric machines in operation
11/09/2005CN1695063A Method and apparatus for diagnosis injectors
11/09/2005CN1695048A Method and device for detecting oscillations of the shafting of an electric machine
11/09/2005CN1694180A Multi-port memory device having serial i/o interface
11/09/2005CN1693918A Robust for detecting physical system model
11/09/2005CN1693917A Semiconductor integrated circuit and testing system
11/09/2005CN1693916A Method and apparatus for automated debug and optimization of in-circuit tests
11/09/2005CN1693915A Device for testing thermal relaxation time of semiconductor laser and testing method thereof
11/09/2005CN1693914A Transistor measuring instrument
11/09/2005CN1693913A Method and apparatus for testing and diagnosing electrical paths through area array integrated circuits
11/09/2005CN1693912A Circuit device and method for testing relay switching contacts of a digital output circuit
11/09/2005CN1226779C Reliability testing device and its testing method
11/09/2005CN1226635C Tester for semiconductor devices and test tray used for the same
11/09/2005CN1226634C Method and apparatus for testing wiring
11/09/2005CN1226592C Position detecting method, position detecting apparatus and method for positioning printed circuit board
11/08/2005US6964004 Method and apparatus for testing a system-on-a-chip
11/08/2005US6964003 Integrated circuit testing system and method
11/08/2005US6964002 Scan chain design using skewed clocks
11/08/2005US6964001 On-chip service processor
11/08/2005US6964000 Semiconductor integrated circuit device having a test circuit of a random access memory
11/08/2005US6963811 Method and apparatus for improved detection of multisynchronous signals title
11/08/2005US6963536 Admission control in a network device
11/08/2005US6963229 Clock skew indicating apparatus
11/08/2005US6963217 Method and apparatus for creating circuit redundancy in programmable logic devices
11/08/2005US6963216 Method and apparatus for detecting shorted rectifying control elements of an engine driven power source for welding-type system
11/08/2005US6963215 Operation of semiconductor devices subject to hot carrier injection
11/08/2005US6963214 OBIRCH dual power circuit
11/08/2005US6963213 Auto-recovery wafer testing apparatus and wafer testing method
11/08/2005US6963212 Self-testing input/output pad
11/08/2005US6963211 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment
11/08/2005US6963210 Various electrical characteristics and small test point testing module
11/08/2005US6963209 Apparatus and method for calibrating equipment for high frequency measurements
11/08/2005US6963208 Probe device, probe card channel information creation program, and probe card information creation device
11/08/2005US6963204 Method to include delta-I noise on chip using lossy transmission line representation for the power mesh
11/08/2005US6963203 Methods and apparatus for analyzing high voltage circuit breakers
11/08/2005US6963202 Testing interface for railroad signal relays
11/08/2005US6963198 Signal detection contactor and signal correcting system
11/08/2005US6963197 Targeted timed reset fault indicator
11/08/2005US6963193 a-C:H ISFET device, manufacturing method, and testing methods and apparatus thereof
11/08/2005US6963192 Device for tracing electrical cable
11/08/2005US6963082 Multi-chip package device including a semiconductor memory chip
11/08/2005US6962827 Semiconductor device capable of shortening test time and suppressing increase in chip area, and method of manufacturing semiconductor integrated circuit device
11/08/2005US6962435 Condition diagnosing
11/04/2005CA2505943A1 Monitoring the robustness of the modelling of a physical system
11/03/2005WO2005104507A1 Wideband frequency domain reflectometry to determine the nature and location of subscriber line faults
11/03/2005WO2005104155A1 Method for determining a value for residual contact play representing the wear of switch contacts in a power switch
11/03/2005WO2005103967A2 Restricted scan reordering technique to enhance delay fault coverage
11/03/2005WO2005103745A2 Method and arrangement for determining operating parameters of an electrochemical storage battery
11/03/2005WO2005103743A1 Tcp handling device
11/03/2005WO2005103742A1 Tcp handling device
11/03/2005WO2005103741A1 Tcp handling device