| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 11/17/2005 | DE102005001126A1 Begrenzungskastensignal-Detektor Bounding box Signal Detector |
| 11/17/2005 | DE102005001124A1 Bereitstellung und Verwendung von Sicherheitstoken, um eine automatisierte Testausrüstung freizugeben Deployment and use of security tokens to enable an automated test equipment |
| 11/17/2005 | DE102004025176A1 Phase failure recognition circuit for a converter compares potential at a resistance star point relative to that of a positive or negative intermediate circuit voltage |
| 11/17/2005 | DE102004020187A1 Umverdrahtungssubstratstreifen mit mehreren Halbleiterbauteilpositionen Rewiring substrate having a plurality of semiconductor component positions |
| 11/17/2005 | DE102004019475A1 Anordnung und Verfahren zur Detektion und Lokalisierung von Kurzschlüssen in Membran-Elektroden-Anordnungen Arrangement and method for the detection and localization of a short circuit in the membrane electrode assemblies |
| 11/17/2005 | DE102004018923A1 Electronic circuit of optical sensor, includes second component ensuring similarity with class of circuits at one point of characteristic curve |
| 11/17/2005 | DE10137128B4 Testvorrichtung zum Testen von Testobjekten und Verfahren zum Übermitteln eines Testsignals Test apparatus for testing of test objects and method for transmitting a test signal |
| 11/17/2005 | DE10053534B4 Selbstdiagnoseschaltung für Schwinggyroskope Self-diagnostic circuit for Schwinggyroskope |
| 11/17/2005 | CA2564943A1 Integrated acceptance testing |
| 11/17/2005 | CA2564351A1 System and method for generating a jittered test signal |
| 11/17/2005 | CA2564297A1 System and method for testing integrated circuits |
| 11/17/2005 | CA2564191A1 Compliant electrical contact assembly |
| 11/17/2005 | CA2470516A1 Battery charge testing apparatus |
| 11/16/2005 | EP1596491A2 Damping control in a three-phase motor with a single current sensor |
| 11/16/2005 | EP1596429A1 Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method |
| 11/16/2005 | EP1596267A1 Voltage regulator feedback protection method and apparatus |
| 11/16/2005 | EP1596213A1 Electronic monitoring device for multi-part electric energy storage unit |
| 11/16/2005 | EP1596212A1 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof |
| 11/16/2005 | EP1596211A1 Combining multiple independent sources of information for classification of devices under test |
| 11/16/2005 | EP1596210A1 Method for lifetime determination of submicron metal interconnects |
| 11/16/2005 | EP1596209A1 Electromagnetic field measuring device, its control system, and its electronic circuit |
| 11/16/2005 | EP1596204A1 Electrical testing facility |
| 11/16/2005 | EP1595211A2 Compressing test responses using a compactor |
| 11/16/2005 | EP1595157A1 Method and system for electrical length matching |
| 11/16/2005 | EP1595156A2 Testing of integrated circuits |
| 11/16/2005 | EP1595155A1 Device and method for the tolerance analysis of digital and/or digitalised measuring values |
| 11/16/2005 | EP1595154A1 Integrated circuit testing methods using well bias modification |
| 11/16/2005 | EP1595152A2 Arc fault detection system |
| 11/16/2005 | EP1527348A4 Time-frequency domain reflectometry apparatus and method |
| 11/16/2005 | EP1509796A4 Laser production and product qualification via accelerated life testing based on statistical modeling |
| 11/16/2005 | EP1466380A4 Multiple plateau battery charging method and system to charge to the second plateau |
| 11/16/2005 | EP1454375A4 Multiple plateau battery charging method and system to fully charge the first plateau |
| 11/16/2005 | EP1108216A4 High resolution analytical probe station |
| 11/16/2005 | CN2741058Y Voltage dropping analog tester of switching contacts |
| 11/16/2005 | CN2741057Y Fault monitoring system of distributing lines |
| 11/16/2005 | CN1698183A Probe pin zero-point detecting method and probe device |
| 11/16/2005 | CN1697979A Measurement circuit with improved accuracy |
| 11/16/2005 | CN1697977A Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device |
| 11/16/2005 | CN1697444A Recording media, information processing apparatus, control method |
| 11/16/2005 | CN1697427A Providing automatic format conversion via an access gateway in a home |
| 11/16/2005 | CN1697426A Location based directories via a broadband access gateway and control |
| 11/16/2005 | CN1697305A Damping control in a three-phase motor with a single current sensor |
| 11/16/2005 | CN1697245A Cell evaluation device |
| 11/16/2005 | CN1696906A Method, system and program product for autonomous error recovery for memory devices |
| 11/16/2005 | CN1696867A System and method of controlling power source in main board through network |
| 11/16/2005 | CN1696859A Voltage regulator feedback protection method and apparatus |
| 11/16/2005 | CN1696726A Automated testing system and method for light emitting diode |
| 11/16/2005 | CN1696725A Route selection method for single-phase grounded malfunction in grounded system of low current |
| 11/16/2005 | CN1696724A Adaptive approach for route selection of grounded system connected to arc suppression coil |
| 11/16/2005 | CN1696723A Electric arc fault detector |
| 11/16/2005 | CN1696722A Malfunction route selection method for resonant grounded system based on current decomposition and wattles detection |
| 11/16/2005 | CN1696721A Combining multiple independent sources of information for classification of devices under test |
| 11/16/2005 | CN1696720A Method and device for testing audio player through audio analyzer |
| 11/16/2005 | CN1696719A Automatic calibrating device and method |
| 11/16/2005 | CN1696708A Electrical test device |
| 11/16/2005 | CN1696652A Particle beam device probe operation |
| 11/16/2005 | CN1227796C Battery charging system capable of storing charging information in battery and battery therefor |
| 11/16/2005 | CN1227668C Semiconductor memory device and method for selecting multi-word-line in said device |
| 11/15/2005 | US6966042 System for detecting and reporting defects in a chip |
| 11/15/2005 | US6966041 Chip fabrication procedure and simulation method for chip testing with performance pre-testing |
| 11/15/2005 | US6966022 System and method for determining integrated circuit logic speed |
| 11/15/2005 | US6966021 Method and apparatus for at-speed testing of digital circuits |
| 11/15/2005 | US6966020 Identifying faulty programmable interconnect resources of field programmable gate arrays |
| 11/15/2005 | US6966019 Instrument initiated communication for automatic test equipment |
| 11/15/2005 | US6966018 Integrated circuit tester with multi-port testing functionality |
| 11/15/2005 | US6965853 Back annotation apparatus for carrying out a simulation based on the extraction result in regard to parasitic elements |
| 11/15/2005 | US6965852 Pseudo random test pattern generation using Markov chains |
| 11/15/2005 | US6965838 Apparatus having in-circuit FET on-resistance characterization |
| 11/15/2005 | US6965648 Source synchronous link integrity validation |
| 11/15/2005 | US6965248 Compensation for test signal degradation due to DUT fault |
| 11/15/2005 | US6965246 Burn-in socket assembly |
| 11/15/2005 | US6965238 Methods and apparatus for analyzing high voltage circuit breakers |
| 11/15/2005 | US6965226 Chuck for holding a device under test |
| 11/15/2005 | US6964577 Dual stage latch and release mechanism |
| 11/10/2005 | WO2005107092A1 System and method for monitoring cross connections of telecommunication cables |
| 11/10/2005 | WO2005107035A2 Power supply device |
| 11/10/2005 | WO2005106817A2 Method and apparatus for dynamically determining when to use quality of service reservation in internet media applications |
| 11/10/2005 | WO2005106514A1 Measuring device |
| 11/10/2005 | WO2005106513A1 Direct current test apparatus |
| 11/10/2005 | WO2005106512A1 Manual test device |
| 11/10/2005 | WO2005106511A1 Cleaning system, device and method |
| 11/10/2005 | WO2005106510A2 Apparatus for high speed probing of flat panel displays |
| 11/10/2005 | WO2005106504A1 Electric connecting device |
| 11/10/2005 | WO2005093447A3 Method of testing an electrochemical device |
| 11/10/2005 | WO2005065437A3 Probe arrays and method for making |
| 11/10/2005 | US20050251763 Methods and apparatus for scan insertion |
| 11/10/2005 | US20050251761 Integrated circuit configuration system and method |
| 11/10/2005 | US20050251720 Single-ended transmission for direct access test mode within a differential input and output circuit |
| 11/10/2005 | US20050251719 Test case inheritance controlled via attributes |
| 11/10/2005 | US20050251718 Method for localization and generation of short critical sequence |
| 11/10/2005 | US20050251717 Method and/or apparatus implemented in hardware to discard bad logical transmission units (LTUs) |
| 11/10/2005 | US20050251716 Software to test a storage device connected to a high availability cluster of computers |
| 11/10/2005 | US20050251715 Method and apparatus for automated debug and optimization of in-circuit tests |
| 11/10/2005 | US20050251714 Test apparatus for semiconductor devices built-in self-test function |
| 11/10/2005 | US20050251713 Multi-port memory device having serial I/O interface |
| 11/10/2005 | US20050251710 Testing of integrated circuit receivers |
| 11/10/2005 | US20050251370 Combining multiple independent sources of information for classification of devices under test |
| 11/10/2005 | US20050251368 Methods and apparatus for identifying test number collisions |
| 11/10/2005 | US20050251361 Methods and apparatus for handling test number collisions |
| 11/10/2005 | US20050251358 System and method for increasing die yield |