Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2005
11/22/2005US6968481 Method and device for adapting/tuning signal transit times on line systems or networks between integrated circuits
11/22/2005US6968472 Serial data interface
11/22/2005US6968420 Use of EEPROM for storage of security objects in secure systems
11/22/2005US6968408 Linking addressable shadow port and protocol for serial bus networks
11/22/2005US6968302 System and method for remote analysis and control of test and measurement devices
11/22/2005US6968287 System and method for predicting burn-in conditions
11/22/2005US6968285 Method and apparatus for scenario search based random generation of functional test suites
11/22/2005US6968249 Current measuring circuit for measuring drive current to load
11/22/2005US6967878 Redundancy architecture for repairing semiconductor memories
11/22/2005US6967647 Method of controlling display brightness of portable information device, and portable information device
11/22/2005US6967585 Input voltage sense circuit in a line powered network element
11/22/2005US6967499 Dual ramp rate dielectric breakdown testing methodology
11/22/2005US6967498 Apparatus and method for inspecting electronic circuits
11/22/2005US6967496 AC testing of leakage current in integrated circuits using RC time constant
11/22/2005US6967495 Dynamic burn-in apparatus and adapter card for dynamic burn-in apparatus
11/22/2005US6967491 Spatial and temporal selective laser assisted fault localization
11/22/2005US6967488 Double-mirror short-circuit detection
11/22/2005US6967487 Distributed diode fault check
11/22/2005US6967484 Electronic battery tester with automotive scan tool communication
11/22/2005US6967483 Apparatus and method for determining contact dynamics
11/22/2005US6967475 Device transfer mechanism for a test handler
11/22/2005US6967474 Device for positioning an electronic test head with respect to a manipulator for manipulating electronic components, in particular integrated circuits
11/22/2005US6967473 Attachable/detachable variable spacing probing tip system
11/22/2005US6967466 Method for determining the amount of charge which can be drawn on a storage battery, and monitoring device for a storage battery
11/22/2005US6967445 Circuit continuity and function monitor
11/22/2005US6967397 Test circuit and multi-chip package type semiconductor device having the test circuit
11/22/2005US6967348 Signal sharing circuit with microelectric die isolation features
11/22/2005US6967307 Method and process of contact to a heat softened solder ball array
11/22/2005US6966744 Multi stacker for handler
11/17/2005WO2005109666A2 System and method for generating a jittered test signal
11/17/2005WO2005109450A1 Compliant electrical contact assembly
11/17/2005WO2005109366A2 Method and apparatus for controlling traffic in a computer network
11/17/2005WO2005109147A1 Method and apparatus for improving the frequency resolution of a direct digital synthesizer
11/17/2005WO2005109022A1 Measuring device and measuring method for determining battery cell voltages
11/17/2005WO2005109021A1 Systems and methods for testing packaged dies
11/17/2005WO2005109020A2 System and method for characterizing a signal path using a sub-chip sampler
11/17/2005WO2005109019A1 Timing generator and semiconductor testing apparatus
11/17/2005WO2005109018A1 Method for determining time to failure of submicron metal interconnects
11/17/2005WO2005109017A2 System and method for testing integrated circuits
11/17/2005WO2005109016A1 Tcp handler
11/17/2005WO2005109015A1 Non-contact cable state testing
11/17/2005WO2005109014A1 Wireless quality-of-service detection method
11/17/2005WO2005109013A2 Efficient protection mechanisms in a ring topology network utilizing label switching protocols
11/17/2005WO2005109011A2 Integrated acceptance testing
11/17/2005WO2005107372A2 Product functionality assurance and guided troubleshooting
11/17/2005WO2005052612A3 Input and output circuit for an integrated switching circuit, method for testing an integrated switching circuit and an integrated switching circuit provided with said input and output circuit
11/17/2005US20050257117 Method and circuit for determining an ending of an ethernet frame
11/17/2005US20050257110 Method and apparatus for evaluating susceptibility to common mode noise in a computer system
11/17/2005US20050257108 Access method for embedded jtag tap controller instruction registers
11/17/2005US20050257107 Parallel bit testing device and method
11/17/2005US20050257104 Method and apparatus for bit error rate test
11/17/2005US20050257087 Test circuit topology reconfiguration and utilization method
11/17/2005US20050257077 Method for voltage drop analysis in integreted circuits
11/17/2005US20050257076 System and method for controlling power sources of motherboards under test through networks
11/17/2005US20050256662 Test apparatus
11/17/2005US20050256655 System and method for identifying failure candidates in a semiconductor apparatus
11/17/2005US20050256618 Method of testing motor torque integrity in a hybrid electric vehicle
11/17/2005US20050256548 System and method for monitoring power source longevity of an implantable medical device
11/17/2005US20050255796 Probe cleaning sheet and cleaning method
11/17/2005US20050255744 Method and apparatus for inspecting printed circuit boards
11/17/2005US20050255611 Defect identification system and method for repairing killer defects in semiconductor devices
11/17/2005US20050255610 Semiconductor wafer shape evaluating method and shape evaluating device
11/17/2005US20050254433 Recording media, information processing apparatus, control method and program
11/17/2005US20050254325 Semiconductor integrated circuit and method of testing same
11/17/2005US20050254276 Interface circuit
11/17/2005US20050254269 Input voltage sense circuit in a line powered network element
11/17/2005US20050254192 Electrostatic discharge (ESD) detector
11/17/2005US20050253762 Mobile electromagnetic compatibility (EMC) test laboratory
11/17/2005US20050253640 Control signal generator, latch circuit, flip-flop and method for controlling operations of the flip-flop
11/17/2005US20050253629 Input buffer with automatic switching point adjustment circuitry, and synchronous dram device including same
11/17/2005US20050253620 Method for testing using a universal wafer carrier for wafer level die burn-in
11/17/2005US20050253619 Method for testing using a universal wafer carrier for wafer level die burn-in
11/17/2005US20050253618 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof
11/17/2005US20050253617 System and method for testing integrated circuits
11/17/2005US20050253616 Method and apparatus for testing and diagnosing electrical paths through area array integrated circuits
11/17/2005US20050253615 Parameter measurement of semiconductor device from pin with on die termination circuit
11/17/2005US20050253614 Electrical connecting method
11/17/2005US20050253613 Probe apparatus with optical length-measuring unit and probe testing method
11/17/2005US20050253611 Probe apparatus
11/17/2005US20050253610 Test method for semiconductor components using anisotropic conductive polymer contact system
11/17/2005US20050253609 Testing apparatus with electronic camera
11/17/2005US20050253608 Electrical test device
11/17/2005US20050253607 Electric signal connecting device and probe assembly and probing device using the same
11/17/2005US20050253606 Microprobe tips and methods for making
11/17/2005US20050253605 Probe for high electric current
11/17/2005US20050253604 Surrounding structure for a probe card
11/17/2005US20050253603 Ultra-broadband differential voltage probes
11/17/2005US20050253602 Resilient contact probe apparatus, methods of using and making, and resilient contact probes
11/17/2005US20050253593 Initialization of a bidirectional, self-timed parallel interface with automatic testing of ac differential wire pairs
11/17/2005US20050253591 Cell evaluation device
11/17/2005US20050253590 Battery charge testing apparatus
11/17/2005US20050253575 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
11/17/2005US20050253566 Voltage regulator feedback protection method and apparatus
11/17/2005US20050253140 Method of bumping die pads for wafer testing
11/17/2005US20050252709 Sensor, controller and method for monitoring at least one sensor
11/17/2005US20050252545 Infrared detection of solar cell defects under forward bias
11/17/2005US20050252281 System and method for treating process fluids delivered to an electrochemical cell stack
11/17/2005DE10393883T5 Zeitablauferzeugungsschaltung und das die Zeitablauferzeugungsschaltung aufweisendes Halbleitertestgerät Timing generating circuit and the timing generating circuit exhibiting semiconductor testing apparatus
11/17/2005DE10236943B4 Verfahren zum Erkennen von Gefährdungen durch Streuströme A method of detecting hazards by stray currents
11/17/2005DE102005015727A1 Verfahren zur Ermittlung der Ruhespannung einer Speicherbatterie Method for determining the open circuit voltage of a storage battery
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