| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 11/24/2005 | US20050262407 High frequency divider state correction circuit with data path correction |
| 11/24/2005 | US20050262406 High frequency divider state correction circuit |
| 11/24/2005 | US20050262405 Apparatus and method for reducing test resources in testing DRAMs |
| 11/24/2005 | US20050262404 Data transfer device and abnormal transfer state detecting method |
| 11/24/2005 | US20050262403 Apparatus and method for single operation read-modify-write in a bit-accessible memory unit memory |
| 11/24/2005 | US20050262236 Methods and systems for monitoring and diagnosing machinery |
| 11/24/2005 | US20050262080 Methods and apparatus that use contextual test number factors to assign test numbers |
| 11/24/2005 | US20050262079 Method and apparatus for assigning test numbers |
| 11/24/2005 | US20050261866 Thermal protection for a VLSI chip through reduced c4 usage |
| 11/24/2005 | US20050261863 Integrated circuit configuration system and method |
| 11/24/2005 | US20050261861 Method and test adapter for testing an appliance having a smart card reader |
| 11/24/2005 | US20050261858 System and method for linking and loading compiled pattern data |
| 11/24/2005 | US20050261857 System and method for linking and loading compiled pattern data |
| 11/24/2005 | US20050261856 Carrier module for adapting non-standard instrument cards to test systems |
| 11/24/2005 | US20050261855 Supporting calibration and diagnostics in an open architecture test system |
| 11/24/2005 | US20050261854 Vacuum chamber with two-stage longitudinal translation for circuit board testing |
| 11/24/2005 | US20050260970 Method of and apparatus for operating a mobile terminal in response to an indication of charge level of battery of the terminal |
| 11/24/2005 | US20050259838 Hearing aid and hearing aid system |
| 11/24/2005 | US20050259556 Detection apparatus, detection method, and program |
| 11/24/2005 | US20050259505 System and method for maintaining device operation during clock signal adjustments |
| 11/24/2005 | US20050259370 Inverter device for automobile |
| 11/24/2005 | US20050259096 Method and structure for measuring a bonding resistance |
| 11/24/2005 | US20050258859 Determining leakage in matrix-structured electronic devices |
| 11/24/2005 | US20050258858 Multichip package test |
| 11/24/2005 | US20050258857 Fault tolerant selection of die on wafer |
| 11/24/2005 | US20050258856 High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test method |
| 11/24/2005 | US20050258855 Oscillation detecting apparatus and test apparatus |
| 11/24/2005 | US20050258854 Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device |
| 11/24/2005 | US20050258852 Plate with an indicator for discerning among pre-identified probe holes in the plate |
| 11/24/2005 | US20050258848 Selectively configurable probe strucutres, e.g., for testing microelectronic components |
| 11/24/2005 | US20050258847 Method of connecting probe pin to circuit board and method of manufacturing probe card |
| 11/24/2005 | US20050258846 Test board for high-frequency system level test |
| 11/24/2005 | US20050258845 Pad type wafer test apparatus |
| 11/24/2005 | US20050258844 Freely deflecting knee probe with controlled scrub motion |
| 11/24/2005 | US20050258842 Radiation detector for electrostatic discharge |
| 11/24/2005 | US20050258838 Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit |
| 11/24/2005 | US20050258837 Press-connecting pliers for electric communication terminals on transmitting lines for phone and network |
| 11/24/2005 | US20050258836 Apparatus and method of inspecting breakdown of conducting wire |
| 11/24/2005 | US20050258835 Method of measuring contact resistance of probe and method of testing semiconductor device |
| 11/24/2005 | US20050258827 Magnetoresistive element lifecycle tester with temperature control |
| 11/24/2005 | US20050258819 Property measurement method for high frequency circuit, calibration pattern, and calibration jig |
| 11/24/2005 | US20050258818 Reduced pin count test method and apparatus |
| 11/24/2005 | US20050258801 Method and system for battery protection |
| 11/24/2005 | US20050258769 Electro-optical device, method of checking the same , and electronic apparatus |
| 11/24/2005 | DE10337350B3 Method of discovering and locating a defect in a logic electronic circuit board where the board is considered in tact or not depending on the comparison on switched signals |
| 11/24/2005 | DE102005018865A1 Verfahren und Vorrichtung zum Messen unter Verwendung einer Haupt- und einer entfernten Einheit Method and apparatus for measuring using a main and a remote unit |
| 11/24/2005 | DE102005018114A1 Spannungs-/Prozessbewertung bei Halbleitern Voltage / process evaluation in semiconductors |
| 11/24/2005 | DE102005013900A1 Vorrichtung und Verfahren zum Testen von Halbleitervorrichtungen Apparatus and method for testing semiconductor devices |
| 11/24/2005 | DE102005011373A1 Interconnection for test measurement and logical analysis systems and probes for integrated circuits has flexible layers with contact bumps sandwiching rigid layer with holes |
| 11/24/2005 | DE102005002187A1 In eine Versand- und Handhabungsabdeckung eingebettete Teststruktur für integrierte-Schaltung-Sockel und Verfahren zum Testen von integrierte-Schaltung-Sockeln und Schaltungsanordnungen, die dieselben verwenden In a shipping and handling cap embedded test structure for integrated circuit socket and method for testing integrated circuit sockets and circuit arrangements which use the same |
| 11/24/2005 | DE102004027676A1 Verfahren und Vorrichtung zum Prüfen wenigstens eines LED-Strangs A method and apparatus for testing at least one LED strand |
| 11/24/2005 | DE102004012102B3 Schaltungsanordnung zur Detektion eines Kriech- oder Defektstroms Circuit arrangement for detecting a leakage or creepage current |
| 11/24/2005 | CA2565989A1 Compression of data traces for an integrated circuit with multiple memories |
| 11/23/2005 | EP1599011A2 Distributed system for data communication |
| 11/23/2005 | EP1598929A1 Inverter device including a ground fault detection circuit |
| 11/23/2005 | EP1598917A2 Electronic device, battery pack, power-supply controlling method and program for electronic device |
| 11/23/2005 | EP1598913A2 System and method for monitoring a vehicle battery |
| 11/23/2005 | EP1598675A1 Method for optimal batterycharge management of a mobile communication terminal |
| 11/23/2005 | EP1598674A1 Method of displaying high resistance ground in a three phase network |
| 11/23/2005 | EP1597732A1 Multi-chip card |
| 11/23/2005 | EP1597605A2 Testing of electronic circuits |
| 11/23/2005 | EP1597604A2 Antenna for detection of partial discharges in a chamber of an electrical instrument |
| 11/23/2005 | EP1597603A2 Method and apparatus for transmitting information within a communication system |
| 11/23/2005 | EP1597597A1 Method for measuring the current consumption of an electric radiator in a vehicle ventilation, heating or air conditioning system |
| 11/23/2005 | EP1529293B1 Built-in-self-test of flash memory cells |
| 11/23/2005 | EP1407280B1 Method of manufacturing a probe card |
| 11/23/2005 | EP1322964B1 Electronic test head positioner |
| 11/23/2005 | EP1153308B1 Partial discharge site location system for determining the position of faults in a high voltage cable |
| 11/23/2005 | EP1127423B1 Measurement of nonlinear distortion in transmitters |
| 11/23/2005 | EP1118006B1 Method and device for testing capacitors integrated on a semiconductor chip |
| 11/23/2005 | CN1701489A Manufacturing method of motor |
| 11/23/2005 | CN1701427A LSI package, LSI element testing method, and semiconductor device manufacturing method |
| 11/23/2005 | CN1701240A Device and method for characterizing the version of integrated circuits and use for controlling operations |
| 11/23/2005 | CN1701239A Locking device and load board assembly |
| 11/23/2005 | CN1701238A Measurement of lateral diffusion of diffused layers |
| 11/23/2005 | CN1700577A Inverter device for automobile |
| 11/23/2005 | CN1700437A Test board for high-frequency system level test |
| 11/23/2005 | CN1700357A Semiconductor memory device for build-in fault diagnosis |
| 11/23/2005 | CN1700356A Semiconductor memory |
| 11/23/2005 | CN1700284A Electro-optical device, method of checking the same, and electronic apparatus |
| 11/23/2005 | CN1700030A Device and method for indicating mobile communication terminal battery allowrance |
| 11/23/2005 | CN1700029A Insulation gas voltage endurance testing method and testing device |
| 11/23/2005 | CN1700028A Zero sequence direction measurement element with negative sequence negative direction blocking |
| 11/23/2005 | CN1700027A Zero sequence direction measurement method with zero sequence voltage compensation |
| 11/23/2005 | CN1700026A Apparatus and method of detecting breakdown of conducting wires |
| 11/23/2005 | CN1700025A Carrier wave intelligentized detection control apparatus for single power inductance ballasts and detection method thereof |
| 11/23/2005 | CN1228829C Identifying method of mark on semiconductor device |
| 11/23/2005 | CN1228644C Automatic measuring apparatus of mechanical characteristic for DC motor |
| 11/23/2005 | CN1228643C Semiconductor testing system based on specific application affairs |
| 11/23/2005 | CN1228642C Precisely Positioning method and device for power transmission line fault using multiple terminal signals |
| 11/23/2005 | CN1228641C Nickel alloy probe card frame laminate |
| 11/23/2005 | CN1228640C PTC thermistor zero-power voltage effect automatic testing system |
| 11/23/2005 | CN1228148C Method of screening laminated ceramic capacitor |
| 11/22/2005 | US6968545 Method and apparatus for no-latency conditional branching |
| 11/22/2005 | US6968519 System and method for using IDDQ pattern generation for burn-in tests |
| 11/22/2005 | US6968515 Semiconductor circuit designing apparatus and a semiconductor circuit designing method in which the number of steps in a circuit design and a layout design is reduced |
| 11/22/2005 | US6968489 Pseudo random optimized built-in self-test |
| 11/22/2005 | US6968488 System and method for testing a circuit |
| 11/22/2005 | US6968486 Master-slave-type scanning flip-flop circuit for high-speed operation with reduced load capacity of clock controller |
| 11/22/2005 | US6968485 Signal measurement apparatus and method |