Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2005
11/30/2005EP1118005A4 Semiconductor wafer evaluating apparatus and method
11/30/2005EP0987632B1 Boundary scan element and communication device made by using the same
11/30/2005EP0843822B1 A bidirectional load and source cycler
11/30/2005CN2743846Y Testing device of power frequency withstand voltage for switch on column voltage
11/30/2005CN2743845Y Alarm for collector to ground short circuit
11/30/2005CN2743844Y Liquid crystal substrate alignment device
11/30/2005CN1703855A Method and apparatus for analyzing serial data streams
11/30/2005CN1703759A Semiconductor storage device, test method therefor, and test circuit therefor
11/30/2005CN1703011A Initialization of a bidirectional, self-timed parallel interface with automatic testing of AC differential wire pairs
11/30/2005CN1702968A Semiconductor integrated circuit device having scan flip-flop circuit
11/30/2005CN1702864A Inspection substrate for display device
11/30/2005CN1702861A Semiconductor device with a plurality of ground planes
11/30/2005CN1702728A Shift register, data line driving circuit, scanning line driving circuit, electro-optical device, and electronic apparatus
11/30/2005CN1702712A Scan driving apparatus, flat panel display having the same, and driving method thereof
11/30/2005CN1702635A High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test method
11/30/2005CN1702587A Voltage regulator feedback protection method and apparatus
11/30/2005CN1702471A System and method for controlling a fuel cell testing device
11/30/2005CN1702470A Probe card for probing wafers with raised contact elements
11/30/2005CN1702469A Detecting chip with multiple detecting units
11/30/2005CN1702468A Battery leakage detection circuit for electric vehicle and leakage detection method for electric vehicle
11/30/2005CN1702467A Detection device for LCD connector of mobile communication terminal
11/30/2005CN1702463A Probe for high electric current
11/30/2005CN1702462A Electrical detection facility
11/30/2005CN1702461A Sampling electrical detection facility and method for manufacturing the same
11/30/2005CN1229890C Method for separating secondary cell
11/30/2005CN1229859C Evaluating method for semiconductor crystal chip
11/30/2005CN1229808C Portable household appliance maintaining instrument
11/30/2005CN1229721C In circuit emulated equipment using high-level programming language and method thereof
11/30/2005CN1229668C Substrate device, its test method, photoelectric device and manufacturing method thereof
11/30/2005CN1229651C Inspecting apparatus and inspecting method for circuit substrate
11/30/2005CN1229650C Circuit for detecting leak from power supply
11/30/2005CN1229649C Re-locatable partial discharge transducer head
11/30/2005CN1229648C Electric switch test detection instrument
11/30/2005CN1229647C Automatic positioning system/global positioning system receiver comprehensive testing system
11/30/2005CN1229244C Solenoid controlled actuator fault detecting system and method for driving system
11/29/2005USRE38894 Method and apparatus for testing integrated circuits
11/29/2005US6971054 Method and system for determining repeatable yield detractors of integrated circuits
11/29/2005US6971052 Semiconductor integrated circuit and method for testing the same
11/29/2005US6971045 Reducing tester channels for high pinout integrated circuits
11/29/2005US6970815 Method of discriminating between different types of scan failures, computer readable code to cause a display to graphically depict one or more simulated scan output data sets versus time and a computer implemented circuit simulation and fault detection system
11/29/2005US6970807 Diagnostic system and method for electric leak detecting device
11/29/2005US6970797 Method and product for processing system test data
11/29/2005US6970634 Fiber optic wafer probe
11/29/2005US6970491 Planar and wafer level packaging of semiconductor lasers and photo detectors for transmitter optical sub-assemblies
11/29/2005US6970471 Communicating using IP addressing for redundant telephony modules
11/29/2005US6970417 Methods and systems for fast restoration in a mesh network of optical cross connects
11/29/2005US6970274 Display device and driving method of the same
11/29/2005US6970029 Variable-delay signal generators and methods of operation therefor
11/29/2005US6970009 Single-transistor two resistor circuit which translate test signals to selectable voltage levels
11/29/2005US6970008 Chip testing machine with rotary conveying disk set for receiving and conveying the chips for testing
11/29/2005US6970007 Semiconductor device low temperature test apparatus using electronic cooling element
11/29/2005US6970006 Apparatus for the automated testing, calibration and characterization of test adapters
11/29/2005US6970005 Multiple-chip probe and universal tester contact assemblage
11/29/2005US6970004 Apparatus for inspecting defects of devices and method of inspecting defects
11/29/2005US6970003 Electronics board life prediction of microprocessor-based transmitters
11/29/2005US6970002 Tube measurement and calibration system
11/29/2005US6970001 Variable impedance test probe
11/29/2005US6969997 Power source test instrument
11/29/2005US6969974 Battery fuel gauge using safety circuit
11/29/2005US6969973 Apparatus for calculating remaining battery capacity
11/29/2005US6969970 Method of controlling the charging of a battery
11/29/2005US6969830 Wafer chuck having thermal plate with interleaved heating and cooling elements
11/29/2005US6969632 Method for fabricating image sensor semiconductor package
11/29/2005US6969622 Anisotropically conductive connector, its manufacture method and probe member
11/29/2005US6969620 Semiconductor device inspection system
11/29/2005US6969262 IC socket
11/29/2005US6968994 RF-ID for cable management and port identification
11/29/2005US6968614 Method for positioning an electronic module having a contact column array into a template
11/28/2005CA2508803A1 Push button control device
11/24/2005WO2005112478A1 Method and system for scanning and detecting metallic cross-connects
11/24/2005WO2005112040A1 Compression of data traces for an integrated circuit with multiple memories
11/24/2005WO2005111801A2 Apparatus and method for improving emulation speed of high-level languages in on-chip emulation systems
11/24/2005WO2005111796A2 Defect location identification for microdevice manufacturing and test
11/24/2005WO2005111644A1 Device for judging acceptableness of secondary battery and its ripple generating circuit
11/24/2005WO2005111643A1 Battery state recognition
11/24/2005WO2005111642A1 Method and device for determining the energy content of an energy accumulator
11/24/2005WO2005111641A1 State recognizing device and switching controller of power switching apparatus using state recognizing device
11/24/2005WO2005111640A1 System monitor in an integrated circuit
11/24/2005WO2005111639A1 Oscillation detecting apparatus and testing apparatus
11/24/2005WO2005111638A2 Storage switch traffic bandwidth control
11/24/2005WO2005111637A1 Leakage detector
11/24/2005WO2005111636A1 Method of operating a shielded connection, and communications network
11/24/2005WO2005111632A1 Sheet-like probe, method of producing the probe, and application of the probe
11/24/2005WO2005057752A3 Method and apparatus for use with a portable power source
11/24/2005WO2005057334A3 Internet endpoint system
11/24/2005WO2005043347A3 Electric utility storm outage management
11/24/2005WO2005025114A3 Method and system for out-of-band messaging between customer premises equipment and a cable modem termination station
11/24/2005WO2005008768A3 A system and method for determining a cross sectional feature of a structural element using a reference structural element
11/24/2005WO2004084276A3 Apparatus and method for controlling the temperature of an electronic device
11/24/2005US20050262492 Dynamic reconfiguration of a system monitor (DRPORT)
11/24/2005US20050262460 Method for creating a JTAG tap controller in a slice for use during custom instance creation to avoid the need of a boundary scan synthesis tool
11/24/2005US20050262459 Automatic tuning of signal timing
11/24/2005US20050262457 Checking the robustness of a model of a physical system
11/24/2005US20050262422 Semiconductor memory device for build-in fault diagnosis
11/24/2005US20050262414 Datalog support in a modular test system
11/24/2005US20050262413 Shift register, data line driving circuit, scanning line driving circuit, electro-optical device, and electronic apparatus
11/24/2005US20050262412 Method and system for simulating a modular test system
11/24/2005US20050262410 Tool for generating a re-generative functional test
11/24/2005US20050262409 Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits
11/24/2005US20050262408 Fast min* - or max* - circuit in LDPC (Low Density Parity Check) decoder