Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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11/30/2005 | EP1118005A4 Semiconductor wafer evaluating apparatus and method |
11/30/2005 | EP0987632B1 Boundary scan element and communication device made by using the same |
11/30/2005 | EP0843822B1 A bidirectional load and source cycler |
11/30/2005 | CN2743846Y Testing device of power frequency withstand voltage for switch on column voltage |
11/30/2005 | CN2743845Y Alarm for collector to ground short circuit |
11/30/2005 | CN2743844Y Liquid crystal substrate alignment device |
11/30/2005 | CN1703855A Method and apparatus for analyzing serial data streams |
11/30/2005 | CN1703759A Semiconductor storage device, test method therefor, and test circuit therefor |
11/30/2005 | CN1703011A Initialization of a bidirectional, self-timed parallel interface with automatic testing of AC differential wire pairs |
11/30/2005 | CN1702968A Semiconductor integrated circuit device having scan flip-flop circuit |
11/30/2005 | CN1702864A Inspection substrate for display device |
11/30/2005 | CN1702861A Semiconductor device with a plurality of ground planes |
11/30/2005 | CN1702728A Shift register, data line driving circuit, scanning line driving circuit, electro-optical device, and electronic apparatus |
11/30/2005 | CN1702712A Scan driving apparatus, flat panel display having the same, and driving method thereof |
11/30/2005 | CN1702635A High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test method |
11/30/2005 | CN1702587A Voltage regulator feedback protection method and apparatus |
11/30/2005 | CN1702471A System and method for controlling a fuel cell testing device |
11/30/2005 | CN1702470A Probe card for probing wafers with raised contact elements |
11/30/2005 | CN1702469A Detecting chip with multiple detecting units |
11/30/2005 | CN1702468A Battery leakage detection circuit for electric vehicle and leakage detection method for electric vehicle |
11/30/2005 | CN1702467A Detection device for LCD connector of mobile communication terminal |
11/30/2005 | CN1702463A Probe for high electric current |
11/30/2005 | CN1702462A Electrical detection facility |
11/30/2005 | CN1702461A Sampling electrical detection facility and method for manufacturing the same |
11/30/2005 | CN1229890C Method for separating secondary cell |
11/30/2005 | CN1229859C Evaluating method for semiconductor crystal chip |
11/30/2005 | CN1229808C Portable household appliance maintaining instrument |
11/30/2005 | CN1229721C In circuit emulated equipment using high-level programming language and method thereof |
11/30/2005 | CN1229668C Substrate device, its test method, photoelectric device and manufacturing method thereof |
11/30/2005 | CN1229651C Inspecting apparatus and inspecting method for circuit substrate |
11/30/2005 | CN1229650C Circuit for detecting leak from power supply |
11/30/2005 | CN1229649C Re-locatable partial discharge transducer head |
11/30/2005 | CN1229648C Electric switch test detection instrument |
11/30/2005 | CN1229647C Automatic positioning system/global positioning system receiver comprehensive testing system |
11/30/2005 | CN1229244C Solenoid controlled actuator fault detecting system and method for driving system |
11/29/2005 | USRE38894 Method and apparatus for testing integrated circuits |
11/29/2005 | US6971054 Method and system for determining repeatable yield detractors of integrated circuits |
11/29/2005 | US6971052 Semiconductor integrated circuit and method for testing the same |
11/29/2005 | US6971045 Reducing tester channels for high pinout integrated circuits |
11/29/2005 | US6970815 Method of discriminating between different types of scan failures, computer readable code to cause a display to graphically depict one or more simulated scan output data sets versus time and a computer implemented circuit simulation and fault detection system |
11/29/2005 | US6970807 Diagnostic system and method for electric leak detecting device |
11/29/2005 | US6970797 Method and product for processing system test data |
11/29/2005 | US6970634 Fiber optic wafer probe |
11/29/2005 | US6970491 Planar and wafer level packaging of semiconductor lasers and photo detectors for transmitter optical sub-assemblies |
11/29/2005 | US6970471 Communicating using IP addressing for redundant telephony modules |
11/29/2005 | US6970417 Methods and systems for fast restoration in a mesh network of optical cross connects |
11/29/2005 | US6970274 Display device and driving method of the same |
11/29/2005 | US6970029 Variable-delay signal generators and methods of operation therefor |
11/29/2005 | US6970009 Single-transistor two resistor circuit which translate test signals to selectable voltage levels |
11/29/2005 | US6970008 Chip testing machine with rotary conveying disk set for receiving and conveying the chips for testing |
11/29/2005 | US6970007 Semiconductor device low temperature test apparatus using electronic cooling element |
11/29/2005 | US6970006 Apparatus for the automated testing, calibration and characterization of test adapters |
11/29/2005 | US6970005 Multiple-chip probe and universal tester contact assemblage |
11/29/2005 | US6970004 Apparatus for inspecting defects of devices and method of inspecting defects |
11/29/2005 | US6970003 Electronics board life prediction of microprocessor-based transmitters |
11/29/2005 | US6970002 Tube measurement and calibration system |
11/29/2005 | US6970001 Variable impedance test probe |
11/29/2005 | US6969997 Power source test instrument |
11/29/2005 | US6969974 Battery fuel gauge using safety circuit |
11/29/2005 | US6969973 Apparatus for calculating remaining battery capacity |
11/29/2005 | US6969970 Method of controlling the charging of a battery |
11/29/2005 | US6969830 Wafer chuck having thermal plate with interleaved heating and cooling elements |
11/29/2005 | US6969632 Method for fabricating image sensor semiconductor package |
11/29/2005 | US6969622 Anisotropically conductive connector, its manufacture method and probe member |
11/29/2005 | US6969620 Semiconductor device inspection system |
11/29/2005 | US6969262 IC socket |
11/29/2005 | US6968994 RF-ID for cable management and port identification |
11/29/2005 | US6968614 Method for positioning an electronic module having a contact column array into a template |
11/28/2005 | CA2508803A1 Push button control device |
11/24/2005 | WO2005112478A1 Method and system for scanning and detecting metallic cross-connects |
11/24/2005 | WO2005112040A1 Compression of data traces for an integrated circuit with multiple memories |
11/24/2005 | WO2005111801A2 Apparatus and method for improving emulation speed of high-level languages in on-chip emulation systems |
11/24/2005 | WO2005111796A2 Defect location identification for microdevice manufacturing and test |
11/24/2005 | WO2005111644A1 Device for judging acceptableness of secondary battery and its ripple generating circuit |
11/24/2005 | WO2005111643A1 Battery state recognition |
11/24/2005 | WO2005111642A1 Method and device for determining the energy content of an energy accumulator |
11/24/2005 | WO2005111641A1 State recognizing device and switching controller of power switching apparatus using state recognizing device |
11/24/2005 | WO2005111640A1 System monitor in an integrated circuit |
11/24/2005 | WO2005111639A1 Oscillation detecting apparatus and testing apparatus |
11/24/2005 | WO2005111638A2 Storage switch traffic bandwidth control |
11/24/2005 | WO2005111637A1 Leakage detector |
11/24/2005 | WO2005111636A1 Method of operating a shielded connection, and communications network |
11/24/2005 | WO2005111632A1 Sheet-like probe, method of producing the probe, and application of the probe |
11/24/2005 | WO2005057752A3 Method and apparatus for use with a portable power source |
11/24/2005 | WO2005057334A3 Internet endpoint system |
11/24/2005 | WO2005043347A3 Electric utility storm outage management |
11/24/2005 | WO2005025114A3 Method and system for out-of-band messaging between customer premises equipment and a cable modem termination station |
11/24/2005 | WO2005008768A3 A system and method for determining a cross sectional feature of a structural element using a reference structural element |
11/24/2005 | WO2004084276A3 Apparatus and method for controlling the temperature of an electronic device |
11/24/2005 | US20050262492 Dynamic reconfiguration of a system monitor (DRPORT) |
11/24/2005 | US20050262460 Method for creating a JTAG tap controller in a slice for use during custom instance creation to avoid the need of a boundary scan synthesis tool |
11/24/2005 | US20050262459 Automatic tuning of signal timing |
11/24/2005 | US20050262457 Checking the robustness of a model of a physical system |
11/24/2005 | US20050262422 Semiconductor memory device for build-in fault diagnosis |
11/24/2005 | US20050262414 Datalog support in a modular test system |
11/24/2005 | US20050262413 Shift register, data line driving circuit, scanning line driving circuit, electro-optical device, and electronic apparatus |
11/24/2005 | US20050262412 Method and system for simulating a modular test system |
11/24/2005 | US20050262410 Tool for generating a re-generative functional test |
11/24/2005 | US20050262409 Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits |
11/24/2005 | US20050262408 Fast min* - or max* - circuit in LDPC (Low Density Parity Check) decoder |