| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/06/2005 | US6972202 Method of manufacturing and testing a semiconductor device |
| 12/06/2005 | US6971793 Test handler temperature monitoring system |
| 12/06/2005 | CA2218458C Method and apparatus for design verification using emulation and simulation |
| 12/01/2005 | WO2005115069A1 Ic socket |
| 12/01/2005 | WO2005115068A2 High density interconnect system having rapid fabrication cycle |
| 12/01/2005 | WO2005114928A1 Digital subscriber line user capacity estimation |
| 12/01/2005 | WO2005114808A2 Intelligent battery charging system |
| 12/01/2005 | WO2005114241A2 Method and structure to develop a test program for semiconductor integrated circuits |
| 12/01/2005 | WO2005114240A1 Method and system for controlling interchangeable components in a modular test system |
| 12/01/2005 | WO2005114239A1 Supporting calibration and diagnostics in an open architecture test system |
| 12/01/2005 | WO2005114238A1 Datalog support in a modular test system |
| 12/01/2005 | WO2005114237A1 Method and system for simulating a modular test system |
| 12/01/2005 | WO2005114236A1 Carrier module for adapting non-standard instrument cards to test systems |
| 12/01/2005 | WO2005114235A2 Method and structure to develop a test program for semiconductor integrated circuits |
| 12/01/2005 | WO2005114234A1 Method and circuit arrangement for testing functions and/or algorithms implemented in electrical circuits |
| 12/01/2005 | WO2005114233A2 System and method for providing channels in application server and transaction-based systems |
| 12/01/2005 | WO2005114232A2 Method and apparatus for the determination of the concentration of impurities in a wafer |
| 12/01/2005 | WO2005114228A1 Laminated board and probe card |
| 12/01/2005 | WO2005114141A2 Decoding an alternator output signal |
| 12/01/2005 | WO2005114122A1 Thermal protection for a vlsi chip through reduced c4 usage |
| 12/01/2005 | WO2005112576A2 Method of bumping die pads for wafer testing |
| 12/01/2005 | WO2005078769A3 Manufacturing integrated circuits |
| 12/01/2005 | WO2005057332A3 Reliable multicast communication |
| 12/01/2005 | US20050268265 Metastability effects simulation for a circuit description |
| 12/01/2005 | US20050268260 Capacitance measurements for an integrated circuit |
| 12/01/2005 | US20050268259 System and method for verifying trace widths of a PCB layout |
| 12/01/2005 | US20050268196 Multiple sweep point testing of circuit devices |
| 12/01/2005 | US20050268195 Apparatus and method for improving emulation speed of high-level languages in on-chip emulation systems |
| 12/01/2005 | US20050268194 Method and apparatus for multi-level scan compression |
| 12/01/2005 | US20050268193 Module, electronic device and evaluation tool |
| 12/01/2005 | US20050268192 Scan driving apparatus, flat panel display having the same, and driving method thereof |
| 12/01/2005 | US20050268191 Semiconductor integrated circuit device having scan flip-flop circuit |
| 12/01/2005 | US20050268190 Dynamically reconfigurable shared scan-in test architecture |
| 12/01/2005 | US20050268189 Device testing using multiple test kernels |
| 12/01/2005 | US20050268186 Semiconductor wafer with test circuit and manufacturing method |
| 12/01/2005 | US20050268184 Method and apparatus for monitoring the power state of computer system |
| 12/01/2005 | US20050268183 Local area network measurement test device |
| 12/01/2005 | US20050268177 Compression of data traces for an integrated circuit with multiple memories |
| 12/01/2005 | US20050268166 Circuit for detecting ground offset of parts of a network |
| 12/01/2005 | US20050267730 Dynamic programming of trigger conditions in hardware emulation systems |
| 12/01/2005 | US20050267706 Increase productivity at wafer test using probe retest data analysis |
| 12/01/2005 | US20050267705 Method and system for providing quality control on wafers running on a manufacturing line |
| 12/01/2005 | US20050267696 Measurement instrument and measurement method |
| 12/01/2005 | US20050266734 Support member assembly for conductive contact members |
| 12/01/2005 | US20050266690 Manufacture of probe unit having lead probes extending beyond edge of substrate |
| 12/01/2005 | US20050265249 Methods of detecting signaling information in a wireless communication system |
| 12/01/2005 | US20050265087 Power supply boost control device and method for identifying and judging fault location in power supply boost control device |
| 12/01/2005 | US20050265009 Detecting short circuits and detecting component misplacement |
| 12/01/2005 | US20050264373 Switching matrix and method for distinction of a connecting line |
| 12/01/2005 | US20050264315 Test device for electrical testing of a unit under test |
| 12/01/2005 | US20050264314 Built-in self test technique for programmable impedance drivers for RapidChip and ASIC drivers |
| 12/01/2005 | US20050264313 Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe |
| 12/01/2005 | US20050264312 Test device for electrical testing of a unit under test, as well as a method for production of a test drive |
| 12/01/2005 | US20050264311 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment |
| 12/01/2005 | US20050264310 Method for evaluating at least one electrical conducting structure of an electronic component |
| 12/01/2005 | US20050264309 Test apparatus having auto probe and test method using the same |
| 12/01/2005 | US20050264308 Test board locking device including stiffener |
| 12/01/2005 | US20050264306 Apparatus for detecting defect in circuit pattern and defect detecting system having the same |
| 12/01/2005 | US20050264299 Method and apparatus for measuring insertion loss of a conductor |
| 12/01/2005 | US20050264298 Partial discharge detection test link, partial discharge detection system and methods for detecting partial discharge on a power cable |
| 12/01/2005 | US20050264297 Characterizing analog and digital telephone circuits and other types of wiring systems using frequency domain reflectometry (FDR) |
| 12/01/2005 | US20050264296 Battery tester capable of identifying faulty battery post adapters |
| 12/01/2005 | US20050264279 Wafer test equipment and method of aligning test equipment |
| 12/01/2005 | US20050264278 Device for releasable connecting an interface with a test equipment |
| 12/01/2005 | US20050264277 Method and apparatus to probe bus signals using repeaters |
| 12/01/2005 | US20050264276 Attachable/detachable variable spacing probing tip system |
| 12/01/2005 | US20050264264 Battery leakage detection circuit for electric vehicle and leakage detection method for electric vehicle |
| 12/01/2005 | US20050264110 Flux probe for electric generator |
| 12/01/2005 | US20050263759 Semiconductor devices and method for manufacturing the same, semiconductor device modules, circuit substrates and electronic apparatuses |
| 12/01/2005 | US20050263702 Defect inspection and charged particle beam apparatus |
| 12/01/2005 | US20050263701 Substrate inspection method, method of manufacturing semiconductor device, and substrate inspection apparatus |
| 12/01/2005 | US20050263517 Apparatus relating to the reconstruction of semiconductor wafers for wafer-level processing |
| 12/01/2005 | US20050263383 Push button control device |
| 12/01/2005 | US20050263247 Plasma processing apparatus and plasma processing method |
| 12/01/2005 | DE20321016U1 Probe station for measuring ultra-low current in integrated circuit, has cable in which additional layer is arranged between outer dielectric and shield conductor to reduce existing triboelectric current generation |
| 12/01/2005 | DE19919946B4 Verfahren, Vorrichtung und Messortreferenzquelle zum Erzeugen eines Signals mit einer programmierbaren Frequenz A method, apparatus and Messortreferenzquelle for generating a signal having a programmable frequency |
| 12/01/2005 | DE102005015729A1 Verfahren und Anordung zur Ermittlung von Betriebsparametern einer elektrochemischen Speicherbatterie A method and arrangement for determining operating parameters of an electrochemical storage battery |
| 12/01/2005 | DE102005008622A1 Verfahren und Vorrichtung, die kontextabhängige Testzahlfaktoren zum Zuweisen von Testzahlen verwenden Method and apparatus using context-sensitive test number factors for assigning test numbers |
| 12/01/2005 | DE102005008345A1 Verfahren und Vorrichtung, die kontextabhängige Testzahlfaktoren zum Zuweisen von Testzahlen verwenden Method and apparatus using context-sensitive test number factors for assigning test numbers |
| 12/01/2005 | DE102005008344A1 Verfahren und Vorrichtung zum Handhaben von Testzahlkollisionen Method and apparatus for handling collisions test number |
| 12/01/2005 | DE102005008341A1 Verfahren und Vorrichtung zum Identifizieren von Testzahlkollisionen Method and apparatus for identifying test number collisions |
| 12/01/2005 | DE102005005585A1 Verfahren und Vorrichtung zum Zuweisen von Testzahlen Method and apparatus for assigning test numbers |
| 12/01/2005 | DE102004052316B3 Switching method for measuring switch times on an on-load step switch attaches a test circuit to electric switch elements inside a step switch with a separate source of voltage |
| 12/01/2005 | DE102004023621A1 Verfahren und Vorrichtung zur Energieinhaltsbestimmung eines Energiespeichers Method and device for determining the energy content of an energy storage |
| 12/01/2005 | DE102004022719A1 Data extraction for quality assessment of electrical energy involves transferring event data to memory and processing devices, deriving second event data, deriving expansion data, third parameters, processing to assess quality parameters |
| 12/01/2005 | DE102004021782A1 Current supply unit with two parallel current feeding modules for telecomms has control and regulation units with cyclical output of current data |
| 12/01/2005 | DE102004021380A1 Vorrichtung zur Stromversorgung Device for power supply |
| 12/01/2005 | DE10033933B4 Konstantstromquelle zur Bereitstellung kleiner Ströme und Mehrkanalstromquelle Constant current source for supplying small streams and multi-channel current source |
| 11/30/2005 | EP1601231A2 Hearing aid or hearing aid system with acoustic battery indication |
| 11/30/2005 | EP1600865A1 Dynamic programming of trigger conditions in hardware emulation systems |
| 11/30/2005 | EP1600807A1 Apparatus and method of detecting breakdown of conducting wires |
| 11/30/2005 | EP1600784A1 Serial/parallel interface for an integrated circuit |
| 11/30/2005 | EP1600783A1 Circuit for measuring and monitoring current |
| 11/30/2005 | EP1600782A1 Testing device for electronic testing of a sample and and method for producing a device |
| 11/30/2005 | EP1600781A1 Device for the electrical test of a device under test |
| 11/30/2005 | EP1599738A1 Detection of earth faults in three phase systems |
| 11/30/2005 | EP1595211A4 Compressing test responses using a compactor |
| 11/30/2005 | EP1549965A4 Secure scan |
| 11/30/2005 | EP1390771B1 Fuel cell voltage monitoring |
| 11/30/2005 | EP1292834B1 Systems for testing integrated circuits |