Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2005
12/08/2005US20050270051 Integrated circuit (IC) test assembly including phase change material for stabilizing temperature during stress testing of integrated circuits and method thereof
12/08/2005US20050270050 Semiconductor facility
12/08/2005US20050270049 Semiconductor device
12/08/2005US20050270048 Spring-loaded, removable test fixture for circuit board testers
12/08/2005US20050270047 Plasma probe systems
12/08/2005US20050270046 Plasma probe
12/08/2005US20050270045 Electrical contact
12/08/2005US20050270042 System and method for measuring electrical characteristics of a capacitor
12/08/2005US20050270038 Test apparatus and control method
12/08/2005US20050270037 Method and system for non-destructive evaluation of conducting structures
12/08/2005US20050270036 Method and apparatus for monitoring integrity of wires or electrical cables
12/08/2005US20050270035 Short detection circuit and short detection method
12/08/2005US20050270034 Short circuit detecting circuit and abnormality monitoring signal generating circuit
12/08/2005US20050270033 Method and apparatus for automatic determination of lead-acid battery specific gravity
12/08/2005US20050270017 System and method for automatically comparing test points of a PCB
12/08/2005US20050270015 Method and apparatus for electronic meter testing
12/08/2005US20050270012 Bi-directional current sensing by monitoring VS voltage in a half or full bridge circuit
12/08/2005US20050269993 Method and apparatus for determining the available of energy of a lithium ion battery
12/08/2005US20050269991 Battery state-of-charge estimator
12/08/2005US20050269511 Probe driving method, and probe apparatus
12/08/2005US20050269480 Multifunction multi-spectrum signalling device
12/08/2005US20050269240 Semiconductor inspection apparatus and tray for inspection parts used thereof
12/08/2005US20050268734 Electrical condition monitoring method for polymers
12/08/2005US20050268718 Micromechanical sensor having fault identification
12/08/2005US20050268459 System and method for detecting connector pin insertion in printed circuit board assemblies
12/08/2005DE19818264B4 Vorrichtung zur Überprüfung von Sicherheitskomponenten in Kraftfahrzeugen Apparatus for checking of safety components in motor vehicles
12/08/2005DE19644283B4 Verzögerungszeit-Meßvorrichtung für eine Verzögerungsschaltung Delay time measuring device for a delay circuit
12/08/2005DE102005014190A1 Sensorkabel mit leicht änderbarer Gesamtlänge, das fehlerfreie und Hochgeschwindigkeits-Signalübertragung ermöglicht, selbst wenn die Gesamtlänge vergrößert wird, und vom Verstärker getrennter Sensortyp mit dem Kabel Sensor cables with modifiable total length, error-free and high-speed signal transmission possible even if the total length is increased, and the amplifier separate type of sensor with cable
12/08/2005DE102005006086A1 Verfahren zur Erkennung von Chipfehlpositionen Method for detecting faulty chip positions
12/08/2005DE102004035556B3 Verfahren und Einrichtung, insbesondere probecard, zum Kalibrieren eines Halbleiter-Baulement-Test-Systems, insbesondere eines Halbleiter-Bauelement-Testgeräts Method and apparatus, in particular probe card, for calibrating a semiconductor element Baule-test system, especially a semiconductor device testing apparatus
12/08/2005DE102004024991A1 Electrically conductive connection e.g. bond connection, stability checking method, involves determining information about whether bond connection still conducts electricity, based on evaluated electrical performance of connection
12/08/2005DE102004023987A1 Elektrische Prüfeinrichtung Electrical test equipment
12/08/2005DE102004022543A1 Electrical component testing method used in vehicle manufacture, subjecting component under test to voltage and measuring current through data line
12/08/2005DE102004011099B3 Vorrichtung zum Prüfen von Stoffeigenschaften hinsichtlich Zugscherbelastungen, insbesondere zur Prüfung von Klebstoffen Apparatus for testing of material properties with regard to Zugscherbelastungen, in particular for the testing of adhesives
12/07/2005EP1603211A1 Detection and disconnection device for broken covered conductor in medium voltage electrical network
12/07/2005EP1602998A1 Voltage regulator with multiple feedback
12/07/2005EP1602997A1 Voltage regulator with signal generator having high output impedance
12/07/2005EP1602935A1 Electronic device diagnostic methods and systems
12/07/2005EP1602934A1 Sensor device for monitoring the operation of a PV system, and PV system with such a sensor device
12/07/2005EP1601985A1 Laminated core testing device
12/07/2005EP1601984A1 Automatically detecting and routing of test signals
12/07/2005EP1601983A2 Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments
12/07/2005EP1601982A2 Method and apparatus for adaptive processing gain for multiple source devices in a communications system
12/07/2005EP1601981A2 Method and apparatus for source device synchronization in a communication system
12/07/2005EP1601980A1 Wrist joint for positioning a test head
12/07/2005EP1423717B1 Method and device for the diagnosis of an electric system in a motor vehicle electric system
12/07/2005EP1295139B1 Arrangement for calibrating timing of an integrated circuit wafer tester and method
12/07/2005EP1274991A4 Current measuring apparatus for battery
12/07/2005EP1046044B1 Motor winding contamination detector and detection
12/07/2005EP0855037B1 Loaded board drop pin fixture
12/07/2005CN1705890A Methods and apparatus for indicating a fault condition in fuel cells and fuel cell components
12/07/2005CN1705096A Short detection circuit and short detection method
12/07/2005CN1705095A Semiconductor inspection apparatus and tray for inspection parts used thereof
12/07/2005CN1705081A Semiconductor device
12/07/2005CN1704765A Method for testing battery electrode material filling properties
12/07/2005CN1704764A Simulation test method applied for chips
12/07/2005CN1704763A Electronic device diagnostic methods and systems
12/07/2005CN1704762A Internal circuit detection method and detection apparatus used thereby
12/07/2005CN1704742A Physical quantity detection device with bridge circuit and temperature compensation method
12/07/2005CN1230962C Apparatus for battery capacity measurement and for remaining capacity calculation
12/07/2005CN1230885C Fault-tolerance method and system of testing chip for boundary scanning
12/07/2005CN1230830C RAM high speed test control circuit and its testing method
12/07/2005CN1230685C Test method and test seat making process for high-power surface mounted integrated circuit
12/07/2005CN1230684C High-frequency wide-band local discharging on-line monitoring method in gas insulation converting station
12/07/2005CN1230676C Detection device based on electric leakage trace appearance proof characteristic and electrical erosion proof property of electrical resistant material
12/06/2005US6973631 Scan insertion with bypass login in an IC design
12/06/2005US6973609 Scan cell circuit and scan chain consisting of same for test purpose
12/06/2005US6973606 Partially distributed control mechanism for scanout incorporating flexible debug triggering
12/06/2005US6973600 Bit error rate tester
12/06/2005US6973599 Method of and system for constructing valid data for memory-based tests
12/06/2005US6973422 Method and apparatus for modeling and circuits with asynchronous behavior
12/06/2005US6973406 Apparatus and method for electrical testing of electrical circuits
12/06/2005US6973404 Method and apparatus for administering inversion property in a memory tester
12/06/2005US6973402 System for testing integrated circuits
12/06/2005US6973395 Observation and/or failure inspection apparatus, method and program therefor
12/06/2005US6973391 Method for predicting whether a failure of an electrical device may occur
12/06/2005US6973038 System and method for real-time buying and selling of internet protocol (IP) transit
12/06/2005US6973028 SONET ring map generation method and system
12/06/2005US6973000 Synchronous semiconductor memory device of fast random cycle system and test method thereof
12/06/2005US6972848 Semiconductor fabricating apparatus with function of determining etching processing state
12/06/2005US6972704 Sigma-delta modulator with PWM output
12/06/2005US6972612 Semiconductor device with malfunction control circuit and controlling method thereof
12/06/2005US6972598 Methods and arrangements for an enhanced scanable latch circuit
12/06/2005US6972592 Self-timed scan circuit for ASIC fault testing
12/06/2005US6972586 Panel inspection apparatus
12/06/2005US6972585 Semiconductor integrated circuit device and digital measuring instrument
12/06/2005US6972584 Power decoupling circuit for loop powered time-of-flight ranging systems
12/06/2005US6972583 Method for testing electrical characteristics of bumps
12/06/2005US6972582 Apparatus and method for measuring semiconductor wafer electrical properties
12/06/2005US6972581 Apparatus for handling electronic components and method for controlling temperature of electronic components
12/06/2005US6972580 Selectively configurable probe structures, e.g., for testing microelectronic components
12/06/2005US6972578 Method and system for compensating thermally induced motion of probe cards
12/06/2005US6972577 Voltage testing and measurement
12/06/2005US6972574 Method and apparatus for monitoring integrity of wires or electrical cables
12/06/2005US6972573 Device and method for inspecting circuit board
12/06/2005US6972572 Arc fault detector
12/06/2005US6972571 Load board with embedded relay tracker
12/06/2005US6972570 Quick-connect ballast testing and monitoring method and apparatus
12/06/2005US6972557 Handler for testing semiconductor device
12/06/2005US6972554 Universal aircraft generator electrical bench test apparatus