| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/14/2005 | EP1435005B1 A digital system and a method for error detection thereof |
| 12/14/2005 | EP1145281B1 Modelling electrical characteristics of thin film transistors |
| 12/14/2005 | EP0747803B1 Clock for a fail-fast, fail-functional, fault-tolerant multiprocessor system |
| 12/14/2005 | CN2746453Y Detection card for multifunction detection |
| 12/14/2005 | CN2746404Y Circuit system for testing open-circuit and closed circuit voltage of secondary battery |
| 12/14/2005 | CN2746403Y Device for monitoring ring fire of DC large electric machine |
| 12/14/2005 | CN2746402Y Instrument for testing service life of microelectric machine |
| 12/14/2005 | CN2746401Y Electrical parameter test equipment |
| 12/14/2005 | CN1708905A Self-adjusting programmable on-chip clock aligner |
| 12/14/2005 | CN1708842A Integrated circuit and method of measurement and preparation of measurement structure |
| 12/14/2005 | CN1708693A Test head positioning apparatus |
| 12/14/2005 | CN1707484A System and method for checking wiring across crack on main machine board |
| 12/14/2005 | CN1707454A Hub, memory module, memory system and methods for reading and writing to the same |
| 12/14/2005 | CN1707280A Battery state of charge detection |
| 12/14/2005 | CN1707279A Battery remaining capacity indicating apparatus and battery remaining capacity indicating method |
| 12/14/2005 | CN1707277A Distribution line fault monitoring system |
| 12/14/2005 | CN1707276A Real-time emulation method and apparatus for electric system |
| 12/14/2005 | CN1707275A Method for removing interference inductive voltage in transmission line power frequency parameter test |
| 12/14/2005 | CN1707274A Automatic connecting tester |
| 12/14/2005 | CN1707272A Inspection apparatus |
| 12/14/2005 | CN1231768C Signal fault injection machine |
| 12/14/2005 | CN1231767C Scanning vector support for testing system based on event |
| 12/14/2005 | CN1231766C Method for testing internal capacitance of integrated circuit using bridge circuit |
| 12/13/2005 | US6976234 Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits |
| 12/13/2005 | US6976200 Semiconductor integrated circuit having bonding optional function |
| 12/13/2005 | US6976199 AC LSSD/LBIST test coverage enhancement |
| 12/13/2005 | US6976198 Self-repairing integrated circuit and method of operating the same |
| 12/13/2005 | US6976183 Clock architecture for a frequency-based tester |
| 12/13/2005 | US6975980 Hierarchical linking module connection to access ports of embedded cores |
| 12/13/2005 | US6975978 Method and apparatus for fault simulation of semiconductor integrated circuit |
| 12/13/2005 | US6975976 Property specific testbench generation framework for circuit design validation by guided simulation |
| 12/13/2005 | US6975956 Multiple sweep point testing of circuit devices |
| 12/13/2005 | US6975954 Functional testing of logic circuits that use high-speed links |
| 12/13/2005 | US6975953 Analysis method for semiconductor device, analysis system and a computer program product |
| 12/13/2005 | US6975945 System and method for indication of fuse defects based upon analysis of fuse test data |
| 12/13/2005 | US6975696 Built-in self test for a counter system |
| 12/13/2005 | US6975630 System and method of avoiding cell disposal in buffer |
| 12/13/2005 | US6975594 System and method for providing controlled broadband access bandwidth |
| 12/13/2005 | US6975588 Method and apparatus for computing a path through a bidirectional line switched |
| 12/13/2005 | US6975587 Mechanism for automatic protection switching in a router |
| 12/13/2005 | US6975490 Apparatus and method for detecting phase state |
| 12/13/2005 | US6975312 Computer system having network connector and method of checking connection state of network cable therefor |
| 12/13/2005 | US6975242 Method and apparatus for tracking remote ends of networking cables |
| 12/13/2005 | US6975163 Precision margining circuitry |
| 12/13/2005 | US6975131 Integrated module having a delay element |
| 12/13/2005 | US6975130 Techniques for controlling movement of a circuit board module along a card cage slot |
| 12/13/2005 | US6975128 Electrical, high temperature test probe with conductive driven guard |
| 12/13/2005 | US6975127 Planarizing and testing of BGA packages |
| 12/13/2005 | US6975126 Contactor apparatus for semiconductor devices and a test method of semiconductor devices |
| 12/13/2005 | US6975125 Semiconductor device tester |
| 12/13/2005 | US6975111 Method and device for measuring intensity of electromagnetic field, method and device for measuring current-voltage distribution, and method for judging quality of electronic device, and electronic device thereof |
| 12/13/2005 | US6975105 Side supports with adjustable center of gravity |
| 12/13/2005 | US6975103 Resistance ratio digitizing ohmmeter system |
| 12/13/2005 | US6975102 Apparatus and method for analyzing capacitance of insulator |
| 12/13/2005 | US6975095 Remaining battery capacity computation system |
| 12/13/2005 | US6975028 Thermal apparatus for engaging electronic device |
| 12/13/2005 | US6974710 Fabrication method of semiconductor integrated circuit device and testing method |
| 12/08/2005 | WO2005117246A2 Method and device for determining the mechanical load of an alternating current synchronous electric motor with a permanent magnet rotor |
| 12/08/2005 | WO2005116675A1 Secondary battery residual-capacity estimating method and apparatus |
| 12/08/2005 | WO2005116674A2 Method and apparatus for pipelined scan compression |
| 12/08/2005 | WO2005116673A2 Local area network measurement test device |
| 12/08/2005 | WO2005116672A1 Power supply current measuring apparatus and testing apparatus |
| 12/08/2005 | WO2005116671A2 Increase productivity at wafer test using probe retest data analysis |
| 12/08/2005 | WO2005116670A1 Circuit board inspecting apparatus and circuit board inspecting method |
| 12/08/2005 | WO2005076019A3 Digital kick meter and graphical user interface (gui) |
| 12/08/2005 | WO2005065431A3 Microprobe tips and methods for making |
| 12/08/2005 | US20050273685 Automated and customizable generation of efficient test programs for multiple electrical test equipment platforms |
| 12/08/2005 | US20050273684 Timing generator and semiconductor testing device |
| 12/08/2005 | US20050273683 Insertion of embedded test in RTL to GDSII flow |
| 12/08/2005 | US20050273682 Match circuit for performing pattern recognition in a performance counter |
| 12/08/2005 | US20050273681 System and method for testing nodes in a network |
| 12/08/2005 | US20050273679 Semi-conductor component test procedure, in particular for a system with several modules, each comprising a data buffer component, as well as a test module to be used in a corresponding procedure |
| 12/08/2005 | US20050273677 Circuit and method for storing a signal using a latch shared between operational and diagnostic paths |
| 12/08/2005 | US20050273660 Debugger of an electronic circuit manufactured based on a program in hardware description language |
| 12/08/2005 | US20050273320 Wideband signal analyzing apparatus, wideband period jitter analyzing apparatus, and wideband skew analyzing apparatus |
| 12/08/2005 | US20050273290 Method for evaluating semiconductor device |
| 12/08/2005 | US20050272282 Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method |
| 12/08/2005 | US20050272174 Test structures in unused areas of semiconductor integrated circuits and methods for designing the same |
| 12/08/2005 | US20050272172 Method of temporarily securing a die to a burn-in carrier |
| 12/08/2005 | US20050271179 Multi-strobe generation apparatus, test apparatus and adjustment method |
| 12/08/2005 | US20050271162 Techniques to adjust vertical offset |
| 12/08/2005 | US20050271131 System and method for generating a jittered test signal |
| 12/08/2005 | US20050271003 Service based bearer control and traffic flow template operation with Mobile IP |
| 12/08/2005 | US20050270871 Semiconductor integrated circuit device, and adjustment method of semiconductor integrated circuit device |
| 12/08/2005 | US20050270859 Test method and test circuit for electronic device |
| 12/08/2005 | US20050270858 Plural circuit selection using role reversing control inputs |
| 12/08/2005 | US20050270720 Devices and methods for detecting operational failures of relays |
| 12/08/2005 | US20050270199 Method for designing mixed signal integrated circuits and configurable synchronous digital noise emulator circuit |
| 12/08/2005 | US20050270198 Circuit for current measurement and current monitoring |
| 12/08/2005 | US20050270194 Coding information in integrated circuits |
| 12/08/2005 | US20050270165 Failure analyzing system and method for displaying the failure |
| 12/08/2005 | US20050270087 Current comb generator |
| 12/08/2005 | US20050270059 Display apparatus and inspection method |
| 12/08/2005 | US20050270058 System for testing integrated circuit devices |
| 12/08/2005 | US20050270057 Test arrangement including anisotropic conductive film for testing power module |
| 12/08/2005 | US20050270056 Thermal optical chuck |
| 12/08/2005 | US20050270055 Systems and methods for testing microelectronic imagers and microfeature devices |
| 12/08/2005 | US20050270054 Method and apparatus for iddq measuring |
| 12/08/2005 | US20050270053 Method and system for monitoring module power information in a communication device |
| 12/08/2005 | US20050270052 Method and system for monitoring module power status in a communication device |