| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/15/2005 | WO2005120073A1 Apparatus for verifying a low noise block output voltage |
| 12/15/2005 | WO2005119982A1 Service based bearer control and traffic flow template operation with mobile ip |
| 12/15/2005 | WO2005119829A1 Method and apparatus for automatic determination of lead-acid battery specific gravity |
| 12/15/2005 | WO2005119282A1 Method and apparatus for determining the available energy of a lithium ion battery |
| 12/15/2005 | WO2005119281A1 Devices and methods for detecting operational failures of relays |
| 12/15/2005 | WO2005119280A2 Bi-directional current sensing by monitoring vs voltage in a half or full bridge circuit |
| 12/15/2005 | WO2005119279A2 Method and apparatus for multi-level scan compression |
| 12/15/2005 | WO2005119278A1 Sensor device for monitoring the operation of a pv system, and pv system with such a sensor device |
| 12/15/2005 | WO2005119277A1 A method of monitoring line faults in a medium voltage network |
| 12/15/2005 | WO2005118212A1 Solder mask enhancement and method of inspecting printed circuit board assemblies |
| 12/15/2005 | WO2005109013A3 Efficient protection mechanisms in a ring topology network utilizing label switching protocols |
| 12/15/2005 | WO2005101038A3 Wireless test cassette |
| 12/15/2005 | WO2005094154A3 Method and device for detecting an external antenna |
| 12/15/2005 | WO2005088712A3 Temperature control system which sprays liquid coolant droplets against an ic-module and directs radiation against the ic-module |
| 12/15/2005 | WO2005077024A3 Methods and apparatus for data analysis |
| 12/15/2005 | WO2005043176A3 Probe testing structure |
| 12/15/2005 | WO2005024557A3 Integrated network interface supporting multiple data transfer protocols |
| 12/15/2005 | WO2004110077A3 Input voltage sense circuit in a line powered network element |
| 12/15/2005 | US20050278678 Substrate contact analysis |
| 12/15/2005 | US20050278677 Novel test structure for automatic dynamic negative-bias temperature instability testing |
| 12/15/2005 | US20050278675 General purpose delay logic |
| 12/15/2005 | US20050278667 Integrated circuit diagnosing method, system, and program product |
| 12/15/2005 | US20050278599 Testing device |
| 12/15/2005 | US20050278598 Test apparatus |
| 12/15/2005 | US20050278597 Methods and apparatus for data analysis |
| 12/15/2005 | US20050278596 Semiconductor integrated circuit device |
| 12/15/2005 | US20050278595 Built-in self test circuit and test method for storage device |
| 12/15/2005 | US20050278594 Semiconductor memory device having ECC circuit |
| 12/15/2005 | US20050278593 Scan-test structure having increased effectiveness and related systems and methods |
| 12/15/2005 | US20050278592 Semiconductor memory |
| 12/15/2005 | US20050278591 System and method for testing a data storage device without revealing memory content |
| 12/15/2005 | US20050278564 Method and apparatus for determining mis-wired addressable loops |
| 12/15/2005 | US20050278400 Test data compression and decompression method using zero-detected run-length code in system-on-chip |
| 12/15/2005 | US20050278147 Electronic device diagnostic methods and systems |
| 12/15/2005 | US20050278134 Probe card and a method for detecting defects using a probe card and an additional inspection |
| 12/15/2005 | US20050278133 Integrated test circuit |
| 12/15/2005 | US20050278128 Circuit inspection method, method of manufacturing liquid-crystal display, and circuit inspection apparatus |
| 12/15/2005 | US20050277323 Mechanically reconfigurable vertical tester interface for IC probing |
| 12/15/2005 | US20050277272 Low temperature epitaxial growth of silicon-containing films using UV radiation |
| 12/15/2005 | US20050277210 Sequential unique marking |
| 12/15/2005 | US20050277209 Plasma leak monitoring method, plasma processing apparatus and plasma processing method |
| 12/15/2005 | US20050276321 Circuit for PLL-based at-speed scan testing |
| 12/15/2005 | US20050276222 Platform level overload control |
| 12/15/2005 | US20050276031 Printed circuit assembly system and method |
| 12/15/2005 | US20050275434 Comparator and method for amplifying an input signal |
| 12/15/2005 | US20050275423 System and method for checking a layout of circuit traces on a PCB |
| 12/15/2005 | US20050275422 Integrated circuit device with compliant bumps and testing method for testing the integrated circuit device |
| 12/15/2005 | US20050275421 System and method for the probing of a wafer |
| 12/15/2005 | US20050275420 Method and apparatus for managing aligning and coupling of a land grid array interposer for a field replacement unit |
| 12/15/2005 | US20050275418 High density interconnect system having rapid fabrication cycle |
| 12/15/2005 | US20050275414 Double-mirror short-circuit detection |
| 12/15/2005 | US20050275413 Very precise resistance measurement |
| 12/15/2005 | US20050275412 Cable power indicator |
| 12/15/2005 | US20050275411 Device and method for testing for a wiring fault condition |
| 12/15/2005 | US20050275410 Phase difference detection circuit and optical disk device |
| 12/15/2005 | US20050275409 240 volt outlet tester |
| 12/15/2005 | US20050275408 Method and apparatus for detecting impedance |
| 12/15/2005 | US20050275407 Available input-output power estimating device for secondary battery |
| 12/15/2005 | US20050275405 Switching matrix apparatus for semiconductor characteristic measurement apparatus |
| 12/15/2005 | US20050275398 Pressing member and electronic device handling apparatus |
| 12/15/2005 | US20050275382 Charge consumption monitor for electronic device |
| 12/15/2005 | US20050275376 Electric power unit and electronics device |
| 12/15/2005 | US20050275116 Reconstructed semiconductor wafers |
| 12/15/2005 | US20050275099 Semiconductor apparatus and method of manufacturing semiconductor apparatus |
| 12/15/2005 | US20050275068 Method and structures for indexing dice |
| 12/15/2005 | US20050274989 Integrated test circuit arrangement and test method |
| 12/15/2005 | US20050274335 Electromagnetic actuator for controlling a valve of an internal combustion engine and internal combustion engine equipped with such an actuator |
| 12/15/2005 | US20050274325 Semiconductor heating apparatus |
| 12/15/2005 | DE19813197B4 Testschaltung zum Gleichstromtesten eines LSI und Verfahren zum Gleichstromtesten Test circuit for DC testing an LSI and method for DC testing |
| 12/15/2005 | DE10333396B4 Drehmoment-Meßvorrichtung für Elektromotoren und Verfahren zur Messung des Drehmoments eines Elektromotors Torque measuring apparatus for electric motors and method for measuring the torque of an electric motor |
| 12/15/2005 | DE10297849T5 Programmierbares Logikanalysator-Datenanalyseverfahren Programmable logic analyzer data analysis methods |
| 12/15/2005 | DE102005021253A1 Verfahren zum Testen der Motordrehmomentintegrität bei einem Hybrid-Elektrofahrzeug A method of testing the integrity of motor torque in a hybrid electric vehicle |
| 12/15/2005 | DE102005021247A1 Eigenschaftsmessverfahren für Hochfrequenzschaltung, Kalibriermuster und Kalibriervorrichtung Property Measuring method for high frequency circuit calibration pattern and calibration |
| 12/15/2005 | DE102005014253A1 Monitoring thermal loading of component driven intermittently, e.g. in motor vehicle braking system, by determining maximum allowable thermal load from time relationship between drive phase and rest phase |
| 12/15/2005 | DE102004063299A1 Halbleiterwaferprüfgerät und Sondenübertragungseinrichtung Halbleiterwaferprüfgerät and probe transmission device |
| 12/15/2005 | DE102004056133A1 Verfahren zur Erfassung einer Offsetdrift bei einer Wheatstone-Meßbrücke A method for detecting an offset drift in a Wheatstone measuring bridge |
| 12/15/2005 | DE102004037071B3 Stromsparbetrieb bei Hörhilfegeräten Power Saving Mode in hearing aids |
| 12/15/2005 | DE102004026514A1 Fuel cell system has contact pin on printed circuit board for measuring cell voltage |
| 12/15/2005 | DE102004024386A1 Verfahren und Schaltungsanordnung zum Testen von Funktionen und/oder Algorithmen, die in elektronischen Schaltungen implementiert sind Method and circuit arrangement for testing functions and / or algorithms that are implemented in electronic circuits |
| 12/15/2005 | DE102004024100A1 Test device for earth leakage circuit breaker, functions with test voltage differing from supply voltage of supply network |
| 12/15/2005 | DE102004001692B4 Prüfverfahren und Prüfeinrichtung für einen Piezoaktor Test methods and testing device for a piezoelectric actuator |
| 12/15/2005 | DE10143455B4 Verfahren und Vorrichtung zum Testen von zu testenden Schaltungseinheiten mit erhöhter Datenkompression für Burn-in A method and apparatus for testing the circuit under test with increased data compression units for burn-in |
| 12/14/2005 | EP1605559A1 Socket for electric component |
| 12/14/2005 | EP1605492A1 Charged particle beam device with retarding field analyzer |
| 12/14/2005 | EP1605334A2 Interface circuit for a single logic input pin of an electronic system |
| 12/14/2005 | EP1605276A1 Localisation of an electromagnetic radiation source located on a eletrical equipment |
| 12/14/2005 | EP1605273A1 Device and method for estimating losses by Joule effect and the state of charge of a battery |
| 12/14/2005 | EP1605272A1 Battery remaining capacity indicating apparatus and battery remaining capacity indicating method |
| 12/14/2005 | EP1605271A1 Testing apparatus, program for testing apparatus, test pattern recording medium, and method of controlling testing appratus |
| 12/14/2005 | EP1604488A1 Non-intrusive cable connection monitoring for use in HFC networks |
| 12/14/2005 | EP1604341A1 In-use unambiguously determining the near-end-of-life state of a combustion engine battery |
| 12/14/2005 | EP1604218A2 Method of mitigating effects of component deflection in a probe card analyzer |
| 12/14/2005 | EP1604217A1 Apparatus and method for cooling optically probed integrated circuits |
| 12/14/2005 | EP1604216A2 Method and system for emulating a fibre channel link over a sonet/sdh path |
| 12/14/2005 | EP1604215A1 Generation and measurement of timing delays by digital phase error compensation |
| 12/14/2005 | EP1604194A1 Optical inspection system and method for displaying imaged objects in greater than two dimensions |
| 12/14/2005 | EP1603773A1 Method and system for early detecting the defects of an electrically controlled brake system |
| 12/14/2005 | EP1549962A4 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 12/14/2005 | EP1460569B1 Semiconductor integrated circuit device with test signal repeater circuit and related design automation apparatus, method and program |
| 12/14/2005 | EP1445621B1 Parallel testing of integrated circuits |