Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
09/1996
09/12/1996WO1996028003A1 Communications and measurement apparatus
09/12/1996DE19507127A1 Adaptersystem für Baugruppen-Platinen, zu verwenden in einer Prüfeinrichtung To use adapter system for component boards at a test facility
09/11/1996EP0731360A2 Structure for testing bare integrated circuit devices
09/11/1996EP0471760B1 A method and an apparatus for testing the assembly of a plurality of electrical components on a substrate
09/10/1996US5555422 Prober for semiconductor integrated circuit element wafer
09/10/1996US5554940 Bumped semiconductor device and method for probing the same
09/10/1996US5554939 Non-destructive measuring sensor for semiconductor wafer and method of manufacturing the same
09/10/1996US5554173 Defibrillator charge tester
09/06/1996WO1996027136A1 Adapter system for component boards, for use in a test device
09/04/1996EP0729652A1 Contact structure for interconnections, interposer, semiconductor assembly and method
09/04/1996EP0729585A1 A surface mount test point enabling hands free diagnostic testing of electronical circuits
09/04/1996CN1130257A Ic carrier
09/03/1996US5552978 Device for supplying a voltage to an electronic circuit, in particular an electronic circuit associated with a current sensor disposed on an electrical line
09/03/1996US5552631 Semiconductor device assembly including power or ground plane which is provided on opposite surface of insulating layer from signal traces, and is exposed to central opening in insulating layer for interconnection to semiconductor die
09/03/1996US5552563 Shielded low noise multi-lead contact
08/1996
08/29/1996WO1996026446A1 Manipulator for automatic test equipment test head
08/29/1996WO1996018109A3 An integrated resistor for sensing electrical parameters
08/28/1996EP0729006A2 Information processing apparatus with probe undergoing circular motion
08/28/1996CN2234095Y Intermediate current mutual inductor
08/27/1996US5550483 High speed test probe positioning system
08/27/1996US5550482 Probe device
08/27/1996US5550481 Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making
08/27/1996US5550480 Method and means for controlling movement of a chuck in a test apparatus
08/27/1996US5550406 Multi-layer tab tape having distinct signal, power and ground planes and wafer probe card with multi-layer substrate
08/27/1996US5550370 Potential sensor employing electrooptic crystal and potential measuring method
08/27/1996US5549489 Connector module with test and jumper access
08/22/1996WO1996025672A1 Contact structure of a handler for an ic testing device
08/21/1996CN2233585Y High-precision batch meter
08/20/1996US5548525 Method and apparatus for pin assignment in automatic circuit testers
08/20/1996US5548523 Monitoring device secured to power distribution system conductors
08/20/1996US5548223 Probe adapter for electronic device
08/15/1996WO1996024854A1 Top load socket for ball grid array devices
08/14/1996EP0726651A1 Integrated circuit comprising a variable conductance controlled with a digital reference signal
08/14/1996EP0726471A2 Electro-optic voltage measurement apparatus
08/13/1996US5546405 Debug apparatus for an automated semiconductor testing system
08/13/1996US5546012 Probe card assembly having a ceramic probe card
08/13/1996US5545050 IC socket
08/13/1996US5544617 Method for producing single crystal, and needle-like single crystal
08/08/1996WO1996024069A1 Test device for flat electronic assemblies
08/08/1996DE19603090A1 Programmable amplifier for electronic probe
08/08/1996DE19503329A1 Testvorrichtung für elektronische Flachbaugruppen Testing apparatus for electronic printed circuit boards
08/08/1996DE19503245A1 High frequency load resistor with high isolation from ground
08/07/1996CN2232588Y Convinent and safety multimeter test pencil
08/06/1996US5543726 Open frame gantry probing system
08/06/1996US5543725 Reusable carrier for burn-in/testing on non packaged die
08/06/1996US5543724 Method and apparatus for locating conductive features and testing semiconductor devices
08/06/1996US5543718 Cable testing device
08/06/1996US5543386 Oxide waveguides
08/01/1996DE19501719A1 Measuring shunt with auxiliary current branch and parallel measuring current branch
07/1996
07/30/1996US5541525 Carrier for testing an unpackaged semiconductor die
07/30/1996US5541503 Alternating current sensor based on concentric-pipe geometry and having a transformer for providing separate self-powering
07/24/1996EP0723158A1 Multimeter with an erroneous input prevention mechanism
07/23/1996US5539676 Method of identifying probe position and probing method in prober
07/23/1996US5539324 Universal wafer carrier for wafer level die burn-in
07/23/1996US5539305 Calibration board for an electronic circuit tester
07/18/1996WO1996021852A1 Improved silicon semiconductor wafer test
07/18/1996DE19516327C1 Electrical parameter measuring device for LV switchgear
07/18/1996DE19507959C1 Current measuring device for automobile onboard supply network
07/17/1996EP0722216A2 Split-path linear isolation circuit apparatus and method
07/17/1996CN1126889A Measure tool for nonradiative dielectric waveguide device
07/17/1996CN1126852A Monitoring device secured to power distribution system conductors
07/16/1996US5537288 PTC switch protected termination resistor
07/16/1996US5537108 Method and structure for programming fuses
07/16/1996US5537051 Apparatus for testing integrated circuits
07/16/1996US5537050 Process for inspecting electrodes using rotation alignment correction
07/16/1996US5537031 Integrated circuit test jig
07/10/1996EP0721237A2 Mass termination of signals from electronic systems to devices under test
07/10/1996EP0721209A2 Method of testing semiconductor devices and conductive adhesive thereby used
07/10/1996EP0721109A2 Multiplexing electronic test probe
07/09/1996US5534788 Integrated resistor for sensing electrical parameters
07/09/1996US5534787 High-frequency coaxial interface test fixture
07/09/1996US5534785 Integrated circuit bare chip carrier
07/09/1996US5534784 Method for probing a semiconductor wafer
07/03/1996CN1125898A Interface apparatus for automatic test equipment
07/02/1996US5532657 High speed coaxial contact and signal transmission element
07/02/1996US5532613 Probe needle
07/02/1996US5532611 Miniature probe positioning actuator
07/02/1996US5532610 Apparatus for testing semicondctor wafer
07/02/1996US5532609 Wafer probe station having environment control enclosure
07/02/1996US5532608 Ceramic probe card and method for reducing leakage current
07/02/1996US5531608 IC retainer in IC socket
07/02/1996US5531022 Method of forming a three dimensional high performance interconnection package
06/1996
06/27/1996WO1996019734A1 Method and apparatus for semiconductor die testing
06/27/1996WO1996019713A1 Indicator
06/27/1996DE4439922A1 Circuit board test equipment with replaceable holding-down frame
06/27/1996DE19514902A1 Anzeigeinstrument Gauge
06/26/1996EP0718917A2 Electrical interconnect contact system
06/26/1996EP0718635A2 An electrical metering system having an electrical meter and an external current sensor
06/26/1996EP0718633A1 Current measuring device
06/26/1996EP0614532A4 Capacitive moisture sensor.
06/26/1996CN2230038Y Housing of testing instrument
06/26/1996CN1125323A Open frame gantry probing system
06/25/1996US5530376 Reusable carrier for burn-in/testing of non packaged die
06/25/1996US5530375 Method of testing circuits and/or burning-in chips
06/25/1996US5530374 Method of identifying probe position and probing method in prober
06/25/1996US5530371 Probe card assembly
06/25/1996US5529504 Electrically anisotropic elastomeric structure with mechanical compliance and scrub
06/19/1996EP0716905A2 Method and apparatus for automated docking of a test head to a device handler
06/18/1996US5528160 Spacing frame structure for IC handler
06/18/1996US5528159 Method and apparatus for testing integrated circuit chips
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