Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
09/1993
09/29/1993EP0430950B1 Reference-voltage supply circuit
09/29/1993CN2142972Y Crocodile-clip-like pen-type instrument
09/29/1993CN1076785A Test equipment
09/28/1993US5249143 Coupling radiant energy/electric current transducers to processors
09/28/1993US5248261 Double ended hermaphroditic signal node module
09/22/1993EP0561328A2 Connector assembly
09/22/1993CN1076525A Magnetic induction type electric meter
09/21/1993US5247250 Integrated circuit test socket
09/21/1993US5247249 Bi-level test fixture
09/21/1993US5247246 Testing of integrated circuit devices on loaded printed circuit boards
09/21/1993CA1322388C Electrical test fixture
09/16/1993DE4206012C1 Circuit board testing adaptor assembly system - uses eccentrically weighted motor to vibrate sleeve which supplies test pins for fitting in adaptor bores
09/15/1993EP0560148A1 Clamp-on current measuring probe and method of calibration of this probe
09/15/1993CN1022137C Wireless loss monitoring method for low-voltage circuits
09/14/1993US5245277 Clamp for testing used integrated circuit devices
09/14/1993US5243752 Process of manufacturing an instrumentation apparatus with curable internal magnets
09/08/1993EP0559274A2 Probe apparatus and method for measuring high-frequency signals
09/07/1993US5243275 Input protecting mechanism for measuring device
09/07/1993US5241870 Test head manipulator
09/02/1993WO1993017349A1 Defibrillation discharge current sensor
09/01/1993CN2141569Y Induction static electricity voltage meter
08/1993
08/31/1993US5240429 Chip carrier socket
08/25/1993EP0556868A2 Electrode water circulation and processing system and hooded radiator for water rheostat
08/24/1993US5239261 Probe apparatus for testing electronic circuits immersed in a liquid cryogen
08/24/1993US5239260 Semiconductor probe and alignment system
08/24/1993US5239259 Moving magnet type indicating instrument combined with a counter mechanism
08/18/1993EP0556099A1 Current sensor
08/17/1993US5237493 Current-to-voltage converter with low noise, wide bandwidth and high dynamic range
08/17/1993US5237269 Connections between circuit chips and a temporary carrier for use in burn-in tests
08/17/1993US5237268 Film carrier structure capable of simplifying test
08/17/1993US5237267 Wafer probe station having auxiliary chucks
08/12/1993DE4300562A1 Electromagnetic screening sheet - comprises electrically conductive resin layer on metal foil giving good screening and low wt.
08/11/1993EP0554622A2 Apparatus and method for testing bare dies
08/11/1993EP0515577A4 Making and testing an integrated circuit using high density probe points
08/11/1993CN1075212A Launcher for waveguide system
08/10/1993US5235268 Test and measurement system
08/10/1993US5234359 Terminal device for electrical connection
08/10/1993US5234149 Debondable metallic bonding method
08/05/1993WO1993015540A1 Analogue muliplexer protected against high input overvoltages
08/05/1993WO1993015409A1 Pneumatic test fixture with springless test probes
08/04/1993EP0554143A1 Pivoting electrical actuator, especially for use in vehicle dashboards
08/04/1993EP0553969A1 Coplanar transmission structure having spurious mode suppression
08/03/1993US5233290 Switch probe
07/1993
07/27/1993US5231349 Millimeter-wave active probe system
07/22/1993DE4208067C1 Test plug for electrical series clamps - contains sprung contacting device with spring=loaded arms insertable into clamp
07/21/1993EP0552036A1 A probing apparatus having an automatic probe card installation mechanism and a semiconductor wafer testing system including the same
07/21/1993EP0551564A2 Non-contact test probe
07/20/1993US5228866 Socket for integrated circuit carrier
07/20/1993US5228189 Adapter arrangement for electrically connecting flat wire carriers
07/20/1993CA1320546C Electrical connectors and ic chip tester embodying same
07/15/1993DE4200404A1 Electrical testing arrangement, pref. for circuit boards, - has deflectable laser beam for changing conducting state of semiconducting contact arrangement
07/14/1993EP0551222A1 Indicating instrument having an illuminated pointer
07/13/1993US5227730 Microwave needle dielectric sensors
07/13/1993US5227718 Double-headed spring contact probe assembly
07/13/1993US5227717 Contact assembly for automatic test handler
07/13/1993US5226827 Test connector
07/06/1993US5225796 Coplanar transmission structure having spurious mode suppression
07/06/1993US5225777 High density probe
07/06/1993US5225776 Method and apparatus for probing and sampling an electrical signal
07/06/1993US5225773 Switch probe
07/06/1993US5225771 Making and testing an integrated circuit using high density probe points
07/06/1993US5225769 Defibrillation discharge current sensor
07/06/1993US5225037 Method for fabrication of probe card for testing of semiconductor devices
06/1993
06/30/1993EP0549240A2 Socket
06/30/1993EP0548279A1 Functional at speed test system for integrated circuits on undiced wafers
06/29/1993US5223787 High-speed, low-profile test probe
06/29/1993US5223786 Burn-in device
06/29/1993US5223785 Apparatus for and method of latching and unlatching integrated circuit test sockets
06/24/1993DE4301420A1 Contact arrangement for wafer prober - has silicon base body with silicon tongues carrying metallised silicon contacting elements
06/24/1993DE4141888A1 Adaptor for test and setting up of component assemblies, esp. of complex electronic communications systems - contains additional plug and socket arrangement connected to rear of circuit board
06/23/1993EP0547251A1 A method for testing a micro circuit
06/23/1993CN1073529A Pen-type electronic voltmeter
06/23/1993CN1073527A Multipurpose measurer
06/23/1993CN1021376C Adjustment circuit and method for solid-state electricity meter
06/22/1993US5221895 Probe with microstrip transmission lines
06/22/1993US5221209 Modular pad array interface
06/22/1993US5220956 Multiple device fixture used in conjunction with a standard temperature forcing unit
06/16/1993CN2136481Y External arc-extinguishing protector for direct resistance metering of transformer
06/15/1993US5220481 Composite to enable contact electrostatic voltage sensing
06/15/1993US5220280 Method and an apparatus for testing the assembly of a plurality of electrical components on a substrate
06/15/1993US5220279 Probe apparatus
06/15/1993US5220278 Fixing card for use with high frequency
06/15/1993US5220274 Surface mounted electrical switch and probe structure
06/09/1993EP0545070A1 Membrane probe contact bump compliancy system
06/09/1993CN2135785Y Magnetic steel positioning fixture
06/08/1993US5218293 Passive high-frequency signal probe
06/08/1993US5218290 Multi-function, multi-mode switch for an instrument
06/08/1993US5217383 Plug contact arrangement
06/02/1993EP0543877A1 Method and electrical measuring apparatus for analyzing the impedance of the source of an actual alternating voltage
06/02/1993EP0543808A1 Spring contact field component for wiring/printed circuit board testing device
06/01/1993US5216623 System and method for monitoring and analyzing energy characteristics
06/01/1993US5216361 Modular board test system having wireless receiver
06/01/1993US5216358 Device for testing a printed circuit board
06/01/1993US5215476 Interface connector assembly
06/01/1993US5215472 High density grid array socket
05/1993
05/26/1993EP0543545A2 Composite to enable contact electrostatic voltage sensing
05/26/1993CN2134652Y Special testing gage bar for integrated circuit block
05/25/1993US5214407 High performance current shunt
05/25/1993US5214389 Multi-dimensional high-resolution probe for semiconductor measurements including piezoelectric transducer arrangement for controlling probe position
05/25/1993US5214375 Multi-point probe assembly for testing electronic device
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