| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 09/01/1994 | WO1994019699A1 Method and apparatus for bare die burn-in and test using z-axis electrically conductive material |
| 08/31/1994 | EP0613335A1 Socket apparatus for IC package testing |
| 08/31/1994 | EP0613016A1 Voltage detection apparatus |
| 08/31/1994 | EP0613014A1 Test probe for liquid crystal display panel |
| 08/31/1994 | EP0613013A1 Self leveling membrane test probe |
| 08/30/1994 | US5342807 Soft bond for semiconductor dies |
| 08/30/1994 | US5342206 Socket for direct electrical connection to an integrated circuit chip |
| 08/24/1994 | EP0612081A1 Resistive current measuring elements and connection- and measure modules |
| 08/24/1994 | CN1091213A Arrangement of circuit for processing of analogous current and voltage signals |
| 08/23/1994 | CA1331575C Electroforming emp shielding elements |
| 08/18/1994 | DE4304105A1 Test card system for testing integrated circuits with interchangeable pin wheel and optional interchangeable wiring/electronics |
| 08/16/1994 | US5339066 Energy-measuring resistor bank |
| 08/16/1994 | US5339027 Rigid-flex circuits with raised features as IC test probes |
| 08/16/1994 | US5338223 Hybrid wafer probe |
| 08/16/1994 | US5338208 High density electronic connector and method of assembly |
| 08/09/1994 | US5336992 On-wafer integrated circuit electrical testing |
| 08/09/1994 | US5336990 Electrical test shunt having dual contact point mating terminals |
| 08/09/1994 | US5336649 Removable adhesives for attachment of semiconductor dies |
| 08/04/1994 | DE4302452A1 Measurement amplifying system with negative feedback HF input amplifier |
| 08/03/1994 | EP0354958B1 Apparatus for measuring data of living body |
| 08/02/1994 | US5334931 Molded test probe assembly |
| 08/02/1994 | US5334043 Test fixture for electronic components |
| 07/28/1994 | DE4401469A1 Testmodule mit expandierbarem Diaphragma und Steckverbinder Test modules with expandable diaphragm and Connectors |
| 07/27/1994 | EP0607465A1 Clip-on current probe with improved operating means |
| 07/26/1994 | US5332963 High input impedance buffer with low feedback resistance |
| 07/21/1994 | WO1994015816A1 Junction box having integrally formed shunt |
| 07/20/1994 | CN2172474Y Changing old watt-hour meter into 4 times overload long-service one |
| 07/19/1994 | US5331275 Probing device and system for testing an integrated circuit |
| 07/19/1994 | US5331273 Thermal fixture for testing an integrated circuit |
| 07/19/1994 | US5330919 Method for electrically testing a semiconductor die using a test apparatus having an independent conductive plane |
| 07/14/1994 | DE4342654A1 Ausrichtsystem für eine Prüfvorrichtung Alignment system for a test device |
| 07/13/1994 | EP0605812A1 Microwave monolithic integrated circuit testing |
| 07/12/1994 | US5329227 Test socket assembly for testing LCC packages of both rectangular and square configuration |
| 07/12/1994 | US5329226 Probe card for testing integrated circuit chips |
| 07/07/1994 | WO1994015220A1 Integrated circuit test jig |
| 07/06/1994 | EP0604721A2 Magneto-optic probe |
| 07/05/1994 | US5326428 Method for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability |
| 06/29/1994 | CN2170524Y Multifunctional energy-saving single-phase watt-hour meter |
| 06/29/1994 | CN1025243C Eddy current meter |
| 06/28/1994 | US5325052 Probe apparatus |
| 06/23/1994 | DE4243637A1 Component handling device for automatic testing system |
| 06/21/1994 | US5323115 Electrostatic voltmeter producing a low voltage output |
| 06/21/1994 | US5323107 Active probe card |
| 06/21/1994 | US5323106 Device for testing semiconductor devices |
| 06/21/1994 | US5323105 Test template for monitoring the pins of a multi-pin chip cirucit package |
| 06/21/1994 | US5323035 Interconnection structure for integrated circuits and method for making same |
| 06/21/1994 | US5322446 For use with IC devices |
| 06/15/1994 | CA2111187A1 Microwave monolithic integrated circuit testing |
| 06/14/1994 | US5321453 Probe apparatus for probing an object held above the probe card |
| 06/14/1994 | US5321352 Probe apparatus and method of alignment for the same |
| 06/14/1994 | US5321351 Test fixture alignment system |
| 06/14/1994 | US5320559 Connector for leadless IC package |
| 06/14/1994 | US5320551 For receiving an electrical part |
| 06/09/1994 | WO1994012887A1 Die carrier and test socket for leadless semiconductor die |
| 06/08/1994 | EP0600604A1 Apparatus and process for bare chip test and burn-in |
| 06/07/1994 | US5318179 Package for microelectric wire test boards |
| 06/01/1994 | EP0599544A1 Capacitive electrode system for detecting open solder joints in printed circuit assemblies |
| 06/01/1994 | EP0448591B1 Electrical testing probe |
| 06/01/1994 | CN2167372Y Electricity measuring meter pen |
| 05/31/1994 | US5317256 High-speed, high-impedance external photoconductive-type sampling probe/pulser |
| 05/31/1994 | US5317255 Electric inspection unit using anisotropically electroconductive sheet |
| 05/31/1994 | US5317250 Modular electronic meter having reduced width |
| 05/26/1994 | WO1994011743A1 Printed circuit board testing device with foil adapter |
| 05/26/1994 | WO1994011707A1 Circuitry for processing analogical current and voltage signals |
| 05/26/1994 | DE4239378A1 Mechanical construction and mfr. of inscribed scales and dials - involve control of flat bed plotter by special CAD program directing movements of standard pen over entire layout |
| 05/25/1994 | CN2166449Y Energy-saving anti-overflow electric meter |
| 05/25/1994 | CN2166448Y Multi-function protector for electric meter |
| 05/24/1994 | US5315481 Packaging construction for semiconductor wafers |
| 05/24/1994 | US5315239 Circuit module connections |
| 05/24/1994 | US5315238 Testing apparatus having an air permeable interface panel spaced from a test head |
| 05/24/1994 | US5315237 Touch sensor unit of prober for testing electric circuit and electric circuit testing apparatus using the touch sensor unit |
| 05/24/1994 | US5314342 Universal probe adapter |
| 05/17/1994 | US5313157 Probe for jesting an electrical circuit chip |
| 05/11/1994 | EP0596773A1 Appliance for in-situ broadband hyperfrequency tests |
| 05/11/1994 | EP0431034B1 Circuit testing |
| 05/11/1994 | DE4237591A1 Leiterplatten-Prüfeinrichtung mit Folienadapter PCB tester with transparency adapters |
| 05/10/1994 | US5311120 Test fixture with test function feature |
| 05/10/1994 | US5311119 Probe contact through small amplitude vibration for bed of nails testing |
| 05/10/1994 | US5309978 Multiple device fixture used in conjunction with a standard temperature forcing unit |
| 05/03/1994 | US5309088 Measurement of semiconductor parameters at cryogenic temperatures using a spring contact probe |
| 05/03/1994 | US5308443 Microprobe provided circuit substrate and method for producing the same |
| 05/03/1994 | US5308256 Socket |
| 05/03/1994 | US5308250 Pressure contact for connecting a coaxial shield to a microstrip ground plane |
| 05/03/1994 | US5307561 Method for making 3-D electrical circuitry |
| 05/03/1994 | US5307560 Automated test pin loading method |
| 04/28/1994 | WO1994009513A1 Interconnection structure for integrated circuits and method for making same |
| 04/28/1994 | WO1994009374A1 Probe unit and method of manufacturing the same |
| 04/28/1994 | DE4313816A1 Electronic circuit board handler, esp. for production lines, - contains transport mechanism passing boards through frame contg. testing appts. with contact and restraining devices |
| 04/27/1994 | EP0593966A1 Three dimensional high performance interconnection package |
| 04/26/1994 | US5307012 Test substation for testing semi-conductor packages |
| 04/26/1994 | US5307006 Optical voltage reference |
| 04/26/1994 | US5306948 Semiconductor device and semiconductor module having auxiliary high power supplying terminals |
| 04/26/1994 | US5306167 IC socket |
| 04/21/1994 | DE4234837A1 Testing system for flat electrical assemblies and/or PCB(s) - mounted on or removed from testing adaptor by means of gripping unit raised or lowered by drive unit |
| 04/20/1994 | EP0592878A2 Method and device for inspecting probe cards for testing integrated circuits |
| 04/19/1994 | US5305244 Hands-free, user-supported portable computer |
| 04/19/1994 | US5304922 Electrical circuit with resilient gasket support for raised connection features |
| 04/19/1994 | US5304921 Enhanced grounding system for short-wire lengthed fixture |
| 04/14/1994 | WO1994008364A1 Socket for multi-lead integrated circuit packages |
| 04/14/1994 | WO1994008247A1 Capacitive moisture sensor |