Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
12/1995
12/12/1995US5475318 Microprobe
12/12/1995US5475317 Singulated bare die tester and method of performing forced temperature electrical tests and burn-in
12/12/1995US5475259 Semiconductor device and carrier for carrying semiconductor device
12/12/1995CA2020671C Separable connector access port and fittings
12/07/1995DE4419200A1 Testprobe for monitoring condition of 3 pole lighting circuit
12/07/1995DE19519454A1 Component transporter for integrated circuit tester
12/07/1995DE19517373A1 Voltage generating circuit for testing large scale integrated circuit
12/06/1995EP0685745A2 Apparatus for measuring the amount of electric charge induced in conductive part and method of measuring electric charge
12/06/1995EP0685742A1 High speed coaxial contact and signal transmission element
12/06/1995CN1030478C Low impedance, high voltage protection circuit
12/05/1995US5473258 Probe apparatus for carrying away dust created by probe testing
12/05/1995US5473244 Apparatus for measuring voltages and currents using non-contacting sensors
11/1995
11/30/1995WO1995032432A1 Process and system for testing the correct position of printed circuit boards having contact islands and conductor paths in a testing device
11/30/1995DE4418679A1 Integrated circuit interconnect system for wafer test
11/30/1995DE4416755A1 Production line circuit board tester station
11/29/1995CN1112683A Clamp for detecting characteristic of semiconductor and manufacture and application of same
11/28/1995US5471148 Probe card changer system and method
11/28/1995US5470247 Burn-in socket apparatus
11/23/1995WO1995031701A1 Measurement device based on a strain gauge, use thereof and modulation amplifier for such measurement devices
11/23/1995DE4417811A1 Testing electronic circuit boards
11/23/1995DE4417228A1 Dehnungsmeßstreifen-Meßanordnung, Verwendung derselben und Modulationsverstärker für derartige Meßanordnungen Strain-measuring device, using the same modulation and amplifier for such measurement arrangements
11/21/1995US5469074 Chip socket testing apparatus with adjustable contact force
11/21/1995US5469073 Method and apparatus for ultrasonically energizing pin seating in test fixture devices
11/21/1995US5469072 Integrated circuit test system
11/21/1995US5469064 Electrical assembly testing using robotic positioning of probes
11/21/1995US5468655 Method for forming a temporary attachment between a semiconductor die and a substrate using a metal paste comprising spherical modules
11/21/1995US5468158 Non-destructive interconnect system for semiconductor devices
11/21/1995US5468157 Non-destructive interconnect system for semiconductor devices
11/16/1995WO1995031008A1 Lead frame including an inductor or other such magnetic component
11/16/1995DE4421915A1 Metal encapsulated fixed choke device
11/16/1995DE4416148A1 Electronic circuit board contacting and testing appts.
11/15/1995EP0682260A2 Contacting system for electrical circuits
11/15/1995EP0682259A1 Circuit-test fixture that includes shorted-together probes
11/14/1995US5467020 Testing fixture and method for circuit traces on a flexible substrate
11/08/1995EP0681186A2 Method for probing a semiconductor wafer
11/08/1995CN2212203Y Electric test pen
11/08/1995CN1111357A Printed circuit board test fixture and method
11/07/1995US5465065 Coupled to a transmitting device
11/07/1995CA2048118C Indicating instruments
11/02/1995WO1995029553A1 Self-powered powerline sensor
11/02/1995WO1995029407A1 Device for displaying the voltage of a conductor of a high-voltage power supply system
11/02/1995WO1995029406A1 Test system for equipped and unequipped printed circuit boards
11/02/1995EP0679128A1 Junction box having integrally formed shunt
11/02/1995DE4414770A1 Testsystem für bestückte und unbestückte Leiterplatten Test system for loaded and bare boards
11/02/1995CA2188273A1 Test system for equipped and unequipped printed circuit boards
10/1995
10/31/1995US5463325 Apparatus for measuring characteristics of electronic parts
10/31/1995US5463324 Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like
10/31/1995US5463313 Reduced magnetic field line integral current sensor
10/31/1995US5462446 Socket apparatus
10/26/1995DE4414361A1 Electrical circuit-board and associated test device
10/26/1995DE4413697A1 Vorrichtung zur Anzeige der Spannung eines Leiters eines Hochspannungsenergieversorgungssystems A device for displaying the voltage of a conductor of a high voltage power supply system
10/25/1995EP0678749A2 High frequency switch and method of testing H-F apparatus
10/24/1995US5461327 Probe apparatus
10/24/1995US5461326 Self leveling and self tensioning membrane test probe
10/24/1995US5461325 Probe clamp assembly
10/24/1995US5461324 Split-fixture configuration and method for testing circuit traces on a flexible substrate
10/24/1995US5461307 Electro-optical current sensing system and method for sensing and avoiding thermally induced measurement error therein
10/24/1995US5460538 Socket
10/24/1995CA2027135C Electrical contact mechanism for ultrasonic transducers on fasteners
10/19/1995WO1995027905A1 Cable testing device
10/18/1995EP0677745A1 Probe card assembly
10/17/1995US5459408 Measurement of semiconductor parameters at cryogenic temperatures using a spring contact probe to form a MIS device
10/17/1995US5459407 Apparatus and method of correcting loss of test contact continuity
10/17/1995US5459394 Electro-optic measurement device for the measurement of an electric signal in an electronic component
10/17/1995US5458967 Laminated metal foil and a conductive hot melt resin in which is dispersed vapor phase grown carbon fibers
10/17/1995US5457882 Method of making conductive molded tip head assembly
10/12/1995DE4411954A1 Connector for coupling test and measuring devices to main distributor
10/11/1995EP0676823A1 Air cooled power load and fictive antenna
10/11/1995EP0676644A1 Tweezer probe and arm therefor
10/11/1995EP0664925A4 Interconnection structure for integrated circuits and method for making same.
10/10/1995US5457441 Inductive amplifier having two-terminal auto-on function
10/10/1995US5457399 Microwave monolithic integrated circuit fabrication, test method and test probes
10/10/1995US5457398 Wafer probe station having full guarding
10/10/1995US5457392 Testing clip and circuit board contacting method
10/10/1995US5457380 Circuit-test fixture that includes shorted-together probes
10/10/1995US5457344 Test fixtures for C4 solder-bump technology
10/10/1995US5456404 Method of testing semiconductor chips with reusable test package
10/10/1995US5456018 Alignment system for planar electronic devices arranged in parallel fashion
10/09/1995CA2146199A1 Air-cooled power load
10/04/1995EP0675366A2 Probe system and probe method
10/04/1995EP0674768A1 Die carrier and test socket for leadless semiconductor die
10/03/1995US5455518 Test apparatus for integrated circuit die
10/03/1995US5455502 High speed, large-current power control circuit
09/1995
09/27/1995EP0674474A1 IC package connector
09/27/1995EP0538432B1 Device for producing an electric circuit, especially for a measuring probe, and a measuring probe
09/26/1995US5453702 Automatic probe fixture loading apparatus with gimballing compensation
09/26/1995US5453701 Bare die test and burn-in device
09/26/1995US5453700 Test clip contact arrangement
09/26/1995US5453681 Current sensor employing a mutually inductive current sensing scheme
09/26/1995US5453404 Method for making an interconnection structure for integrated circuits
09/20/1995EP0673143A2 Method and device for connecting a subscriber set to a telephone line monitoring apparatus in a telecommunication jack box
09/20/1995EP0588983B1 A protection case for remote controls
09/20/1995CN1108808A Method for recovering bare semiconductor chips from plastic packaged moduler
09/19/1995US5451883 Spring probe contactor with device stop for testing PGA devices and method therefor
09/19/1995US5451865 Method and apparatus for sensing an input current with a bridge circuit
09/19/1995US5451863 Fiber optic probe with a magneto-optic film on an end surface for detecting a current in an integrated circuit
09/19/1995US5451489 Multilayer element wafers with photoresist layers treated with light
09/19/1995US5451165 Temporary package for bare die test and burn-in
09/19/1995US5450766 Test head manipulator
09/19/1995CA2037823C Inspection probe having thin metal wires with self resiliency
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