| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 06/10/1997 | US5637990 For controlling supply of electrical power to a load |
| 06/10/1997 | US5637923 Semiconductor device, carrier for carrying semiconductor device |
| 06/10/1997 | US5637012 Adapter for a test system for circuit boards |
| 06/10/1997 | US5636781 Apparatus and method for removing known good die using hot shear process |
| 06/05/1997 | WO1997020339A1 Socket for a tape carrier package |
| 06/05/1997 | WO1997020223A1 Device for carrying out measurements on communication lines |
| 06/05/1997 | DE19648949A1 Test card for integrated circuits measuring low current levels |
| 06/05/1997 | DE19648475A1 Micro-contact pin structure for IC test card |
| 06/04/1997 | EP0662258B1 Socket for multi-lead integrated circuit packages |
| 06/03/1997 | US5635849 Miniature probe positioning actuator |
| 06/03/1997 | US5635848 Method and system for controlling high-speed probe actuators |
| 06/03/1997 | US5635847 Apparatus for testing circuits and/or burning-in chips |
| 06/03/1997 | US5635846 Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer |
| 06/03/1997 | US5635832 IC carrier for use with an IC handler |
| 06/03/1997 | US5635780 Instrument holder and method for inspection of a dynamo-electric machine in a gap between a stator and a rotor and dynamo-electric machine having the instrument holder |
| 06/03/1997 | US5634828 Capacitive pickup clip |
| 06/03/1997 | US5634801 Electrical interconnect contact system |
| 06/03/1997 | US5634267 Method and apparatus for manufacturing known good semiconductor die |
| 05/28/1997 | EP0775914A2 Optical voltage sensor, group of optical parts and method of manufacturing same |
| 05/28/1997 | EP0775318A1 Capacitive open-circuit test employing an improved threshold determination |
| 05/28/1997 | CN1150843A Method of cleaning probe tips of probe cards and apparatus for impelementing method |
| 05/27/1997 | US5633598 For testing a printed circuit board |
| 05/27/1997 | US5633597 Micro interface technology system utilizing slide engagement mechanism |
| 05/27/1997 | US5633596 Fixtureless automatic test equipment and a method for registration for use therewith |
| 05/27/1997 | US5633455 Method of detecting particles of semiconductor wafers |
| 05/27/1997 | US5633122 Pattern of contact pads |
| 05/27/1997 | US5632631 Microelectronic contacts with asperities and methods of making same |
| 05/21/1997 | EP0702797B1 Integrated circuit probing apparatus including a capacitor bypass structure |
| 05/20/1997 | US5631856 Test sequence optimization process for a circuit tester |
| 05/20/1997 | US5631585 For an alternating analog output signal from a sensor |
| 05/20/1997 | US5631574 Contact probe unit |
| 05/20/1997 | US5631573 Probe-type test handler |
| 05/20/1997 | US5631571 Infrared receiver wafer level probe testing |
| 05/20/1997 | US5630947 Cycles of depositing metal layers, masking and etching them, then depositing dielectric layer and etching it, forming recesses and filling them with solder, depositing hard conductors on solder, etching them to form tip heads |
| 05/15/1997 | WO1997017822A1 Method for producing contact pads on pattern boards and adapter board for testing pattern boards |
| 05/14/1997 | EP0773445A2 Inspection apparatus of conductive patterns |
| 05/14/1997 | EP0772784A1 A method and a system for moving a measuring means above a test object |
| 05/13/1997 | US5629632 System for testing electric properties of an object |
| 05/13/1997 | US5629631 Interface card for a probe card assembly |
| 05/13/1997 | US5629630 Semiconductor wafer contact system and method for contacting a semiconductor wafer |
| 05/13/1997 | US5629617 Multiplexing electronic test probe |
| 05/13/1997 | US5629615 Oscilloscope casing structure |
| 05/13/1997 | US5629137 Method of repairing an integrated circuit structure |
| 05/13/1997 | US5628634 Rotary probe, printed circuit board on which the rotary probe is mounted, and connecting device incorporating the rotary probe |
| 05/09/1997 | WO1997016874A1 Socket for measuring ball grid array semiconductor |
| 05/09/1997 | WO1997016849A1 Ball grid array integrated circuit socket |
| 05/09/1997 | WO1997016737A1 Membrane for holding a probe tip in proper location |
| 05/07/1997 | EP0772049A2 Method for fabrication of probe |
| 05/07/1997 | EP0772048A1 Test means for printed circuits and/or flat assemblies |
| 05/07/1997 | EP0772046A2 Magnetic field probe and current and/or energy probe |
| 05/07/1997 | DE19541287A1 Probe-terminated spring contact pin for end of wire or cable e.g.for testing electronic components |
| 05/07/1997 | DE19541244A1 Test system for testing electrical connection of unencumbered of structural elements |
| 05/07/1997 | CN1149167A Liquid crystal display panel inspection device and method for manufacturing same |
| 05/06/1997 | US5626971 Thin film probe |
| 05/01/1997 | WO1997015836A1 Temporary connection of semiconductor die using optical alignment techniques |
| 04/30/1997 | CN1148889A Measurement device based on a strain gauge, use thereof and modulation amplifier for such measurement devices |
| 04/29/1997 | US5625299 Multiple lead analog voltage probe with high signal integrity over a wide band width |
| 04/29/1997 | US5625298 Semi-conductor chip test probe |
| 04/29/1997 | US5625297 Testing device for testing electrical or electronic test specimens |
| 04/29/1997 | US5625292 System for measuring the integrity of an electrical contact |
| 04/29/1997 | US5625286 Digital multimeter having an improved design against mechanical shock |
| 04/29/1997 | US5625177 High frequency switch and method of testing H-F apparatus |
| 04/24/1997 | DE19538792A1 Kontaktsonden-Anordnung zum elektrischen Verbinden einer Prüfeinrichtung mit den kreisförmigen Anschlußflächen eines Prüflings Contact probe arrangement for electrically connecting a testing device with the circular contact pads of a device under test |
| 04/24/1997 | DE19517373C2 Spannungserzeugungs-Schaltung zum Testen integrierter Schaltungen Voltage generating circuit for testing integrated circuits |
| 04/22/1997 | US5623214 Multiport membrane probe for full-wafer testing |
| 04/22/1997 | US5623213 Membrane probing of circuits |
| 04/17/1997 | DE19535733C1 Prüfadapter Test Fixtures |
| 04/16/1997 | EP0768534A1 Method for fabrication of probe structure and circuit substrate therefor |
| 04/16/1997 | CN2252341Y Magnetic regulating type meter core support |
| 04/15/1997 | US5621521 Checking apparatus for array electrode substrate |
| 04/15/1997 | US5621333 For use in testing an electronic device |
| 04/15/1997 | US5621329 Automatic self-calibration system for digital teraohmmeter |
| 04/15/1997 | US5621311 Digital multimeter having an improved enclosure |
| 04/10/1997 | WO1997013301A1 Test socket for leadless ic device |
| 04/10/1997 | WO1997013154A1 Crossed coil gauge with active flux ring |
| 04/10/1997 | CA2233895A1 Miniature crossed-coil gauge having an active flux ring |
| 04/09/1997 | EP0766829A2 Method of cleaning probe tips of probe cards and apparatus for implementing the method |
| 04/08/1997 | US5619129 Multimeter having an erroneous input prevention mechanism |
| 04/08/1997 | US5617945 Device transfer mechanism for IC test handler |
| 04/03/1997 | WO1997012250A1 Test adapter |
| 04/03/1997 | WO1997012206A1 Electro-optic interface for field instrument |
| 04/01/1997 | US5615824 Method of making an electrical connection |
| 03/27/1997 | WO1997011379A1 Esd protection for grid type test fixtures |
| 03/27/1997 | WO1997011378A1 Machine for the control of printed circuits |
| 03/27/1997 | WO1997011377A1 Machine for the opposite control of printed circuits |
| 03/27/1997 | CA2231865A1 Machine for the opposite control of printed circuits |
| 03/26/1997 | EP0764352A1 Microelectronic contacts and assemblies |
| 03/26/1997 | CN2250524Y Self protective and limited electric meter |
| 03/25/1997 | US5614835 Method and apparatus for handling a packaged integrated circuit device for testing |
| 03/25/1997 | US5614819 Multi-station machine and press assembly for electrically testing a printed circuit board having manual and automatic operating modes |
| 03/25/1997 | US5613861 Photolithographically patterned spring contact |
| 03/20/1997 | WO1997010514A1 Near-field resistivity microscope |
| 03/20/1997 | WO1996038858A3 Method and probe card for testing semiconductor devices |
| 03/20/1997 | DE19638402A1 Test component for semiconductor chip in multi-contact integrated circuit |
| 03/18/1997 | US5612620 Inductive pickup sensor with enhanced cross-talk immunity |
| 03/18/1997 | US5611705 Mounting apparatus for ball grid array device |
| 03/13/1997 | WO1997009740A1 Process and device for testing a chip |
| 03/13/1997 | DE19600994A1 Verfahren und Vorrichtung zum Testen eines Chips A method and apparatus for testing a chip |
| 03/12/1997 | EP0760936A1 Strain gauge sensor and modulation amplifier for bridge circuits |
| 03/11/1997 | US5610529 Probe station having conductive coating added to thermal chuck insulator |