| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 02/14/1995 | US5388998 Method and system for producing electrically interconnected circuits |
| 02/14/1995 | US5388996 Electrical interconnect contact system |
| 02/09/1995 | WO1995004447A1 Buckling beam test probe with elastomer encapsulated probe wires |
| 02/08/1995 | EP0637752A2 Socket apparatus |
| 02/07/1995 | US5387872 Positioning aid for a hand-held electrical test probe |
| 02/07/1995 | US5387861 Programmable low profile universally selectable burn-in board assembly |
| 02/01/1995 | EP0636892A2 Electrostatic voltmeter |
| 02/01/1995 | EP0636887A1 Probe for capacitive open-circuit tests |
| 02/01/1995 | CN2188773Y Instrument panel with protecting film for improving fixed hole shape |
| 01/31/1995 | US5386197 Slidable adapter for simultaneous connection of a plurality of contacts of a backboard test module to conductors of a backboard |
| 01/31/1995 | US5385477 Contactor with elastomer encapsulated probes |
| 01/26/1995 | WO1995002830A1 Test card for integrated circuits whose age may be objectively determined |
| 01/26/1995 | WO1995002829A1 Adapter with solid body |
| 01/25/1995 | EP0635723A1 Buckling beam test probe assembly |
| 01/24/1995 | US5384638 Sampling-type optical voltage detector utilizing movement of interference fringe |
| 01/24/1995 | US5384532 Bipolar test probe |
| 01/19/1995 | WO1995002196A1 Reusable die carrier for burn-in and burn-in process |
| 01/19/1995 | DE4319643C1 Device for testing and/or measuring electrical quantities |
| 01/18/1995 | CN2187794Y Pointer type electric meter case |
| 01/17/1995 | US5382898 High density probe card for testing electrical circuits |
| 01/11/1995 | EP0633475A2 Interface for electric devices |
| 01/05/1995 | WO1995000857A1 Optical scan and alignment of devices under test |
| 01/05/1995 | WO1995000856A1 Measurement amplifier |
| 01/04/1995 | EP0632281A2 Bare die testing |
| 01/03/1995 | US5379176 Protective input circuit for an instrument |
| 01/03/1995 | US5378982 Test probe for panel having an overlying protective member adjacent panel contacts |
| 01/03/1995 | US5378977 Device for making current measurements used in determining the charging of a vehicle storage battery |
| 01/03/1995 | US5378971 Gold-copper alloy |
| 01/03/1995 | CA2127234A1 Bare die testing |
| 12/27/1994 | US5376010 Burn-in socket |
| 12/22/1994 | WO1994029816A1 Integrated circuit probe card inspection system |
| 12/22/1994 | WO1994029732A1 Integrated circuit probing apparatus including a capacitor bypass structure |
| 12/21/1994 | CN1096587A Testing apparatus |
| 12/20/1994 | US5374888 Electrical characteristics measurement method and measurement apparatus therefor |
| 12/15/1994 | DE4318986A1 Multi-contact adaptor for measurement and control stations |
| 12/14/1994 | EP0629036A2 Device for supplying a voltage to an electronic circuit, in particular to an electronic circuit associated to a current sensor placed on an electric line |
| 12/14/1994 | EP0628826A1 High current measurement shunt with a resister mounted on a metallic isolated substrate |
| 12/14/1994 | CN2185438Y Dual-purpose instrument pen of hook-and direct-touch |
| 12/13/1994 | US5373231 For use in testing a circuit |
| 12/13/1994 | US5373230 Test clip for five pitch IC |
| 12/06/1994 | US5371654 Three dimensional high performance interconnection package |
| 11/29/1994 | US5369358 Method of ensuring electrical contact between test probes and chip pads through the use of vibration and nondestructive deformation |
| 11/23/1994 | EP0625709A1 Probe for electrical measuring instrument, in particular a voltage tester |
| 11/23/1994 | EP0625701A1 Force detector using piezoresistive elements |
| 11/23/1994 | CN2183568Y Electric meter preventing fraudulent use of electricity |
| 11/23/1994 | CN2183566Y Test-control indicating meter |
| 11/23/1994 | CN1095483A Microwave probe for coplanar integrated circuit chip |
| 11/22/1994 | US5367254 Test probe assembly using buckling wire probes within tubes having opposed overlapping slots |
| 11/22/1994 | US5367253 Clamped carrier for testing of semiconductor dies |
| 11/22/1994 | US5367252 Test fixture for electronic circuit boards |
| 11/22/1994 | US5367251 Tool for grasping and piercing insulated electrical cable for determining whether conductor of cable is energized |
| 11/17/1994 | EP0624801A1 Inspection apparatus, inspection method and semiconductor device |
| 11/17/1994 | DE4316111A1 Integrated circuit test board suitable for high-temperature measurements |
| 11/15/1994 | US5364472 Probemat cleaning system using CO2 pellets |
| 11/09/1994 | EP0623984A1 Coupling circuit for a measuring instrument |
| 11/09/1994 | EP0623826A1 Membrane connector with stretch induced micro scrub |
| 11/08/1994 | US5363038 Method and apparatus for testing an unpopulated chip carrier using a module test card |
| 11/03/1994 | DE4314127A1 System to simulate a real electrical consumer, and device as part of this system |
| 11/02/1994 | EP0622982A1 Improved burn-in socket apparatus |
| 11/02/1994 | EP0622981A1 Wiring board for electrical tests and method of manufacturing the same |
| 11/02/1994 | EP0589935B1 Inspection of a dynamo-electric machine in a gap between stator and rotor |
| 11/01/1994 | US5360973 Millimeter wave beam deflector |
| 11/01/1994 | US5360348 Integrated circuit device test socket |
| 10/27/1994 | WO1994024575A1 Electrooptic instrument |
| 10/27/1994 | DE4312810A1 Device for connecting electronic printed circuit boards |
| 10/26/1994 | EP0621486A1 Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same |
| 10/26/1994 | EP0621485A2 Double-headed spring contact probe |
| 10/26/1994 | EP0621484A1 Method and apparatus for coupling a semiconductor device with a tester |
| 10/26/1994 | EP0621483A1 Test connector for series terminal |
| 10/26/1994 | CN2181000Y Double-pointer overlapping electricity meter |
| 10/26/1994 | CN1026357C Test device for electric circuits on boards |
| 10/25/1994 | US5357671 Device for loading an adapter for a device for testing printed circuit boards |
| 10/19/1994 | EP0470118B1 Testing device for testing electrical or electronic test specimens |
| 10/19/1994 | CN1093809A Wave generator |
| 10/18/1994 | US5357194 Testing bed and apparatus including same for testing printed circuit boards and other like articles |
| 10/18/1994 | US5357192 Method of contacting a semiconductor die with probes |
| 10/18/1994 | CA2014681C Electrooptic apparatus for the measurement of ultrashort electrical signals |
| 10/11/1994 | US5355105 Multi-layer flexible printed circuit and method of making same |
| 10/11/1994 | US5355080 Multi-point probe assembly for testing electronic device |
| 10/11/1994 | US5355079 Probe assembly for testing integrated circuit devices |
| 10/11/1994 | US5354205 Electrical connections with shaped contacts |
| 09/29/1994 | DE4313962C1 Device for the automatic testing of LSI modules |
| 09/28/1994 | EP0471830B1 Electrical connector for test rig |
| 09/27/1994 | US5351002 Test probe |
| 09/27/1994 | US5351001 Microwave component test method and apparatus |
| 09/27/1994 | CA1332189C Method and apparatus for low power offset correction of amplified sensor signals |
| 09/21/1994 | EP0616394A1 Method and system for producing electrically interconnected circuits |
| 09/21/1994 | EP0616225A2 Electro-optic probe |
| 09/21/1994 | EP0616223A1 A testing contactor for small-size semiconductor devices |
| 09/20/1994 | US5349543 Constant force probe |
| 09/20/1994 | US5349289 Clamp-on multimeter having a display for indicating the results of a plurality of measurements |
| 09/20/1994 | US5349288 Radial planar current detection device having an extended frequency range of response |
| 09/20/1994 | US5348164 Method and apparatus for testing integrated circuits |
| 09/14/1994 | EP0615131A1 Prober for semiconductor integrated circuit element wafer |
| 09/14/1994 | EP0614532A1 Capacitive moisture sensor |
| 09/14/1994 | CN2177243Y Movable iron plate needle frame device for metre |
| 09/13/1994 | US5347226 Array spreading resistance probe (ASRP) method for profile extraction from semiconductor chips of cellular construction |
| 09/13/1994 | US5347215 Semiconductor chip test jig |
| 09/08/1994 | DE4406674A1 Method for testing an electrode plate to be tested |
| 09/06/1994 | US5345170 Wafer probe station having integrated guarding, Kelvin connection and shielding systems |