| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 03/11/1997 | US5610512 Clamp-on electrical measuring device |
| 03/11/1997 | US5610506 Voltage reference circuit |
| 03/11/1997 | US5610081 Integrated circuit module fixing method for temperature cycling test |
| 03/11/1997 | US5609489 Socket for contacting an electronic circuit during testing |
| 03/05/1997 | EP0760104A1 Process and system for testing the correct position of printed circuit boards having contact islands and conductor paths in a testing device |
| 03/04/1997 | US5608334 Device testing system with cable pivot and method of installation |
| 03/04/1997 | US5607818 Method for making interconnects and semiconductor structures using electrophoretic photoresist deposition |
| 02/27/1997 | WO1997007410A1 Bare chip carrier, burn-in device using the same, and bare chip burn-in method |
| 02/27/1997 | WO1997007407A1 Probe card having vertical type needles and the method thereof |
| 02/26/1997 | EP0759174A1 Adapter system for component boards, for use in a test device |
| 02/25/1997 | US5606481 Overvoltage protection for battery powered equipment |
| 02/25/1997 | US5606263 Probe method for measuring part to be measured by use thereof and electrical circuit member |
| 02/25/1997 | US5606262 Manipulator for automatic test equipment test head |
| 02/25/1997 | US5606250 Measurement device with common mode current cancellation |
| 02/25/1997 | US5605464 IC package connector |
| 02/20/1997 | WO1997006444A1 Semiconductor wafer test and burn-in |
| 02/19/1997 | EP0758807A2 Surface mating electrical connector |
| 02/19/1997 | EP0758454A1 Test system for equipped and unequipped printed circuit boards |
| 02/19/1997 | EP0708926B1 Adapter with solid body |
| 02/18/1997 | US5604446 Probe apparatus |
| 02/18/1997 | US5604445 Apparatus, and corresponding method, for stress testing semiconductor chips |
| 02/18/1997 | US5604444 Wafer probe station having environment control enclosure |
| 02/18/1997 | US5603619 Scalable test interface port |
| 02/12/1997 | EP0757870A1 Self-powered powerline sensor |
| 02/12/1997 | CN2247342Y Movement for step digital electronic instrument and meter |
| 02/12/1997 | CN1142613A Test section for use in IC handler |
| 02/11/1997 | US5602491 Integrated circuit testing board having constrained thermal expansion characteristics |
| 02/11/1997 | US5602490 Connector for automatic test equipment |
| 02/11/1997 | US5602483 Active trim method and apparatus |
| 02/11/1997 | US5601740 Method and apparatus for wirebonding, for severing bond wires, and for forming balls on the ends of bond wires |
| 02/11/1997 | US5600883 Method of tip formation for spring probe with piloted and headed contact |
| 02/06/1997 | WO1997004373A1 A voltage reference arrangement, a voltameter, a battery voltage detection arrangement, and a wireless communication device |
| 02/06/1997 | WO1997004324A1 Prober and tester with compact interface for integrated circuits-containing wafer held docked in a vertical plane |
| 02/05/1997 | EP0757413A2 Adapter with a carrier having a connection apparatus |
| 02/05/1997 | EP0756710A1 Device for displaying the voltage of a conductor of a high-voltage power supply system |
| 02/04/1997 | US5600289 Measuring jig used for evaluation of a device with a nonradiative dielectric waveguide |
| 02/04/1997 | US5600278 Programmable instrumentation amplifier |
| 02/04/1997 | US5600259 Method and apparatus for reducing interference in a pin array |
| 02/04/1997 | US5600258 Method and apparatus for automated docking of a test head to a device handler |
| 02/04/1997 | US5600257 Semiconductor wafer test and burn-in |
| 02/04/1997 | US5600256 Cast elastomer/membrane test probe assembly |
| 02/04/1997 | US5600236 Converter and digital channel selector |
| 02/04/1997 | CA2089664C Method and electrical measuring apparatus for analyzing the impedance of the source of an actual alternating voltage |
| 01/30/1997 | WO1997003467A1 Top loading socket for ball grid arrays |
| 01/30/1997 | CA2226856A1 Top loading socket for ball grid arrays |
| 01/29/1997 | EP0504169B1 Fluidics head for testing chemical and ionic sensors |
| 01/29/1997 | CN1141519A Connector module with test and jumper access |
| 01/29/1997 | CN1141434A Contact structure of treatment device used for IC testing apparatus |
| 01/29/1997 | CA2179424A1 Sensor including two entwined spiral electrodes |
| 01/28/1997 | US5598104 Breakaway test probe actuator used in a probing apparatus |
| 01/28/1997 | US5598096 Method and apparatus for testing an integrated circuit using controlled wirebonding and wirebonding removal |
| 01/28/1997 | US5597982 Electrical connection structure |
| 01/28/1997 | US5597737 Method for testing and burning-in a semiconductor wafer |
| 01/28/1997 | US5597317 Surface mating electrical connector |
| 01/23/1997 | WO1997002494A1 Shunt assembly for current measurement |
| 01/23/1997 | CA2226107A1 Shunt assembly for current measurement |
| 01/22/1997 | EP0755071A2 Semiconductor probe card device with a ball-bump |
| 01/21/1997 | US5596282 Tester for integrated circuits |
| 01/21/1997 | US5596229 Chip carrier structure |
| 01/16/1997 | WO1997001885A1 Improved charge rate electrometer |
| 01/15/1997 | EP0753699A2 Instrument tilt bail with stepped projections |
| 01/15/1997 | EP0670033B1 Circuitry for processing analogical current and voltage signals |
| 01/14/1997 | US5594359 Voltage generating circuit for IC test |
| 01/14/1997 | US5594358 Radio frequency probe and probe card including a signal needle and grounding needle coupled to a microstrip transmission line |
| 01/14/1997 | US5594357 Testing apparatus and connection method for the testing apparatus |
| 01/14/1997 | US5594356 Interconnection device for connecting test equipment with a circuit board designed for fine pitch solder lead integrated circuit components |
| 01/14/1997 | US5594332 Alternating current detector |
| 01/14/1997 | US5594329 Method and apparatus for obtaining voltage-isolated measurement channels with an isolation transformer and multiplier |
| 01/08/1997 | EP0752594A2 Contact structure for electrically connecting a testing board and die |
| 01/08/1997 | EP0752588A2 Testing apparatus |
| 01/08/1997 | EP0752587A2 Electrical connection structure |
| 01/07/1997 | US5592101 Electro-optic apparatus for measuring an electric field of a sample |
| 01/07/1997 | US5592093 Electronic battery testing device loose terminal connection detection via a comparison circuit |
| 01/07/1997 | CA2091099C Connector assembly |
| 01/01/1997 | CN1139213A Split-path linear isolation circuit apparatus and method |
| 12/31/1996 | US5589781 Die carrier apparatus |
| 12/24/1996 | US5586891 Electrical socket for high-frequency applications |
| 12/19/1996 | WO1996041506A1 Photolithographically patterned spring contact |
| 12/19/1996 | WO1996041204A1 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus |
| 12/18/1996 | EP0748450A1 Printed circuit board test set with test adapter and method for setting the latter |
| 12/18/1996 | CN1138165A Device testing system with cable pivot and method of installation |
| 12/17/1996 | US5586114 Multiplexing instrumentation preamplifier |
| 12/17/1996 | US5585739 Doubled ended spring probe ring interface for multiple pin test heads and method therefor |
| 12/17/1996 | US5585738 Probe system having vertical height detection and double focal image pickup coinciding with probe contact in height adjustment |
| 12/17/1996 | US5585737 Semiconductor wafer probing method including arranging index regions that include all chips and minimize the occurrence of non-contact between a chip and a probe needle during chip verification |
| 12/17/1996 | US5585736 Contact probe utilizing conductive meltable probing material |
| 12/17/1996 | US5585735 E-O probe with FOP and voltage detecting apparatus using the E-O probe |
| 12/17/1996 | US5585282 Process for forming a raised portion on a projecting contact for electrical testing of a semiconductor |
| 12/12/1996 | WO1996039795A1 Multiple probing of an auxiliary test pad which allows for reliable bonding to a primary bonding pad |
| 12/11/1996 | EP0747713A2 Circuit for measuring the load current of a power semiconductor device with a load on the source or drain side |
| 12/11/1996 | EP0747712A2 Capacitive pickup clip |
| 12/11/1996 | EP0746772A1 Reusable die carrier for burn-in and burn-in process |
| 12/11/1996 | EP0438537B1 A device for monitoring and indicating a given minimum battery power reserve |
| 12/10/1996 | US5583801 Voice troubleshooting system for computer-controlled machines |
| 12/10/1996 | US5583447 Voltage probe with reverse impedance matching |
| 12/10/1996 | US5583446 For measuring high speed signals with a low speed measurement instrument |
| 12/10/1996 | US5583445 Opto-electronic membrane probe |
| 12/10/1996 | US5583444 Voltage detection apparatus |
| 12/10/1996 | US5583442 Differential voltage monitor using a bridge circuit with resistors on and off of an integrated circuit |
| 12/08/1996 | CA2178450A1 Capacitive pickup clip |