| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 03/31/1998 | US5734176 Impedance controlled test fixture for multi-lead surface mounted integrated circuits |
| 03/31/1998 | US5733133 Pin socket connector for print circuit board |
| 03/26/1998 | WO1998012568A1 Process for producing semiconductor device and semiconductor device |
| 03/26/1998 | DE19638288A1 Multiple conductor systems electric current detecting component |
| 03/25/1998 | EP0831332A1 Adapter for testing electric circuit boards |
| 03/25/1998 | EP0740795B1 Reversible chip contacting device |
| 03/24/1998 | US5731710 Contact probe apparatus used in electric tests for a circuit board |
| 03/24/1998 | US5731709 Method for testing a ball grid array semiconductor device and a device for such testing |
| 03/24/1998 | US5731579 Electro-optical voltage sensor head |
| 03/24/1998 | US5731073 Reusable, selectively conductive, Z-axis, elastomeric composite substrate |
| 03/19/1998 | WO1998011449A1 Wafer scale high density probe assembly, apparatus for use thereof and methods of fabrication thereof |
| 03/19/1998 | WO1998011446A1 Integrated compliant probe for wafer level test and burn-in |
| 03/19/1998 | WO1998011445A1 Probe structure having a plurality of discrete insulated probe tips |
| 03/18/1998 | EP0829728A2 Rapid action engagement interface connection system |
| 03/18/1998 | CN1176505A Self-aligning low profile socket for connecting ball grid array devices through dendritic interposer |
| 03/17/1998 | US5729150 Low-current probe card with reduced triboelectric current generating cables |
| 03/17/1998 | US5729149 Apparatus for holding a testing substrate in a semiconductor wafer tester and method for using the same |
| 03/17/1998 | US5729148 Probe assembly |
| 03/17/1998 | US5729147 Housing for surface mountable device packages |
| 03/17/1998 | US5729146 Quick stacking translator fixture |
| 03/12/1998 | WO1998010298A1 Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel |
| 03/12/1998 | WO1997043656A3 Wafer-level burn-in and test |
| 03/12/1998 | DE19640829A1 Circuit arrangement with isolating amplifier and measurement sensor |
| 03/10/1998 | US5727110 Electro-optic interface for field instrument |
| 03/10/1998 | US5726580 Universal wafer carrier for wafer level die burn-in |
| 03/10/1998 | US5726566 Apparatus for measuring an RF parameter |
| 03/10/1998 | US5726482 Device-under-test card for a burn-in board |
| 03/10/1998 | US5725995 Transistors and integrated circuits |
| 03/05/1998 | DE19703896C1 Electrical cable clamp |
| 03/05/1998 | DE19634439A1 Fault current measurement with intelligent GST distributor for electrical plant |
| 03/05/1998 | DE19634356A1 Radio frequency compensation method for potential measuring probe |
| 03/04/1998 | EP0826969A2 Substrate inspection apparatus and method therefore |
| 03/04/1998 | EP0826152A1 Method and apparatus for testing semiconductor dice |
| 03/04/1998 | EP0756710B1 Device for displaying the voltage of a conductor of a high-voltage power supply system |
| 03/04/1998 | CN1175307A Top load socket for ball grid array devices |
| 03/03/1998 | US5724387 Cable loss simulator for serial digital source using a passive network |
| 03/03/1998 | US5723894 Structure for providing an electrical connection between circuit members |
| 03/03/1998 | US5723347 Semi-conductor chip test probe and process for manufacturing the probe |
| 03/03/1998 | US5722514 Tray installation rack for test handler |
| 02/24/1998 | US5721496 Method and apparatus for leak checking unpackaged semiconductor dice |
| 02/24/1998 | US5720098 Method for making a probe preserving a uniform stress distribution under deflection |
| 02/19/1998 | WO1998007041A1 Semiconductor device testing apparatus |
| 02/19/1998 | WO1998007040A1 Membrane probing system with local contact scrub |
| 02/17/1998 | US5718040 Method of making spring probe with piloted and headed contact |
| 02/12/1998 | WO1998005753A1 Storage device for objects, storage station, and air-conditioned cabinet |
| 02/10/1998 | US5717328 Method and apparatus for using a miniature probe as a hand held probe |
| 02/10/1998 | US5717326 Current measuring apparatus for measuring current in a wire |
| 02/10/1998 | US5716218 Process for manufacturing an interconnect for testing a semiconductor die |
| 02/05/1998 | WO1998004927A1 Loaded board drop pin fixture |
| 01/29/1998 | DE19630316A1 Electronic component contacting device for function testing |
| 01/28/1998 | EP0821244A2 Device to shield a magnetic field in a given plane |
| 01/23/1998 | CA2181758A1 Rf probe for emi diagnostics |
| 01/22/1998 | WO1998002755A1 A device for reducing the time for measuring on a cable |
| 01/22/1998 | DE19627442A1 High viscosity adhesive for affixing probes onto boards |
| 01/22/1998 | CA2259571A1 A device for reducing the time for measuring on a cable |
| 01/21/1998 | CN1171167A Composite intermediate connecting element of microelectronic device and its production method |
| 01/15/1998 | WO1998001906A1 Floating lateral support for ends of elongate interconnection elements |
| 01/14/1998 | EP0818685A1 Device for testing electronic boards under special temperature or treatment conditions |
| 01/14/1998 | EP0818684A2 Test system for printed circuits |
| 01/14/1998 | EP0817973A1 Interface apparatus for automatic test equipment |
| 01/14/1998 | CN2272583Y Composite measuring continuity tester |
| 01/14/1998 | CN1170461A Method and apparatus for semiconductor die testing |
| 01/14/1998 | CN1037053C Device for suplying voltage to electronic circuit |
| 01/13/1998 | US5707000 Apparatus and method for removing known good die using hot shear process |
| 01/08/1998 | DE19624922A1 Optical measuring process for measuring alternating quantity |
| 01/07/1998 | EP0817260A2 IC package, IC prober and connector and method of forming the same |
| 01/07/1998 | EP0815454A1 Voltage transformer |
| 01/07/1998 | EP0779989A4 Membrane probing of circuits |
| 01/07/1998 | EP0779987A4 Membrane probing of circuits |
| 01/07/1998 | CN1036945C Microwave probe-needle for coplanar integrated cricuit chip |
| 01/06/1998 | US5705933 Resuable carrier for burn-in/testing on non packaged die |
| 01/06/1998 | US5705932 System for expanding space provided by test computer to test multiple integrated circuits simultaneously |
| 12/31/1997 | WO1997050001A1 A method of testing and fitting electronic surface-mounted components |
| 12/30/1997 | US5703928 Method of sensing a signal in a pair of wires |
| 12/30/1997 | US5703494 Probing test apparatus |
| 12/30/1997 | US5703493 Wafer holder for semiconductor applications |
| 12/30/1997 | US5703491 Voltage detection apparatus |
| 12/30/1997 | US5703324 Shielded banana plug with double shroud and input receptacle |
| 12/30/1997 | US5702822 Method for producing single crystal, and needle-like single crystal |
| 12/30/1997 | US5701666 Method for manufacturing a stimulus wafer for use in a wafer-to-wafer testing system to test integrated circuits located on a product wafer |
| 12/29/1997 | EP0813804A1 Communications and measurement apparatus |
| 12/29/1997 | EP0792462A4 Probe card assembly and kit, and methods of using same |
| 12/23/1997 | US5701087 Prescaler IC test method capable of executing alternate current test by the use of IC tester for direct current test |
| 12/23/1997 | US5701086 Connecting test equipment to adjacent legs of an IC or the like by interdigitating conductive wedges with the legs |
| 12/23/1997 | US5701085 Apparatus for testing flip chip or wire bond integrated circuits |
| 12/23/1997 | US5700979 Flexible strip cable with extension for testing |
| 12/17/1997 | EP0813067A2 Electronic measuring circuit, especially for measuring currents with an integrated measuring resistance |
| 12/17/1997 | EP0740796B1 Current sensor including magnetic sensors |
| 12/17/1997 | EP0411106B1 Thermo-optical current sensor and thermo-optical current sensing systems |
| 12/16/1997 | US5699036 Shunt |
| 12/16/1997 | US5698990 Counterforce spring assembly for printed circuit board test fixtures |
| 12/16/1997 | US5698984 Adaptive digital filter for improved measurement accuracy in an electronic instrument |
| 12/16/1997 | US5697322 Analog display having electroluminescent pointer |
| 12/10/1997 | EP0811167A1 Manipulator for automatic test equipment test head |
| 12/10/1997 | CN2270231Y Volt-ammeter with electric connection point |
| 12/10/1997 | CN1167335A Semiconductor checking device |
| 12/09/1997 | US5695068 Probe card shipping and handling system |
| 12/04/1997 | WO1997045869A1 Semiconductor package and device socket |
| 12/03/1997 | CN1166876A Method and device for testing of electronic components |
| 12/02/1997 | US5694050 Multiprobing semiconductor test method for testing a plurality of chips simultaneously |